MIL SPECS YUE D MM 0000125 0033734 7 MMMILS | pT q | INCH~POUND | Co MIL-S-19500/452 2 August 1993 The documentation and process conversion measures necessary to comply with this amendment shall be completed by 2 November 1993 -- SUPERSEDING MIL-S-19500/4528 25 August 1990 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW LEVEL, VOLTAGE-REFERENCE TYPES IN4565A THROUGH IN4584A, 1N4565A-1 THROUGH IN4584A-1, AND 1N4565AUR-1 THROUGH IN4SB4AUR-1, JAN, JANTX, JANTXV, JANS, AND JANC This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for 6.4 volts #5 percent, low bias current, silicon voltage-reference diodes. Four levels of product assurance are provided for each device type as specified in MIL-S-19500, and one Level of product assurance for die (element evaluation). 1.2 Physical dimensions. See figures 1 and 2, and 3.2. 1.3 Maximum ratings. Ta= +25C, unless otherwise specified. | | | | | | Pr | Tstg and Top | Iz | Power derating | | | | | above Ta = +25C | | | | | _ (see 6.3) | | | | | | | mW | c | mA dc | mW /C | | | | | 475 | -65 to +175 | 70 | 3.16 | | | | | | {Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in | Jimproving this document should be addressed to: NASA/Parts Projects Office (NPPO), NASA Goddard Space | [Flight Center, Code 310.A, Greenbelt, MD 20771 by using the Standardization Document Improvement | {Proposal (DD Form 1426) appearing at the end of this document or by letter. | AMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.MIL SPECS GUE D M@@ 0000325 0033735 9 MENILS MIL~-S-19500/452 1.4 Primary electrical characteristics. | | | | Type 1/ | AVz | 22 | Vz IR | | | (voltage- | | 1z= 0.5 mAdc | VrR=3Vde | | | temperature [{ Iz = 0.5 mA de I | | | stability) | | | | | | | | [Min | max | | | | | | | | | | V de | ohms | volts | volts | uA | | | | | | | {7N4565A, IN4565A-1, IN4S65AUR-1 | 0.100 | 200 | 6.08 | 6.72 | 2.0 | JIN4566A, 1IN4566A-1, IN4566AUR-1 | 0.050 | " | " | " | " | |INGS67A, IN4S67A-1, INGS67AUR-1 | 0.020 | " | " | " | |1N4568A, 1N4568A-1, IN4S68AUR-1 | 0.010 " | " | " | [1N4569A, IN4569A-1, INGS69AUR-1 | 0.005 " | . | " | " l | | | | | | Type 1/ | Avz 22 | V2 | IR | ] (val tage- | | 1z=1.0 mde | VR=3vdce | | temperature | I7= 1.0 mA de { | | stability) | | | | | | Min | Max | | | | | | | i V_de ohms | votts | volts | HA | | | | | |anesz0a, IN4570A-1, 1IN4570AUR-1 0.100 100 | 6.08 | 6.72 | 2.0 | JIN4S71A, IN4571A-1, IN4S7TAUR-1 0.050 " | " | " | " | [1N4572A, IN4572A-1, IN45S72AUR-1 0.020 " | " | " | " | |IN4573A, 1N4573A-1, 1NG573AUR-1 0.010 | " | " | " | LAINSS74A, 1N4574A-1, 1N4574AUR-1 0.005 " l " | " L " | | | | | | Type 1/ Avz zz | Vz | IR | i (voltage- | Iz= 2.0 made | Vpe=3Vde | | temperature 1z= 2.0 mA de LL l stability) | | | [min [| Max | | | | | | V_de ohms | volts | volts uA | | | |1N4575A, 1N4575A-1, INSS75AUR-1 0.100 50 | 6.08 | 6.72 2.0 |1N4576A, 1N4576A-1, 1N&S76AUR-1 0.050 " | " | " " |AN4S77A, 1NGS77A-1, INGS77AUR-1 0.020 " }o oo" | " " |1N4578A, 1IN4S78A-1, 1N4578AUR-1 0.010 " | " | " " LIN4579A, IN4S79A-1, IN4579AUR-1 | 0.005 | " {" " | Type 1/ AVZ zz | Vz IR (vol tage- | Iz = 4.0 mA de VR=3Vde | temperature Iz = 4.0 mA dc L stability) | | | b. |. Min j Max 1 | | V_de ohns volts | volts | pA | | | 1N4580A, IN4580A-1, IN4S80AUR-1 0.100 25 | 6.08 | 6.72 | 2.0 IN4581A, 1N4581A-1, 1N4587AUR-1 0.050 " " | " | " 1N4582A, 1N4582A-1, 1IN4582AUR-1 0.020 " " | " | " IN4583A, 1N4583A-1, IN4S83AUR~1 0.010 " " | " | " IN4S84A, 1N4584A-1, IN4584AUR-1 0.005 " | | . 4/ Electrical characteristics and test conditions for "A, A-1, and AUR-1" devices are identical.MIL SPECS 44E D MM 0000325 0033736 O MEMILS MIL-S-19500/452C 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those Listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. STANDARD MILITARY MIL-ST0-750 - Test Methods for Semiconductor Devices. (Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Standardization Documents Order Desk, Building 4D, 700 Robbins Avenue, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Associated detail specification. The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein. 3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shalt be as specified in MIL-S-19500. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-S-19500, and figures 1, 2, 3, and 4 herein. 3.3.1 tead finish. Lead finish shall be solderable as defined in MIL-S-19500, MIL-STD-750, and herein. When a choice of lead finish is desired, it shall be specified in the acquisition requirements (see 6.2). 3.3.2 Dash-one construction. These devices shall be category I or Il metallurgical bond in accordance with MIL-S-19500. 3.4 Marking. Marking shall be in accordance with MIL-S-19500. At the option of the manufacturer, the following markings may be omitted from the device (nonsurface mount): a. Country of origin. b. "IN" portion of type designation. c. The DO-35 versions may leave off "-" portion of type designation (example: JANTX1N4565A1). 3.4.1 UR devices. for "UR" devices only, all marking (except polarity) may be omitted from the body, but shail be retained on the initial container. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S-19500, and as specified herein, except that the lot accumulation period requirement shail be 6 months in Lieu of 6 weeks.MIL SPECS GGE D WM 0000125 0033737 2 MMNILS MIL-S-19500/452C 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-S-19500. Subgroups 3 and 6 of group B inspection and subgroup 6 of group inspection shail be performed on a full sample size of the highest voltage temperature stability type (lowest AVz ) of each bias current to qualify that type and all lower voltage-temperature stability types of that bias current. 4.2.1 Group inspection. Qualification inspection shall be in accordance with table VII of MIL-S-19500 and as follows. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table I1 herein. Subgroup Method Condition ~ Qualification conformance inspection E1 1051 500 cycles 22 devices, c = 0. 2 1038 Condition A, 1,000 hours 22 devices, c = Q. 3, 4, --- --- Not applicable ES, & 6 4.2.2 JANC devices. Qualification for JANC devices shall be in accordance with appendix H of MIL-S-19500. This testing may be performed on a TO-5S package in lieu of the DO-7, DO-35, or the DO-213AA packages. 4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with table II of MIL-S-19500, and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the Limits of table I herein shall not be acceptable. 22s #15 percent of initial value. | initial value, AZz = +15 | | | $i | AVz s +.005 V de from initial value, | herein; AVz s +.005 V dc from { A | | percent of initial value. | | | | | Measurement | | Screen (see table II | | |__of MIL-$-19500) | JANS Level JANTX_and JANTXV Levels | | | | | 3a Temperature cycling Temperature cycling | | | | | | 11 | Vz, 22, IR | Vz, 2z, Ir | | | | | | | 12 See 4.3.1 See 4.3.1 | | | | 13 ubgroups 2 and 3 of table I herein; Subgroup 2 of table I | | | | | | | 4.3.1 Power burn-in conditions. Power burn-in conditions are as follows (applies to A, A-1, and AUR-1 versions): 1N4565 through 1N4569: 17 = 0.5 +.05 mA dc, Ta= +150C, +5C, -0C. 1N4570 through 1N4574: Iz= 1.0 #.1 mA de, Ta= +150C, +5C, -OC. 1N4575 through 1N4579: Iz= 2.0 #.2 mA dc, Ta= +150C, +5C, -0C. 1N4580 through 1N46584: Iz = 4.0 .4 mA dc, Ta= +150C, +5C, -OC. * 4.3.2 Screening (JANC). Screening of JANC die shall be in accordance with MIL-S-19500, appendix H. As a minimum, die shali be 100-percent probed in accordance with group A, subgroup 2. 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-S-19500. 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-S-19500, and table I herein.MIL SPECS 44E D MM 0000325 0033734 4 MBMILS MIL-S-19500/452C 4.4.2 Group 8 inspection for JANS. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IVa (JANS) of MIL-S-19500, and as follows. Electrical measurements (end points) and delta requirements shall be as specified in footnote 2/ of table II herein. 4.4.2.1 Group B inspection, table IVa (JANS) of MIL-S-19500. Subgroup Method Condition B3 7071 Gross leak conditions: Condition E. B4 1037 I2m= 70 mA de at Ta= +25C; ton= toff 3 minutes minimum for 2,000 cycles, no forced air cooling on the device shall be permitted. BS 1027 Izm= 70 mA de for 96 hours; Ta = +75C or adjusted as required, to give an average lot Ty = +200C. B --- Not applicable. 4.4.3 Group B inspection for JAN, JANTX, and JANTXV. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IVb (JAN, JANTX, and JANTXV) of MIL-S-19500, and as follows. Electrical measurements (end points) and delta requirements shall be as specified in footnote 3/ of table II herein. 4.4.3.1 Group 8 inspection, table IVb (JAN, JANTX, and JANTXV) of MIL-S-19500. Subgroup Method Condition B3 1027 Conditions for A, A-1, and AUR-1 versions of: 1N4565 through 1N4569: Iz = 0.5 mA dco; Ta= +100C. 1N4570 through 1N4574: I7 = 1.0 mA dc; Ta= +100C. IN4575 through 1N4579: Iz = 2.0 mA de; Ta = +100C. 1N4580 through 1N4584: 17 = 4.0 mA de; Ta = +100C. B4, 85 --- Not applicable. 4.4.4 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table V of MIL-S-19500, and as follows. Electrical measurements (end points) and delta requirements shall be as specified in footnote 4/ of table II herein. Subgroup Method Condition C2 2036 Lead fatigue: Test condition E; tension: test condition A; 4 pounds, 15 #3 seconds (lead fatigue and tension tests do not apply to surface mount devices) c5 --- Not applicable. c 1026 Conditions for A, A-1, and AUR-1 versions of: 1N4565 through 1N4569: 172 0.5 mA dc; Ta = +100C. 1N4570 through 1N4574: 17% 1.0 mA de; Ta = +100C. IN4575 through 1N4579: Iz= 2.0 mA dc; Ta = +100C. IN4580 through 1N4584: 17 = 4.0 mA de; Ta = +100C. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows. 4.5.1 Voltage-temperature stability. The breakdown voltage of each diode type shall be measured and recorded at each of the specified temperatures. The lowest measured voltage shall be subtracted from the highest measured voltage for each diode. The difference value obtained shall not exceed the specified AVz per diode type.MIL SPECS G4E D MM 0000125 0033735 & MBNILS MIL-S-19500/452C 4.5.2 Reference voltage time stability. The breakdown voltage shall be measured prior to life testing, at 340 hours, and at the conclusion of the life test. The 340-hour reading shall be compared with the O- hour reading and the 1,000-hour reading compared with the 340-hour reading. The change in breakdown voltage shall not exceed the limits specified. The test temperature for breakdown voltage shall be the same as the specified ambient life-test temperature. 4.5.3 Reference voltage. The test current shalt be applied until thermal equilibrium 1s attained (15 s maximum) prior to reading the reference voltage. For this test, the diode shall be suspended by its' leads with mounting clips whose inside edge is Located at 0.375 inch (9.53 mm) from the body and the mounting clips shall be maintained at the specified temperature. This measurement may be performed after a shorter time following application of the test current than that which provides thermal equilibrium if correlation to stabilized readings can be established to the satisfaction of the Government.MIL SPECS UE D go00125 0033740 e MMNILS MIL-S-19500/452 TABLE I. Group A inspection. | | i | | | ] MIL-STD-750 | Symbol | Limits [Unit | | | | _| | | | | | | | | Inspection 1/ [Method | Conditions | | Min | Max | | | | | | | | | | | | | | | Subgroup 1 | { | | | | | | | | | | | Visual and mechanical { 2071 | | | | | | inspection | | | I i | | | | | | { | Subgroup 2 | | | | | | | | | | | | | Reference voltage | 4022 | (See 4.5.3) | vz | \ | | | | | | | i | 1N4565 through 1N4569 | | Iz = 0.5 +.01 mA de | | 6.08 | 6.72 | V de | 1N4570 through 1N4574 | | Iz = 1.0 #.01 mA de | |} 6.08 | 6.72 | V de | 1N4575 through 1N4579 | | Iz = 2.0 .01 mA de | { 6.08 | 6.72 | Vde | 1N4580 through 1N4584 | | Iz = 4.0 #.01 mA de | | 6.08 | 6.72 | V de | | | | | | | | Small-signal breakdown | 4051 | { | | | | impedance | | | | | [ | | | | | | | | 1N4565 through 1N4569 | | Iz = 0.5 .01 mA de | | --- | 200 | a | | | Isig = 0.05 mA rms | | - | | | 1N4570 through 1N4574 | | Iz = 1.0 +.01 ma de | | --- | 100 | @ | | { Istg = 0.1 mA rms | | | [ 1N4575 through 1N4579 | | Iz = 2.0 +.01 mA de [| --- | 50 | 2 i | | Isig = 0.2 mA rms | | | | 1N4580 through 1N4584 | | Iz = 4.0 .01 mA dc | } o--- | 2 Q | | | Isig = 0.4 mA rms | | | | | | | Reverse current Leakage | 4016 | DC method; Ir i -- | 2.0 pA i | | Ve= 3.0 V de | | | | | | | Subgroup 3 | | | { | | | | | | | Voltage-temperature stability | [Ta = -55C, 40C, +25C, | Avz | | (see 4.5.1 and 4.5.3) | |+75C, +100C, #2C | | | | 1N4565A, IN4565A-1, N4565AUR-1 | | | | --- | 100 { mV dco |1N4570A, 1N4570A-1, 1N4570AUR-1 | | | { { | J1N4575A, 1N4575A-1, IN4575AUR-1 | | | { " |1NGS8OA, 1NGSBOA-1, AN4SBOAUR-1 | | ; os [ | | | | ] 1N4566A, 1N4566A-1, INSS66AUR-1 | } |! | --- | 50 |! mV de |1N4571A, IN4SS71A-1, IN4S7TAUR-1 | | | | } oo" | |1N4S76A, INGS76A-1, INGS76AUR-1 | | | } * | J1N4581A, 1N4581A-1, INGSB1AUR-1 | | | | f " | | | | { | | ( | 1N45674, INSS67A-1, TN4567AUR-1 | | | | --- | 20 | mv de |1N4572A, 1N4572A-1, 1NGS72AUR-1 | | | | { " | J 1N4577A, IN4S77A-1, 1IN4S77AUR-1 | | | | { " | | 1N4S82A, IN4582A-1, IN4SSBZ2AUR-1 { | | | {| " | See footnote at end of table.MIL SPECS 4W4E D M@@ 0000125 0033741 4 MEMILS MIL-S-19500/452C TABLE I. Group A inspection - Continued. | | | r MIL-STO-750 | Symbol | Limits | Unit | | | | | | | | | Inspection 1/ {Method | Conditions | {| Min | Max l | | | | | | | | | Subgroup 3 - Continued | { | | | | | | | | | | | Voltage-temperature stability | iTa= -55C, +0C, #25C, | AVZ | | { | (see 4.5.1 and 4.5.3) | |+75c, +100C, *2C | | | { | | | | | 1NGS68A, INGS68A-1, IN4S68AUR-1 | | | | --- | 10 | mde 4NGS73A, INGS73A-1, INSS73AUR-1 | | | | {oo | 1N4578A, 1N4578A-1, IN4578AUR-1 | { | | jo" | 4N4583A, 1N4583A-1, IN4SB3AUR-1 | | | | ; "| | | | | | | ]1N4569A, 1N4569A-1, 1N4569AUR-1 | | | | --- | 5 | mV de JIN4574A, 1N4574A-1, 1N4S74AUR~1 | | | | | " INGST9A, IN4S7T9A-1, IN4S79AUR-1 | | | | | " 1N4584A, INGS84A-1, 1N4584AUR-1 | | | | | " | | | | | | | 4/ For sampling plan, see MIL-S-19500. TABLE Il. Groups A, 8, C, and E electrical measurements. | [| Step Inspection MIL-STD~750 Symbol Limits JUnit | Method Conditions 1/ | Min { Max | | | | | | 1. | Reference voltage 4022 (see 4.5.3) vz | | | | | 1N4565 through 1N4569 Iz = 0.5 .01 mA de 6.08 | 6.72 | V de 4N4570 through 1N4574 1z= 1.0 2.01 mA de 6.08 | 6.72 | V de 1N4575 through 1N4579 Iz= 2.0 t.01 mde | 6.08 {| 6.72 | Vde 1N4580 through 1N4584 Iz= 4.0 .01 mA de | 6.08 | 6.72 | Vide | | 2. | Small-signal breakdown 4051 | impedance | | | 1N4565 through 1N4569 Iz = 0.5 +.01 mA de | --- | 200 Q Istg = 0.05 mA rms { 1N4570 through 1N4574 Iz = 1.0 .01 mA de --- =| 100 Q Isig = 0.1 mA rms | 1N4575 through 1N4579 Iz = 2.0 +.01 mA de --- | 50 Q Is1g = 0.2 mA rms | | | 4N4580 through 1N4584 Iz = 4.0 +.01 mA de | --- |] 2 [a Isig = 0.4 mA rms | | | | 3. | Reverse current leakage 4016 DC method; IR J --- | 2.0 pA VR = 3.0 V de | | See footnotes at end of table.MIL SPECS 44E D MM 0000325 0033742 b MMMILS MIL-S-19500/452C TABLE II. Groups A, B, C, and E electrical measurements - Continued. Step Inspection MIL-STD-750 Symbol Limits Unit Method Conditions 1/ Min Max 4. | Voltage-temperature Ta = -55C, +0C, AVz i stability (see 4.5.1 +25C, +75C, ' and 4.5.3) +100C, 22C 1N4565, 1N4570, 1N4575, 1N4580 -~- 100 mV de 1N4566, 1N4571, 1N4576, 1N4581 --- | 50 mV dc 1N4567, 1N4572, 1N4577, 1N4582 --- 20 mV de 1N4568, 1N4573, 1N4578, 1N4583 --- | 10 mV de 1N4569, 1N4574, 1N4579, 1N4584 --- 5 mV de 5. Reference-vol tage Ta = +100C, +2C; AVz stability (0 to 340 hours); . (see 4.5.2 and 4.5.3) i 1N4565, 1N4570, 1N4575, 1N4580 --- | 10 mV de 1N4566, 1N4571, 1N4576, 1N4581 --- 8 mV dc 1N4567, 1N4572, 1N4577, 1N4582 --- 7 mV dc 1N4568, 1N4573, 1N4578, 1N4583 --- . 6 mV dc 1N4569, 1N4574, 1N4579, 1N4584 --- 6 5 mV dc 6. Reference-vol tage Ta = +100C, +2C, AVZ | stability (340 to 1,000 hours); | (see 4.5.2 and 4.5.3) 1N4565, 1N4570, 1N4575, 1N4580 | 5 mV dc 1N4566, 1N4571, 1N4576, 1N4581 --- 4 mV dc 1N4567, 1N4572, 1N4577, 1N4582 --- 1 4 mV dc 1N4568, 1N4573, 1N4578, 1N4583 --~ | 3 mV de 1N4569, 1N4574, 1N4579, 1N4584 --- | 3 mV de d/ Electrical characteristics and test conditions for "A, A-1, and AUR~1" devices are identical. 2/ The electrical measurements for table IVa (JANS) of MIL-S-19500 are as follows: a. Subgroup 3, see table Il herein, steps 1, 2, 3, and 4. b. Subgroup 4, see table II herein, steps 1, 2, 3, and 4. c. Subgroup 5, steps 1, 2, 3, and 4. 3/ The electrical measurements for table IVb (JANTX and JANTXV) of MIL-S-19500 are as follows: a. Subgroup 2, see table II herein, steps 1, 2, 3, and 4. b. Subgroup 3, see table II herein, steps 1, 2, 3, and 4. . Subgroup 6, see table II herein, steps 1, 2, 3, and 4. 4/ The electrical measurements for table V of MIL-S-19500 are as follows: a. Subgroup 2, see table II herein, steps 1, 2, 3, and 4. ae b. Subgroup 3, see table II herein, steps 1, 2, 3, and 4, c. Subgroup 6, (0 to 340 hours) see table II herein, step 5; (340 to 1,000 hours) steps 1, 2, 3, 4, and 6. 3/ The electrical measurements for table VII of MIL-S-19500 are as follows: a. Subgroup 1, see table II herein, steps 1, 2, 3, and 4, b. Subgroup 2, see table II herein, Steps 1, 2, 3, and 4.MIL SPECS YUE D MM 00001325 0033743 & MHNILS MIL-S-19500/452C L a G L +O le he | Dimensions | Ltr Inches Millimeters | Notes | L_ Min | Max Min Max | B .018 | .023 0.46 0.58 | | D .060 107 1.52 2.71 3 G -120 .300 | 3.05 7.62 3 | L 1.000 | 1.500 | 25.40 { 38.10 | Li 0.50 | | 1.27 4 | | | | | | NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. * 3. Package contour optional within gD and Length G. Heat slugs, if any, shall be included within this cylinder but shall not be subject to minimum Limit of 9D. 4. Within this zone, lead diameter may vary to allow for lead finishes and irregularities, other than heat slugs. FIGURE 1. Physical dimensions, 1N4565A through 1N4584A, N4565A-1 through 1N4584A-1 (DO-7 and DO-35). 10Po MIL SPECS W4E D MM 0000125 0033744 T MEMILS MIL-S-19500/452C 4 ae Fe G4 - aul G __ | | | Dimensions | | | | | Ltr | Inches Millimeters | | | | | | | |. Min Max | Min Max | | | | | jg | .063 .067 1.60 1.70 | | | | |_f | .016 | .022 | 0.41 | 0.55 | | | | | | |G | .130 | .146 | 3.30} 3.71 { | | | | |_G1 | .100 Ref {| 2.54 Ref _| | | | | [_s | 001 Min | 0.03 Min | NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 2. Physical dimensions, IN4S56SAUR-1 through IN4S84AUR-1 (DO-213AA). 11MIL SPECS a YUE D MM 00001325 0033745 1 M@EMILS MIL-~S-19500/452C | | | | | Dimensions | 8 c OPE FT | | | | T Va > 7 } Symbol | Inches [_Millimeters | | | | | | Ll Y Y WL) \ | Min | Max | Min _ | Max | J | | | | | | OL, Lv) Z [a | .028 | 032 | .71 | .81 | | | | | | | Y 4 VY V7 [ B | .008 | .o10 | .20 | .25 | W4 | | | | | M 2 Y 1 Z KOA c ! 0104 | 0106 1264 | 269 YW VY) Y { p | .0019 | .0021_ | .048 | .053 L, / oY) | r | | | A iY [ | .0054 | .0056 | .137_ | 142 | N 3 | | | | | ZL LF [..002 | .004 | .05 | .10 4 i | | | | | C/ f H | .003 | .005 | .08 | .13 | | | | | | [kK 0209 | .0211_ | .531 536 | | | L 008 | .070 .20 25 | BACKSIOE MUST BE ELECTRICALLY ISOLATED 4 010% | 0106 264 269 | r [ oN |. .0059 | .0061_ | .150 | .155 | DESIGN DATA Metal lization: Circuit Layout data: Top: 1 (Cathode) ~--- AL For zener operation, cathode must be 2 (Anode) - --- - Al operated positive with respect to anode. 3 (Test pad) - - - - Al Back -----+------ Au AL thickness - - -- - - - 12,000 A minimum Gold thickness - - - - - - 3,000 A minimum Chip thickness - - - - - - 10 mils t2 mils > NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 3. JANC (A-version) die dimensions. TeMIL SPECS a WUE D MM 0000125 0033746 3 MBNILS MIL~S-19500/452C F = | | Dimensions } a ee | Symbol Inches | _ Millimeters XQ SN WSN WY | | | Cc NX SX SY Cc [ Min | max | Min | Max N S t | | NAY YY A -0035 | .0065 | .088 | .165 | | | | NN 8 {..0050 | .0080 | .127 |{ .200 E | \ C 0050 | .0065 | .127 -165 | | D .0050 | .0065 | .127 -165 | D -0150 | .0165 { .381 -419 SX | i S F .0260 | .0290_ | .660 | .737 taaml- (> -tnm . 8B omt f\ BACKSIDE MUST BE ELECTRICALLY ISOLATED DESIGN DATA Metal lization: Circuit layout data: Top: 1 (Cathode) ---- Al For zener operation, cathode must be 2 (Anode) - - - - - Al operated positive with respect to anode. Back -------+--+-- Au Al thickness - - - - - - - 40,000 A minimum Gold thickness - - - - - - 5,000 A minimum Chip thickness - - - - - - 10 mils #2 mils NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 4. JANC (B-version) die dimensions. 13MIL SPECS G4E D M@m@ 0000125 003374? 5 MENILS MIL-S-19500/452C 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-S-19500. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.) 6.1 Notes. The notes specified 1n MIL-S-19500 are applicable to this specification. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. Issue of DODISS to be cited in the solicitation, and if required, the specific 1ssue of individual documents referenced (see 2.1). . Lead finish (see 3.2.1). d. Product assurance level and type designator. e. for die acquisition, the JANC letter version (see 6.3 and figures 3 and 4). 6.3 Voltage-temperature stability. This parameter will be within the Limits of the specification provided temperature extremes of -55C to +100C are not exceeded (see 4.5.2). 6.4 Suppliers of JANC die. The qualified JANC suppliers with the applicable letter version (example, JANCAGS6SA) Will be identified on the Qualified Products List. The Part or Identifying Number (PIN) is indicated below: | | | JANC ordering information | | | | PIN Manufacturer | | | | i i 55801 {12954 sd | | | | | 1N4565A | ASSOSA | B4565A | | through | through =| through | | N4584A | AG5B4A | B4584A | 6.5 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. CONCLUDING MATERIAL Custodians: Preparing activity: Army - ER NASA - NA Navy - EC Air Force - 17 Agent: . NASA ~ NA DLA - ES Review activities: (Project 5961-1431) Army - AR, MI Air Force - 85, 99 DLA - ES User activities: Army - SM Navy - AS, CG, MC, OS Air Force - 19 14