6367255 MOTOROLA SC (DIODES/OPTO) _ SEMICONDUCTOR & nna TECHNICAL DATA TEMPERATURE-COMPENSATED ZENER REFERENCE DIODES Temperature-compensated zener reference diodes utilizing an oxide-passivated junction for long-term voltage stability. A rugged, glass-enclosed, hermetically sealed structure. Designers Data for Worst Case Conditions The Designers Data Sheet permits the design of most circuits entirely from the information presented. Limit data representing device characteristic boundaries are given to facilitate worst case design. MAXIMUM RATINGS . Junction Temperature: -56 to +1 78C Storage Temperature. 65 to +175C DC Power Dissipation: 500 mW @ T, = 25C Fb DE @b3b?e5S5 GO77449? a off = t/-f) 1N935,A,B thru 1N939,A,B TEMPERATURE- COMPENSATED SILICON ZENER REFERENCE DIODES 9.0 V, 500 mW MECHANICAL CHARACTERISTICS CASE: Hermetically sealed, all-glass DIMENSIONS: See outline drawing. FINISH: All external surfaces are corrosion resistant and leads are readily solderable and weldable. POLARITY: Cathode indicated by polarity band. WEIGHT: 0,2 Gram (approx) MOUNTING POSITION: Any ELECTRICAL CHARACTERISTICS (T, = 25C unless otherwise noted Vz = 9.0 V 5.0%* @ I77 = 7.5 mA) Maximum Ambient Maximum Voltage Test Temperature Dynamic JEDEC Change Temperature Coefficient Impedance Type No. V2 (Volts) c %/C Zz7 (Ohms) {Note 1) (Note 2) +e {Note 2) (Note 3) 1N935 0.067 0.01 1N936 0.033 - 0.005 1N937 0.013 0, +25,4+75 0.002 20 1N938 0.006 . 0.001 1N939 0.003 0.0005 1N935A 0,139 _ 0.01 1NS36A 0.069 0.005 1N937A 0.027 Fe Oe. : 0.002 20 ANO938A 0.013 ' 0.001 INS39A 0.007 0.0005 1N935B 0.184 . 0.01 1N936B 0.092 0.005 IN937B 0.037 we ate Fieo 0.002 20 1N938B8 0.018 , 0.001 1N938B 0.009 0.0005 *Tighter-tolerance units available on special request. tL 4 ay Pak AILJEDEC dimensions and notes apply CASE 51-02 DO-204AA GLASS NOTES: 1, PACKAGE CONTOUR OPTIONAL WITHIN DIA B AND LENGTH A, HEAT SLUGS, IF ANY, SHALL 8E INCLUDED WITHIN THIS CYLINDER, BUT SHALL NOT BE SUBJECT TO THE MiN LIMIT OF THA B. 2. LEAD DIA NOT CONTROLLED IN ZONES F, TO ALLOW FOR FLASH, LEAD FINISH BUILDUP, AND MINOR IRREGULARITIES OTHER THAN HEAT SLUGS. 4-13 | 6367255 MOTOROLA SC (DIODES/OPTO) 46 dE @ese7255 oor7798 J Tt T-If-H 1N935, A, B thru 1N939, A, B MAXIMUM VOLTAGE CHANGE versus TEMPERATURE (with 177 = 7.5 mA 0.01 mA) (See Note 4) coe 1N935 thru 1NO39. . i FIGURE ta oy FIGURE 1b | % - ; 1N935 1NS36 Mz, MAXIMUM VOLTAGE CHANGE (mV) (Referenced to0C) mh A. 1N935 1NS36 < Qo 2 50 5 Ta, AMBIENT TEMPERATURE (C) MAXIMUM VOLTAGE CHANGE versus TEMPERATURE (with Izq7 = 7.5 MA 0.01 MA} (See Note 4} INQ935A thru 1N939A i FIGURE 2a FIGURE 2b E 180 ! (50 WNasea INGA 5 40 100 1NS37A s 1N936A, = 20 g se 1NQ37A 10 1N93BA etd 1N938A 1N939A 2 0 ae? < i 56 =s 53 0 TN93SA = 1N9IaA = -50 = -20 = 2 -20 40 ; | -150 \ 50 1ag35a_{\1Ng36A 55 G 50 100 180 55 Q 50 100 . Ta, AMBIENT TEMPERATURE (C) 1 Pepe = 6 1N935, A, B thru 1N939, A, B o. T-t{- MAXIMUM VOLTAGE CHANGE versus TEMPERATURE (with Iz7 = 7.5 mA 0.01 mA} (See Note 4} 1N935B thru 1N939B ; FIGURE 3a ~ FIGURE 3b 200 {60 (ZT =7.5 mA 40 160 30 = 100 1N936B = w 20 = 00 oS att} Zo Ee 3? 0 <0 == 59 -10 3 1N938B 3 -20 -100 -30 - 4N9378 -40 1N935B -200 \ #0 1N935B $5 -55 0 50 100 160 iz, ZENER CURRENT (mA) Ta, AMBIENT TEMPERATURE (C} FIGURE 4 ZENER CURRENT versus MAXIMUM FIGURE 5 MAXIMUM ZENER IMPEDANCE VOLTAGE CHANGE (at specified temperatures) versus ZENER CURRENT (See Note 5) {See Note 3) MORE THAN THE ARE IN THE RANGES INDICATED BY THE THE 10 55C +190C 9.0 F759C Zz, MAXIMUM ZENER IMPEDANCE (OHMS) 160 ~100 50 0 50 100 ot 10 10 100 AV2, MAXIMUM VOLTAGE CHANGE (mV) 17, ZENER CURRENT (mA) (Referenced ta 127 = 7.5 mA) 4-15 387255 MOTOROLA sc cpropes/opTo) 7h DEgb3b7255 0077999 3 I 1N935, A, B thru 1N939, A, B NOTE 1: Types 1N935B, 1N937B, and 1N939B are available to MIL-S-19500/ 156 and MEG-A-LIFE II, Levels 1, 2, & 3, specifications. NOTE 2: . Voltage Variation (aVz) and Temperature Coefficient. All reference diodes are characterized by the box method. This guarantees a maximum voltage variation (aVz] over the specified tamperature range, at the specified tast current {Iz7), verified by tests at indicated temperature points within the ranges. This method of indicating voltage stability is now used for JEDEC registration as well as for mititary qualification. The former method of indicating voltage stability by means of temperature coeffictent accurately teflects the voltage deviation at the temperature extremes, but is not necessarily accurate within the temperature range because reference diodes have a nonlinear temperature relationship. The temperature coefficient, therefore, is given only as-a reference. NOTE 3: wo Zener Impedance Derivation cot The dynamic zener impedance, 2727. is derived from the 60-Hz ac voltage drop which results when an ac current with an cms value equal to 10% of the de zener currant, Iz, is superimposed an \27- 6367255 MOTOROLA SC (DIODES/OPTO) 4b ve uanzess oo7e8000 4 i Tlf Curves showing the variation of zener impedance with zener current for each series are given in Figure 5. A cathode-ray tube curve-trace test on a sample basis is used to ensure that each zener characteristic has a sharp and stable knee region. NOTE 4: These graphs can be used to determine the maximum voltage change of any device in the series over any specific temperature range. For example, a temperature change from +25 to +50C wili cause a volt- age change no greater than +22 mV or -22 mV for 1N935, as illus- trated by tha dashed lines in Figure 1. The boundaries given are maximum values. For greater resolution, expanded views of the shaded areas in Figures 1a, 2a, and 3a are shown in Figures tb, 2b, and 3b respectively. NOTE 5: The maximum voltage change, 4V7z. in Figure 4 is due entirely to the impedance of the device. if both temperature and IZT are varied, then the total voltage change may be obtained by adding 4VZ in Fig ure 4 to the aVz in Figure 1, 2, or 3 for the device under considera tion. |f the device is to be operated at some stable currant other than the specified test Current, a new set of characteristics may be plotted by superimposing the data in Figure 4 on Figure 1, 2, or 3.