Product
Specification 108-1422
15Jul08 Rev E
Surface Mount Matched I mpedance Connector
©2008 Tyco Electronics Corporation
Harrisburg, PA
All International Rights Reserved.
* Trademark
| Indi cates change For latest revision, visi t ou r website at www.t ycoel ectronics.com\documents.
For Regional Customer Service, visit our website at www.tycoelectronics.com 1 of 9
LOC B
1. SCOPE
1.1. Content
This specification covers performance, test s and quali ty requirements for the Tyco Electronics Surface|Mount Matched I mpedance Connector (MI CTOR) for board to board applications using two design
sty les, right angle and vert ical. These two piece connector designs accommodate a vari ety of printed
ci rcuit board thicknesses. Plug assemblies are loaded with .008 inch thick MICTOR cont acts whi ch mate
with hermaphroditic contacts in the receptacle assembly. Both plug and receptacle assemblies are
available in signal counts of 38 t o 266 position in 38 pin incr ements for .025 inch centerline.
1.2. Qualification
When tests are perfor med on the subject product line, procedures specified in Figure 1 shall be used.|Al l i nspections shall be performed using the appli cable inspection plan and product drawing.
1.3. Qual ification Test Resul ts|
Successful qualification testing on the subject product line was completed on 13Dec98. The|Qual ification Test Report number for this testing is 501-252. This documentation is on file at and|available f rom Engineering Practices and Standards (EPS).|
2. APPLI CABLE DOCUMENTS
The follow ing Tyco Electronics documents form a part of this specification to the extent specified herein.|Unl ess otherwise specified, the latest edition of the document applies. In the event of conflict between
the r equirements of this specification and the product drawing, the product draw ing shall take
precedence. In the event of conflict between the requirements of this specification and the referenced
documents, this speci fication shall take precedence.
|
!
109-1: General Requirements for Test Speci fications
!
109 Series: Test Specifications as indicated in Figure 1
!
501-252: Qualification Test Report (Surface Mount Matched Impedance Connector)|
3. REQUIREMENTS
3.1. Desi gn and Construction
Product shall be of design, construction and physi cal dimensions specified on the applicable product
drawing.
108-1422
Rev E 2 of 9
3.2. Materials
!
Contacts:
Plug: High reliability copper all oy, nickel underplate al l over, mating surfaces plated to meet|Level 1 or Level 2 durability performance requirements, solder tails plated tin-lead or matte tin| Receptacle: High reliability copper alloy, nickel underplate all over, mating surfaces plated to|meet Level 1 or Level 2 durability performance requirements, solder tails plated tin-lead or|matte tin|
!
Ground bus:
Plug: Brass, nickel underplate all over, mating surfaces plated to meet Level 1 or Level 2|durability performance requirements, solder tail s plated tin-lead or matte tin| Receptacle: Phosphor br onze, ni ckel underplate all over, mating surfaces plated to meet|Level 1 or Level 2 durability performance requirements, solder tails plated tin-lead or matte tin|
!
Housi ng: Liquid cryst al polymer, (LCP), UL94V-0
3.3. Ratings
!
Vol tage: 30 volts AC
!
Current:
Signal contacts: Signal application only
Ground bus: See Figure 4 for applicable current carrying capability
!
Temperature: -55 to 125
/
C
!
Charact eristic Impedance: 50 ± 5 ohms at 1 nanosecond
3.4. Perf ormance and Test Description
Product is designed to meet t he electrical, mechanical and envi ronmental perfor mance requirements
speci fied in Figur e 1. Unless otherwi se specified, all tests shall be performed at ambient environmental
condi tions per Test Speci fication 109-1.|
3.5. Test Requirements and Procedures Summary
Test Description Requi rement Procedur e
Examination of product. Meets requirements of product
drawing. Visual, dimensional and functional
per applicable quality inspection
plan.
ELECTRICAL
Termi nation resistance.
)
R 10 milliohms maximum. AMP 109-6-1.
Subject mated contacts assembled
i n housing to 50 mv maximum open
ci rcuit at 100 ma maximum.
See Fi gure 3.
Insulati on resistance. 10000 megohms minimum. AMP Spec 109-28-1.
Test between adjacent signal
contact s and between al l signal
contact s and ground of mated
samples.
Di electric withstanding voltage. 500 volts AC at sea level. AMP Spec 109-29-1.
Test between adjacent signal
contact s and between al l signal
contact s and ground of mated
samples.
Fi gure 1 (continued)
108-1422
Test Description Requi rement Procedur e
Rev E 3 of 9
MECHANICAL
Random vibration. No di scontinuiti es of 1 mi crosecond
or longer durat ion.
See Note.
AMP Spec 109-21-5.
Subject mated samples to 11.95
G's rms. Ninety minutes in each of 3
mutual ly per pendicular planes.
Mechanical shock.| No discontinuities of 1 microsecond
or longer durat ion.
See Note.
AMP Spec 109-26-1.
Subject mated samples to 50 G's
hal f-sine shock pulses of 11
milliseconds duration. 3 shocks in
each di rection appli ed along 3
mutual ly per pendicular planes, 18
tot al shocks.
Durability. See Note. AMP Spec 109-27.
Mate and unmate sampl es for 25
cycles for Level 1 contacts and 500|cycles for Level 2 contacts at|maximum rate of 600 cycles per
hour.
Mating force. 152 ounces maximum per module
(1 modul e = 38 contacts + 1 gr ound
bus).
AMP Spec 109-42, Condition A.
Measure force necessary to mate
sa mples at maximum rate of 1 inch
per mi nute.
Unmati ng force. 19 ounces minimum per modul e (1
module = 38 contacts + 1 ground
bus).
AMP Spec 109-42, Condition A.
Measure force necessary to unmate
sa mples at maximum rate of 1 inch
per mi nute.
ENVIRONMENTAL
Thermal shock. See Note. AMP Spec 109-22.
Subject mated samples to 5 cycles
between -55 and 125
/
C.
Humidity/temperature cycling. See Note. AMP Spec 109-23-3, Condition B.
Subject mated samples to 10 cycles
between 25 and 65
/
C at 95% RH.
Temperature life. See Note. AMP Spec 109-43.
Subject mated samples to
temperat ure life at 118
/
C for 792
hours.
Mixed f lowing gas. See Not e. AMP Spec 109-85-2.
Subject mated samples to
environmental cl ass II for 14 days.
Temperature cycling. See Note. AMP Spec 109-75-2.
Subject mated samples to 1024
cycles between -40 and 60
/
C at 2
hours per cycle.
Shall meet visual requirements, show no physical damage and shall meet r equirements of
NOTE
additional tests as specified in Test Sequence in Figur e 2.
Fi gure 1 (end)
108-1422
Rev E 4 of 9
3.6. Product Qualification and Requalification Test Sequence
Test or Examination Test Group (a)
12345
Test Sequence (b)
Examination of product 1,9 1,5 1,5 1,8 1,5
Termi nation resistance 3,7 2,4 2,4 2,4
Insulation resistance 2,6
Di electric withstanding voltage 3,7
Random vibration|5
Mechanical shock|6
Durability 4
Mating force 2
Unmati ng force 8
Thermal shock 4
Humidity/temperature cycling 5
Temperature life 3(c)
Mixed f lowing gas 3(c)
Temperature cycling 3(c)
(a) See paragraph 4.1.A.
NOTE
(b) Numbers indicate sequence in which tests ar e performed.
(c) Precondition samples with 3 cycles durability.
Fi gure 2
108-1422
Rev E 5 of 9
4. QUALI TY ASSURANCE PROVISIONS
4.1. Qual ification Testi ng
A. Sample Selection
Samples shall be prepared in accordance wi th applicable Instruction Sheets and shall be selected
at r andom from curr ent production. Test groups 1, 2, 3 and 5 shall consist of 3 mated pairs (plug
and recept acle) of vert ical and right angle assemblies. Samples shall be mounted on . 062 inch
thick pri nted circuit boards. Housings shall be full y populated with signal contacts and bus bars.
Test group 4 shall consist of 5 mated pairs (plug and receptacle) of vert ical and right angle
assemblies. Housings shall be fully populat ed wit h signal contacts and bus bars and shall not be
mounted on printed ci rcuit boards.
B. Test Sequence
Qual ification inspection shall be verified by testing samples as specified in Figure 2.
4.2. Requal ification Testi ng
If changes significantly affecting form, fit or function are made to product or manufacturing process,
product assurance shall coordinate requalification testing, consisting of all or part of original testing
sequence as deter mined by development/product, quality and reliability engineering.
4.3. Acceptance
Acceptance is based on verification that product meets requirements of Figure 1. Failures attributed to
equi pment, test setup or operator def ici encies shall not disqualify pr oduct. When product failure occurs,
corr ective action shall be taken and samples resubmitted for qualification. Testing to confirm corr ective
action is r equired before resubmittal.
4.4. Qual ity Conformance Inspection
The applicable quality inspection plan will specify sampling acceptable quality level to be used.|Di mensional and f unctional requirements shall be in accordance w ith applicable product drawing and
this specif ication.
108-1422
Rev E 6 of 9
Vert ical Design
Ri ght Angle Design
Fi gure 3
Termi nation Resistance Measurement Points
108-1422
Rev E 7 of 9
Fi gure 4A
Derating Curve, Test Group 1
Fi gure 4B
Derating Curve, Test Group 2
108-1422
Rev E 8 of 9
Fi gure 4C
Derating Curve, Test Group 3
Fi gure 4D
Derating Curve, Test Group 4
108-1422
Rev E 9 of 9
Number of Bus
Bl ades Energiz ed Ri ght Angle Vert ical/Verti cal
Seven Position 20 AWG Wire
Single 1 1
Two Adjacent or Separated .921 .925
Three Adjacent .816 .823
Three Separated .886 .891
Four Adjacent .759 .768
Four Separ ated (57%) .842 .849
Five .715 .725
Six .685 .697
Seven (100%) .684 .676
To deter mine acceptable current carrying capacity for percentage connector loading and wire
NOTE
gage indicated, use the Multiplication Factor (F) from the above chart and mult iply it times the
Base rat ed Current for a single circuit at the maximum ambient operating temperature shown
i n Figures 4A, 4B, 4C or 4D.
Fi gure 4E
Curr ent Rating