CY74FCT16841T
CY74FCT162841T
2
Maximum Ratings[3, 4]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperat ure......................................−55°C to +125°C
Ambient Temper ature with
Power Applied ..................................................−55°C to +125°C
DC Input Voltage.................................................−0.5V to +7.0V
DC Output Voltage..............................................−0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin)...........................−60 to +120 mA
Power Dissipation. ...................... ............ .......... ............. 1.0W
Static Discharge Voltage...........................................>2001V
(per MIL-STD-883, Method 3015)
Pin Description
Name Description
DData Inputs
LE Latch Enable Input (Active HIGH)
OE O utput Enable Input (Active LOW)
OThree-State O utputs
Function Table[1]
Inputs Outputs
DLE OE Q
H H L H
L H L L
X L L Q[2]
X X H Z
Operating Range
Range Ambient
Temperature VCC
Commercial −40°C to +85°C 5V ± 10%
Electrical Characteristics Over the Operating Range
Parame-
ter Description Test Conditions Min. Typ.[5] Max. Unit
VIH Input HIGH Voltag e Guaranteed Logic HIGH Level 2.0 V
VIL Input LOW Voltage Guaranteed Logic LOW Level 0.8 V
VHInput Hysteresis[6] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
IIH Input HIGH Current VCC=Max., VI=VCC ±1µA
IIL Input LOW Current VCC=Max., VI=GND ±1µA
IOZH High Impedance Output
Current (Three-State Output pins) VCC=Max., V OUT=2.7V ±1µA
IOZL High Impedance Output
Current (Three-State Output pins) VCC=Max., V OUT=0.5V ±1µA
IOS Sh ort Circuit Current[7] VCC=Max., VOUT=GND −80 −140 −200 mA
IOOutput Drive Current[7] VCC=Max., VOUT=2.5V −50 −180 mA
IOFF Power-Off Disable VCC=0V, VOUT≤4.5V[8] ±1µA
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance.
2. Output level before LE HIGH-to-LOW Transition.
3. Operation beyond the limits set for th may impair the useful l ife of the device. Unles s otherwise noted, these limits are over the operating free-air temperature
range.
4. Unus ed inputs must always be connected to an appropriate logic voltage lev e l, preferably either VCC or g ro und.
5. Typical values are at VCC= 5.0V, TA= +25°C ambient.
6. This parameter is guaranteed but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one sec ond. The use of high-s peed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational val ues. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other par ametric tests. In any sequence of para meter
tests, IOS tests should be performed last.
8. Tested at +25°C.