FAIRCHILD LINEAR INTEGRATED CIRCUITS A720 FUNDAMENTAL COMPONENT OF CURRENT TYPICAL PERFORMANCE CURVES FOR A720C TEST CIRCUIT 1, unless otherwise specified. CURRENTS AS A FUNCTION OF VOLTAGE (V3) RF TRANSCONDUCTANCE AS A FUNCTION OF FREQUENCY e927 / 8 tg + 1g tng + lhe CURRENT INTO PIN 3 ~ mA gmap RELATIVE RF TRANSCONDUCTAACE 4B 4 86 8 0 12 4 16 VOLTAGE ON PIN 3 - VOLTS f FREQUENCY MHz RF AND IF TRANSCONDUCTANCE AS A REF AGC CHARACTERISTIC FUNCTION OF TEMPERATURE 700 m2" fyg = MH = 260 kHz eel ) 5 260kHe RF GAIN REDUCTION dB gm RF AND IF TRANSCONDUCTANCE - mmhos -20 Oo 2 640 ao 80 Ta AMBIENT TEMPERATURE C 100 120 100 1500-2000 8G 300 380 DETECTOR INPUT VOLTAGE mVans OSCILLATOR TERMINAL (PIN 2) V/l CHARACTERISTIC RELATIVE GAIN AS A FUNCTION OF SUPPLY TERMINAL VOLTAGE hr Ta = 25C - ty = 1 Miz -180 fy = 260 kHz fyg= MHz z 3 i < -120 z 1 < nn o : e = 20 z $ : z z 10 120 14 16 1 4 SINEWAVE VOLTAGE AT PIN 2 Vays, SUPPLY VOLTAGE {Vy} Vv IF TRANSCONDUCTANCE AS A FUNCTION OF FREQUENCY he 4 -. 2 4 gmp RELATIVE IF TRANSCONDUCTANCE - dB 1 f FREQUENCY MHz CONVERTER TRANSCONDUCTANCE AS A FUNCTION OF TEMPERATURE 30 fy) 8 TMH2, Fig = Oe 25 @#M ogy CONVERTER TRANSCONDUCTANCE mmhos 2 40 BO Ta AMBIENT TEMPERATURE C 100 TOTAL HARMONIC DISTORTION OF THE MODULATING SIGNAL AS A FUNCTION OF CARRIER INPUT LEVEL he too * 40H: DISTORTION OF MODULATING SIGNAL % 1 2 345 10 304080 = 100 CARAIER INPUT LEVEL Vans. TEST CIRCUIT 1 100 uF =e + O4taE te Ria 1 Uconv. AF conv 4 S208 Ww oo OSCILLATOR _ ON IN out \ AI3 mel 43 1 - SVT. 20 24 ose, as [3 aa 0.47 uF out rm ee ato $2 1 Ve . C= 200pF 34 suppuy ml 2 1 wN {t 4 Lt Oe 4 RF CHOKE 0 game _ O.1uF narz0 SS tela % x | 2 ly cole CONV. re 7 DEC. EC. i 3908 FS) gate > EF LT 1OnF 4} 5] oer. AGE mune = IN FILT. RG ls = Tank Circuit Parameters: fg = 1.26MHz, 1008 Shir cn [2 Q=30 + 10%, Rp = 10k + 5%. The para- our ' meters of the tank are measured at pins 2 onnae ar cna Le and 3 of the test jig without a device in- 1 IN 2 L serted, R,, Is the effective paraliel resis- tance at resonance. 10-12