REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Changes to paragraphs 3.1 and 3.5. 1 to add “QD” requirements. Updat e
boilerplate to reflect current requirements. -rrp
02-05-29
R. MONNIN
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS REV A A A A A A A A A
OF SHEETS SHEET 1 2 3 4 5 6 7 8 9
PMIC N/A PREPARED BY
Charles E. Besore
DEFENSE SUPPLY CENTER COLUMBUS
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
Ray Monnin
COLUMBUS, OHIO 43216
http://www.dscc.dla.mil
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
APPROVED BY
Michael A. Frye
MICROCI RCUIT, LINEAR, HIGH SPEED
DIFFERENTIAL VOLTAGE COMPARATOR,
MONOLITHIC SILICON
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
88-06-03
AMSC N/A
REVISION LEVEL
A SIZE
A CAGE CO DE
67268
5962-87674
SHEET
1 OF
9
DSCC FORM 2233
APR 97 5962-E421-02
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-87674 01 C X
Drawing number
Device type
(see 1.2.1) Case outline
(see 1.2.2) Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function
01 LM160 High-speed differential comparator
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
C GDIP1-T14 or CDIP2-T14 14 Dual-in-line
G MACY1-X8 8 Can
P GDIP1-T8 or CDIP2-T8 8 Dual-in-line
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absolute maximum ratings.
Supply voltage (VCC) ........................................................... ±8.0 V dc
Peak output current (IOP) ..................................................... 20 mA
Differential input voltage (VID) ............................................ ±5.0 V dc
Input voltage (VIN) ............................................................... VCC+ ≥ VIN ≥ VCC-
Storage temperature range ................................................. -65°C to +150°C
Lead temperature (soldering, 10 seconds) ......................... +260°C
Junction temperature (TJ) ................................................... +175°C
Power dissipation (PD) ........................................................ 550 mW 1/
Thermal resistance, junction-to-case (θJC) .......................... See MIL-STD-1835
Thermal resistance, junction-to-ambient (θJA):
Case C ............................................................................ 76°C/W
Case G ............................................................................ 166°C/W
Case P ............................................................................ 125°C/W
1.4 Recommended operating conditions.
Supply voltage:
V
CC+ ................................................................................ +4.5 V to +6.5 V
V
CC- ................................................................................. -4.5 V to –6.5 V
Ambient operating temperature range (TA) ......................... -55°C to +125°C
1/ Must withstand the added PD due to short circuit test; e.g., IOS.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed
in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in
the solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38535 -- Integrated Circuits, Manufacturing, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 -- List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance wi th MIL-PRF-38535, appendix A for non-
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance wi th MIL-
PRF-38535 is required to identify when the QML flow option is used. This drawing has been modified to allow the
manufacturer to use the alternate die/fabrication requirements of paragraph A.3.2.2 of MIL-PRF-38535 or other alternative
approved by the qualifying activity.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535, appendix A and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections and logic diagram. The terminal connections and logic diagram shall be as specified on
figure 1.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in table I.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits Unit
Min Max
Logical “1” output voltage
VOH VCC = ±4.5 V,
IOUT = -320 µA 1,2,3 01 2.4 V
Logical “0” output voltage
VOL VCC = ±4.5 V,
IOUT = 6.4 mA 1,2,3 01 0.4 V
Input bias current
IIB VCC = ±5 V,
VIN = 5 V 1,2,3 01 20
µA
Positive supply current
ICC+ VCC = ±6.5 V 1,2,3 01 32 mA
Negative supply current
ICC- VCC = ±6.5 V 1,2,3 01 -16 mA
Short circuit current
IOS VCC = ±4.5 V 1,2,3 01 -15 -52 mA
Input offset voltage
VIO VCC = ±5.0 V 1,2,3 01 -5 5 mV
Input offset current
IIO VCC = ±5.0 V 1,2,3 01 -3 3 µA
IIN1 VCC = ±5 V,
VIN1 = 0 V, VIN2 = 5 V -1
Unbalanced input current 1/
IIN2 VCC = ±5 V,
VIN1 = 5 V, VIN2 = 0 V
1,2,3 01
-1
mA
Supply voltage 1/
VCC 1,2,3 01
±4.5 ±6.5 V
Supply breakdown voltage
1/
BVCC 1,2,3 01
±8.0 V
Common mode input
voltage range 1/
VCM VCC = ±6.5 V 1,2,3 01
±4.0 V
Differential input voltage
range 1/
VDIFF 1,2,3 01
±5.0 V
3/ 25 Response time
tresp VCC = +5.0 V, 2/
TA = +25°C 4/
9 01
20
ns
1/ Parameter tested go-no-go only.
2/ Guaranteed parameter if not tested.
3/ Measured from the 50 percent point of a 30 mVP-P, 10 MHz sinusoidal input to the 50 percent point of the output.
4/ Measured from the 50 percent point of a 2 VP-P, 10 MHz sinusoidal input to the 50 percent point of the output.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 5
DSCC FORM 2234
APR 97
Case C
FIGURE 1. Terminal connections and logic diagram.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 6
DSCC FORM 2234
APR 97
Case G
FIGURE 1. Terminal connections and logic diagram – Continued.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 7
DSCC FORM 2234
APR 97
Case P
FIGURE 1. Terminal connections and logic diagram – Continued.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 8
DSCC FORM 2234
APR 97
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For
packages where marking of the entire SMD PIN number is not feasible due to space limitati ons, the manufacturer has the
option of not marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used. For product built in accordance with A.3.2.2 of
MIL-PRF-38535, or as modified in the manufacturer’s QM plan, the “QD” certification mark shall be used in place of the "Q" or
"QML" certification mark.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-
38535, appendix A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
with each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,
appendix A.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, 7, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCI RCUIT DRAWING
SIZE
A
5962-87674
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000 REVISION LEVEL
A SHEET 9
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004) 1
Final electrical test parameters
(method 5004) 1*, 2, 3, 9
Group A test requirements
(method 5005) 1, 2, 3, 9
Groups C and D end-point
electrical parameters
(method 5005)
1, 2, 3
* PDA applies to subgroup 1.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Mi crocircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone
(614) 692-0547.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted
by DSCC-VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 02-05-29
Approved sources of supply for SMD 5962-87674 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revision of MIL-HDBK-103 and QML-38535.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8767401CA OC7V7
3/ LM160
LM160J-14/883
5962-8767401GA 27014 LM160H/883
5962-8767401PA OC7V7
3/ LM160
LM160J/883
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE Vendor name
number and address
27014 National Semiconductor
2900 Semiconductor Dr
PO BOX 58090
Santa Clara, CA 95052-8090
OC7V7 Qualified Parts Laboratory, Inc.
3605 Kifer Road
Santa Clara, CA 95051
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
