54ABT240 54ABT240 Octal Buffer/Line Driver with TRI-STATE Outputs Literature Number: SNOS040 54ABT240 Octal Buffer/Line Driver with TRI-STATE (R) Outputs General Description The 'ABT240 is an inverting octal buffer and line driver designed to be employed as a memory address driver, clock driver and bus oriented transmitter or receiver which provides improved PC board density. n Guaranteed latchup protection n High impedance glitch free bus loading during entire power up and power down cycle n Nondestructive hot insertion capability n Standard Microcircuit Drawing (SMD) -- 5962-9318801 Features n Output sink capability of 48 mA, source capability of 24 mA Ordering Code Package Number Military Package Description 54ABT240J-QML J20A 20-Lead Ceramic Dual-In-Line 54ABT240W-QML W20A 20-Lead Cerpack 54ABT240E-QML E20A 20-Lead Ceramic Leadless Chip Carrier, Type C Connection Diagrams Pin Assignment for DIP and Flatpak Pin Assignment for LCC DS100202-2 DS100202-1 Pin Names OE1, OE2 Description TRI-STATE Output Enable Inputs I0-I7 Inputs O0-O7 Outputs TRI-STATE (R) is a registered trademark of National Semiconductor Corporation. (c) 1998 National Semiconductor Corporation DS100202 www.national.com 54ABT240 Octal Buffer/Line Driver with TRI-STATE Outputs July 1998 Truth Tables Inputs In Outputs (Pins 12, 14, 16, 18) L L H L H L H X Z In Outputs (Pins 3, 5, 7, 9) L L H L H L H X Z OE1 Inputs OE2 H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance www.national.com 2 Absolute Maximum Ratings (Note 1) Current Applied to Output in LOW State (Max) DC Latchup Source Current (Across Comm Operating Range) Over Voltage Latchup (I/O) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias Ceramic VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Any Output in the Disabled or Power-Off State in the HIGH State -65C to +150C -55C to +125C twice the rated IOL (mA) -150 mA 10V Recommended Operating Conditions -55C to +175C -0.5V to +7.0V -0.5V to +7.0V -30 mA to +5.0 mA Free Air Ambient Temperature Military Supply Voltage Military Minimum Input Edge Rate Data Input Enable Input -0.5V to 5.5V -0.5V to VCC -55C to +125C +4.5V to +5.5V (V/t) 50 mV/ns 20 mV/ns Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol Parameter ABT240 Min VIH Input HIGH Voltage VIL Input LOW Voltage VCD Input Clamp Diode Voltage VOH Output HIGH Voltage VOL Output LOW Voltage IIH Input HIGH Current Typ Units VCC Conditions Max 2.0 V Recognized HIGH Signal 0.8 V Recognized LOW Signal -1.2 V Min IIN = -18 mA 54ABT 2.5 V Min IOH = -3 mA 54ABT 2.0 V Min IOH = -24 mA 0.55 V Min IOL = 48 mA 5 A Max 54ABT VIN = 2.7V (Note 4) VIN = VCC 5 IBVI Input HIGH Current Breakdown Test 7 A Max VIN = 7.0V IIL Input LOW Current -5 A Max VIN = 0.5V (Note 4) V 0.0 VIN = 0.0V -5 VID Input Leakage Test 4.75 IID = 1.9 A All Other Pins Grounded VOUT = 2.7V; OEn = 2.0V IOZH Output Leakage Current 50 A 0 - 5.5V IOZL Output Leakage Current -50 A 0 - 5.5V IOS Output Short-Circuit Current -275 mA Max VOUT = 0.0V ICEX Output High Leakage Current 50 A Max VOUT = VCC IZZ Bus Drainage Test 100 A 0.0 VOUT = 5.5V; All Others GND ICCH Power Supply Current 50 A Max All Outputs HIGH ICCL Power Supply Current 30 mA Max All Outputs LOW ICCZ Power Supply Current 50 A Max -100 VOUT = 0.5V; OEn = 2.0V OEn = VCC; All Others at VCC or Ground ICCT Additional ICC/Input Max VI = VCC - 2.1V Outputs Enabled 1.5 mA Outputs TRI-STATE 1.5 mA Enable Input VI = VCC - 2.1V Outputs TRI-STATE 50 A Data Input VI = VCC - 2.1V All Others at VCC or Ground ICCD Dynamic ICC No Load mA/ (Note 4) 0.1 MHz Max Outputs Open OEn = GND, (Note 3) One Bit Toggling, 50% Duty Cycle Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz. Note 4: Guaranteed, but not tested. 3 www.national.com AC Electrical Characteristics Symbol Parameter 54ABT TA = -55C to +125C VCC = 4.5V-5.5V Units Fig. No. ns Figure 5 ns Figure 4 ns Figure 4 CL = 50 pF Min Max tPLH Propagation Delay 0.8 5.5 tPHL Data to Outputs 1.0 5.5 tPZH Output Enable 0.8 7.5 tPZL Time 0.8 7.7 tPHZ Output Disable 1.0 7.5 tPLZ Time 1.0 7.2 Capacitance Symbol Parameter Typ Units CIN Input Capacitance 5.0 pF COUT (Note 5) Output Capacitance 9.0 pF Conditions TA = 25C VCC = 0V VCC = 5.0V Note 5: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012. AC Loading Amplitude Rep. Rate tW tr tf 3.0V 1 MHz 500 ns 2.5 ns 2.5 ns FIGURE 3. Test Input Signal Requirements DS100202-3 *Includes jig and probe capacitance FIGURE 1. Standard AC Test Load DS100202-4 FIGURE 2. Test Input Signal Levels www.national.com 4 AC Waveforms DS100202-7 DS100202-6 FIGURE 5. Propagation Delay Waveforms for Inverting and Non-Inverting Functions FIGURE 4. TRI-STATE Output HIGH and LOW Enable and Disable Times 5 www.national.com 6 Physical Dimensions inches (millimeters) unless otherwise noted 20-Terminal Ceramic Chip Carrier (L) NS Package Number E20A 20-Lead Ceramic Dual-In-Line Package (D) NS Package Number J20A 7 www.national.com 54ABT240 Octal Buffer/Line Driver with TRI-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Ceramic Flatpak (F) NS Package Number W20A LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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