ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 1/12
Revision History :
Revision 1.0 (Jul. 6, 2007)
- Original
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 2/12
PSRAM 16-Mbit (1M x 16)
Pseudo Static RAM
Features
• Wide voltage range: 1.7V–1.95V
• Access Time: 70 ns
• Ultra-low active power
— Typical active current: 3 mA @ f = 1 MHz
— Typical active current: 18 mA @ f = fmax
• Ultra low standby power
• Automatic power-down when deselected
• CMOS for optimum speed/power
‧Available in 48-ball BGA package
• Operating Temperature: –40°C to +85°C
Functional Description[1]
The M24D16161DA is a high-performance CMOS Pseudo
Static RAM organized as 1M words by 16 bits that supports
an asynchronous memory interface. This device features
advanced circuit design to provide ultra-low active current.
This is ideal portable applications such as cellular telephones.
The device can be put into standby mode when deselected
( 1CE HIGH or CE2 LOW or both BHE and BLE are
HIGH). The input/output pins (I/O0 through I/O15) are placed in
a high-impedance state when : deselected ( 1CE HIGH or
CE2 LOW), outputs are disabled ( OE HIGH), both Byte High
Enable and Byte Low Enable are disabled ( BHE ,BLE
HIGH), or during a write operation ( 1OE LOW and CE2
HIGH and WE LOW).
To write to the device, take Chip Enable ( 1CE LOW and
CE2HIGH) and Write Enable ( WE ) input LOW. If Byte Low
Enable( BLE ) is LOW, then data from I/O pins (I/O0 through
I/O7), is written into the location specified on the address pins
(A0through A19). If Byte High Enable ( BHE ) is LOW, then
data from I/O pins (I/O8 through I/O15) is written into the
location specified on the address pins (A0 through A19).
To read from the device, take Chip Enables ( 1CE LOW and
CE2 HIGH) and Output Enable ( OE ) LOW while forcing the
Write Enable ( WE ) HIGH. If Byte Low Enable ( BLE ) is LOW,
then data from the memory location specified by the address
pins will appear on I/O0 to I/O7. If Byte High Enable ( BHE ) is
LOW, then data from memory will appear on I/O8 to
I/O15.Refer to the truth table for a complete description of read
and write modes.
Logic Block Diagram
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 3/12
Pin Configuration[2, 3]
48-ball VFBGA
Top View
Product Portfolio[4]
Power Dissipation
Operating ICC(mA)
VCC Range (V) Speed(ns)
f = 1MHz f = fmax Standby ISB2(µA)
Product
Min. Typ.[4] Max .Typ.[4] Max. .Typ.[4] Max .Typ. [4] Max
M24D16161DA 1.7 1.8 1.95 70 3 5 18 20 55 70
Power-up Characteristics
The initialization sequence is shown in the figure below. Chip
Select should be 1OE HIGH or CE2 LOW for at least 200 µs
after VCC has reached a stable value. No access must be
attempted during this period of 200 µs.
Parameter Description Min. Max. Unit
TPU Chip Enable Low After Stable VCC 200 µs
Notes:
2.Ball H6 and E3 can be used to upgrade to a 32-Mbit and a 64-Mbit density, respectively.
3.NC “no connect”-not connected internally to the die.
4.Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC (typ)
and TA = 25°C. Tested initially and after design changes that may affect the parameters.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 4/12
Maximum Ratings
(Above which the useful life may be impaired. For user
guide-lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage to Ground Potential.–0.2V to VCCMAX + 0.3V
DC Voltage Applied to Outputs
in High Z State[5, 6, 7]........................–0.2V to VCCMAX + 0.3V
DC Input Voltage[5, 6, 7]....................–0.2V to VCCMAX + 0.3V
Output Current into Outputs (LOW).............................20 mA
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current....................................................> 200 mA
Operating Range
Range Ambient
Temperature (TA) VCC
Industrial −40°C to +85°C 1.7V to 1.95V
DC Electrical Characteristics (Over the Operating Range) [5, 6, 7]
-70
Parameter Description Test Conditions Min. Typ.[4] Max. Unit
VCC Supply Voltage 1.7 1.8 1.95 V
VOH Output HIGH
Voltage
IOH = −0.1 mA
VCC = 1.7V to 1.95V VCC-0.2 V
VOL Output LOW
Voltage
IOL = 0.1 mA,
VCC = 1.7V to 1.95V 0.2 V
VIH Input HIGH
Voltage VCC = 1.7V to 1.95V 0.8* VCC V
CC+0.3V V
VIL Input LOW Voltage VCC = 1.7V to 1.95V -0.2 0.2* VCC V
IIX Input Leakage
Current GND ≤VIN ≤ V
CC -1 +1
µA
IOZ Output Leakage
Current GND ≤ V
OUT ≤ V
CC -1 +1
µA
f = fMAX = 1/tRC
VCC= VCCmax
IOUT = 0mA
CMOS levels
18 25 mA
ICC VCC Operating
Supply Current
f = 1 MHz 3 5 mA
ISB1
Automatic CE
Power-Down
Current
—CMOS Inputs
CE ≥ V
CC − 0.2V, CE2 ≤0.2V, VIN > VCC
− 0.2V, VIN < 0.2V, f = fMAX (Address and
Data Only), f = 0 ( OE , WE ,
BHE and BLE ), VCC=3.60V
55 70 µA
ISB2
Automatic CE
Power-Down
Current
—CMOS Inputs
1CE ≥VCC−0.2V, CE2 ≤0.2V, VIN ≥
VCC − 0.2V or VIN ≤ 0.2V, f = 0, VCC =
VCCMAX,
55 70 µA
Capacitance[8]
Parameter Description Test Conditions Max. Unit
CIN Input Capacitance 8 pF
COUT Output Capacitance
TA = 25°C, f = 1 MHz,
VCC = VCC(typ) 8 pF
Thermal Resistance[8]
Parameter Description Test Conditions VFBGA Unit
ΘJA Thermal Resistance
(Junction to Ambient) 56 °C/W
ΘJC Thermal Resistance
(Junction to Case)
Test conditions follow standard test methods
and procedures for measuring thermal
impedence, per EIA/JESD51. 11 °C/W
Notes:
5. VIL(MIN) = –0.5V for pulse durations less than 20 ns.
6.VIH(Max) = VCC + 0.5V for pulse durations less than 20 ns.
7.Overshoot and undershoot specifications are characterized and are not 100% tested.
8.Tested initially and after any design or process changes that may affect these parameters.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 5/12
AC Test Loads and Waveforms
Parameters 1.8V VCC Unit
R1 14000 Ω
R2 14000 Ω
RTH 7000 Ω
VTH 1.90 V
Switching Characteristics Over the Operating Range[9, 10, 11, 15, 14] -70
Parameter Description Min. Max.
Unit
Read Cycle
tRC[13] Read Cycle Time 70 40000 ns
tCD Chip Deselect Time 1CE =HIGH or CE2=LOW,
BLE /BHE High Pulse Time
15
ns
tAA Address to Data Valid 70 ns
tOHA Data Hold from Address Change 5 ns
tACE 1CE LOW to Data Valid 70
ns
tDOE OE LOW to Data Valid 35
ns
tLZOE OE LOW to Low Z[10, 11, 12] 5
ns
tHZOE OE HIGH to High Z[10, 11, 12] 25
ns
tLZCE 1CE LOW and CE2 HIGH to Low Z[10, 11, 12] 10
ns
tHZCE 1CE HIGH and CE2 LOW to High Z[10, 11, 12] 25
ns
tDBE BLE /BHE LOW to Data Valid 70
ns
tLZBE BLE /BHE LOW to Low Z[10, 11, 12] 5
ns
tHZBE BLE /BHE HIGH to High Z[10, 11, 12] 25
ns
Notes:
9. Test conditions for all parameters other than tri-state parameters assume signal transition time of 1 ns/V, timing reference
levels of VCC(typ.)/2, input pulse levels of 0V to VCC, and output loading of the specified IOL/IOH as shown in the “AC Test Loads
and Waveforms” section.
10. At any given temperature and voltage conditions tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and
tHZWE is less than tLZWE for any given device. All low-Z parameters will be measured with a load capacitance of 30 pF (3V).
11. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high-impedance state.
12. High-Z and Low-Z parameters are characterized and are not 100% tested.
13 .If invalid address signals shorter than min. tRC are continuously repeated for 40 µs, the device needs a normal read timing
(tRC) or needs to enter standby state at least once in every 40 µs.
14. In order to achieve 70-ns performance, the read access must be Chip Enable ( 1CE or CE2) controlled. That is, the
addresses must be stable prior to Chip Enable going active.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 6/12
Switching Characteristics Over the Operating Range[9, 10, 11, 15, 14] (continued)
-70
Parameter Description Min. Max.
Unit
Write Cycle[15]
tWC Write Cycle Time 70 40000 ns
tSCE 1CE LOW and CE2 HIGH to Write End 60 ns
tAW Address Set-Up to Write End 60 ns
tCD Chip Deselect Time 1CE = HIGH or CE2 = LOW,
BLE /BHE High Pulse Time
15
ns
tHA Address Hold from Write End 0 ns
tSA Address Set-Up to Write Start 0 ns
tPWE WE Pulse Width 50 ns
tBW BLE /BHE LOW to Write End 60 ns
tSD Data Set-Up to Write End 25 ns
tHD Data Hold from Write End 0 ns
tHZWE WE LOW to High-Z[10, 11, 12] 25 ns
tLZWE WE HIGH to Low-Z[10, 11, 12] 10 ns
Note:
15. The internal Write time of the memory is defined by the overlap of WE , 1CE = VIL or CE2 = VIH, BHE and/or BLE = VIL.
All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data
input set-up and hold timing should be referenced to the edge of the signal that terminates the write.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 7/12
Switching Wave forms
Read Cycle 1 (Address Transition Controlled)[17, 18]
Read Cycle 2 ( OE Controlled)[16, 18,19]
Notes:
16.Whenever 1CE = HIGH or CE2 = LOW, BHE /BLE are taken inactive, they must remain inactive for a minimum of 5 ns.
17.Device is continuously selected. OE = 1CE = VIL and CE2 = VIH.
18. WE is HIGH for Read Cycle.
19. CE is the Logical AND of 1CE and CE2.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 8/12
Switching Waveforms (continued)
Notes:
20.Data I/O is high-impedance if OE ≥ V
IH.
21.During the DON’T CARE period in the DATA I/O waveform, the I/Os are in output state and input signals should not be applied.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 9/12
Switching Waveforms (continued)
Write Cycle 2 ( 1CE or CE2 Controlled)[15, 12, 16, 20, 21]
Write Cycle 3 (WE Controlled, O
E
LOW)[16, 21]
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 10/12
Switching Waveforms (continued)
Write Cycle 4 (BHE/BLE Controlled, OE LOW)[15, 16, 20, 21]
Truth Table[22]
1CE CE2 WE OE BHE BLE Inputs/Outputs Mode Power
H X X X X X High Z Deselect/Power-Down Standby (ISB)
X L X X X X High Z Deselect/Power-Down Standby (ISB)
X X X X H H High Z Deselect/Power-Down Standby (ISB)
L H H L L L Data Out (I/O0–I/O15) Read Active (ICC)
L H H L H L Data Out (I/O0–I/O7);
(I/O8–I/O15) in High Z Read Active (ICC)
L H H L L H
Data Out (I/O8–I/O15);
(I/O0–I/O7) in High Z Read Active (ICC)
L H H H L L High Z Output Disabled Active (ICC)
L H H H H L High Z Output Disabled Active (ICC)
L H H H L H High Z Output Disabled Active (ICC)
L H L X L L Data In (I/O0–I/O15) Write (Upper Byte and Lower
Byte) Active (ICC)
L H L X H L
Data In (I/O0–I/O7);
(I/O8–I/O15) in High Z Write (Lower Byte Only) Active (ICC)
L H L X L H
Data Out (I/O8–I/O15);
(I/O0–I/O7) in High Z Write (Upper Byte Only) Active (ICC)
Notes:
22.H = Logic HIGH, L = Logic LOW, X = Don’t Care.
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 11/12
Ordering Information
Speed (ns) Ordering Code Package Type Operating Range
70 M24D16161DA -70BIG 48-ball Very Fine Pitch BGA (6 x 8 x 1 mm) (Pb-Free) Industrial
Package Diagrams
48-ball VFBGA (6 x 8 x 1 mm)
ESMT M24D16161DA
Elite Semiconductor Memory Technology Inc. Publication Date : Jul. 2007
Revision : 1.0 12/12
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