
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585
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Symbol Test Conditions Characteristic Values
(TJ = 25°C unless otherwise specified)
min. typ. max.
gfs IC= IC25; VCE = 10 V 25 33 S
Note 2
Cies 3700 pF
Coes VCE = 25 V, VGE = 0 V, f = 1 MHz 180 pF
Cres 44 pF
Qg155 nC
Qge IC = IC90, VGE = 15 V, VCE = 0.5 VCES 30 nC
Qgc 51 nC
td(on) 46 ns
tri 57 ns
td(off) 270 500 ns
tfi 50 100 ns
Eoff 1.5 3.0 mJ
td(on) 48 ns
tri 42 ns
Eon 2.5 mJ
td(off) 300 ns
tfi 70 ns
Eoff 2.4 mJ
RthJC 0.65 K/W
RthCK 0.15 K/W
Inductive load, TJ = 125°°
°°
°C
IC = IC90, VGE = 15 V
RG = 2.7 Ω, VCE = 0.8 VCES
Note 3
Inductive load, TJ = 25°°
°°
°C
IC = IC90, VGE = 15 V
RG = 2.7 Ω, VCE = 0.8 VCES
Note 3
IXGR 32N170AH1
Notes: 1. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.
2. Pulse test, t ≤ 300 µs, duty cycle ≤ 2 %
3. Switching times may increase for VCE (Clamp) > 0.8 • VCES, higher TJ or
increased RG.
4. See DH60-18A and IXGH32N170A datasheets for additional
characteristics
ISOPLUS247 Outline
Reverse Diode (FRED) Characteristic Values
(TJ = 25°C, unless otherwise specified)
Symbol Test Conditions min. typ. max.
VFIF = 20A, VGE = 0 V, Note 2 2.7 V
IRM IF = 50A, VGE = 0 V, -diF/dt = 800 A/µs50A
trr VR = 600 V 150 ns
RthJC 1.5 K/W
See IXGX32N170AH1 for
charcteristic curves