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FEATURES
All-silicon time delay
5 taps equally spaced
Delay tolerance ±2 ns or ±3%, whichever is
greater
Stable and precise over temperature and
voltage range
Leading and trailing edge accuracy
Economical
Auto-insertable, low profile
Standard 14-pin DIP, 8-pin DIP, or 16-pin
SOIC
Tape and reel available for surface-mount
Low-power CMOS
TTL/CMOS compatible
Vapor phase, IR and wave solderability
Custom delays available
Quick turn prototypes
Extended temperature range available
PIN ASSIGNMENT
PIN DESCRIPTION
TAP 1-TAP 5 - TAP Output Number
VCC - +5 Volts
GND - Ground
NC - No Connection
IN - Input
DESCRIPTION
The DS1005 5-Tap Silicon Delay Line provides five equally spaced taps with delays ranging from 12 ns
to 250 ns, with an accuracy of ±2 ns or ±3%, whichever is greater. This device is offered in a standard 14-
pin DIP, making it compatible with existing delay line products. Space-saving 8-pin DIPs and 16-pin
SOICs are also available. Both enhanced performance and superior reliability over hybrid technology is
achieved by the combination of a 100% silicon delay line and industry standard DIP and SOIC
packaging. In order to maintain complete pin compatibility, DIP packages are available with h ybrid lead
configurations. The DS1005 reproduces the input logic level at each tap after the fix ed dela y specified b y
the dash number in Table 1. The device is designed with both leading and trailing edge accuracy. Each
tap is capable of driving up to ten 74LS loads. Dallas Semiconductor can customiz e standard products to
meet special needs. For special requests and rapid delivery, call (972) 371–4348.
DS1005
5-Tap Silicon Delay Line
www.dalsemi.com
IN
NC
NC
TAP 2
TAP 4
NC
GND
NC
NC
NC
TAP 5
TAP 3
TAP 1
VCC
1
2
3
4
5
6
7
14
13
12
11
10
9
8
DS1005 14-Pin DIP (300-mil)
See Mech. Drawings Section
IN
TAP 2
TAP 4
GND
VCC
TAP 1
TAP 3
TAP 5
1
2
3
4
6
5
8
7
DS1005M 8-Pin DIP (300-mil)
See Mech. Drawings Sectio
n
DS1005S 16-Pin SOIC
(300-mil)
See Mech. Drawin
g
s Sectio
n
IN
NC
NC
TAP 2
TAP 4
NC
GND
NC
NC
NC
TAP 5
TAP 3
TAP 1
VCC
1
2
3
4
5
6
7
16
15
14
13
12
89
10
11
NC
NC
DS1005
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LOGIC DIAGRAM Figure 1
PART NUMBER DELAY TABLE (tPHL, tPLH) Table 1
PART NO. TAP 1 TAP 2 TAP 3 TAP 4 TAP 5
DS1005-60 12 ns 24 ns 36 ns 48 ns 60 ns
DS1005-75 15 ns 30 ns 45 ns 60 ns 75 ns
DS1005-100 20 ns 40 ns 60 ns 80 ns 100 ns
DS1005-125 25 ns 50 ns 75 ns 100 ns 125 ns
DS1005-150 30 ns 60 ns 90 ns 120 ns 150 ns
DS1005-175 35 ns 70 ns 105 ns 140 ns 175 ns
DS1005-200 40 ns 80 ns 120 ns 160 ns 200 ns
DS1005-250 50 ns 100 ns 150 ns 200 ns 250 ns
Custom delays available
DS1005
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ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to Ground -1.0V to +7.0V
Operating Temperature 0°C to 70°C
Storage Temperat ure -55°C to +125°C
Soldering Temperature 260°C for 10 seconds
Short Circuit Output Current 50 mA for 1 second
* This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operation sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect reliability.
DC ELECTRICAL CHARACTERISTICS (0°C to 70°C; VCC = 5.0V ± 5%)
PARAMETER SYM TEST
CONDITION MIN TYP MAX UNITS NOTES
Supply Voltage VCC 4.75 5.00 5.25 V 1
High Level Input
Voltage VIH 2.2 VCC + 0.5 V 1
Low Level Input
Voltage VIL -0.5 0.8 V 1
Input Leakage
Current II0.0V ≤ VI ≤ VCC -1.0 1.0 u A
Active Current ICC VCC=Max;
Period=Min. 40 70 mA 2
High Level Output
Current IOH VCC=Min.
VOH=4 -1.0 mA
Low Level Output
Current IOL VCC=Min.
VOL=0.5 12 mA
AC E LEC TRICAL CHARACTER ISTICS (TA = 25°C; VCC = 5V ± 5%)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Input Pulse Width tWI 40% of Tap 5 tPLH ns 7
Input to Tap Delay
(leading edge) tPLH Table 1 ns 3, 4, 5, 6
Input to Tap Delay
(trailing edge) tPHL Table 1 ns 3, 4, 5, 6
Power-up Time tPU 100 ms
Period 4 (tWI)ns7
CAPACITANCE (TA = 25°C)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Input Capacitance CIN 510pF
DS1005
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NOTES:
1. All voltages are referenced to ground.
2. Measured with outputs open.
3. VCC = 5V @ 25°C. Delays accurate on both risin g and falling edges within ±2 ns or ±3%, whichever
is greater.
4. See Test Conditions.
5. The combination of temperature variations from 25°C to 0°C or 25°C to 70°C and voltage variations
from 5.0V to 4.75V or 5.0V to 5.25V may produce an additional input-to-tap del ay shift of ±1.5 ns or
±4%, whichever is greater.
6. All tap delays tend to vary unidirectionall y with temperature or voltage. For example, if TAP 1 slows
down, all other taps will also slow down; TAP 3 can never be faster than TAP 2.
7. Pulse width and duty cycle specifications may be exceeded; however, accuracy will be application-
sensitive (decoupling, layout, etc.).
TERMINOLOGY
Period: The time elapsed between the leading edge of the first pulse and the leading edge of the
following pulse.
tWI (Pulse Width): The elapsed time on the pulse between the 1.5V point on the leading edge and the
1.5V point on the trailing edge, or the 1.5V point on the trailing edge and the 1.5V point on the leading
edge.
tRISE (Input Rise Time): The elapsed time between the 20% and the 80% point on the leading edge of the
input pulse.
tFALL (Input Fall Time): The elapsed time between the 80% and the 20% point on the trailing edge of the
input pulse.
tPLH (Time Delay, Rising): The elapsed time between the 1.5V point on the leading edge of the input
pulse and the 1.5V point on the leading edge of any tap output pulse.
tPHL (Time Delay, Falling): The elapsed time between the 1.5V point on the trailing edge of the input
pulse and the 1.5V point on the trailing edge of any tap output pulse.
DS1005
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TEST SETUP DESCRIPTION
Figure 3 illustrates the hardware confi guration used for measuring the timing parameters on the DS1005.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected between the input and each tap. Each
tap is selected and connected to the counter by a VHF switch control unit. All measurements are fully
automated, with each instrument controlled by a central computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature 25°C ±=3°C
Supply Voltage (VCC) 5.0V ±=0.1V
Input Pulse High = 3.0V ±=0.1V
Low = 0.0V ±=0.1V
Source Impedance 50 ohm maximum
Rise and Fall Time 3.0 ns maximum
Pulse Width 500 ns
Period 1 µs
OUTPUT:
Each output is loaded with the equivalent of a 74F04 input gate. Delay is measured at the 1.5V level on
the rising and falling edge.
NOTE:
Above conditions are for test only and do not restrict the operation of the device under other data sheet
conditions.
DS1005
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TIMING DI AGRAM: SILICON DELAY LINE Figure 2
DALLAS SEMICONDUCTOR TEST CIRCUIT Figure 3
