REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE number 75569 to the drawing. Add vendor CAGE number 6Y440 to device types 03LX, 03XX, 04LX, and 04XX. Removed Vendor CAGE number OBK02 from drawing as approved source of supply. Editorial changes throughout. 89-10-16 M. A. Frye B Drawing updated to reflect current requirements. Editorial changes throughout. - gap 00-10-23 Raymond Monnin C Boilerplate update and part of five year review. tcr 07-02-23 Joseph Rodenbeck THE FRONT PAGE OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY James E. Jamison DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil CHECKED BY Charles Reusing APPROVED BY Michael A. Frye MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256K X 1 SRAM, MONOLITHIC SILICON DRAWING APPROVAL DATE 88-10-22 REVISION LEVEL C SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 1 OF 5962-88725 14 5962-E271-07 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88725 01 L Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) X Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 02 03 04 05 5C2561 5C2561 5C2561 5C2561 5C2561 Circuit function Access time 256K x 1 CMOS SRAM 256K x 1 CMOS SRAM 256K x 1 CMOS SRAM 256K x 1 CMOS SRAM 256K x 1 CMOS SRAM 35 ns 45 ns 55 ns 70 ns 25 ns 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter L X Y Descriptive designator Terminals GDIP3-T24 or CDIP4-T24 CQCC3-N28 CDFP4-F28 24 28 28 Package style Dual-in-line package Rectangular leadless chip carrier Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Voltage on any input relative to VSS ............................................... Voltage applied to Q ...................................................................... Storage temperature range ........................................................... Maximum power dissipation (PD) ................................................... Lead temperature (soldering, 10 seconds) .................................... Thermal resistance, junction-to-case (JC) .................................... Junction temperature (TJ) .............................................................. -0.5 V dc to +7.0 V dc -0.5 V dc to +6.0 V dc -65C to +150C 1.0 W +260C See MIL-STD-1835 +150C 1/ 1.4 Recommended operating conditions. Supply voltage range (VCC) ........................................................... Supply voltage (VSS) ...................................................................... Input high voltage range (VIH) ........................................................ Input low voltage range (VIL) ......................................................... Case operating temperature range (TC) ....................................... 4.5 V dc to 5.5 V dc 0V +2.2 V dc to +6.0 V dc -0.5 V dc to +0.8 V dc 2/ -55C to +125C 1/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening conditions in accordance with method 5004 of MIL-STD-883. 2/ VIL minimum = -3.0 V dc for pulse width less than 20 ns. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 2 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for nonJAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MILPRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MILPRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 3 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 4 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C VCC = 4.5 V to 5.5 V VSS = 0 V Group A subgroups Device types 1, 2, 3 01-04 120 05 135 1, 2, 3 All 25 mA 1, 2, 3 All 20 mA 1, 2, 3 All 10 A 1, 2, 3 All 10 A 1, 2, 3 All 1, 2, 3 All 0.4 V 4 All 10.0 pF 4 All 12.0 pF 9, 10, 11 01 35 ns 02 45 03 55 04 70 05 25 unless otherwise specified Operating supply current ICC1 1/ Limits Min tAVAV = tAVAV (minimum), VCC = 5.5 V, CE = VIL, Unit Max mA All other inputs at VIL Standby power supply current TTL ICC2 1/ CE VIH, all other inputs VIL or VIH, VCC = 5.5 V, f = 0 MHz Standby power supply current CMOS ICC3 1/ CE (VCC -0.2 V), f = 0 MHz, VCC = 5.5 V, all other inputs < 0.2 V or > (VCC -0.2 V) Input leakage current, IILK VCC = 5.5 V, VIN = 0 V to 5.5 V any input Off-state output leakage IOLK VCC = 5.5 V, VIN = 0 V to 5.5 V current Output high voltage VOH IOUT = -4.0 mA, VCC = 4.5 V, 2.4 V VIL = 0.8 V, VIH = 2.2 V Output low voltage VOL IOUT = 8.0 mA, VCC = 4.5 V, VIL = 0.8 V, VIH = 2.2 V Input capacitance CIN VIN = 0 V, f = 1.0 MHz, TC = 25C, See 4.3.1c Output capacitance COUT VOUT = 0 V, f = 1.0 MHz, TC = 25C, See 4.3.1c Chip enable access tELQV See figure 3 2/ time See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C VCC = 4.5 V to 5.5 V VSS = 0 V Group A subgroups Device types 9, 10, 11 01 35 02 45 03 55 04 70 05 25 unless otherwise specified Read cycle time Address access time Output hold after tAVAV tAVQV See figure 3 See figure 3 Limits Min 2/, 3/ 2/, 4/ 9, 10, 11 Unit Max ns 01 35 02 45 03 55 04 70 05 25 ns tAVQX See figure 3 2/, 9, 10, 11 All 3.0 ns tELQX See figure 3 2/, 5/, 6/ 9, 10, 11 All 3.0 ns tEHQZ See figure 3 2/, 5/, 6/ 9, 10, 11 01, 02, 05 0 20 03 0 25 04 0 30 0 address change Chip enable to output active Chip disable to output inactive Chip enable to power up tELPU See figure 3 2/, 5/ 9, 10, 11 All Chip enable to power tEHPD See figure 3 2/, 5/ 9, 10, 11 01 35 02 45 03 55 04 70 05 25 down Write cycle time Write pulse width tAVAV tWLWH See figure 4 See figure 4 2/ 9, 10, 11 2/ 9, 10, 11 01 35 02 45 03 55 04 70 05 25 01 30 02 40 03 50 04 55 05 20 ns ns ns ns ns See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C VCC = 4.5 V to 5.5 V VSS = 0 V Group A subgroups Device types 9, 10, 11 01 30 02 40 03 50 04 55 05 20 01, 02 20 03, 04 25 05 16 unless otherwise specified Chip enable to end of tELEH See figure 4 Min 2/ write Data setup to end of tDVWH See figure 4 2/ 9, 10, 11 write Data hold after end of Limits Unit Max ns ns tWHDX See figure 4 2/ 9, 10, 11 All 2.0 ns tAVWH See figure 4 2/ 9, 10, 11 01 30 02 40 03 50 04 55 05 20 9, 10, 11 All 0 ns 9, 10, 11 All 2.0 ns 5.0 ns write Address setup to end of write Address setup to tAVWL beginning of write See figure 4 2/ ns (write cycle number 1) tAVEL See figure 4 2/ (write cycle number 2) Address hold after end tWHAV See figure 4 2/ 9, 10, 11 All tWLQZ See figure 4 2/, 5/, 6/ 9, 10, 11 01, 05 0 15 02 0 20 03 0 25 04 0 30 All 0 of write Write enable to output disable Output active after end tWHQX See figure 4 2/, 5/, 6/, 7/ 9, 10, 11 ns ns of write 1/ ICC is dependent upon output loading and cycle rate. The specified values apply with output(s) unloaded. 2/ AC measurements assume signal transition times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 V to 3.0 V and output loading of 30 pF load capacitance. Output timing reference is 1.5 V. See figure 5. 3/ For read cycles 1 and 2, WE is high for entire cycle. 4/ Device is continuously selected, CE low. 5/ Parameter, if not tested, shall be guaranteed to the limits specified in table I. 6/ Measured 500 mV from steady-state output voltage. Load capacitance is 5.0 pF. 7/ If WE is low when CE goes low, the output remains in the high impedance state. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 7 Device types Case outlines 01 through 05 L Terminal number X Y Terminal symbol 1 A A A 2 A A A 3 A A A 4 A NC A 5 A A A 6 A A A 7 A A NC 8 A A NC 9 A A A 10 Q A A 11 WE Q A 12 VSS NC Q 13 CE WE WE 14 D VSS VSS 15 A CE CE 16 A D D 17 A A A 18 A NC A 19 A A A 20 A A 21 A A A NC 22 A A NC 23 A A A 24 VCC A A 25 --- A A 26 --- NC A 27 --- A A 28 --- VCC VCC FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 8 Device types 01 through 05 Mode I/O Power CE WE H X Not selected High Z Standby L L Write DIN Active L H Read DOUT Active H = Logic "1" state L = Logic "0" state X = Don't care FIGURE 2. Truth table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 9 READ CYCLE NO. 1 ( WE HIGH, CE LOW) (See notes 1, 2, and 3) READ CYCLE NO. 2 ( WE HIGH) (See notes 1 and 2) NOTES: 1. WE is high for entire cycle. 2. CE and WE must transition between VIH (min) to VIL (max) or VIL (max) to VIH (min) in monotonic fashion. 3. Device is continuously selected, CE low. FIGURE 3. Read cycle timing diagrams. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 10 WRITE CYCLE NO. 1 ( WE CONTROLLED) (See notes 1 and 2) WRITE CYCLE NO. 2 ( CE CONTROLLED) (See notes 1 and 2) NOTES: 1. CE and WE must transition between VIH (min) to VIL (max) to VIH (min) in monotonic fashion. 2. CE and WE must be VIH during address transitions. FIGURE 4. Write cycle timing diagram. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 11 (for tELQX, tWLQX, tEHQX, tWHQX) AC test conditions Input pulse levels GND to 3.0 V Input rise fall times 5 ns Input timing reference levels 1.5 V Output reference levels 1.5 V FIGURE 5. Output load circuits. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 12 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) --- Final electrical test parameters (method 5004) 1*, 2, 3, 7*, 8A, 8B, 9, 10, 11 Group A test requirements (method 5005) 1, 2, 3, 4**, 7, 8A, 8B, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) * ** 2, 3, 7, 8A, 8B PDA applies to subgroup 1 and 7. See 4.3.1c. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CIN and COUT measurements) shall be measured only for the initial test and after process or design changes which may affect input or output capacitance. d. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 13 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MILHDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-88725 A REVISION LEVEL C SHEET 14 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 07-02-23 Approved sources of supply for SMD 5962-88725 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ 5962-8872501LA 5962-8872501XA 5962-8872501YA 5962-8872502LA 5962-8872502XA 5962-8872502YA 5962-8872503LA 5962-8872503XA Vendor CAGE number 0EU86 0C7V7 3/ 3/ 3/ 3/ 0EU86 0C7V7 3/ 3/ 0C7V7 3/ 0EU86 0C7V7 3/ 3/ 3/ 3/ 0EU86 0C7V7 3/ 3/ 0C7V7 3/ 0EU86 0C7V7 3/ 3/ 3/ 3/ 0EU86 0C7V7 3/ 3/ Vendor similar PIN 2/ MT5C2561C-35 CY7C197-35DMB EDI81256C35QB P4C1257-35CMB IDT71257S35CB HM1-65797K/883 MT5C2561EC-35 CY7C197-35LMB EDI81256C35LB P4C1257-35LMB CY7C197-35FMB EDI81256C35FB MT5C2561C-45 CY7C197-45DMB EDI81256C45LB P4C1257-45LMB IDT71257S45CB HM1-65797M/883 MT5C2561EC-45 CY7C197-45LMB EDI81256C45LB P4C1257-45LMB CY7C197-45FMB EDI81256C45FB MT5C2561C-55 CY7C197-55DMB EDI81256C55QB P4C1257-55CMB IDT71257S55CB HM1-65797N/883 MT5C2561EC-55 CY7C197-55LMB EDI81256C55LB P4C1257-55LMB The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. 1 of 2 STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued. Standard microcircuit drawing PIN 1/ 5962-8872503YA 5962-8872504LA 5962-8872504XA 5962-8872504YA 5962-8872505LA 5962-8872505XA 5962-8872505YA Vendor CAGE number 0C7V7 3/ 0EU86 0C7V7 3/ 3/ 3/ 3/ 0EU86 0C7V7 3/ 3/ 0C7V7 3/ 0EU86 0C7V7 3/ 3/ 3/ 0EU86 0C7V7 3/ 0C7V7 Vendor similar PIN 2/ CY7C197-55FMB EDI81256C55FB MT5C2561C-70 CY7C197-70DMB EDI81256C70QB P4C1257-70CMB IDT71257S70CB HM1-65797N/883 MT5C2561EC-70 CY7C197-70LMB EDI81256C70LB P4C1257-70LMB CY7C197-70FMB EDI81256C70FB MT5C2561C-25 CY7C197-25DMB IDT71257S25CB P4C1257-25CMB HM1-65797H/883 MT5C2561EC-25 CY7C197-25LMB P4C1257-25LMB CY7C197-25FMB 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. Vendor CAGE number Vendor name and address 0EU86 Austin Semiconductor International L.P. 8701 Cross Park Drive Austin, TX 78754-4566 0C7V7 QP Semiconductor 2945 Oakmead Village Ct. Santa Clara, CA 95051-0812 2