
Si3443DV
2www.irf.com
Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage ––– ––– -1.2 V TJ = 25°C, IS = -1.7A, VGS = 0V
trr Reverse Recovery Time ––– 51 77 ns TJ = 25°C, IF = -1.7A
Qrr Reverse Recovery Charge ––– 30 44 nC di/dt = -100A/µs
Source-Drain Ratings and Characteristics
A
-20
-2.0
S
D
G
Repetitive rating; pulse width limited by
max. junction temperature.
Notes:
Pulse width ≤ 300µs; duty cycle ≤ 2%.
Surface mounted on FR-4 board, t ≤ 5sec.
Starting TJ = 25°C, L = 6.8mH
RG = 25Ω, IAS = -3.0A.
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -20 – –– ––– V VGS = 0V, ID = -250µA
∆V(BR)DSS/∆TJBreakdown Voltage Temp. Coefficient ––– -0.005 ––– V/°C Reference to 25°C, ID = -1mA
––– 0.034 0.065 VGS = -4.5V, ID = -4.4A
––– 0.053 0.090 ΩVGS = -2.7V, ID = -3.7A
––– 0.060 0.100 VGS = -2.5V, ID = -3.5A
VGS(th) Gate Threshold Voltage -0.60 ––– -1.2 V VDS = VGS, I D = -250µA
gfs Forward Transconductance ––– 12 ––– S VDS = -10V, ID = -4.4 A
––– ––– -1.0 µA VDS = -20V, VGS = 0V
––– ––– -5.0 VDS = -20V, VGS = 0V, TJ = 70°C
Gate-to-Source Forward Leakage ––– ––– -100 nA VGS = -12V
Gate-to-Source Reverse Leakage ––– ––– 100 VGS = 12V
QgTotal Gate Charge –– – 11 15 ID = -4.4A
Qgs Gate-to-Source Charge ––– 2.2 – –– nC VDS = -10V
Qgd Gate-to-Drain ("Miller") Charge ––– 2.9 – –– VGS = -4.5V
td(on) Turn-On Delay Time ––– 12 50 VDD = -10V, VGS = -4.5V
trRise Time ––– 33 60 ns ID = -1.0A
td(off) Turn-Off Delay Time ––– 70 1 00 RG = 6.0 Ω
tfFall Time ––– 72 100 RD = 10 Ω,
Ciss Input Capacitance ––– 1079 ––– VGS = 0V
Coss Output Capacitance ––– 220 ––– pF VDS = -10V
Crss Reverse Transfer Capacitance ––– 152 ––– ƒ = 1.0MHz
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
IGSS
RDS(on) Static Drain-to-Source On-Resistance
IDSS Drain-to-Source Leakage Current