TCD1703C
2001-10-15
1
TOSHIBA CCD LINEAR IMAGE SENSOR CCD(Charge Coupled Device)
TCD1703C
The TCD1703C is a high sensitive and low dark current 7500 elements
CCD image sensor.
The sensor is designed for facsimile, imagescanner and OCR.
The device contains a row of 7500 elements photodiodes which provide
a 24 lines / mm (600DPI) across a A3 size paper. The device is operated
by 5V (pulse), and 12V power supply.
FEATURES
Number of Image Sensing Elements : 7500 elements
Image Sensing Element Size
: 7µm by 7µm on 7µm centers
Photo Sensing Region : High sensitive and low voltage dark signal
pn photodiode
Clock : 2 phase (5V)
Package : 22pin DIP
MAXIMUM RATINGS (Note 1)
CHARACTERISTIC SYMBOL RATING UNIT
Clock Pulse Voltage Vφ
Shift Pulse Voltage VSH
Reset Pulse Voltage VRS
Clamp Pulse Voltage VCP
−0.3~8
Power Supply Voltage VOD −0.3~15
V
Operating Temperature Topr −25~60 °C
Storage Temperature Tstg −40~100 °C
Note 1: All voltage are with respect to SS terminals (Ground).
Weight : 6.6g ( Typ. )
(TOP VIEW)
PIN CONNECTION
TCD1703C
2001-10-15
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CIRCUIT DIAGRAM
PIN NAMES
φ1E, O Clock (Phase 1)
φ2E, O Clock (Phase 2)
φ2B Final Stage Clock (Phase 2)
SH Shift Gate
RS Reset Gate
CP Clamp Gate
OS1 Signal Output 1
OS2 Signal Output 2
OD Power
SS Ground
NC Non Connection
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OPTICAL / ELECTRICAL CHARACTERISTICS
(Ta=25°C, VOD=12V, Vφ=VSH=VRS=VCP=5V (PULSE), fφ=1MHz,
tINT (INTEGRATION TIME)=10ms, LIGHT SOURCE=DAYLIGHT FLUORESCENT LAMP,
LOAD RESISTANCE=100kΩ)
CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT NOTE
Sensitivity R 12 15 18 V / lx·s
PRNU ― 3 10 % (Note 2)
Photo Response Non Uniformity
PRNU (3) ― 6 12 mV (Note 8)
Saturation Output Voltage VSAT 1.5 2.0 ― V (Note 3)
Saturation Exposure SE 0.08 0.13 ― lx·s (Note 4)
Dark Signal Voltage VDRK ― 1.2 3 mV (Note 5)
Dark Signal Non Uniformity DSNU ― 2.5 4 mV (Note 5)
DC Power Dissipation PD ― 350 400 mW
Total Transfer Efficiency TTE 92 98 ― %
Output Impedance Zo ― 0.2 1 kΩ
Dynamic Range DR ― 1660 ― ― (Note 6)
VOS1 4.0 5.5 7.0
DC Signal Output Voltage
VOS2 4.0 5.5 7.0
V (Note 7)
DC Differential Error Voltage |VOS1−VOS2| ― ― 300 mV
Random Noise NDσ― 1.0 ― mV (Note 9)
Note 2: Measured at 50% of SE (Typ.)
Definition of PRNU : PRNU=
()
%100
×
χ
χ∆
Where χis average of total signal outputs and χ∆ is maximum deviation from χunder uniform illumination.
(Channel 1)
In the case of 3750 elements (Channel 2), the condition is the same as above too.
Note 3: VSAT is defined as minimum saturation output voltage of all effective pixels.
Note 4: Definition of SE : SE= R
SAT
V(lx·s)
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Note 5: VDRK is defined as average dark signal voltage of all effective pixels.
DSNU is defined as different voltage between VDRK and VMDK when VMDK is maximum dark signal voltage.
Note 6: Definition of DR : DR=
DRK
V
SAT
V
V
DRK is proportional to tINT (Integration Time).
So the shorter tINT condition makes wider DR values.
Note 7: DC signal output voltage and DC compensation output voltage are defined as follows:
Note 8: PRNU (3) is defined as maximum voltage with next pixel, where measured 5% of SE (Typ.)
TCD1703C
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Note 9: Random noise is defined as the standard deviation (sigma) of the output level difference between two
adjacent effective pixels under no illumination (i.e. dark condition) calculated by the following procedure.
1) Two adjacent pixels (pixel n and n+1) in one reading are fixed as measurement points.
2) Each of the output levels at video output periods averaged over 200 nanosecond period to get Vn and
Vn+1.
3) Vn+1 is subtracted from Vn to get ∆V
∆V=Vn−Vn+1
4) The standard deviation of ∆V is calculated after procedure 2) and 3) are repeated 30 times (30 readings).
()
∑
=∆−∆=σ
∑
=∆=∆ 30
1i
2
VVi
30
1
30
1i
Vi
30
1
VKK
5) Procedure 2), 3) and 4) are repeated 10 times to get 10 sigma values.
∑
=σ=σ 10
1j
j
10
1
6) σvalue calculated using the above procedure is observed 2times larger than that measured relative to
the ground level. So we specify the random noise as follows.
Random noise= σ
2
1
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OPERATING CONDITION
CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT
“H” Level 4.5 5 5.5
Clock Pulse Voltage
“L” Level
Vφ1E, O
Vφ2E, O 0 ― 0.5
V
“H” Level 4.5 5 5.5
Final Stage Clock Voltage
“L” Level
Vφ2B
0 ― 0.5
V
“H” Level 4.5 5 5.5
Shift Pulse Voltage
“L” Level
VSH 0 ― 0.5
V
“H” Level 4.5 5 5.5
Reset Pulse Voltage
“L” Level
VRS 0 ― 0.5
V
“H” Level 4.5 5 5.5
Clamp Pulse Voltage
“L” Level
VCP 0 ― 0.5
V
Power Supply Voltage VOD 11.4 12.0 13.0 V
CLOCK CHARACTERISTICS (Ta=25°C)
CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT
Clock Pulse Frequency fφ― 1 20 MHz
Reset Pulse Frequency fRS ― 1 20 MHz
CφE ― 300 ―
Clock Capacitance (Note 10)
CφO ― 300 ―
pF
Final Stage Clock Capacitance CφB ― 10 20 pF
Shift Gate Capacitance CSH ― 60 ― pF
Reset Gate Capacitance CRS ― 10 20 pF
Clamp Gate Capacitance CCP ― 10 20 pF
Note 10: VOD=12V
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TIMING CHART
TCD1703C−7
TCD1703C
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TIMING REQUIREMENTS
Note 11: Each RS and CP pins put to Low level during this period.
TCD1703C
2001-10-15
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CHARACTERISTIC SYMBOL MIN.
TYP.
(Note 12
)
MAX. UNIT
Pulse Timing of SH and φ1E, φ1O t1, t5 200 500 ― ns
SH Pulse Rise Time, Fall Time t2, t4 0 50 ― ns
SH Pulse Width t3 1000 1500 ― ns
φ2B Pulse Rise Time, Fall Time t6, t7 0 100 ― ns
RS Pulse Rise Time, Fall Time t8, t10 0 20 ― ns
RS Pulse Width t9 10 100 ― ns
Video Data Delay Time (Note 13) t11 ― 10 ― ns
CP Pulse Rise Time, Fall Time t12, t14 0 20 ― ns
CP Pulse Width t13 10 100 ― ns
Pulse Timing ofφ2B and CP t15 0 50 ― ns
t16 0 100 ―
Pulse Timing of RS and CP
t17 10 100 ―
ns
Pulse Timing of SH and CP t18 200 ― ― ns
Pulse Timing of SH and RS t19 200 ― ― ns
Note 12: TYP. is the case of fRS=1.0MHz
Note 13: Load Resistance is 100kΩ
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CAUTION
1. Window Glass
The dust and stain on the glass window of the package degrade optical performance of CCD sensor.
Keep the glass window clean by saturating a cotton swab in alcohol and lightly wiping the surface, and
allow the glass to dry, by blowing with filtered dry N2. Care should be taken to avoid mechanical or
thermal shock because the glass window is easily to damage.
2. Electrostatic Breakdown
Store in shorting clip or in conductive foam to avoid electrostatic breakdown.
CCD Image Sensor is protected against static electricity, but interior puncture mode device due to static
electricity is sometimes detected. In handing the device, it is necessary to execute the following static
electricity preventive measures, in order to prevent the trouble rate increase of the manufacturing system
due to static electricity.
a. Prevent the generation of static electricity due to friction by making the work with bare hands or by
putting on cotton gl oves and non-charging working clothes.
b. Discharge the static electricity by providing earth plate or earth wire on the floor, door or stand of the
work room.
c. Ground the tools such as soldering iron, radio cutting pliers of or pincer.
It is not necessarily required to execute all precaution items for static electricity.
It is all right to mitigate the precautions by confirming that the trouble rate within the prescribed
range.
3. Incident Light
CCD sensor is sensitive to infrared light. Note that infrared light component degrades resolution and
PRNU of CCD sensor.
4. Soldering
Soldering by the solder flow method cannot be guaranteed because this method may have deleterious
effects on prevention of window glass soiling and heat resistance.
Using a soldering iron, complete soldering within ten seconds for lead temperatures of up to 260°C, or
within three seconds for lead temperatures of up to 350°C.
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PACKAGE DIMENSIONS
Note 1: No. 1 SENSOR ELEMENT (S1) TO EDGE OF PACKAGE.
Note 2: TOP OF CHIP TO BOTTOM OF PACKAGE.
Note 3: GLASS THICKNES (n=1.5)
Note 4: No. 1 SENSOR ELEMENT (S1) TO CENTER OF No. 1 PIN.
Weight : 6.6g (Typ.)
Unit : mm
TCD1703C
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• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• The products described in this document are subject to the foreign exchange and foreign trade laws.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
• The information contained herein is subject to change without notice.
000707EB
A
RESTRICTIONS ON PRODUCT USE
