IDT74FCT166244ATPA8 - Integrated Device Technology, Inc.

IDT74FCT166244AT/CT

FAST CMOS 16-BIT BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE

JUNE 2002INDUSTRIAL TEMPERATURE RANGE

FEATURES:

• 0.5 MICRON CMOS Technology

• High-speed, low-power CMOS replacement for ABT functions

• Typical tSK(o) (Output Skew) < 250ps

• Low input and output leakage ≤≤

≤≤

≤1µA (max.)

• Light drive balanced output of ±8mA

• Minimal system switching noise

• Typical VOLP (Output Ground Bounce) < 0.25V at VCC = 5V,

TA = 25°C

• Power off disable outputs permit “live insertion”

• Available in SSOP and TSSOP packages

FUNCTIONAL BLOCK DIAGRAM

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

2002 Integrated Device Technology, Inc. DSC-5462/2

IDT74FCT166244AT/CT

FAST CMOS 16-BIT

BUFFER/LINE DRIVER

DESCRIPTION:

The FCT166244T 16-Bit Buffer/Line Driver is for bus interface or signal

buffering applications requiring high speed and low power dissipation. These

devices have a flow through pin organization, and shrink packaging to simplify

board layout. All inputs are designed with hysteresis for improved noise

margin. The three-state controls allow independent 4-bit, 8-bit or combined 16-

bit operation. These parts are plug in replacements for ABT16244 where

higher speed, lower noise or lower power dissipation levels are desired.

The FCT166244T is suited for very low noise, point-to-point driving

where there is a single receiver, or a very light lumped load (<100pF). The

buffers are designed to limit the output current to levels which will avoid noise

and ringing on the signal lines without using external series terminating

resistors.

3OE

3A1

3A2

3A3

3A4

3Y1

3Y2

3Y3

3Y4

1Y1

1Y2

1Y3

1Y4

1A1

1A2

1A3

1A4

1OE

4OE

4A1

4A2

4A3

4A4

4Y1

4Y2

4Y3

4Y4

2OE

2A1

2A2

2A3

2A4

2Y1

2Y2

2Y3

2Y4

INDUSTRIAL TEMPERATURE RANGE

IDT74FCT166244AT/CT

FAST CMOS 16-BIT BUFFER/LINE DRIVER

SSOP/ TSSOP

TOP VIEW

PIN CONFIGURATION Symbol Description Max Unit

VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 V

VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V

TSTG Storage Temperature –65 to +150 °C

IOUT DC Output Current –60 to +120 mA

ABSOLUTE MAXIMUM RATINGS(1)(1)

(1)(1)

(1)

NOTES:

1 . Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause

permanent damage to the device. This is a stress rating only and functional operation

of the device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect reliability.

2. All device terminals except FCT162XXX Output and I/O terminals.

3. Output and I/O terminals for FCT162XXX.

Symbol Parameter(1) Conditions Typ. Max. Unit

CIN Input Capacitance VIN = 0V 3.5 6 pF

COUT Output Capacitance VOUT = 0V 3.5 8 pF

CAPACITANCE (TA = +25°C, F = 1.0MHz)

NOTE:

1. This parameter is measured at characterization but not tested.

FUNCTION TABLE(1)

NOTE:

1 . H = HIGH Voltage Level

L = LOW Voltage Level

X = Don't Care

Z = High-Impedance

1Y1

GND

1Y3

VCC

GND

3Y2

GND

VCC

GND

1Y2

1Y4

2Y1

2Y2

2Y3

2Y4

3Y1

3Y3

3Y4

4Y1

4Y3

4Y4

4Y2

4OE

1A1

1A2

GND

1A3

1A4

VCC

2A1

2A2

2A3

2A4

3A1

3A2

3A3

3A4

VCC

4A1

4A3

4A4

4A2

GND

2OE

3OE

1OE

Inputs Outputs

xOE xAx xYx

LL L

LH H

HX Z

Pin Names Description

xOE 3-State Output Enable Inputs (Active LOW)

xAx Data Inputs

xYx 3-State Outputs

PIN DESCRIPTION

IDT74FCT166244AT/CT

FAST CMOS 16-BIT BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3) 16 48 96 mA

IODL Output HIGH Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3) –16 –48 –96 mA

VOH Output HIGH Voltage VCC = Min. IOH = –8mA 2 .4 3.3 — V

VIN = VIH or VIL

VOH Output LOW Voltage VCC = Min. IOL = 8 m A — 0.3 0.55 V

VIN = VIH or VIL

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V

VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V

IIH Input HIGH Current (Input pins)(5) VCC = Max. VI = VCC ——±1µA

Input HIGH Current (I/O pins)(5) ——±1

IIL Input LOW Current (Input pins)(5) VI = GND — — ±1

Input LOW Current (I/O pins)(5) ——±1

IOZH High Impedance Output Current VCC = Max. VO = 2.7V — — ±1 µA

IOZL (3-State Output pins)(5) VO = 0.5V — — ±1

VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V

IOS Short Circuit Current VCC = Max., VO = GND(3) –80 –140 –250 mA

VHInput Hysteresis — — 100 — m V

ICCL Quiescent Power Supply Current VCC = Max. — 5 500 µA

ICCH VIN = GND or VCC

ICCZ

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified:

Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.

4. Duration of the condition can not exceed one second.

5 . The test limit for this parameter is ±5µA at TA = -55°C.

OUTPUT DRIVE CHARACTERISTICS

INDUSTRIAL TEMPERATURE RANGE

IDT74FCT166244AT/CT

FAST CMOS 16-BIT BUFFER/LINE DRIVER

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

∆ICC Quiescent Power Supply VCC = Max. — 0.5 1.5 mA

Current TTL Inputs HIGH VIN = 3.4V(3)

ICCD Dynamic Power Supply Current(4) VCC = Max., VIN = VCC — 60 100 µA/

Outputs Open VIN = GND M H z

xOE = GND

One Input Toggling

50% Duty Cycle

ICTotal Power Supply Current(6) VCC = Max., VIN = VCC — 0.6 1.5 mA

Outputs Open VIN = GND

fCP = 10MHz (CLKBA)

50% Duty Cycle VIN = 3.4V — 0.9 2.3

xOE = GND VIN = GND

One Bit Toggling

VCC = Max., VIN = VCC — 2.4 4.5(5)

Outputs Open VIN = GND

fi = 2.5MHz

50% Duty Cycle VIN = 3.4V — 6.4 16.5(5)

xOE = GND VIN = GND

Sixteen Bits Toggling

POWER SUPPLY CHARACTERISTICS

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC

IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi)

ICC = Quiescent Current (ICCL, ICCH and ICCZ)

∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)

DH = Duty Cycle for TTL Inputs High

NT = Number of TTL Inputs at DH

ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)

fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)

NCP = Number of Clock Inputs at fCP

fi = Input Frequency

Ni = Number of Inputs at fi

74FCT166244AT 74FCT166422CT

Symbol Parameter Condition(1) Min.(2) Max. Min.(2) Max. Unit

tPLH Propagation Delay CL = 50pF 1.5 4.8 1.5 4.1 ns

tPHL xAx to xYx RL = 500Ω

tPZH Output Enable Time 1.5 6.2 1.5 5.8 ns

tPZL

tPHZ Output Disable Time 1.5 5.6 1.5 5.2 ns

tPLZ

tSK(o) Output Skew(3) — 0.5 — 0.5 ns

SWITCHING CHARACTERISTICS OVER OPERATING RANGE

NOTES:

1. See test circuits and waveforms.

2. Minimum limits are guaranteed but not tested on Propagation Delays.

3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.

IDT74FCT166244AT/CT

FAST CMOS 16-BIT BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE

Pulse

Generator

D.U.T.

VCC

VIN

VOUT

50pF 500Ω

500Ω

7.0V

1.5V

DATA

INPUT

TIMING

INPUT

ASYNCHRONO US CONTROL

PRESET

CLEAR

ETC.

SYNCHRONOUS CO NTROL

tSU tH

tREM

tSU tH

PRESET

CLEAR

CLO CK ENAB LE

ETC.

HIGH-LOW-HIGH

PULSE

LOW-HIGH-LOW

PULSE

1.5V

SAME PHASE

INPUT TRANSITION

1.5V

VOH

tPLH

OUTPUT

OPPOSITE PHASE

INPUT TRANSITION

1.5V

tPLH tPHL

tPHL

VOL

CONTROL

INPUT

1.5V

3.5V

OUTPUT

NORMALLY

LOW

OUTPUT

NORMALLY

HIGH

SWITCH

CLOSED

SWITCH

OPEN

VOL

0.3V

tPLZtPZL

tPZH tPHZ

3.5V

1.5V

ENABLE DISABLE

VOH

TEST CIRCUITS AND WAVEFORMS

Propagation Delay

Test Circuits for All Outputs

Enable and Disable Times

Set-up, Hold, and Release Times

Pulse Width

NOTES:

1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.

2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.

Test Switch

Open Drain

Disable Low Closed

Enable Low

All Other Tests Open

SWITCH POSITION

DEFINITIONS:

CL = Load capacitance: includes jig and probe capacitance.

RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.

INDUSTRIAL TEMPERATURE RANGE

IDT74FCT166244AT/CT

FAST CMOS 16-BIT BUFFER/LINE DRIVER

ORDERING INFORMATION

IDT XX

Temp. Range XXXX

Device Type XX

Package

244AT

244CT

Shrink Small Outl ine Package

Thin Shrink Small Outline Package

16-Bit Buffer/Line Driver

74 – 40°C to +85°C

166 16-Bit, 5 Volt, Light Drive

FCT XXX

Family

CORPORATE HEADQUARTERS for SALES: for Tech Support:

2975 Stender Way 800-345-7015 or 408-727-6116 logichelp@idt.com

Santa Clara, CA 95054 fax: 408-492-8674 (408) 654-6459

www.idt.com

6/21/2002 Updated according to PDNs Logic-00-07 and Logic-01-04

DATA SHEET DOCUMENT HISTORY