Original Creation Date: 06/23/98
Last Update Date: 10/14/98
Last Major Revision Date: 09/30/98
MN11C91-X REV 1A0 MICROCIRCUIT DATA SHEET
High Speed Prescaler
General Description
NOTE: THIS DEVICE IS NOT INTENDED FOR NEW DESIGNS!
The 11C91 is a high-speed prescaler designed specifically for communication and
instrumentation applications. The 11C91 will divide by 5 or 6. The division ratio is
controlled by the Mode Control. The divide by 5 or 6 capability allows the use of pulse
swallowing techniques to control high-speed counting modulos by lower-speed circuits. The
11C91 may be used with either ECL or TTL power supplies. In addition to the ECL outputs Q
and Q, the 11C91 contains an ECL-to-TTL converter and a TTL output. The TTL output
operates from the same VCC and VEE levels as the counter, but a separate pin is used for
the TTL circuit VEE. This minimizes noise coupling when the TTL output switches and also
allows power consumption to be reduced by leaving the separate VEE pin open if the TTL
output is not used. To facilitate capacitive coupling of the clock signal, a 400 ohm
resistor (VREF) is connected internally to the VBB reference. Connecting this resistor to
the Clock Pulse input (CP) automatically centers the input about the switching threshold.
Maximum frequency operation is achieved with a 50% duty cycle. Each of the Mode Control
inputs is connected to an internal 2k ohm resistor with the other end uncommitted (RM1 and
RM2). An M input can be driven from a TTL circuit operating from the same VCC by
connecting the free end of the associated 2k ohm resistor to VCCA. When an M input is
driven from the ECL circuit, the 2k ohm resistor can be left open or, if required, can be
connected to VEE to act as a pull-down resistor.
NS Part Numbers
11C91DMQB
Industry Part Number
11C91
Prime Die
KC91
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o
1 Static tests at +25
2 Static tests at +125
3 Static tests at -55
4 Dynamic tests at +25
5 Dynamic tests at +125
6 Dynamic tests at -55
7 Functional tests at +25
8A Functional tests at +125
8B Functional tests at -55
9 Switching tests at +25
10 Switching tests at +125
11 Switching tests at -55
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MICROCIRCUIT DATA SHEET
MN11C91-X REV 1A0
Features
- THIS DEVICE IS NOT INTENDED FOR NEW DESIGNS!
2
MICROCIRCUIT DATA SHEET
MN11C91-X REV 1A0
(Absolute Maximum Ratings)
(Note 1)
Storage Temperature (Tstg) -65 C to +150 C
Maximum Junction Temperature (Tj) +175 C
Vee Pin Potential to Ground Pin -7.0V to GND
Input Voltage (DC) VEE to GND
Output Current (DC Output HIGH) -50mA
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or
have its useful life impaired. Functional operation under these conditions is not
implied.
Recommended Operating Conditions
Case Temperature (Tc) -55 C to +125 C
Supply Voltage (Vee) -5.7V to -4.7V
Supply Voltage (VCC) GNDVCC = VCCA
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MN11C91-X REV 1A0 MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC PARAMETERS - ECL OPERATION
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: VEE = -5.2V, VCC=VCCA=GND, TC = -55C to +125C
SYMBOL PARAMETER CONDITIONS NOTES PIN-
NAME MIN MAX UNIT SUB-
GROUPS
IIH Input HIGH
Current VEE = -5.2V, VM = VIH 2, 4 M1, M2 250 uA 1
2, 4 CP, MS 400 uA 1
IIL Input LOW Current VEE = -5.2V, VM = VIL 2, 4 INPUTS 0.5 uA 1
VOH Output HIGH
Voltage VEE = -5.2V, VIL, VIH, LOADING 100
OHMS TO -2.0V 1, 3 OUTPUTS -980 -820 mV 1
1, 3 OUTPUTS -910 -670 mV 2
1, 3 OUTPUTS -1100 -900 mV 3
VOL Output LOW
Voltage VEE = -5.2V, VIL, VIH, LOADING: 100
Ohms to -2.0V 1, 3 OUTPUTS -1820 -1620 mV 1, 2,
3
VREF Reference Voltage VEE = -5.2V, IREF = -10uA 2, 4 VREF -1550 -1150 mV 1
VIH Input HIGH
Voltage VEE = -5.2V 7 INPUTS -1100 -810 mV 1
7 INPUTS -980 -690 mV 2
7 INPUTS -1195 -910 mV 3
VIL Input LOW Voltage VEE = -5.2V 7 INPUTS -1850 -1480 mV 1
7 INPUTS -1800 -1430 mV 2
7 INPUTS -1890 -1520 mV 3
IEE Power Supply
Current VEE = -5.2V, Inputs Open 1, 3 VEE -46 -110 mA 1
1, 3 VEE -46 -118 mA 2, 3
DC PARAMETERS - TTL OPERATION
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: VCC = 5.0V, VEE = 0.0V, TC = -55C TO +125C
IIL Input Low Current VCC = 5.5V, VIL = 0.4V 1, 3 INPUTS -5.0 mA 1, 2,
3
ISC Output Short
Circuit Current VCC = 5.5V, VM = 0.0V 1, 3 QTTL -20 -80 mA 1, 2,
3
VOH Output High
Voltage VCC = 5.0V, VIL, VIH, IOH = -640uA 1, 3 QTTL 2.3 V 1, 2,
3
VOL Output Low
Voltage VCC = 5.0V, VIL, VIH, IOL = 20mA 1, 3 QTTL 0.5 V 1, 2,
3
VIH Input High
Voltage VCC = 5.0V 7 INPUTS 4.1 V 1, 2,
3
VIL Input Low Voltage VCC = 5.0V 7 INPUTS 3.3 V 1, 2,
3
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MN11C91-X REV 1A0 MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS - ECL OPERATION
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: VEE = -5.2V, VCC=VCCA= 0.0V, TC = -55C TO +125C, LOADING: 100 OHMS TO -2.0V
SYMBOL PARAMETER CONDITIONS NOTES PIN-
NAME MIN MAX UNIT SUB-
GROUPS
tpLH
tpHL Propagation Delay VEE = -5.2V, VM = 50% 5 CP to Q 1.3 3.0 ns 9
tpLH Propagation Delay VEE = -5.2V, VM = 50% 5 MS TO Q 6.0 ns 9
ttLH
ttHL Output Transition
Time VEE = -5.2V, VM = 20% to 80% or 80% to
20% 5 OUTPUTS 2.0 ns 9
ts(H/L) Setup time High
or Low VEE = -5.2V 5 M to CP 4.0 ns 9
th(H/L) Hold time High or
Low VEE = -5.2V 5 M to CP 0.0 ns 9
FMAX Maximum Clock
Frequency VEE = -5.2V 5 CP 600 MHz 9
AC PARAMETERS - TTL OPERATION
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: VCC = 5.0V, VEE = 0.0V, TC = -55C TO +125C, LOADING: HIGH IMPEDANCE
tpLH
tpHL Propagation Delay VCC = 5.0V, VM = 50% 5 CP to
QTTL 6.0 14.0 ns 9
tpLH Propagation Delay VCC = 5.0V, VM = 50% 5 MS to
QTTL 17.0 ns 9
ts(H/L) Setup Time High
or Low VCC = 5.0V 5 M to CP 4.0 ns 9
th(H/L) Hold Time High or
Low VCC = 5.0V 5 M to CP 0.0 ns 9
FMAX Maximum Clock
Frequency VCC = 5.0V 5 CP 600 MHz 9
Note 1: Screen tested 100% on each device at -55 C, +25 C and +125 C temperature, subgroups
1, 2, 3, 7 & 8.
Note 2: Screen tested 100% on each device at +25C temperature only, subgroup 1.
Note 3: Sample tested (Method 5005, Table 1) on each MFG. lot at -55C, +25C and +125C
temperature, subgroups 1, 2, 3, 7 & 8.
Note 4: Sample tested, (Method 5005, Table 1) at +25C temperature only, subgroup 1.
Note 5: Guaranteed at +25 C temperature only, subgroup 9.
Note 6: Sample tested at +25C temperature only, 2% LTPD.
Note 7: Guaranteed by applying specific input condition and testing VOH/VOL.
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MICROCIRCUIT DATA SHEET
MN11C91-X REV 1A0
Revision History
Rev ECN # Rel Date Originator Changes
0A0 M0002934 10/14/98 Donald B. Miller Initial MDS Release. Archive Table 1 rev 0.0
Release MDS MN11C91-X rev 0A0.
1A0 M0003024 10/14/98 Donald B. Miller Revision change from 0A0 to 1A0: On page 5, "AC
parameters - ECL operation" section, change the FMAX
note from 6 "Sample tested at +25C temperature only,
2% LTPD" to note 5 "Guaranteed at +25C temperature
only, subgroup 9".
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