INTEGRATED CIRCUITS DIVISION
IX4423-24-25
R02 www.ixysic.com 11
5 Manufacturing Information
5.1 Moisture Sensitivity
All plastic encapsulated semiconductor packages are susc eptible to moisture ingression. IXYS Integrated
Circuits Division classifies its plastic encapsulated devices for moisture se nsitivity according to the latest
v ersion o f the joint indust ry standard, IPC/JEDEC J-STD-020, in force at the time of product evaluation.
We test all of our products to t he maximum conditions set forth in the stan dard, and guarantee proper
operation of our devices when handled according to the limitations and information in that st andard as well as to any
limitations set forth in the information or standards ref erenced belo w.
Failure to adhere to the warnings or limitations as estab l ished by the listed specifications could result in reduced
product performance, reduction of operable lif e, and/or reduction of overall reliability.
This product carries a Moisture Sensitivity Level (MSL) classification as shown below, and should be handled
according to the requirements of the latest version of the joint industry standard IPC/JEDEC J-STD-033.
5.2 ESD Sensitivi ty
This product is ESD Sensitive, and should be handled according to the industry standard JESD-625.
5.3 Soldering Profile
Provided in the table belo w is t he Classification Temperature (TC) of this product and the maximum dwell time the
body temperature of this device may be (TC - 5)ºC or g reater. The classification temperat ure sets the Maximu m Body
Temperature allow ed for this device during lead-free reflow processes . For through-hole devices, and an y ot her
processes, the guidelines of J-STD-020 must be observ ed.
5.4 Board Wash
IXYS Integr ated Circu it s Division recommends t he use of no-clean f lux formulations . Board washing to reduce or
remove flux residue following the solder reflow process is accep table prov ided proper precautio ns ar e taken to
pre vent damage to the de vice. These precautions include but are not limited to: using a low pressure wash and
providing a follow up bake cycle suff icien t to remov e any moisture trapped within the device due to the washing
process. Due to the v ariability of the w ash parameters used to clean the board, determination of the bake temper ature
and duration necessary to remo ve the moisture trapped within the package is the responsibility of the user
(assembler) . Cleaning or drying methods that employ ultr asonic energy may damage the de vice and should not be
used. Additionally, the device must n ot be exposed to flux or solvents tha t are Chlorine- or Fluorine-based
Device Moisture Sensitivity Level (MSL) Classification
IX4423N / IX4424N / IX4425N MSL 1
Device Classification Temperature (TC)Dwell Time (tp)Max Reflow Cycles
IX4423N / IX4424N / IX4425N 260°C 30 seconds 3