Am27S191/S191A/S191SA/PS191/PS191A Am27S291/S291A/S291SA/PS291/PS291A 16,384-Bit (2048x8) Bipolar PROM cl Advanced Micro Devices DISTINCTIVE CHARACTERISTICS Fast access time allows high system speed 50% power savings on deselected parts enhances reliability through total system heat reduction (27PS devices) Plug in replacement for industry standard product no board changes required @ Platinum-Silicide fuses guarantee high reliability, fast programming and exceptionally high programming yields (typ > 98%) @ Voltage and temperature compensated providing ex- tremely flat AC performance over military range @ Rapid recovery from power-down state provides mini- mum delay (27PS devices) GENERAL DESCRIPTION The Am27S191 (2048 words by 8 bits) is a Schottky TTL Programmable Read-Only Memory (PROM). This device has three-state outputs which are compatible with low-power Schottky bus standards capable of satisfy- ing the requirements of a variety of microprogrammable controls, mapping functions, code conversion, or logic replacement. Easy word-depth expansion is facilitated by both active LOW (G1) and active HIGH (G2 and G3) output enables. This device is also available in 300-mil, lateral center DIP (Am27S291). Additionally, this device is offered in a power- switched, three-state version (Am27PS191/Am27PS291). BLOCK DIAGRAM 128 X 128 PROGRAMMABLE ARRAY Youu sy ET Ey Aiea 4 's DO A 8 OO "1 @& 1268 97 Dm) RW A6 C>] DECODER As = 94 OH '3 4 ee 3 ou DY a i [> peconer fe OOH 8 - 1 of 16 MULTIPLEXERS aay SavEp a> G3/E3 ea | 57 1 | W S293 G4 Gg O56 O7 BD006340 E nomenclature applies to the power-switched versions only (Am27PSXXx). PRODUCT SELECTOR GUIDE Three-State Am27S191SA, Am27S191A, Am27S191, Am27PS191A, Am27PS191, Part Number Am278291SA Am275291A Am2758291 Am27PS291A Am27PS291 Address Access Time (ns) 25 30 35 50 50 65 50 65 65 75 Operating Range Cc M Cc M Cc M Cc Mw c M icant Bay. Amendment 5-186 02121 D 10 (issue Date: January 1989CONNECTION DIAGRAMS Top View DIPs* icc** Loc PR pp pe orheorerevee? ppave rape Also available in a 24-pin Fiatpack. **,lso available in a 28-pin Square PLCC. Pinout identical to LCC. Pinout identical to DiIPs. Note: Pin 1 is marked for orientation. LOGIC SYMBOL Ls000033 *E nomenciature applies to the power-switched versions only (Am27PSXXX). Am27S191/SI91A/SI9ISAPSI91/PSI91A Am27S291/S291 A/S291SA/PS291/PS291A 5-187ORDERING INFORMATION (Am27$8191/27PS191) Standard Products AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of: a. Device Number b. Speed Option (if applicable) c. Package Type d. Temperature Range e. Optional Processing f. Alternate Packaging Option AM27S191_ A Cc B f a. DEVICE NUMBER/DESCRIPTION Am27S191/S191A/S191SA/PS191/PS191A 2048 x8 Bipolar PROMS Am27S191 = Three-State PROM Am27PS191 = Power-Switched, Three-State PROM Valid Combinations AM27S191 AM27S191A AM27S191SA LC, LCB, LC-S, LCB-S, AM27PS191 JC, JCB AM27PS191A ALTERNATE PACKAGING OPTION -S =28-Pin Square Ceramic Leadiess Chip Carrier with Thinner Ceramic Thickness (CLT028) OPTIONAL PROCESSING Blank = Standard processing B = Burn-in . TEMPERATURE RANGE C= Commercial (0 to + 75C) . PACKAGE TYPE P = 24-Pin (600-Mil) Plastic DIP (PD 024) D = 24-Pin (600-Mil) Geramic DIP (CD 024) L = 32-Pin Rectangular Ceramic Leadiess Chip Carrier (CLA032) J = 28-Pin Plastic Leaded Chip Carrier (PL 028) . SPEED OPTION See Product Selector Guide Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD PC, PCB, DC, DCB sales office to confirm availability of specific valid combinations, to check on newly released combinations, and to obtain additional data on AMD's standard military grade products. 5-188 Am27S191/S191A/S191SA/PS191/PS191A Am27S291/S291A/S291 SA/PS291/PS291AMILITARY ORDERING INFORMATION (Am27S191/27PS191) APL Products AMD products for Aerospace and Defense applications are available in several packages and operating ranges. APL (Approved Products List) products are fully compliant with MIL-STD-883C requirements. The order number (Valid Combination) for APL products is formed by a combination of: a. Device Number b. Speed Option (if applicable) c. Device Class d. Package Type e. Lead Finish A L_, LEAD FINISH A= Hot Solder Dip AM27S191 s | |. d. PACKAGE TYPE J = 24-Pin (600-Mil) Ceramic DIP (CD 024) K = 24-Pin Ceramic Flatpack (CFM024) U = 32-Pin Rectangular Ceramic Leadiess Chip Carrier (CLRO32) 3 = 28-Pin Square Ceramic Leadless Chip Carrier with Thinner Ceramic Thickness (CLT028) . DEVICE CLASS /B = Class B b. SPEED OPTION See Product Selector Guide a. DEVICE NUMBER/DESCRIPTION Am278191/S191A/S191SA/PS191/PS191A 2048 x 8 Bipolar PROMs Am27S191 = Three-State PROM Am27PS191=Power-Switched, Three-State PROM Valid Combinations . Valid Combinations AM27S191 Valid Combinations list configurations planned to be AM27S191A supported in volume for this device. Consult the local AMD AM27S191SA ie. /BKA, /BUA, sales office to confirm availability of specific valid AM27PS191 combinations or to check for newly reteased valid AM27PS191A combinations. Group A Tests Group A tests consist of Subgroups 1, 2, 3, 7, 8 9, 10, 11. MILITARY BURN-IN Military burn-in is in accordance with the current revision of MIL-STD-883, Test Method 1015, Conditions A through E. Test conditions are selected at AMD's option. Am27S191/S191A/S191SA/PS191/PSI91A Am27S291/S291A/S291SA/PS291/PS291A 5-189ORDERING INFORMATION (Am27S291/27PS291) Standard Products AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of: a. Device Number b. Speed Option (if applicable) c. Package Type d. Temperature Range @. Optional Processing Lo . OPTIONAL PROCESSING TEMPERATURE RANGE C =Commercial (0 to + 75C) tc. PACKAGE TYPE P = 24-Pin (300-M) Plastic DIP (PD9024) D = 24-Pin (300-Mil) Ceramic DIP (CD3024) b. SPEED OPTION See Product Selector Guide @. DEVICE NUMBER/OESCRIPTION Am27S291/S291A/S201SA/PS291 /PS201A PROM Am27PS291 = Power-Switched, Three-State PROM Valid Combinations Valid Combinations AM278201 Valid Combinations list configurations planned to be AM27S291A supported in volume for this device. Consult the local AMD AM27S291SA PC, PCB, DC, DCB sales office to confirm availability of specific valid AM27PS291 combinations, to check on newly released combinations, and 'AM27P5291A to obtain additional data on AMD's standard military grade products. 5-190 Am27S191/S191A/S191SA/PS191/PS191A Am27S291/S291A/S291SA/PS291/PS291AMILITARY ORDERING INFORMATION (Am27S291/27PS291) APL. Products AMD products for Aerospace and Detense applications are available in several packages and operating ranges. APL (Approved Products List) products are fully compliant with MIL-STD-883C requirements. The order number (Valid Combination) for APL products is formed by a combination of: a. Device Number . Speed Option (if applicable) . Device Class . Package Type . Lead Finish AM27S291 A t L A L. LEAD FINISH A=Hot Solder Dip ean d. PACKAGE TYPE : L = 24-Pin (300-Mil) Ceramic DIP (CD3024) c. DEVICE CLASS /B = Class B b. SPEED OPTION See Product Selector Guide a. DEVICE NUMBER/DESCRIPTION Am27$291/S291A/S291SA/PS291/PS291A 2048 x 8 Bipolar PROMs Am27S291 = Three-State PROM Am27PS291 =Power-Switched, Three-State PROM Valid Combinations Valid Combinations AM27S291 Valid Combinations list configurations planned to be AM27S291A supported in volume for this device. Consult the local AMD AM27S291SA /BLA sales office to confirm availability of specific valid AM27PS291 combinations or to check for newly released valid AM27PS291A combinations. Group A Tests Group A tests consist of Subgroups 1, 2, 3, 7, 8, 9, 10, 11. MILITARY BURN-IN Military burn-in is in accordance with the current revision of MIL-STD-883, Test Method 1015, Conditions A through E. Test conditions are selected at AMD's option. Am27S191/S191A/S191SA/PS191/PS191A Am27S291/S291A/S291SA/PS291/PS291A 5-191PIN DESCRIPTION Ag-Aig Address Inputs (input) The 11-bit field presented at the address inputs selects one of 2048 memory locations to be read from. Qo-Q;7 Data Output Port (Output) The outputs whose state represents the data read from the selected memory locations. Gj, Go, Gy Output Enable (input) Provides direct control of the Q-output buffers. Outputs disabled forces all open-collector outputs to an ''OFF" state and all three-state outputs to a floating or high-impedance state. Enable = G eGo Gg Disable = Gy . Go e Gg =G1+G2+Gy3 Voc Device Power Supply Pin The most positive of the logic power supply pins. GND Device Power Supply Pin The most negative of the logic power supply pins. FUNCTIONAL DESCRIPTION Notes on Power Switching The Am27PS191 and Am27PS291 are power-switched de- vices. When the chip is setected, important internal currents increase from small idling or standby values to their larger selected values. This transition occurs very rapidly, meaning that access times from the powered-down state are only slightly slower than from the powered-up state. Deselected, icc is reduced to less than half its full operating amount. Due to this unique feature, there are special considerations which should be followed in order to optimize performance: . When the Am27PS191 and Am27PS291 are selected, a current surge is placed on the Vcc supply due to the power- up feature. in order to minimize the effects of this current transient, it is recommended that a 0.1uf ceramic capacitor be connected from pin 24 to pin 12 at each device. (See Figure 1.) ~ 2. Address access time (TAVQV) can be optimized if a chip enable set-up time (TEVAV) of greater than 25ns is ob- served. Negative set-up times on chip enable (TEVAV < 0) shouid be avoided. (For typical and worse case characteris- tics, see Figures 2A and 2B.) 5-192 Am278191/S191A/S191SA/PS191/PS191A Am27S291/S291 A/S291SA/PS291/PS291AABSOLUTE MAXIMUM RATINGS OPERATING RANGES Storage Temperature .............-::seseeereeeee -65 to + 150C Commercial (C) Devices Ambient Temperature with Ambient Temperature (Ta) ......--..:eeesereres 0 to +75C Power Applied -55 to + 125C Supply Voltage (VCC) ...-....:e eee +475 V to +5.25 V Supply Voltage Military (M) Devices* DC Voitage Applied to Outputs Case Temperature (TC).....--.:.secieeee eee -55 to + 125C (Except During Programming)......- -0.5 V to +Vcc Max. Supply Voltage (Vcc) +45 V to +55 V DC Voltage Applied to Outputs ES . , output O rreet into Cutputs During serteeee sees av Operating ranges define those limits between which the Programming (Max. Duration of 1 sec) ..........-. 250 mA functionality of the device is guaranteed. DC input Voltage ........--... ecereeeereeee -0.5 V to +5.5 V DC Input Current -30 mA to +5 mA *Military product 100% tested at Tc = +25C, + 125C, and -55C. Stresses above those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability. DC CHARACTERISTICS over operating ranges unless otherwise specified (for APL Products, Group A, Subgroups 1, 2, 3 ara tested unless otherwise noted) Parameter Parameter Symbol Description Test Conditions Min. Typ. Max. Unit Voc = Min., lon =-2.0 mA Vou (Note 1} Output HIGH Voltage Vin = Vid oF VIL 24 v Voc = Min., lo. = 16 mA VoL Output LOW Voltage Vin = Vie or VIL 0.50 v Guaranteed input logical HiGH Vin Input HIGH Level voltage for all inputs (Note 3) 2.0 v Guaranteed input logical LOW Vit Input LOW Level voltage for all inputs (Note 3) 0.8 Vv he input LOW Current Voc = Max., Vin = 0.45 V ~0.250 mA lin Input HIGH Current Voc = Max., Vin = Voc 40 pA 1 Output Short-Circuit Vcc = Max. Vout = 0.0 V COM'L -20 -30 mA Sc Current (Note 1) MIL -15 -90 lec Power Supply Current All inputs = GND, Voc = Max. 185 mA vi Input Clamp Voltage Voc = Min., lin =-18 mA -1.2 v Voc = Max. Vo = Voc 40 { Output Leakage Current CEX Pl 9 Vay = 2.4 Vo =0.4 V -40 uA . Vin =2.0 V @ f=1 MHz (Note 2) CIN Input Capacitance Voc = 5 V. Ta= 25C 4.0 - . Vout = 2.0 V @ f=1 MHz (Note 2) Cout Output Capacitance Voc =5 , Ta = 25C 8.0 Notes: 1. Not more than one output should be shorted at a time. Duration of the short-circuit test should not be more than one second. 2. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected. 3. Vi_ and Vj} are input conditions of output tests and are not themselves diractly tasted. Vi_ and Vjq are absolute voltages with respect to device ground and include all overshoots due to system and/or tester noise. Do not attempt to test these values without suitable equipment. Am27S191/S191A/S191SA/PS191/PS191A Am275291/S291A/S291SA/PS291/PS291A 5-193SWITCHING CHARACTERISTICS over operating ranges unless otherwise specified (for APL Products, Group A, Subgroups 9, 10, 11 are tested unless otherwise noted*) Am27S Version | Am27PS Version CcOM'L MIL COM'L MIL Parameter Parameter No. Symbol! Description Version Max. Max. Max. Max. Unit , SA 25 30 1 TAVOV sadress Valid to Output Valid Access A 35 50 50 65 ns STD 50 65 65 75 SA 18 20 TGVQZ Delay from Output Enable Valid to 2 TEVOZ Output Hi-Z A 25 30 25 30 ns STD 25 30 35 45 SA 18 20 TGVQV Delay from Output Enable Valid to 3 TEVQV Output Valid A 25 30 85 7s ns STD 25 30 80 90 Power-Switched Address Valid to Output A 65 75 4 TAVQV1 Valid Access Time (Am27PS Versions ns only) STD 80 90 See also Switching Test Circuits. Notes: 1. Tests are performed with input transition time of 5 ns or less, timing reference levels of 1.5 V, and input pulse levels of 0 to 3.0 V. 2. TGVQZ is measured at steady state HIGH output voltage -0.5 V and steady state LOW output voltage +0.5 V output levels. 3. TAVQV is tested with switch S; closed and C, = 50 pF. 4, TGVQV is tested with C, = 50 pF to the 1.5 V level; S; is open for high impedance to HIGH tests and closed for high impedance to LOW tests. TGVQZ is tested with C_ = 5 pF. HIGH to high impedance tests are made with S} open to an output voltage of steady stata HIGH -0.5 V with S; open; LOW-to-HIGH impedance tests are made to the Steady state LOW +0.5 V level with S; closed. Subgroups 7 and 8 apply to functional tests. SWITCHING TEST CIRCUIT Voc oo7o Ry 300 1) 5-194 Am27S191/S191A/S191SA/PS191/PS191A Am27S291/S291A/S291SA/PS291/PS291ASWITCHING WAVEFORMS KEY TO SWITCHING WAVEFORMS WAVEFORM INPUTS ouTruTs MUST BE WILL BE STEADY STEADY WILL BE MAY CHANGE CHANGING WW FROMHTOL FROM H TOL marcHance WILLE FROML TOW crow. TOH DONT CARE: CHANGING: ANY CHANGE STATE PERMITTED UNKNOWN CENTER DOES NOT LINE IS HIGH APPLY IMPEOANCE OFF STATE KS000010 TAVEYV | TEVAY Boao Xx VALID ADDRESS oe OUTPUTS Hi-Z Og - G7 VALID OUTPUT me VALID OUTPUT G2/E2, Ga/Eg Va K Gye; WF021572 Am27S191/S1S1A/SI9SISA/PSI9T/PS191A Am27S291/S291A/S291SA/PS291/PS2S1A 5-195