DRAM MODULE M364C040(8)4BT0-C
CAPACITANCE (TA = 25°C, f = 1MHz)
Item Symbol Min Max Unit
Input capacitance[A0, B0, A1 - A12]
Input capacitance[W0, W2, OE0, OE2]
Input capacitance[RAS0, RAS2]
Input capacitance[CAS0 - CAS7]
Input/Output capacitance[DQ0 - 71]
CIN1
CIN2
CIN3
CIN4
CDQ
-
-
-
-
-
20
20
24
20
17
pF
pF
pF
pF
pF
Test condition : Vih/Vil=2.6/0.8V, Voh/Vol=2.4/0.4V, output loading CL=100pF
Parameter Symbol -50 -60 Unit Note
Min Max Min Max
Random read or write cycle time tRC 90 110 ns
Read-modify-write cycle time tRWC 133 155 ns
Access time from RAS tRAC 50 60 ns 3,4
Access time from CAS tCAC 18 20 ns 3,4,5,11
Access time from column address tAA 30 35 ns 3,10,11
CAS to output in Low-Z tCLZ 5 5 ns 3,11
Output buffer turn-off delay tOFF 518 520 ns 6,11
Transition time(rise and fall) tT150 150 ns 2
RAS precharge time tRP 30 40 ns
RAS pulse width tRAS 50 10K 60 10K ns
RAS hold time tRSH 18 20 ns 11
CAS hold time tCSH 45 55 ns 11
CAS pulse width tCAS 13 10K 15 10K ns
RAS to CAS delay time tRCD 18 32 18 40 ns 4,11
RAS to column address delay time tRAD 13 20 13 25 ns 10,11
CAS to RAS precharge time tCRP 10 10 ns 11
Row address set-up time tASR 5 5 ns 11
Row address hold time tRAH 8 8 ns 11
Column address set-up time tASC 0 0 ns 12
Column address hold time tCAH 10 10 ns 12
Column address to RAS lead time tRAL 30 35 ns 11
Read command set-up time tRCS 0 0 ns
Read command hold referencde to CAS tRCH 0 0 ns 8
Read command hold referenced to RAS tRRH -2 -2 ns 8,11
Write command hold time tWCH 10 10 ns
Write command pulse width tWP 10 10 ns
Write command to RAS lead time tRWL 20 20 ns 11
Write command to CAS lead time tCWL 13 15 ns 15
Data in set-up time tDS -2 -2 ns 9,11
Data in hold time tDH 15 15 ns 9,11
Refresh period tREF 64 64 ms
Write command set-up time tWCS 0 0 ns 7
CAS to W delay time tCWD 36 40 ns 7,15
Column address to W delay time tAWD 48 55 ns 7
CAS prechange to W delay time tCPWD 53 60 ns 7
AC CHARACTERISTICS (0°C≤TA≤70°C, VCC=5.0V±10%. See notes 1,2.)