ee FAIRCHILD ee SEMICONDUCTOR m FDV302P Digital FET, P-Channel General Description This P-Channel logic level enhancement mode field effect transistor is produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. This device has been designed especially for low voltage applications as a replacement for digital transistors. Since bias resistors are not required, this one P-channel FET can replace several digital transistors with different bias resistors such as the DTCx and DCDx series. a] A SOT-23 October 1997 Features m -25V, -0.12 A continuous, -0.5 A Peak. Rosiany = 13 QO @ Vag= -2.7 V R =1092 @V,,=-4.5 V. DS(ON} = Very low level gate drive requirements allowing direct operation in 3V circuits. Vise. < 1-5V. = Gate-Source Zener for ESD ruggedness. >6kKV Human Body Madel = Compact industry standard SOT-23 surface mount package. = Replace many PNP digital transistors (DTCx and DCDx) with one DMOS FET. Mark:302 G $ SOT-23 Absolute Maximum Ratings T, = 25C unless otherwise noted Symbol | Parameter FDV302P Units Voss Drain-Source Voltage -25 Vv Vase Gate-Source Voliage 8 ly Drain Current - Continuous -0.12 - Pulsed 05 Py Maximum Power Dissipation 0.35 Ww Ty Teta Operating and Storage Temperature Range -55 to 150 Cc ESD Electrostatic Discharge Rating MIL-STD-883D 6.0 kV Human Body Model (100pf/ 1500 Ohm) THERMAL CHARACTERISTICS Raa | Thermal Resistance, Junction-to-Ambient 357 CAN 1997 Fairchild Semiconductor Corporation FDV302P REV. F Hectrical Characteristics (7, = 25 C unless otherwise noted ) Symbol | Parameter | Conditions | Min | Typ | Max | Units OFF CHARACTERISTICS BV nes Drain-Source Breakdown Voltage Vag = OV, I= -250 pA -25 V ABV iy uw oO C4 om a2 8 o i & 2 4 wo oO 7 a QO o1 o2 o3 o4 os Qa, GATE CHARGE (n} Figure 7. Gate Charge Characteristics. SINGLE PULSE 0.02 |- Rewa= 357 CAV Ta= 25 = 08 E ot i op gon ro. ss es =a O of z = 5 005 Vas = -2.7V a 1 2 5 10 15 20 30 40 - Vos , DRAIN-SOURCE VOLTAGE tv} Figure $. Maximum Safe Operating Area. rit) NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE nh an a a CAPACITANCE (pF) 2 = 1MHz Vag -0V of 03 1 2 5 10 18 26 Vog DRAIN TG SOURCE VOLTAGE (V} Figure 8. Capacitance Characteristics. SINGLE PULSE RalA =357CAV Ta = 25C Q 0001 oot o1 1 10 SINGLE PULSE TIME (SEC) ico 6300 Figure 10. Single Pulse Maximum Power Dissipation. Raa tt) =rtt) * Aqua RogJA = 357 C/W 44 1 001 a -, Single Pulse 0 005 . Ty: Ty =P TR qa!) o 002 Duty Cycle, D=t, / ooo1 00004 o 004 oo o4 1 10 400 200 t . TIME tsec} Figure 11. Transient Thermal Response Curve. FDV302P REV. F