TD62C851,852PG
2006-06-14
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TOSHIBA Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC
TD62C851PG,TD62C852PG
8BIT SERIAL−IN PARALLEL−OUT SHIFT REGISTER / LATCH DRIVERS
The TD62C851PG and TD62C852PG are monolithic circuits
designed to be used together with Bi−CMOS integrated circuits.
The devices consist of a 8bit shift register, 8bit latches, and 8
output circuits (integral clamp diodes for switching inductive
loads).
The suffix (G) appended to the part number represents a Lead
(Pb)-Free product.
FEATURES
z 8bit serial−in parallel−out shift register / latch driver
(Bi−CMOS process)
z Output sustaining voltage ; 50 V
z Output current ;
TD62C851PG 200 mA / ch (Low saturation type)
TD62C852PG 500 mA / ch (darlington type)
z Built−in output clamp diodes
z CMOS compatible inputs
z Package ; DIP20−P−300A
PIN CONNECTION (TOP VIEW)
Weight: 2.25 g (typ.)
TD62C851,852PG
2006-06-14
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BLOCK DIAGRAM
TIMING DIAGRAM
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EQUIVALENT OF INPUTS AND OUTPUTS
S−IN, clock terminal equivalent circuits LATCH ,RESET terminal equivalent circuits
ENABLE terminal equivalent circuits S−OUT terminal equivalent circuits
Output terminal equivalent circuits
(TD62C851PG)
Note: The output parasitic diode cannot be used as clamp diode.
Output terminal equivalent circuits
(TD62C852PG)
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TRUTH TABLE
OUT
CK E R LATCH S−IN O1 On S−OUT
L H H L OFF 1- On Q7
L H H H ON 1- On Q7
L H L (*) NC NC Q7
H H (*) (*) OFF NC Q7
(*) (*) (*) (*) NC NC Q7
(*) (*) L H (*) OFF OFF L
(*) H L (*) NC NC L
CK = CLOCK (*) = DON’T CARE
E= ENABLE NC = NO CHANGE
R= RESET L = LOW LEVEL
LATCH = LATCH H = HIGH LEVEL
S−IN = SERIAL IN
OUT = PARALLEL OUT
S−OUT = SERIAL OUT
ABSOLUTE MAXIMUM RATINGS (Ta = 25°C)
CHARACTERISTIC SYMBOL RATING UNIT
Supply Voltage VDD −0.3~7.0 V
Output Sustaining Voltage VCE (SUS) −0.5~50 V
TD62C851PG 200
Output Current
TD62C852PG
IOUT 500
mA / ch
Input Voltage VIN ~0.4~VDD + 0.3 V
Power Dissipation PD 1.47 W
Operating Temperature Topr −40~85 °C
Storage Temperature Tstg −55~150 °C
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RECOMMENDED OPERATING CONDITIONS (Ta = −40~85°C)
CHARACTERISTIC SYMBOL CONDITION MIN TYP. MAX UNIT
Supply Voltage VDD ― 4.5 5.0 5.5 V
Input Voltage VIN ― 0 ― V
DD V
Output Current (“H” Level) S−OUT IOH Ta = 25°C ― ― −0.4 mA
Output Voltage (“L” Level) On V
OH ― 0 ― 50 V
S−OUT ― ― ― 0.4
DC 1 circuit, Ta = 25°C 0 ― 160
Duty = 10% 0 ― 160
TD62C
851PG
8 circuit on
Tpw = 25 ms
Ta = 85°C
VDD = 5.5 V Duty = 40% 0 ― 95
D C 1 circuit, Ta = 25°C 0 ― 400
Duty = 10% 0 ― 400
Output
Current
(“L” Level)
TD62C
852PG
On
IOL
8 circuit on
Tpw = 25 ms
Ta = 85°C
VDD = 5.5 V Duty = 50% 0 ― 170
mA /
ch
Clock Frequency fCLOCK ― 1.5 ― ― MHz
Clock Pulse Width fw CLOCK ― 0.33 ― ― µs
Data Set Up Time tsetup ― 100 ― ― ns
Data Hold Time thold ― 100 ― ― ns
Clamp Diode Reverse Voltage VR ― 0 ― 50 V
TD62C851PG ― 0 ― 160
Clamp Diode Forward
Current TD62C852PG
IF ― 0 ― 400
mA
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ELECTRICAL CHARACTERISTICS (Ta = −40~85°C)
CHARACTERISTIC SYMBOL
TEST
CIR−
CUIT
TEST CONDITION MIN TYP. MAX UNIT
“H” Level VIH ― ― 0.7
VDD
― ―
Input Voltage
“L” Level VIL ― ― ― ― 0.3
VDD
V
“H” Level IIH ― ENABLE, VDD = 5.5 V
VIH = VDD 28 55 110
“L” Level IIL ― LATCH, RESET
VDD = 5.5 V, VIL = GND −55 −110 −275
Input Current
I
IN ― CLOCK, S−IN
VIN = VCC or GND ― ― ±1.0
µA
“H” Level S−OUT VOH ― VDD = 4.5 V
IOH = −10 µA 3.9 4.1 ― V
S−OUT IOL = 0.8 mA ― 0.2 0.4
IOL = 100 mA ― 0.29 0.50
TD62C
851P IOL = 160 mA ― 0.39 0.65
IOL = 250 mA ― 1.24 1.90
Output
Voltage
“L” Level
On
TD62C
852P
VOL ― V
DD = 4.5 V
IOL = 400 mA ― 1.54 2.30
V
Output
Current “H” Level On IOH ― V
DD = 5.5 V, VOH = 50.0 V ― ― 100 µA
IDD1 ENABLE = “H” ― 130 200
Operating Supply Current
IDD2
fCLK = 1 MHz
Output open
DATA = 1 / 2
ENABLE = “H”
― 2.0 5.0
TD62C851PG ― 35 40
TD62C852PG
IDD3
― VDD = 5.5 V
Ta = 25°C
1 circuit on
fCLK = 1 MHz
ENABLE = “L” ― 1.0 1.5
mA
Clamp Diode Reverse Current IR ― V
R = 50 V ― ― 50 µA
TD62C851PG IF = 160 mA ― 1.0 2.0
Clamp Diode
Froward Voltage TD62C852PG
VF ―
IF = 400 mA ― 1.5 2.0
V
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SWITCHING CHARACTERISTICS (Ta = 25°C)
CHARACTERISTIC SYMBOL
TEST
CIR−
CUIT
TEST CONDITION MIN TYP. MAX UNIT
CK−S−OUT ― 0.40 0.65
CK−On ― 1.80 3.00
L−On ― 2.10 3.50
R−On ― 1.50 2.50
Low−to
−High
E−On
tpLH ―
― 1.50 2.50
CK−S−OUT ― 0.33 0.55
CK−On ― 0.41 0.70
L−On ― 0.30 0.50
R−S−OUT ― 0.25 0.42
Propagation
Delay Time
High−to
−Low
E−On
tpHL
―
― 0.21 0.35
µs
Maximum Clock Frequency fMAX ― 1.5 2.0 ― MHz
CLOCK twCK ― 250 330
LATCH twL ― 116 160
Minimum Pulse Width
RESET twR
―
― 107 140
ns
Data Set Up Time tsetup ― 30 60
Data Hold Time thold
―
― 14 40
ns
Maximum Clock Rise Time tr ― 70 ―
Maximum Clock Fall Time tf
―
VDD = 5.0 V, VIH = 5.0 V
VIL = 0 V, Duty = 50%
300 Ω (TD62C851)
120 Ω (TD62C852)
― 70 ―
ns
RL =
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TD62C851PG TD62C851PG
TD62C852PG TD62C852PG
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PRECAUTIONS FOR USING
This IC does not integrate protection circuits such as overcurrent and overvoltage protectors.
Thus, if excess current or voltage is applied to the IC, the IC may be damaged. Please design the IC so that
excess current or voltage will not be applied to the IC.
Utmost care is necessary in the design of the output line, VCC and GND line since IC may be destroyed due to
short−circuit between outputs, air contamination fault, or fault by improper grounding.
TD62C851PG TD62C852PG
TD62C851PG TD62C852PG
TD62C851,852PG
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PACKAGE DIMENSIONS
DIP20−P−300−2.54A Unit: mm
Weight: 2.25 g (Typ.)
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Notes on Contents
1. Block Diagrams
Some of the functional blocks, circuits, or constants in the block diagram may be omitted or simplified for
explanatory purposes.
2. Equivalent Circuits
The equivalent circuit diagrams may be simplified or some parts of them may be omitted for explanatory
purposes.
3. Timing Charts
Timing charts may be simplified for explanatory purposes.
IC Usage Considerations
Notes on Handling of ICs
(1) The absolute maximum ratings of a semiconductor device are a set of ratings that must not be
exceeded, even for a moment. Do not exceed any of these ratings.
Exceeding the rating(s) may cause the device breakdown, damage or deterioration, and may result
injury by explosion or combustion.
(2) Use an appropriate power supply fuse to ensure that a large current does not continuously flow in
case of over current and/or IC failure. The IC will fully break down when used under conditions that
exceed its absolute maximum ratings, when the wiring is routed improperly or when an abnormal
pulse noise occurs from the wiring or load, causing a large current to continuously flow and the
breakdown can lead smoke or ignition. To minimize the effects of the flow of a large current in case of
breakdown, appropriate settings, such as fuse capacity, fusing time and insertion circuit location, are
required.
(3) If your design includes an inductive load such as a motor coil, incorporate a protection circuit into the
design to prevent device malfunction or breakdown caused by the current resulting from the inrush
current at power ON or the negative current resulting from the back electromotive force at power OFF.
IC breakdown may cause injury, smoke or ignition.
Use a stable power supply with ICs with built-in protection functions. If the power supply is unstable,
the protection function may not operate, causing IC breakdown. IC breakdown may cause injury,
smoke or ignition.
(4) Do not insert devices in the wrong orientation or incorrectly.
Make sure that the positive and negative terminals of power supplies are connected properly.
Otherwise, the current or power consumption may exceed the absolute maximum rating, and
exceeding the rating(s) may cause the device breakdown, damage or deterioration, and may result
injury by explosion or combustion.
In addition, do not use any device that is applied the current with inserting in the wrong orientation
or incorrectly even just one time.
(5) Carefully select external components (such as inputs and negative feedback capacitors) and load
components (such as speakers), for example, power amp and regulator.
If there is a large amount of leakage current such as input or negative feedback condenser, the IC
output DC voltage will increase. If this output voltage is connected to a speaker with low input
withstand voltage, overcurrent or IC failure can cause smoke or ignition. (The over current can cause
smoke or ignition from the IC itself.) In particular, please pay attention when using a Bridge Tied
Load (BTL) connection type IC that inputs output DC voltage to a speaker directly.
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Points to Remember on Handling of ICs
(1) Heat Radiation Design
In using an IC with large current flow such as power amp, regulator or driver, please design the
device so that heat is appropriately radiated, not to exceed the specified junction temperature (Tj) at
any time and condition. These ICs generate heat even during normal use. An inadequate IC heat
radiation design can lead to decrease in IC life, deterioration of IC characteristics or IC breakdown. In
addition, please design the device taking into considerate the effect of IC heat radiation with
peripheral components.
(2) Back-EMF
When a motor rotates in the reverse direction, stops or slows down abruptly, a current flow back to
the motor’s power supply due to the effect of back-EMF. If the current sink capability of the power
supply is small, the device’s motor power supply and output pins might be exposed to conditions
beyond absolute maximum ratings. To avoid this problem, take the effect of back-EMF into
consideration in system design.
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About solderability, following conditions were confirmed
• Solderability
(1) Use of Sn-37Pb solder Bath
· solder bath temperature = 230°C
· dipping time = 5 seconds
· the number of times = once
· use of R-type flux
(2) Use of Sn-3.0Ag-0.5Cu solder Bath
· solder bath temperature = 245°C
· dipping time = 5 seconds
· the number of times = once
· use of R-type flux
RESTRICTIONS ON PRODUCT USE 060116EB
A
• The information contained herein is subject to change without notice. 021023_D
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc. 021023_A
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk. 021023_B
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations. 060106_Q
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others. 021023_C
• The products described in this document are subject to the foreign exchange and foreign trade laws. 021023_E
