LTC2413
27
2413fa
For more information www.linear.com/LTC2413
applicaTions inForMaTion
For relatively small values of input capacitance (CIN <
0.01µF), the voltage on the sampling capacitor settles
almost completely and relatively large values for the source
impedance result in only small errors. Such values for CIN
will deteriorate the converter offset and gain performance
without significant benefits of signal filtering and the user
is advised to avoid them. Nevertheless, when small val-
ues of CIN are unavoidably present as parasitics of input
multiplexers, wires, connectors or sensors, the LTC2413
can maintain its exceptional accuracy while operating
with relative large values of source resistance as shown in
Figures 18 and 19. These measured results may be slightly
different from the first order approximation suggested
earlier because they include the effect of the actual second
order input network together with the nonlinear settling
process of the input amplifiers. For small CIN values, the
settling on IN+ and IN– occurs almost independently and
there is little benefit in trying to match the source imped-
ance for the two pins.
Larger values of input capacitors (CIN > 0.01µF) may be
required in certain configurations for antialiasing or gen-
eral input signal filtering. Such capacitors will average the
input sampling charge and the external source resistance
will see a quasi constant input differential impedance.
When internal oscillator is used (FO= LOW), the typical
differential input resistance is 2MΩ which will generate
a gain error of approximately 0.25ppm for each ohm of
source resistance driving IN+ or IN–. When FO is driven
by an external oscillator with a frequency fEOSC (exter-
nal conversion clock operation), the typical differential
input resistance is 0.28 • 1012/fEOSCΩ and each ohm of
source resistance driving IN+ or IN– will result in
1.78 • 10–6 • fEOSCppm gain error. The effect of the source
resistance on the two input pins is additive with respect to
this gain error. The typical +FS and –FS errors as a func-
tion of the sum of the source resistance seen by IN+ and
IN– for large values of CIN are shown in Figures 20 and 21.
In addition to this gain error, an offset error term may
also appear. The offset error is proportional with the
mismatch between the source impedance driving the two
input pins IN+ and IN– and with the difference between the
input and reference common mode voltages. While the
input drive circuit nonzero source impedance combined
with the converter average input current will not degrade
the INL performance, indirect distortion may result from
the modulation of the offset error by the common mode
component of the input signal. Thus, when using large
CIN capacitor values, it is advisable to carefully match the
source impedance seen by the IN+ and IN– pins. When
internal oscillator is used (FO = LOW), every 1Ω mismatch
in source impedance transforms a full-scale common
mode input signal into a differential mode input signal
of 0.25ppm. When FO is driven by an external oscillator
with a frequency fEOSC, every 1Ω mismatch in source
impedance transforms a full-scale common mode input
signal into a differential mode input signal of 1.78 • 10–6 •
fEOSCppm. Figure 22 shows the typical offset error due to
input common mode voltage for various values of source
resistance imbalance between the IN+ and IN– pins when
large CIN values are used.
If possible, it is desirable to operate with the input signal
common mode voltage very close to the reference signal
common mode voltage as is the case in the ratiometric
measurement of a symmetric bridge. This configuration
eliminates the offset error caused by mismatched source
impedances.
The magnitude of the dynamic input current depends upon
the size of the very stable internal sampling capacitors and
upon the accuracy of the converter sampling clock. The
accuracy of the internal clock over the entire temperature
and power supply range is typical better than 0.5%. Such
a specification can also be easily achieved by an external
clock. When relatively stable resistors (50ppm/°C) are used
for the external source impedance seen by IN+ and IN–,
the expected drift of the dynamic current, offset and gain
errors will be insignificant (about 1% of their respective
values over the entire temperature and voltage range). Even
for the most stringent applications a one-time calibration
operation may be sufficient.
In addition to the input sampling charge, the input ESD
protection diodes have a temperature dependent leakage
current. This current, nominally 1nA (±10nA max), results
in a small offset shift. A 100Ω source resistance will create
a 0.1µV typical and 1µV maximum offset voltage.