TCD1703C TOSHIBA CCD LINEAR IMAGE SENSOR CCD(Charge Coupled Device) TCD1703C The TCD1703C is a high sensitive and low dark current 7500 elements CCD image sensor. The sensor is designed for facsimile, imagescanner and OCR. The device contains a row of 7500 elements photodiodes which provide a 24 lines / mm (600DPI) across a A3 size paper. The device is operated by 5V (pulse), and 12V power supply. FEATURES Number of Image Sensing Elements : 7500 elements Image Sensing Element Size : 7m by 7m on 7m centers Photo Sensing Region : High sensitive and low voltage dark signal pn photodiode Clock : 2 phase (5V) Package : 22pin DIP Weight : 6.6g ( Typ. ) PIN CONNECTION MAXIMUM RATINGS (Note 1) CHARACTERISTIC SYMBOL RATING UNIT Clock Pulse Voltage V Shift Pulse Voltage VSH Reset Pulse Voltage VRS Clamp Pulse Voltage VCP Power Supply Voltage VOD -0.3~15 Operating Temperature Topr -25~60 C Storage Temperature Tstg -40~100 C -0.3~8 V Note 1: All voltage are with respect to SS terminals (Ground). (TOP VIEW) 1 2001-10-15 TCD1703C CIRCUIT DIAGRAM PIN NAMES 1E, O Clock (Phase 1) 2E, O Clock (Phase 2) 2B Final Stage Clock (Phase 2) SH Shift Gate RS Reset Gate CP Clamp Gate OS1 Signal Output 1 OS2 Signal Output 2 OD Power SS Ground NC Non Connection 2 2001-10-15 TCD1703C OPTICAL / ELECTRICAL CHARACTERISTICS (Ta=25C, VOD=12V, V=VSH=VRS=VCP=5V (PULSE), f=1MHz, tINT (INTEGRATION TIME)=10ms, LIGHT SOURCE=DAYLIGHT FLUORESCENT LAMP, LOAD RESISTANCE=100k) CHARACTERISTIC Sensitivity Photo Response Non Uniformity Saturation Output Voltage SYMBOL MIN. TYP. MAX. UNIT NOTE R 12 15 18 V / lx*s PRNU 3 10 % (Note 2) PRNU (3) 6 12 mV (Note 8) VSAT 1.5 2.0 V (Note 3) Saturation Exposure SE 0.08 0.13 lx*s (Note 4) Dark Signal Voltage VDRK 1.2 3 mV (Note 5) Dark Signal Non Uniformity DSNU 2.5 4 mV (Note 5) DC Power Dissipation PD 350 400 mW Total Transfer Efficiency TTE 92 98 % Output Impedance Zo 0.2 1 k Dynamic Range DR 1660 (Note 6) VOS1 4.0 5.5 7.0 VOS2 4.0 5.5 7.0 V (Note 7) |VOS1-VOS2| 300 mV ND 1.0 mV DC Signal Output Voltage DC Differential Error Voltage Random Noise (Note 9) Note 2: Measured at 50% of SE (Typ.) Definition of PRNU : PRNU= x 100 (%) Where is average of total signal outputs and is maximum deviation from under uniform illumination. (Channel 1) In the case of 3750 elements (Channel 2), the condition is the same as above too. Note 3: VSAT is defined as minimum saturation output voltage of all effective pixels. V Note 4: Definition of SE : SE= SAT (lx*s) R 3 2001-10-15 TCD1703C Note 5: VDRK is defined as average dark signal voltage of all effective pixels. DSNU is defined as different voltage between VDRK and VMDK when VMDK is maximum dark signal voltage. V Note 6: Definition of DR : DR= SAT VDRK VDRK is proportional to tINT (Integration Time). So the shorter tINT condition makes wider DR values. Note 7: DC signal output voltage and DC compensation output voltage are defined as follows: Note 8: PRNU (3) is defined as maximum voltage with next pixel, where measured 5% of SE (Typ.) 4 2001-10-15 TCD1703C Note 9: Random noise is defined as the standard deviation (sigma) of the output level difference between two adjacent effective pixels under no illumination (i.e. dark condition) calculated by the following procedure. 1) Two adjacent pixels (pixel n and n+1) in one reading are fixed as measurement points. 2) Each of the output levels at video output periods averaged over 200 nanosecond period to get Vn and Vn+1. 3) Vn+1 is subtracted from Vn to get V V=Vn-Vn+1 4) The standard deviation of V is calculated after procedure 2) and 3) are repeated 30 times (30 readings). V = 1 30 Vi KK 30 i=1 = ( ) 2 1 30 Vi - V 30 i=1 5) Procedure 2), 3) and 4) are repeated 10 times to get 10 sigma values. = 1 10 j 10 j=1 6) value calculated using the above procedure is observed 2 times larger than that measured relative to the ground level. So we specify the random noise as follows. Random noise= 1 2 5 2001-10-15 TCD1703C OPERATING CONDITION CHARACTERISTIC SYMBOL MIN. TYP. MAX. V1E, O V2E, O 4.5 5 5.5 0 0.5 4.5 5 5.5 0 0.5 4.5 5 5.5 0 0.5 4.5 5 5.5 0 0.5 4.5 5 5.5 0 0.5 VOD 11.4 12.0 13.0 V SYMBOL MIN. TYP. MAX. UNIT Clock Pulse Frequency f 1 20 MHz Reset Pulse Frequency fRS 1 20 MHz CE 300 CO 300 Final Stage Clock Capacitance CB 10 20 pF Shift Gate Capacitance CSH 60 pF Reset Gate Capacitance CRS 10 20 pF Clamp Gate Capacitance CCP 10 20 pF "H" Level Clock Pulse Voltage "L" Level "H" Level Final Stage Clock Voltage "L" Level "H" Level Shift Pulse Voltage "L" Level "H" Level Reset Pulse Voltage "L" Level "H" Level Clamp Pulse Voltage "L" Level Power Supply Voltage V2B VSH VRS VCP UNIT V V V V V CLOCK CHARACTERISTICS (Ta=25C) CHARACTERISTIC Clock Capacitance (Note 10) pF Note 10: VOD=12V 6 2001-10-15 TCD1703C-7 TIMING CHART TCD1703C 7 2001-10-15 TCD1703C TIMING REQUIREMENTS Note 11: Each RS and CP pins put to Low level during this period. 8 2001-10-15 TCD1703C CHARACTERISTIC TYP. MAX. (Note 12) SYMBOL MIN. Pulse Timing of SH and 1E, 1O t1, t5 200 500 ns SH Pulse Rise Time, Fall Time t2, t4 0 50 ns t3 1000 1500 ns 2B Pulse Rise Time, Fall Time t6, t7 0 100 ns RS Pulse Rise Time, Fall Time t8, t10 0 20 ns t9 10 100 ns t11 10 ns t12, t14 0 20 ns CP Pulse Width t13 10 100 ns Pulse Timing of2B and CP t15 0 50 ns t16 0 100 t17 10 100 Pulse Timing of SH and CP t18 200 ns Pulse Timing of SH and RS t19 200 ns SH Pulse Width RS Pulse Width Video Data Delay Time (Note 13) CP Pulse Rise Time, Fall Time Pulse Timing of RS and CP UNIT ns Note 12: TYP. is the case of fRS=1.0MHz Note 13: Load Resistance is 100k 9 2001-10-15 TCD1703C CAUTION 1. Window Glass The dust and stain on the glass window of the package degrade optical performance of CCD sensor. Keep the glass window clean by saturating a cotton swab in alcohol and lightly wiping the surface, and allow the glass to dry, by blowing with filtered dry N2. Care should be taken to avoid mechanical or thermal shock because the glass window is easily to damage. 2. Electrostatic Breakdown Store in shorting clip or in conductive foam to avoid electrostatic breakdown. CCD Image Sensor is protected against static electricity, but interior puncture mode device due to static electricity is sometimes detected. In handing the device, it is necessary to execute the following static electricity preventive measures, in order to prevent the trouble rate increase of the manufacturing system due to static electricity. a. Prevent the generation of static electricity due to friction by making the work with bare hands or by putting on cotton gloves and non-charging working clothes. b. Discharge the static electricity by providing earth plate or earth wire on the floor, door or stand of the work room. c. Ground the tools such as soldering iron, radio cutting pliers of or pincer. It is not necessarily required to execute all precaution items for static electricity. It is all right to mitigate the precautions by confirming that the trouble rate within the prescribed range. 3. Incident Light CCD sensor is sensitive to infrared light. Note that infrared light component degrades resolution and PRNU of CCD sensor. 4. Soldering Soldering by the solder flow method cannot be guaranteed because this method may have deleterious effects on prevention of window glass soiling and heat resistance. Using a soldering iron, complete soldering within ten seconds for lead temperatures of up to 260C, or within three seconds for lead temperatures of up to 350C. 10 2001-10-15 TCD1703C PACKAGE DIMENSIONS Unit : mm Note 1: No. 1 SENSOR ELEMENT (S1) TO EDGE OF PACKAGE. Note 2: TOP OF CHIP TO BOTTOM OF PACKAGE. Note 3: GLASS THICKNES (n=1.5) Note 4: No. 1 SENSOR ELEMENT (S1) TO CENTER OF No. 1 PIN. Weight : 6.6g (Typ.) 11 2001-10-15 TCD1703C RESTRICTIONS ON PRODUCT USE 000707EBA * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The products described in this document are subject to the foreign exchange and foreign trade laws. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 12 2001-10-15