LTC2107
1
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For more information www.linear.com/LTC2107
Block Diagram
Features Description
16-Bit, 210Msps
High Performance ADC
The LTC
®
2107 is a 16-bit, 210Msps high performance ADC.
The combination of high sample rate, low noise and high
linearity enable a new generation of digital radio designs.
The direct sampling front-end is designed specifically for
the most demanding receiver applications such as software
defined radio and multi-channel GSM base stations. The
AC performance includes, SNR = 80dBFS, SFDR = 98dBFS.
Aperture jitter = 45fsRMS allows direct sampling of IF
frequencies up to 500MHz with excellent performance.
Features such as internal dither, a PGA front-end and
digital output randomization help maximize performance.
Modes of operation can be controlled through a 3-wire
serial interface (SPI).
The double data rate (DDR) low voltage differential (LVDS)
digital outputs help reduce digital line count and enable
space saving designs.
128k Point FFT,
fIN = 30.6MHz, –1dBFS, PGA = 0
applications
n 98dBFS SFDR
n 80dBFS SNR Noise Floor
n Aperture Jitter = 45fsRMS
n PGA Front-End 2.4VP-P or 1.6VP-P Input Range
n Optional Internal Dither
n Optional Data Output Randomizer
n Power Dissipation: 1280mW
n Shutdown Mode
n Serial SPI Port for Configuration
n Clock Duty Cycle Stabilizer
n 48-Lead (7mm × 7mm) QFN Package
n Software Defined Radios
n Military Radio and RADAR
n Cellular Base Stations
n Spectral Analysis
n Imaging Systems
n ATE and Instrumentation
+
16-BIT
ADC CORE
INPUT
S/H
ANALOG
INPUT CORRECTION
LOGIC
OUTPUT
BUFFERS
16 CLKOUT±
OGND
2107 BD
D14_15±
D0_1±
1µF
10µF
2.5V
1.8V
ENC+ENC
AIN
AIN+
VCM
VCM
SENSE
0V
GND
OF±
OVDD
CLOCK AND
CLOCK CONTROL
INTERNAL
REFERENCE
VCM
DRIVER
SER/PAR SDI SCK CS SDO SHDN
ADC CONTROL/SPI INTERFACE
2.2µF
VDD
L, LT, LT C , LT M, Linear Technology and the Linear logo are registered trademarks of Linear
Technology Corporation. All other trademarks are the property of their respective owners.
Protected by U.S. Patents, including 7683695, 8482442, 8648741.
FREQUENCY (MHz)
0 15 30 45 60 75 90
–140
AMPLITUDE (dBFS)
–120
–100
–80
0
–40
–20
–60
–130
–110
–90
–10
–50
–30
–70
105
2107 TA01
LTC2107
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For more information www.linear.com/LTC2107
pin conFiguration
aBsolute maximum ratings
Supply Voltage
VDD ...................................................... 0.3V to 2.8V
OVDD ........................................................ 0.3V to 2V
Analog Input Voltage
AIN+, AIN, ENC+, ENC, PAR/SER, SENSE
(Note 3) ................................... 0.3V to (VDD + 0.2V)
Digital Input Voltage
CS, SDI, SCK (Note 4) ........................... 0.3V to 3.9V
(Notes 1, 2)
orDer inFormation
FULL-RATE CMOS OUTPUT MODE
TOP VIEW
49
GND
UK PACKAGE
48-LEAD (7mm × 7mm) PLASTIC QFN
SENSE 1
GND 2
GND 3
VDD 4
VDD 5
VDD 6
GND 7
AIN+ 8
AIN 9
GND 10
VCM 11
GND 12
36 D13
35 D12
34 D11
33 D10
32 CLKOUT+
31 CLKOUT
30 D9
29 D8
28 D7
27 D6
26 D5
25 D4
48 GND
47 GND
46 PAR/SER
45 CS
44 SCK
43 SDI
42 OGND
41 OVDD
40 OF
39 DNC
38 D15
37 D14
GND 13
ENC+ 14
ENC 15
GND 16
SHDN 17
SDO 18
OGND 19
OVDD 20
D0 21
D1 22
D2 23
D3 24
TJMAX = 150°C, θJA = 29°C/W
EXPOSED PAD (PIN 49) IS GND, MUST BE SOLDERED TO PCB
DOUBLE DATA RATE LVDS OUTPUT MODE
TOP VIEW
49
GND
UK PACKAGE
48-LEAD (7mm × 7mm) PLASTIC QFN
SENSE 1
GND 2
GND 3
VDD 4
VDD 5
VDD 6
GND 7
AIN+ 8
AIN 9
GND 10
VCM 11
GND 12
36 D12_13+
35 D12_13
34 D10_11+
33 D10_11
32 CLKOUT+
31 CLKOUT
30 D8_9+
29 D8_9
28 D6_7+
27 D6_7
26 D4_5+
25 D4_5
48 GND
47 GND
46 PAR/SER
45 CS
44 SCK
43 SDI
42 OGND
41 OVDD
40 OF+
39 OF
38 D14_15+
37 D14_15
GND 13
ENC+ 14
ENC 15
GND 16
SHDN 17
SDO 18
OGND 19
OVDD 20
D0_1 21
D0_1+ 22
D2_3 23
D2_3+ 24
TJMAX = 150°C, θJA = 29°C/W
EXPOSED PAD (PIN 49) IS GND, MUST BE SOLDERED TO PCB
Digital Output Voltage ................ 0.3V to (OVDD + 0.3V)
SDO (Note 4) ........................................ 0.3V to 3.9V
Operating Temperature Range
LTC2107C ................................................ C to 70°C
LTC2107I..............................................–40°C to 8C
Storage Temperature Range .................. 6C to 150°C
LEAD FREE FINISH TAPE AND REEL PART MARKING* PACKAGE DESCRIPTION TEMPERATURE RANGE
LTC2107CUK#PBF LTC2107CUK#TRPBF LTC2107UK 48-Lead (7mm × 7mm) Plastic QFN 0°C to 70°C
LTC2107IUK#PBF LTC2107IUK#TRPBF LTC2107UK 48-Lead (7mm × 7mm) Plastic QFN –40°C to 85°C
Consult LTC Marketing for parts specified with wider operating temperature ranges. *The temperature grade is identified by a label on the shipping container.
For more information on lead free part marking, go to: http://www.linear.com/leadfree/
For more information on tape and reel specifications, go to: http://www.linear.com/tapeandreel/. Some packages are available in 500 unit reels through
designated sales channels with #TRMPBF suffix.
LTC2107
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converter characteristics
analog input
The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 5)
The l denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at TA = 25°C. (Note 5)
PARAMETER CONDITIONS MIN TYP MAX UNITS
Resolution (No Missing Codes) l16 Bits
Integral Linearity Error Differential Analog Input (Note 6) l–4.5 ±1.6 4.5 LSB
Differential Linearity Error Differential Analog Input –1 ±0.4 1.0 LSB
Offset Error (Note 7) l–5 –0.5 5 mV
Gain Error Internal Reference, PGA = 0
External Reference, PGA = 0
l
–0.85
±1.5
–0.2
0.85
%FS
%FS
Offset Drift –20 µV/°C
Full-Scale Drift Internal Reference, PGA = 0
External Reference, PGA = 0
110
70
ppm/°C
ppm/°C
Transition Noise External Reference, PGA = 0
External Reference, PGA = 1
2.3
3.0
LSBRMS
LSBRMS
Noise Density, Input Referred PGA = 0, Sample Rate = 210Msps, Bandwidth = 105MHz
PGA = 1, Sample Rate = 210Msps, Bandwidth = 105MHz
8.3
7.2
nV/√Hz
nV/√Hz
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VIN Analog Input Range (AIN+ – AIN) 2.375V < VDD < 2.625V, PGA = 0
2.375V < VDD < 2.625V, PGA = 1
l
l
2.4
1.6
VP-P
VP-P
VIN(CM) Analog Input Common Mode (AIN+ + AIN)/2 Differential Analog Input (Note 8) l1.15 VCM 1.25 V
VSENSE External Voltage Reference Applied to SENSE External Reference Mode l1.225 1.250 1.275 V
IIN1 Analog Input Leakage Current 0.6V < AIN+ < 1.8V,
0.6V < AIN < 1.8V
l–1 1 µA
IIN2 SENSE, PAR/SER Input Leakage Current 0 < SENSE, PAR/SER < VDD l–1 1 µA
tAP Sample-and-Hold Acquisition Delay Time RS = 25Ω 0.5 ns
tJITTER Sample-and-Hold Acquisition Delay Jitter (Note 11) 45 fsRMS
BW-3dB Full-Power Bandwidth RS = 25Ω 800 MHz
Over-Range Recovery Time ±120% Full Scale (Note 10) 1 Cycles
LTC2107
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For more information www.linear.com/LTC2107
Dynamic accuracy
The l denotes the specifications which apply over the full operating temperature range,
otherwise specifications are at TA = 25°C. AIN = –1dBFS. (Note 5)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
SNR Signal-to-Noise Ratio 5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
78
79.8
79.7
79.5
79.1
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
l75.2 77.0
78.2
76.4
dBFS
dBFS
dBFS
SFDR Spurious Free Dynamic Range
2nd Harmonic
5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
84
104.3
96.8
87
87.5
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
l84 95.5
85.8
89.3
dBFS
dBFS
dBFS
Spurious Free Dynamic Range
3rd Harmonic
5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
86
98
96.8
87
93.3
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
l86 100
80.4
83.5
dBFS
dBFS
dBFS
Spurious Free Dynamic Range
4th Harmonic or Higher
5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
93
100.8
101.6
100.7
105
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
l91 96.4
95.7
96.3
dBFS
dBFS
dBFS
S/(N+D) Signal-to-Noise Plus Distortion Ratio 5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
77
79.4
79.5
78.4
78.7
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
l74 76.7
76.7
76.0
dBFS
dBFS
dBFS
SFDR Spurious Free Dynamic Range at
–25dBFS Dither "Off"
5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
95
100.4
107.4
106.6
108.3
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
106.7
106.7
106.7
dBFS
dBFS
dBFS
Spurious Free Dynamic Range at
–25dBFS Dither "On"
5.1MHz Input (PGA = 0)
30.3MHz Input (PGA = 0)
71.1MHz Input (PGA = 0)
141MHz Input (PGA = 0)
l
103
126
124
119
119
dBFS
dBFS
dBFS
dBFS
141MHz Input (PGA = 1)
250MHz Input (PGA = 0)
250MHz Input (PGA = 1)
122.3
124.4
124.6
dBFS
dBFS
dBFS
SNRD SNR Density Sample Rate = 210Msps, PGA = 0
Sample Rate = 210Msps, PGA = 1
160.2
157.9
dBFS/√Hz
dBFS/√Hz
LTC2107
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For more information www.linear.com/LTC2107
vcm output
Digital inputs anD outputs
The l denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at TA = 25°C. (Note 5)
The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 5)
PARAMETER CONDITIONS MIN TYP MAX UNITS
VCM Output Voltage IOUT = 0 1.17 1.20 1.23 V
VCM Output Temperature Drift 18 ppm/°C
VCM Output Resistance –1mA < IOUT < 1mA 0.35 Ω
VCM Line Regulation 2.375V < VDD < 2.625V 0.8 mV/V
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
Encode Inputs (ENC+, ENC
)
VID Differential Input Voltage (Note 8) l0.2 2 V
VICM Common Mode Input Voltage Internally Set
Externally Set (Note 8)
1.1
1.2
1.5
V
V
VIN Input Voltage Range ENC+, ENC to GND l0 2.5 V
RIN Input Resistance (See Figure 8) 5
RTERM Optional Encode Termination Encode Termination Enabled (See Figure 8) 107 Ω
CIN Input Capacitance Between ENC+ and ENC (Note 8) 3 pF
Digital Inputs (CS, SDI, SCK, SHDN)
VIH High Level Input Voltage VDD = 2.5V l1.2 V
VIL Low Level Input Voltage VDD = 2.5V l0.6 V
IIN Input Current VIN = 0V to 3.6V l–10 10 µA
CIN Input Capacitance (Note 8) 2 pF
SDO Output (Open-Drain Output. Requires 2kΩ Pull-Up Resistor if SDO Is Used)
ROL Logic Low Output Resistance to GND VDD = 2.5V, SDO = 0V 260 Ω
IOH Logic High Output Leakage Current SDO = 0V to 3.6V l–10 10 µA
COUT Output Capacitance (Note 8) 2 pF
Digital Data Outputs (CMOS Mode)
VOH High Level Output Voltage IO = –500µA l1.7 1.790 V
VOL Low Level Output Voltage IO = 500µA l0.010 0.050 V
Digital Data Outputs (LVDS Mode)
VOD Differential Output Voltage 100Ω Differential Load, 3.5mA Mode
100Ω Differential Load, 1.75mA Mode
l
l
247
125
350
175
454
250
mV
mV
VOS Common Mode Output Voltage 100Ω Differential Load, 3.5mA Mode
100Ω Differential Load, 1.75mA Mode
l
l
1.19
1.20
1.250
1.250
1.375
1.375
V
V
RTERM On-Chip Termination Resistance Termination Enabled, OVDD = 1.8V, 3.5mA Mode 100 Ω
LTC2107
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For more information www.linear.com/LTC2107
power requirements
timing characteristics
The l denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. (Note 9)
The l denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. (Note 5)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
VDD Analog Supply Voltage (Note 9) l2.375 2.5 2.625 V
OVDD Output Supply Voltage CMOS Mode (Note 9)
LVDS Mode (Note 9)
l
l
1.7
1.7
1.8
1.8
1.9
1.9
V
V
IVDD Analog Supply Current l495.3 545 mA
IOVDD Digital Supply Current CMOS Mode
LVDS Mode, 1.75mA Mode
LVDS Mode, 3.5mA Mode
l
l
61
23.2
45
26
50
mA
mA
mA
PDISS Power Dissipation CMOS Mode
LVDS Mode, 1.75mA Mode
LVDS Mode, 3.5mA Mode
l
l
1348
1280
1320
1409
1453
mW
mW
mW
PSHDN SHDN Mode Power 6.4 mW
IVDD Analog Supply Current with Inactive Encode Encode Clock Not Active
Keep Alive Oscillator Enabled
366 mA
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
fSSampling Frequency (Note 9) l10 210 MHz
tLENC Low Time Duty Cycle Stabilizer Off (Note 8)
Duty Cycle Stabilizer On (Note 8)
l
l
2.26
1.16
2.38
2.38
50
50
ns
ns
tHENC High Time Duty Cycle Stabilizer Off (Note 8)
Duty Cycle Stabilizer On (Note 8)
l
l
2.26
1.16
2.38
2.38
50
50
ns
ns
tAP Sample-and-Hold Acquisition Delay Time RS = 25Ω 0.5 ns
Digital Data Outputs (CMOS Mode)
tDENC to Data Delay CL = 6.8pF (Notes 8, 12) l1.3 1.9 2.5 ns
tCENC to CLKOUT Delay CL = 6.8pF (Notes 8, 12) l1.3 1.9 2.5 ns
tSKEW DATA to CLKOUT Skew tD – tC (Note 8) l–0.3 0 0.3 ns
Pipeline Latency 7 Cycles
Digital Data Outputs (LVDS Mode)
tDENC to Data Delay CL = 6.8pF (Notes 8, 12) l1.3 1.9 2.5 ns
tCENC to CLKOUT Delay CL = 6.8pF (Notes 8, 12) l1.3 1.9 2.5 ns
tSKEW DATA to CLKOUT Skew tD – tC (Note 8) l–0.3 0 0.3 ns
Pipeline Latency 7 Cycles
SPI Port Timing (Note 8)
tSCK SCK Period Write Mode
Read Back Mode, CSDO = 20pF, RPULLUP = 2k
l
l
40
250
ns
ns
tCSS CS Falling to SCK Rising Setup Time l5 ns
tSCH SCK Rising to CS Rising Hold Time l5 ns
tSCS SCK Falling to CS Falling Setup Time l5 ns
tDS SDI to SCK Rising Setup Time l5 ns
tDH SCK Rising to SDI Hold Time l5 ns
tDO SCK Falling to SDO Valid Read Back Mode, CSDO = 20pF, RPULLUP = 2k l125 ns
LTC2107
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electrical characteristics
timing Diagrams
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All voltage values are with respect to GND and OGND shorted
(unless otherwise noted).
Note 3: When these pin voltages are taken below GND or above VDD, they
will be clamped by internal diodes. This product can handle input currents
of greater than 100mA below GND or above VDD without latchup.
Note 4: When these pin voltages are taken below GND they will be
clamped by internal diodes. When these pin voltages are taken above VDD
they will not be clamped by internal diodes. This product can handle input
currents of greater than 100mA below GND without latchup.
Note 5: VDD = 2.5V, OVDD = 1.8V, fSAMPLE = 210MHz, LVDS outputs,
differential ENC+/ENC = 2VP-P sine wave, input range = 2.4VP-P (PGA = 0)
with differential drive, unless otherwise noted.
Note 6: Integral nonlinearity is defined as the deviation of a code from a
best fit straight line to the transfer curve. The deviation is measured from
the center of the quantization band.
Note 7: Offset error is the offset voltage measured from –0.5LSB when the
output code flickers between 0000 0000 0000 0000 and 1111 1111 1111
1111 in 2’s complement output mode.
Note 8: Guaranteed by design, not subject to test.
Note 9: Recommended operating conditions.
Note 10: Refer to Overflow Bit section for additional information.
Note 11: The test circuit of Figure 11 is used to verify jitter perfomance.
Note 12: CL is the external single-ended load capacitance between each
output pin and ground.
N-7 N-6 N-5 N-4
2107 TD01
ANALOG
INPUT
ENC
ENC+
D0-D15, OF
CLKOUT
CLKOUT+
N
tH
tD
N+1 N+2 N+3 N+4
tAP
tC
tL
CMOS Output Timing Mode
All Outputs Are Single-Ended and Have CMOS Levels
LTC2107
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timing Diagrams
D14
N-7
D15
N-7
N-7 N-6 N-5 N-4
2107 TD02
N-3
D14
N-6
D15
N-6
D15
N-5
D14
N-4
D15
N-4
D14
N-3
D14
N-5
D0
N-7
ANALOG
INPUT
ENC
ENC+
D0_1+
D0_1
D14_15+
D14_15
OF+
OF
CLKOUT
CLKOUT+
D1
N-7
D0
N-6
D1
N-6
D1
N-5
D0
N-4
D1
N-4
D0
N-3
D0
N-5
N
tH
tD
N+1 N+2 N+3 N+4
tC
tL
tAP
Double Data Rate LVDS Output Mode Timing
All Outputs Are Differential and Have LVDS Levels
SPI Timing (Read-Back Mode)
SPI Timing (Write Mode)
D1D2D3D4D5D6D7A0A1A2A6 A5 A4 D0A3
tSCH
tCSS
tSCS
tSCK
CS
SCK
SDI R/W
SDO HIGH IMPEDANCE
tDS
tDH
HIGH
IMPEDANCE
2107 TD03
HIGH IMPEDANCED0D1D2D3D4D5D6D7
XXXXXXX
X
R/WA6 A5 A4 A0A1A2A3
CS
SCK
SDI
SDO
tDO
LTC2107
9
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For more information www.linear.com/LTC2107
typical perFormance characteristics
128k Point FFT, fIN = 5.0MHz,
–1dBFS, PGA = 0, Dither On
128k Point FFT, fIN = 30.6MHz,
–1dBFS, PGA = 0, Dither On
128k Point FFT, 30.6MHz,
–20dBFS, PGA = 0, Dither Off
128k Point FFT, 30.6MHz,–20dBFS,
PGA = 0, Dither On
128k Point 2-Tone FFT,
25.1MHz and 30.51MHz,
–7dBFS PGA = 0, Dither On
128k Point 2-Tone FFT,
25.07MHz and 30.5MHz,
–20dBFS PGA = 0, Dither On
Integral Nonlinearity (INL)
vs Output Code
Differential Nonlinearity (DNL)
vs Output Code AC Grounded Input Histogram
OUTPUT CODE
0
INL ERROR (LSB)
0
1.0
65536
2107 G01
–1.0
–2.0 16384 32768 49152
2.0
–0.5
0.5
–1.5
1.5
OUTPUT CODE
0
DNL ERROR (LSB)
0
0.50
65536
2107 G02
–1.50
–2.00 16384 32768 49152
1.00
–0.25
0.25
–1.75
0.75
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G04
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–140
AMPLITUDE (dBFS)
–120
–100
–80
0
–40
–20
–60
–130
–110
–90
–10
–50
–30
–70
105
2107 G05
FREQUENCY (MHz)
0 15 30 45 60 75 90
–140
AMPLITUDE (dBFS)
–120
–100
–80
0
–40
–20
–60
–130
–110
–90
–10
–50
–30
–70
105
2107 G06
FREQUENCY (MHz)
0 15 30 45 60 75 90
–140
AMPLITUDE (dBFS)
–120
–100
–80
0
–40
–20
–60
–130
–110
–90
–10
–50
–30
–70
105
2107 G07
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G08
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G09
–110
–50
–40
–70
105
OUTPUT CODE
32799
0
COUNT
3333
6667
10000
32809
2107 G03
32819
LTC2107
10
2107fb
For more information www.linear.com/LTC2107
typical perFormance characteristics
128k Point FFT, fIN = 71.1MHz,
–10dBFS, PGA = 0, Dither On
128k Point FFT, fIN = 71.1MHz,
–20dBFS, PGA = 0, Dither On
128k Point FFT, fIN = 71.1MHz,
–20dBFS, PGA = 1, Dither On
SFDR vs Input Level, fIN = 71.1MHz,
PGA = 1, Dither Off
SFDR vs Input Level, fIN = 71.1MHz,
PGA = 1, Dither On
128k Point FFT, fIN = 71.1MHz
and 80MHz, –7dBFS, PGA = 0,
Dither On
SFDR vs Input Level, fIN = 30.6MHz,
PGA = 0, Dither Off
SFDR vs Input Level, fIN = 30.6MHz,
PGA = 0, Dither On
128k Point FFT, fIN = 71.1MHz,
–1dBFS, PGA = 0, Dither On
INPUT LEVEL (dBFS)
–80
SFDR (dBc AND dBFS)
60
120
130
140
–60 –40 –30 –20
2107 G10
40
100
80
50
110
30
90
70
–70 –50 –10 0
dBFS
dBc
INPUT LEVEL (dBFS)
–80
SFDR (dBc AND dBFS)
60
120
130
140
–60 –40 –30 –20
2107 G11
40
100
80
50
110
30
90
70
–70 –50 –10 0
dBFS
dBc
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G12
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G13
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G14
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G15
–110
–50
–40
–70
105
INPUT LEVEL (dBFS)
–80
SFDR (dBc AND dBFS)
60
120
130
140
–60 –40 –30 –20
2107 G16
40
100
80
50
110
30
90
70
–70 –50 –10 0
dBFS
dBc
INPUT LEVEL (dBFS)
–80
SFDR (dBc AND dBFS)
60
120
130
140
–60 –40 –30 –20
2107 G17
40
100
80
50
110
30
90
70
–70 –50 –10 0
dBFS
dBc
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G18
–110
–50
–40
–70
105
LTC2107
11
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typical perFormance characteristics
SFDR vs Input Level, fIN = 141.1MHz,
PGA = 1, Dither Off
SFDR vs Input Level, fIN = 141.1MHz,
PGA = 1, Dither On
64k Point FFT, fIN = 170.0MHz,
–1dBFS, PGA = 1, Dither On
128k Point FFT, fIN = 250.0MHz,
–1dBFS, PGA = 1, Dither On
128k Point FFT, fIN = 250.0MHz,
–10dBFS, PGA = 1, Dither On
128k Point FFT, fIN = 380.0MHz,
–1dBFS, PGA = 1, Dither On
128k Point FFT, fIN = 71.1MHz
and 80MHz, –15dBFS, PGA = 0,
Dither On
64k Point FFT, fIN = 141.1MHz,
–1dBFS, PGA = 0, Dither On
64k Point FFT, fIN = 141.1MHz,
–1dBFS, PGA = 1, Dither On
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G19
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G20
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G21
–110
–50
–40
–70
105
INPUT LEVEL (dBFS)
–80
SFDR (dBc AND dBFS)
60
120
130
140
–60 –40 –30 –20
2107 G22
40
100
80
50
110
30
90
70
–70 –50 –10 0
dBFS
dBc
INPUT LEVEL (dBFS)
–80
SFDR (dBc AND dBFS)
60
120
130
140
–60 –40 –30 –20
2107 G23
40
100
80
50
110
30
90
70
–70 –50 –10 0
dBFS
dBc
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G24
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G25
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G26
–110
–50
–40
–70
105
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G27
–110
–50
–40
–70
105
LTC2107
12
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typical perFormance characteristics
SNR and SFDR vs Sample Rate,
fIN = 5MHz, –1dBFSSNR vs Input Frequency
SNR and SFDR vs Supply Voltage
(VDD), fIN = 5MHz, –1dBFS
IVDD vs Sample Rate, 5MHz Sine
Wave, –1dBFS
Normalized Full Scale vs
Temperature, Internal Reference,
5 Units
Normalized Full Scale vs
Temperature, External Reference,
5 Units
128k Point FFT, fIN = 380.0MHz,
–10dBFS, PGA = 1, Dither On
HD2/HD3 vs Input Frequency,
PGA = 0, –1dBFS
HD2/HD3 vs Input Frequency,
PGA = 1, –1dBFS
FREQUENCY (MHz)
0 15 30 45 60 75 90
–130
AMPLITUDE (dBFS)
–120
–100
–90
–80
–30
–20
–10
0
–60
2107 G28
–110
–50
–40
–70
105
TEMPERATURE (°C)
–40
0.990
NORMALIZED FULL SCALE
0.995
1.000
1.005
1.010
–20 0 20 40
2107 G35
60 80
TEMPERATURE (°C)
–40
0.990
NORMALIZED FULL SCALE
0.995
1.000
1.005
1.010
–20 0 20 40
2107 G36
60 80
INPUT FREQUENCY (MHz)
0
dBFS
100
110
120
200
2107 G29
90
80
70 50 100 150 250
HD3
HD2
INPUT FREQUENCY (MHz)
0
dBFS
100
110
120
200
2107 G30
90
80
70 50 100 150 250
HD3
HD2
INPUT FREQUENCY (MHz)
1
74
SNR (dBFS)
75
76
77
78
79
80
100 200 300 400
2107 G31
500
PGA = 0
PGA = 1
SAMPLE RATE (Msps)
0 30
60
SNR AND SFDR (dBFS)
80
70
60 180
110
100
90
90 120 150 210
2107 G32
SFDR
SNR
SUPPLY VOLTAGE (VDD)
2.3
SNR AND SFDR (dBFS)
90
100
2.7
2107 G33
80
70 2.4 2.5 2.6
110
SFDR
SNR
VDD(MIN) = 2.375V
VDD(MAX) = 2.625V
SAMPLE RATE (Msps)
350
IVDD (mA)
400
450
500
0 30 60 90 120
2107 G34
150 180 210
LTC2107
13
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typical perFormance characteristics
Mid-Scale Settling After Starting
Encode Clock with Keep-Alive On
Mid-Scale Settling After Starting
Encode Clock with Keep-Alive Off
Input Offset Voltage
vs Temperature, 5 Units
SFDR vs Analog Input Common
Mode Voltage, –1dBFS
Mid-Scale Settling After Wake Up
from Shutdown
TEMPERATURE (°C)
–50
–2.0
OFFSET VOLTAGE (mV)
–1.5
–0.5
0
0.5
50
2.5
2107 G37
–1.0
0 100
1.0
1.5
2.0
TIME AFTER WAKE UP FROM SHUTDOWN (µs)
0
–1.0
MID-SCALE ERROR (%)
–0.5
0
0.5
1.0
1.5
2.0
0.5 1.0
2107 G39
TIME AFTER CLOCK RESTART (µs)
0
MID-SCALE ERROR (%)
0
0.05
0.10
0.20
2107 G40
–0.05
–0.10
–0.20 0.05 0.10 0.15
–0.15
0.20
0.15
CLOCK STARTS
HERE
TIME AFTER CLOCK RESTART (µs)
0
MID-SCALE ERROR (%)
0
2107 G41
–0.10
–0.20 0.4 0.8
0.2 0.6 1.0
0.10
0.20
–0.05
–0.15
0.05
0.15
1.2
CLOCK STARTS
HERE
ANALOG INPUT COMMON MODE VOLTAGE (V)
1.1
SFDR (dBFS)
90
100
1.3
80
70 1.15 1.2 1.25
110
MIN MAX
fIN = 141.1MHz, PGA = 1
fIN = 5MHz, PGA = 0
LTC2107
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pin Functions
(Pins That Are the Same for All Digital Output Modes)
SENSE (Pin 1): Reference Programming Pin. The SENSE
pin voltage selects the use of an internal reference or an
external 1.25V reference. Connecting SENSE to ground or
VDD selects the internal reference. Connect SENSE to a
1.25V external reference and the external reference mode
is automatically selected. The external reference must be
1.25V ±25mV for proper operation.
GND (Pins 2, 3, 7, 10, 12, 13, 16, 47, 48, 49): ADC
Power Ground.
VDD (Pins 4, 5, 6): 2.5V Analog Power Supply. Bypass to
ground with an 0402 10µF ceramic capacitor and an 0402
0.1µF ceramic capacitor as close to these pins as possible.
Pins 4, 5 and 6 can share these two bypass capacitors.
AIN+ (Pin 8): Positive Differential Analog Input.
AIN (Pin 9): Negative Differential Analog Input.
VCM (Pin 11): Common Mode Bias Output, Nominally
Equal to 1.2V. VCM should be used to bias the common
mode of the analog inputs. Bypass to ground with a 2.2µF
ceramic capacitor.
ENC+ (Pin 14): Encode Input. Conversion starts on the
rising edge.
ENC (Pin 15): Encode Complement Input. Conversion
starts on the falling edge.
SHDN (Pin 17): Power Shutdown Pin. SHDN = 0V results
in normal operation. SHDN = 2.5V results in powered-
down analog circuitry and the digital outputs are set in
high impedance state.
SDO (Pin 18): In serial programming mode, (PAR/SER =
0V), SDO is the serial interface data output. Data on SDO
is read back from the mode control registers and can be
latched on the falling edge of SCK. SDO is an open-drain
NMOS output that requires an external 2k pull-up resistor
to 1.8V-3.3V. If readback from the mode control registers
is not needed, the pull-up resistor is not necessary and
SDO can be left unconnected.
OGND (Pins 19, 42): Output Driver Ground. OGND and
GND should be tied together with a common ground plane.
OVDD (Pins 20, 41): 1.8V Output Driver Supply. Bypass
each OVDD pin to ground with an 0402 1µF ceramic capaci-
tor and an 0402 0.1µF ceramic capacitor. Place the bypass
capacitors as close to these pins as possible. Pins20 and
41 cannot share these bypass capacitors.
SDI (Pin 43): In serial programming mode, (PAR/SER =
0V), SDI is the serial interface data input. Data on SDI is
clocked into the mode control registers on the rising edge of
SCK. In the parallel programming mode (PAR/SER = VDD),
SDI becomes the digital output randomization control bit.
When SDI is low, digital output randomization is disabled.
When SDI is high, digital output randomization is enabled.
SDI can be driven with 1.8V to 3.3V logic.
SCK (Pin 44): In serial programming mode, (PAR/SER =
0V), SCK is the serial interface clock input. In the parallel
programming mode (PAR/SER = VDD), SCK controls the
programmable gain amplifier front-end, PGA. SCK low
selects a front-end gain of 1, input range of 2.4VP-P. High
selects a front-end gain of 1.5, input range of 1.6VP-P. SCK
can be driven with 1.8V to 3.3V logic.
CS (Pin 45): In serial programming mode, (PAR/SER =
0V), CS is the serial interface chip select input. When
CS is low, SCK is enabled for shifting data on SDI into
the mode control registers. In the parallel programming
mode (PAR/SER = VDD), CS controls the digital output
mode. When CS is low, the full-rate CMOS output mode
is enabled. When CS is high, the double data rate LVDS
output mode (with 3.5mA output current) is enabled. CS
can be driven with 1.8V to 3.3V logic.
PAR/SER (Pin 46): Programming Mode Selection Pin.
Connect to ground to enable the serial programming mode.
CS, SCK, SDI, SDO become a serial interface that control
the A/D operating modes. Connect to VDD to enable the
parallel programming mode where CS, SCK, SDI become
parallel logic inputs that control a reduced set of the A/D
operating modes. PAR/SER should be connected directly
to ground or the VDD of the part and not be driven by a
logic signal.
LTC2107
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pin Functions
Full-Rate CMOS Output Mode
All pins below have CMOS output levels (OGND to OVDD)
CMOS Output Mode is only recommended for sample
rates up to 100Msps.
D0-D15 (Pins 21-30, 33-38): Digital Outputs. D15 is the
MSB.
CLKOUT (Pin 31): Inverted Version of CLKOUT+.
CLKOUT+ (Pin 32): Data Output Clock. The digital outputs
normally transition at the same time as the falling edge
of CLKOUT+. The phase of CLKOUT+ can also be delayed
relative to the digital outputs by programming the mode
control registers.
DNC (Pin 39): Do not connect this pin.
OF (Pin 40): Over/Under Flow Digital Output. OF is high
when an overflow or underflow has occurred.
Double Data Rate LVDS Output Mode
All pins below have LVDS output levels. The output
current level is programmable. There is an optional
internal 100Ω termination resistor between the pins of
each LVDS output pair.
D0_1/D0_1+ to D14_15/D14_15+ (Pins 21/22, 23/24,
25/26, 27/28, 29/30, 33/34, 35/36, 37/38): Double Data
Rate Digital Outputs. Tw o data bits are multiplexed onto
each differential output pair. The even data bits (D0, D2,
D4, D6, D8, D10, D12, D14) appear when CLKOUT+ is low.
The odd data bits (D1, D3, D5, D7, D9, D11, D13, D15)
appear when CLKOUT+ is high.
CLKOUT/CLKOUT+ (Pins 31/32): Data Output Clock.
The digital outputs normally transition at the same time
as the falling and rising edges of CLKOUT+. The phase of
CLKOUT+ can also be delayed relative to the digital outputs
by programming the mode control registers.
OF/OF+ (Pins 39/40): Over/Under Flow Digital Output.
OF+ is high when an overflow or underflow has occurred.
OF is an inverted version of OF+.
LTC2107
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Block Diagram
+
INPUT
S/H
CORRECTION LOGIC
AND
SHIFT REGISTER
OUTPUT
BUFFERS
PIPELINE
ADC
STAGE
6
16 CLKOUT
OGND
2107 F01
D14_15±
D0_1±
1.8V
AIN
AIN+
VCM
BUFFER ADC
REFERENCE
OF
OVDD
2.5V
VDD
GND
ENC+ENC
CLOCK AND
CLOCK CONTROL
PAR/SER SDI SCK CS SDO SHDN
ADC CONTROL/SPI INTERFACE
PIPELINE
ADC
STAGE
5
PIPELINE
ADC
STAGE
4
PIPELINE
ADC
STAGE
3
PIPELINE
ADC
STAGE
2
PIPELINE
ADC
STAGE
1
DITHER
SIGNAL
GENERATOR
INTERNAL
VOLTAGE
REFERENCE
SENSE
RANGE
SELECT
PGA
Figure 1. Functional Block Diagram
applications inFormation
CONVERTER OPERATION
The LTC2107 is a high performance pipelined 16-bit
210Msps A/D converter with a direct sampling PGA front-
end. As shown in Figure 1, the converter has six pipelined
ADC stages; a sampled input will result in a digitized result
seven cycles later (see the Timing Diagrams). The analog
input is differential for improved common mode noise re-
jection, even order harmonic reduction and for maximum
input voltage range. The encode input is also differential
for common mode noise rejection and for optimal jitter
performance. The digital outputs can be CMOS or double
data rate LVDS (to reduce digital noise in the system.)
Many additional features can be chosen by programming
the mode control registers through a serial SPI port.
The LTC2107 has two phases of operation, determined
by the state of the differential ENC+/ENC input pins. For
brevity, the text will refer to ENC+ greater than ENC as
ENC high and ENC+ less than ENC as ENC low.
Successive stages process the signal on a different phase
over the course of seven clock cycles in order to create a
digital representation of the analog input.
When ENC is low, the analog input is sampled differentially,
directly onto the input sample-and-hold (S/H) capacitors,
LTC2107
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applications inFormation
AIN+
LPAR
0.7nH
CPAR
0.66pF
RON
5.6Ω
VDD
LTC2107
1.8Ω
CSAMPLE
5.72pF
AIN
ENC+
LPAR
0.7nH
CPAR
0.66pF
5k
5k
VDD/2
VDD/2
2107 F02
VDD
RON
5.6Ω
VDD
1.8Ω
CSAMPLE
5.72pF
ENC
Figure 2. Equivalent Input Circuit
inside theInput S/H” shown in the Block Diagram. At the
instant the ENC transitions from low to high, the voltage on
the sample capacitors is held. While ENC is high, the held
input voltage is buffered by the S/H amplifier which drives
the first pipelined ADC stage. The first stage acquires the
output of the S/H amplifier during the high phase of ENC.
When ENC goes back low, the first stage produces its
output which is acquired by the second stage. At the same
time, the input S/H goes back to acquiring the next analog
input. When ENC goes back high again, the second stage
produces its output which is acquired by the third stage.
The identical process is repeated for the remaining stages
3-5 finally resulting in an output at the output of the 5th
stage which is sent to the 6th ADC stage for final evaluation.
Results from all stages are digitally delayed such that
stage results are aligned with one analog input sample.
The delayed results from all stages are then combined
in the correction logic and the final result is sent to the
output buffers.
SAMPLE/HOLD OPERATION
Figure 2 shows the equivalent circuit for the LTC2107
direct sampling, differential sample/hold circuit. The dif-
ferential analog inputs, AIN+ and AIN are sampled directly
on to the sampling capacitors (CSAMPLE) through NMOS
transistor switches. The capacitors shown attached to each
input (CPAR) are the summation of all other capacitance
associated with each input, for interconnect and device
parasitics.
During the sample phase, when ENC is low, the NMOS
switches connect the analog inputs to the sampling capaci-
tors, such that they charge to, and track the input voltage.
The capacitance seen at the input during the sample phase
is the sum of CSAMPLE and CPAR or 6.38pF. When ENC
transitions from low to high, the NMOS switches open,
disconnecting the analog inputs from the sampling capaci-
tors. The voltage on the sampling capacitors is held and
is passed to the ADC core for evaluation. The capacitance
seen at the input during the hold phase is CPAR or 0.66pF.
Sampling Glitch
As ENC transitions from high to low, the inputs are re-
connected to the sampling capacitors to acquire a new
sample. Since the sampling capacitors still hold the pre-
vious sample, the analog inputs must supply a charge
that is proportional to the change in voltage between the
current sample and the previous sample. Additionally
there is a fixed charge associated with the turn-on of the
NMOS sampling switches.
Ideally, the input circuitry should be fast enough to fully
charge the sampling capacitor during the sampling period
1/2fENCODE. However, this is not always possible and the
incomplete settling may degrade the SFDR. The sampling
glitch has been designed to be as linear as possible to
minimize the effects of incomplete settling.
LTC2107
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applications inFormation
Particular care has to be taken when driving the ADC with
test equipment involving long BNC cables. Such a situation
can create reflections in the BNC cable which will degrade
SFDR. Connecting a 3dB attenuator pad at the input to the
demo board will help mitigate this problem.
Drive Impedance
As with all high performance, high speed ADCs the dy-
namic performance of the LTC2107 can be influenced by
the input drive circuitry, particularly the second and third
harmonics. Source impedance and input reactance can
influence SFDR. At the falling edge of ENC the sample and
hold circuit will connect the 5.72pF sampling capacitor to
the input pin and start the sampling period. The sampling
period ends when ENC rises, holding the sampled input
on the sampling capacitor.
The analog input drive impedance will affect sampling
bandwidth and settling time. The input impedance of the
LTC2107 is primarily capacitive for frequencies below
1GHz. Higher source impedance will result in slower settling
and lower sampling bandwidth. The sampling bandwidth
is typically 800MHz with a source impedance of 25Ω.
Better SFDR results from lower input impedance. For the
best performance it is recommended to have a source
impedence of 50Ω or less for each input. The source
impedance should be matched for the differential inputs.
Poor matching will result in higher even order harmonics,
especially the second.
PGA Function
The LTC2107 has a programmable gain amplifier sample/
hold circuit. The gain can be controlled through the serial or
parallel modes of operation. PGA = 0 selects a sample/hold
gain of 1 and an input range of 2.4VP-P. PGA = 1 selects a
sample/hold gain of 1.5 and an input range of 1.6VP-P. The
PGA setting allows flexibility for ADC drive optimization.
A lower ADC input signal eases the OIP3 requirements of
the ADC driver circuit.The lower input range of the PGA
= 1 setting is easier to drive and has lower distortion for
high frequency applications. For PGA = 1, SNR is lower by
2.3dB as compared to PGA = 0; however the input referred
noise is improved by 1.2dB.
Table 1. PGA settings
PGA = 0 PGA = 1 UNIT
Input Range 2.4 1.6 VP-P
SNR, Idle Channel 80 77.7 dBFS
Input Referred Noise 85 74 µVRMS
INPUT DRIVE CIRCUITS
The inputs should be driven differentially around a com-
mon mode voltage set by the VCM output pin, which is
nominally 1.2V. For the 2.4V input range, the inputs should
swing from VCM – 0.6V to VCM + 0.6V. There should be
180° phase difference between the inputs.
VCM
2.2µF
1.2V
1.8V
1.2V
0.6V
1.8V
1.2V COMMON
MODE VOLTAGE
SET BY VCM PIN
1.2V
0.6V
AIN+
AIN+
LTC2107
2107 F03
Figure 3. Input Voltage Swings for the 2.4V Input Range
Transformer Coupled Circuits
RF transformers offer a simple, low noise, low power,
and low distortion method for single-ended to differen-
tial conversion, as well as voltage gain and impedance
transformation. Figure 4 shows the analog input being
driven by a transmission line transformer and flux-coupled
transformer combination circuit. The secondary coil of the
flux-coupled transformer is biased with VCM, setting the
A/D input at its optimal DC level. There is always a source
impedance in front of the ADC seen by it’s input pins AIN+
and AIN. Source impedance greater than 50Ω can reduce
the input bandwidth and increase high frequency distor-
tion. A disadvantage of using a transformer is the signal
loss at low frequencies. Most small RF transformers have
poor performance at frequencies below 1MHz.
At higher input frequencies a single transmission line
balun transformer is used (Figures 5 to 6).
LTC2107
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Figure 4. Single-Ended to Differential Conversion Using Tw o Transformers.
Recommended for Input Frequencies from 5MHz to 100MHz
applications inFormation
Figure 5. Single-Ended to Differential Conversion Using Tw o Transformers.
Recommended for Input Frequencies from 100MHz to 250MHz
Figure 6. Single-Ended to Differential Conversion Using One
Transformer. Recommended for Input Frequencies Above
250MHz
VCM
AIN+
2.2µF0.1µF
10pF
0.1µF
WBC1-TLB
0.1µF
ANALOG
INPUT
10Ω
20Ω
200Ω
AIN+
20Ω LTC2107
MABA-007159
-000000
31.6Ω
31.6Ω
2107 F04
VCM
AIN+
2.2µF0.1µF
10pF
0.1µF
0.1µF
ANALOG
INPUT
10Ω
20Ω
200Ω
AIN+
20Ω LTC2107
MABA-007159
-000000
MABA-007159
-000000
31.6Ω
31.6Ω
2107 F05
VCM
AIN+
2.2µF0.1µF
4.7pF
0.1µF
0.1µF
ANALOG
INPUT
10Ω
10Ω
10Ω
AIN+
LTC2107
MABA-007159
-000000
25Ω
25Ω
2107 F06
Dither
The dither function enhances the SFDR performance of
the LTC2107. Dither can be turned on by writing a “1”
to register A1[2]. For brevity, the text will refer to AIN+
– AIN as AIN. The dither function adds a pseudorandom
dither voltage to the sampled analog input at the front of
the ADC, yielding AIN + dither. This signal is converted by
the ADC, yielding AIN + dither in digital format. Dither is
then subtracted, yielding the AIN value at the output of the
ADC in 16 bit resolution. The dither function is invisible to
the user. The input signal range of the ADC is not affected
when dither is turned on.
Reference
The LTC2107 has an internal 1.25V voltage reference.
Connecting SENSE to VDD or GND selects use of the in-
ternal 1.25V reference. The SENSE pin is also the input
for an external 1.25V reference. Figure 7 shows how an
external 1.25V reference voltage or the internal 1.25V
reference can be used. Figure 8 shows how an external
1.25V reference voltage can be configured. Either internal
or external reference will result in an ADC input range of
2.4VP-P with PGA = 0.
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applications inFormation
Encode Input
The signal quality of the differential encode inputs strongly
affects the A/D noise performance. The encode inputs
should be treated as analog signals—do not route them
next to digital traces on the circuit board. Sinusoidal,
PECL, or LVDS encode inputs can be used. The encode
inputs are internally biased to 1.25V through 5k equivalent
resistance. An optional 100Ω termination resistor can be
Figure 12. PECL or LVDS Encode Drive
Figure 11. Sinusoidal Encode Drive
turned on by writing a “1” to control register bit A3[5]. The
encode inputs can be taken up to VDD, and the common
mode range is from 1.1V to 1.5V.
For good jitter performance a high quality, low jitter clock
source should be used. A 2VP-P differential encode signal
is recommended for optimum SNR performance. Refer to
Figure 10 for clock source jitter requirements to achieve
a desired SNR at a given input frequency.
Figure 9. Equivalent Encode Input Circuit
Figure 10. Ideal SNR Versus Analog Input Frequency
and Clock Source Jitter
5k
5k
ENC+
LTC2107
ENC
OPTIONAL 100Ω
TERMINATION
1.25V
VDD DIFFERENTIAL
COMPARATOR
1.25V
2107 F08
ANALOG INPUT FREQUENCY (MHz)
10
55
SNR (dBFS)
60
65
70
75
85
100 1000
2107 F10
80
0fsRMS
50fsRMS
100fsRMS
200fsRMS
ADDITIVE
JITTER
24.9Ω
24.9Ω
2107 F11
0.1µF
10Ω
2VP-P
10Ω
0.1µF
SINEWAVE
INPUT
MABA-007159
-000000
BANDPASS FILTER
(RECOMMENDED
FOR LOW NOISE
APPLICATIONS)
0.1µF
LT2107
ENC+
ENC
2VP-P
0.1µF
CAPACITORS 0402
PACKAGE SIZE
PECL OR
LVDS
CLOCK ENC
2107 F12
0.1µF ENC+
LTC2107
Figure 8. Using an external 1.25V reference.
LTC2107
VCM
SENSE
25k
VDD
LT1634-1.25
2.2µF
0.1µF 2107 F08
Figure 7. Reference Circuit.
INTERNAL
ADC
REFERENCE
TIE SENSE TO 0V OR VDD TO USE
THE INTERNAL 1.25V REFERENCE
TIE SENSE TO A 1.25V REFERENCE
TO USE AN EXTERNAL REFERENCE
REFERENCE
SELECTION
CIRCUIT
1.2V
SENSE
LTC2107
1.25V
VCM BUFFER
2.2µF
2107 F07
1.25V
BANDGAP
REFERENCE
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Figure 13. Functionality of Keep-Alive Oscillator
applications inFormation
Clock Duty Cycle Stabilizer
The clock duty cycle stabilizer (DCS) is a circuit that pro-
duces a 50% duty cycle clock internal to the LTC2107
from a non 50% duty cycle encode input. The clock DCS
is off by default and is enabled by writing a “1” to control
register bit A3[0] (serial programming mode only). When
the DCS is disabled optimum ADC performance is achieved
when the encode signal has a 50%(±5%) duty cycle. When
the optional clock duty cycle stabilizer circuit is enabled,
the encode duty cycle can vary from 30% to 70% and the
duty cycle stabilizer will maintain a constant 50% internal
duty cycle. If the encode signal changes frequency or is
turned off and on again, the duty cycle stabilizer circuit
requires approximately one hundred clock cycles to lock
onto the input clock and maintain a steady state.
For applications where the sample rate needs to be changed
quickly, the clock duty cycle stabilizer can be left disabled.
If the duty cycle stabilizer is disabled, care should be taken
to make the sampling clock have a 50%(±5%) duty cycle.
Keep-Alive Oscillator
There are many circuits on the LTC2107 which depend
on the presence of a clock for refresh purposes, proper
functionality and biasing. However an encode clock may
not be available to the LTC2107 all of the time during
operation.
The keep-alive oscillator ensures the presence of an on-chip
800kHz clock when an encode clock is not active at ENC+/
ENC. The keep-alive oscillator functionality is shown in
Figure 13. The purpose of this function is to enable fast
operation of the ADC when an encode clock does become
active at the ENC+/ENC pins. See the Mid-Scale and Full-
Scale Settling performance plots for evidence of fast ADC
recovery when the ENC+/ENC clock becomes active. The
keep-alive oscillator can be disabled by writing a “1” to
A3[4]. In the event that the keep-alive oscillator is disabled
and a clock is not active at the ENC+/ENC pins there will
be no on-chip clock active. This will also result in elevated
input leakage current on the AIN+/AIN pins.
DIGITAL OUTPUTS
Digital Output Modes
The LTC2107 can operate in two digital output modes:
CMOS mode or double data rate LVDS mode. The output
mode is set by mode control register A4[0] (serial pro-
gramming mode), or by CS (parallel programming mode).
LVDS mode is generally used to reduce digital noise on
the printed circuit board.
TO
ADC
CORE
CLKDET
2107 F13
ENC+
LTC2107
ENC
DIFFERENTIAL
COMPARATOR
CLOCK
DETECTION
CIRCUIT
800kHz
KEEP-ALIVE
OSCILLATOR
LTC2107
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applications inFormation
CMOS Mode
In CMOS mode the 16 digital outputs (D0-D15), overflow
(OF), and the data output clocks (CLKOUT+, CLKOUT
)
have CMOS output levels. The outputs are powered by
OVDD and OGND which are isolated from the A/D core
power and ground.
For good performance the digital outputs should drive
minimal capacitive loads. If the load capacitance is larger
than 5pF a digital buffer should be used.
CMOS mode is not recommended for sampling rates
greater that 100Msps.
Double Data Rate LVDS Mode
In double data rate LVDS mode, two data bits are multi-
plexed and output on each differential output pair. There
are eight LVDS ADC data output pairs: (D0_1+/D0_1
through D14_15+/D14_15). Overflow (OF+/OF) and
the data output clock (CLKOUT+/CLKOUT) each have an
LVDS output pair.
By default the outputs are standard LVDS levels: 3.5mA
output current and a 1.25V output common mode volt-
age. An external 100Ω differential termination resistor
is required for each LVDS output pair. The termination
resistors should be located as close as possible to the
LVDS receiver.
The outputs are powered by OVDD and OGND which are
isolated from the A/D core power and ground. In LVDS
mode, OVDD should be 1.8V.
Programmable LVDS Output Current
In LVDS Mode, the default output driver current is 3.5mA.
This current can be adjusted by serially programming mode
control register A4. Available current levels are 1.75mA,
2.1mA, 2.5mA, 3mA, 3.5mA, 4mA and 4.5mA.
Optional LVDS Driver Internal Termination
In most cases using just an external 100Ω termination
resistor will give excellent LVDS signal integrity. In addi-
tion, an optional internal 100Ω termination resistor can
be enabled by serially programming mode control register
A4[3]. The internal termination helps absorb any reflections
caused by imperfect termination at the receiver. When the
internal termination is enabled, the output driver current
is doubled to maintain the same output voltage swing.
Overflow Bit
The overflow output bit (OF) outputs a logic high when
the analog input is either overranged or underranged. The
overflow bit has the same pipeline latency as the data bits.
In Full-Rate CMOS mode OF is the overflow pin. In DDR
LVDS mode OF/OF+ are the two differential overflow pins.
Sustained over-range or under-range beyond 120% of
full-scale, for more than 20,000 samples may produce
erroneous ADC codes and an extended ADC recovery time.
Phase Shifting the Output Clock
In full rate CMOS mode the data output bits normally
change at the same time as the falling edge of CLKOUT+,
so the rising edge of CLKOUT+ can be used to latch the
output data. In double data rate LVDS mode the data output
bits normally change at the same time as the falling and
rising edges of CLKOUT+. To allow adequate setup and
hold time when latching the data, the CLKOUT+ signal may
need to be phase shifted relative to the data output bits.
Most FPGAs have this feature—this is generally the best
place to adjust the timing.
The LTC2107 can also phase shift the CLKOUT+/CLKOUT
signals by serially programming mode control register
A3[2:1]. The output clock can be shifted by 0°, 45°, 90°,
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applications inFormation
or 135°. To use the phase shifting feature the clock duty
cycle stabilizer must be turned on. Writing a “1” to A3[0]
will invert the polarity of CLKOUT+ and CLKOUT, inde-
pendently of the phase shift. The combination of these two
features enables phase shifts of 45° up to 315° (Figure 14).
DATA FORMAT
Table 2 shows the relationship between the analog input
voltage, the digital data output bits and the over-flow bit.
By default the output data format is offset binary. The 2’s
complement format can be selected by serially program-
ming mode control register A5[0]
PHASE
SHIFT
0 0 0
45° 0 0 0
90° 0 1 0
135° 0 1 1
180°
CLKOUT+
D0-D15, OF
ENC+
1 0 0
225° 1 0 1
270° 1 1 0
315°
2107 F14
1 1 1
CLKINV CLKPHASE1
MODE CONTROL BITS
CLKPHASE0
Figure 14. Phase Shifting CLKOUT
Table 2. Output Codes vs Input Voltage
AIN+ – AIN
(2.4V RANGE) OF
D15 – D0
(OFFSET BINARY)
D15 – D0
(2’S COMPLEMENT)
>1.2000000V
+1.1999634V
+1.1999268V
1
0
0
1111 1111 1111 1111
1111 1111 1111 1111
1111 1111 1111 1110
0111 1111 1111 1111
0111 1111 1111 1111
0111 1111 1111 1110
+0.0000366V
+0.0000000V
–0.0000366V
–0.0000732V
0
0
0
0
1000 0000 0000 0001
1000 0000 0000 0000
0111 1111 1111 1111
0111 1111 1111 1110
0000 0000 0000 0001
0000 0000 0000 0000
1111 1111 1111 1111
1111 1111 1111 1110
–1.1999634V
–1.2000000V
≤–1.200000V
0
0
1
0000 0000 0000 0001
0000 0000 0000 0000
0000 0000 0000 0000
1000 0000 0000 0001
1000 0000 0000 0000
1000 0000 0000 0000
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Digital Output Randomizer
Interference from the A/D digital outputs is sometimes
unavoidable. Digital interference may be from capacitive or
inductive coupling or coupling through the ground plane.
Even a tiny coupling factor can cause unwanted tones
in the ADC output spectrum. By randomizing the digital
output before it is transmitted off chip, these unwanted
tones can be randomized which reduces the unwanted
tone amplitude.
The digital output israndomized” by applying an ex-
clusive-OR logic operation between the LSB and all other
data output bits. To decode, the reverse operation is ap-
plied—an exclusive-OR operation is applied between the
LSB and all other bits. The LSB, OF and CLKOUT outputs
are not affected. The output randomizer is enabled by
serially programming mode control register A5[1].
Alternate Bit Polarity
Another feature that reduces digital feedback on the circuit
board is the alternate bit polarity mode. When this mode is
enabled, all of the odd bits (D1, D3, D5, D7, D9, D11, D13,
D15) are inverted before the output buffers. The even bits
(D0, D2, D4, D6, D8, D10, D12, D14), OF and CLKOUT are
not affected. This can reduce digital currents in the circuit
board ground plane and reduce digital noise, particularly
for very small analog input signals.
When there is a very small signal at the input of the A/D
that is centered around mid-scale, the digital outputs toggle
between mostly 1’s and mostly 0’s. This simultaneous
switching of most of the bits will cause large currents in the
ground plane. By inverting every other bit, the alternate bit
polarity mode makes half of the bits transition high while
half of the bits transition low. To first order, this cancels
current flow in the ground plane, reducing the digital noise.
Figure 15. Functional Equivalent of Digital Output Randomizer
Figure 16. Unrandomizing a Randomized Digital Output Signal
D15
OF
D15
OF
CLKOUT CLKOUT
LTC2107
D14
D14
D2 D2
D1
D0
2107 F15
D1
D0
RANDOMIZER
ON
FPGA
CLKOUT
PC BOARD
OF
D15
D14
D2
D1
D0
2107 F16
LTC2107
LTC2107
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The digital output is decoded at the receiver by inverting
the odd bits (D1, D3, D5, D7, D9, D11, D13, D15). The
alternate bit polarity mode is independent of the digital
output randomizer—either, both or neither function can
be on at the same time. The alternate bit polarity mode is
enabled by serially programming mode control register
A5[2].
Digital Output Test Patterns
To allow in-circuit testing of the digital interface to the
A/D, there are several test modes that force the A/D data
outputs (OF, D15-D0) to known values:
All 1s: All outputs are 1
All 0s: All outputs are 0
Alternating: Outputs change from all 1s to all 0s on alter-
nating samples.
Checkerboard:
Outputs change from 10101010101010101
to 01010101010101010 on alternating samples.
The digital output test patterns are enabled by serially pro-
gramming mode control register A5[5:3]. When enabled,
the Test Patterns override all other formatting modes: 2’s
complement, randomizer, alternate-bit-polarity.
Output Disable
The digital outputs may be disabled by serially program-
ming mode control register A4[2]. All digital outputs in-
cluding OF and CLKOUT are disabled. The high impedance
disabled state is intended for long periods of inactivity—it
is too slow to multiplex a data bus between multiple con-
verters at full speed.
Shutdown Mode
The A/D may be placed in shutdown mode to conserve
power. In shutdown mode the entire A/D converter is
powered down, resulting in 6.4mW power consumption.
Shutdown mode is enabled by mode control register A1[1]
(serial programming mode), or by SHDN (parallel or se-
rial programming mode). The amount of time required to
recover from shutdown is shown in the mid-scale settling
performance plots.
DEVICE PROGRAMMING MODES
The operating modes of the LTC2107 can be programmed
by either a parallel interface or a simple serial interface.
The serial interface has more flexibility and can program
all available modes. The parallel interface is more limited
and can only program some of the more commonly used
modes.
Parallel Programming Mode
To use the parallel programming mode, PAR/SER should be
tied to VDD. The CS, SCK, SDI, and SHDN pins are binary
logic inputs that set certain operating modes. These pins
can be tied to VDD or ground, or driven by 1.8V, 2.5V, or
3.3V CMOS logic. Table 3 shows the modes set by CS,
SCK, SDI and SHDN.
Table 3. Parallel Programming Mode Control Bits
PIN DESCRIPTION
CS Digital Output Mode Control Bit
0 = Full Rate CMOS Digital Output Mode
1 = Double Data Rate (DDR) LVDS Output Modes
SCK Programmable Gain Front-End (PGA) Control Bit
0 = Front-End Gain = 1 (FS = 2.4VP-P)
1 = Front-End Gain = 1.5 (FS = 1.6VP-P)
SDI Digital Output Randomizer Control Bit
0 = Digital Output Randomization Disabled
1 = Digital Output Randomization Enabled
SHDN 0 = Normal Operation
1 = ADC Power Shut Down
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Serial Programming Mode
To use the Serial Programming mode, the PAR/SER pin
should be tied to ground. The CS, SCK, SDI and SDO
pins become the Serial Peripheral Interface (SPI) pins
that program the A/D control registers. Data is written to
a register with a 16-bit serial word. Data can also be read
back from a register to verify its contents.
Serial data transfer starts when CS is taken low. SCK must
be low at the time of the falling edge of CS for proper
operation (see the SPI Timing Diagrams). The data on the
SDI pin is latched at the first 16 rising edges of SCK. Any
SCK rising edges after the first 16 are ignored. The data
transfer ends when CS is taken high again.
The first bit of the 16-bit input word is the R/W bit. The
next 7 bits are the address of the register (A6:A0). The
final 8 bits are the register data (D7:D0). If the R/W bit is
low, the serial data (D7:D0) will be written to the register
set by the address bits (A6:A0).
If the R/W bit is high, data in the register set by the ad-
dress bits (A6:A0) will be read back on the SDO pin (see
the SPI Timing Diagrams). During a read-back command
the register is not updated and data on SDI is ignored.
The SDO pin is an open-drain output that pulls to ground
through a 260Ω resistance. If register data is read back
through SDO, an external 2k pull-up resistor is required.
If serial data is only written and read-back is not needed,
SDO may be left floating and no pull-up resistor is needed.
Table 4 shows a map of the mode control registers.
Software Reset
If serial programming is used, the mode control registers
should be programmed as soon as possible after the power
supplies turn on and are stable. The first serial command
must be a software reset which will reset all register data
bits to logic 0. To perform a software reset, bit A0[7] in
the reset register is written with a logic 1. After the reset
is complete, bit A0[7] is automatically set back to zero.
All serial control bits are set to zero after a reset.
GROUNDING AND BYPASSING
The LTC2107 requires a printed circuit board with a clean
unbroken ground plane. A multilayer board with an internal
ground plane is recommended. Layout for the printed
circuit board should ensure that digital and analog signal
lines are separated as much as possible. In particular, care
should be taken not to run any digital track alongside an
analog signal track or underneath the ADC.
High quality ceramic bypass capacitors should be used at
the VDD, OVDD, and VCM pins. Bypass capacitors must be
located as close to the pins as possible. Size 0402 ceramic
capacitors are recommended for the 0.1µF, 1µF, 2.2µF
and 10µF decoupling capacitors. The traces connecting
the pins and bypass capacitors must be kept short and
should be made as wide as possible.
The analog inputs, encode signals, and digital outputs
should not be routed next to each other. Ground fill and
grounded vias should be used as barriers to isolate these
signals from each other.
HEAT TRANSFER
Most of the heat generated by the LTC2107 is transferred
from the die through the bottom-side exposed pad and
package leads onto the printed circuit board. For good
electrical and thermal performance, the exposed pad must
be soldered to a large grounded pad on the PC board.
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Table 4. Serial Programming Mode Register Map
REGISTER A0: RESET REGISTER (ADDRESS 00h)
D7 D6 D5 D4 D3 D2 D1 D0
RESET X X X X X X X
Bits 7 RESET Software Reset Bit
0 = Not Used
1 = Software Reset. All Mode Control Registers are reset to 00h. This bit is automatically set back to zero after the reset is complete.
The Reset Register is Write Only.
Bits 6-0 Unused Bits. Read back as 0.
REGISTER A1: ADC CONTROL REGISTER (ADDRESS 01h)
D7 D6 D5 D4 D3 D2 D1 D0
X X X X PGA DITH SHDN X
Bits 7-4,0 Unused Bits. Read back as 0.
Bit 3 PGA Programmable Gain Front-End Control Bit
0 = Front-End Gain of 1. Default value at start-up.
1 = Front-End Gain of 1.5
Bit 2 DITH Dither Control Bit
0 = Dither Enabled. Default value at start-up.
1 = Dither Disabled
Bit 1 SHDN ADC Power Shut Down Control Bit
0 = Normal Operation. Default value at start-up.
1 = ADC Power Shut Down
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REGISTER A2: NOT USED (ADDRESS 02h)
D7 D6 D5 D4 D3 D2 D1 D0
XXXXXXXX
Bits 7-0 Unused Bits. Read back as 0.
REGISTER A3: CLOCK CONTROL REGISTER (ADDRESS 03h)
D7 D6 D5 D4 D3 D2 D1 D0
X X Encode Term KAOSC CLKINV CLKPHASE1 CLKPHASE0 DCS
Bits 7-6 Unused Bits. Read back as 0.
Bit 5 100Ω clock encode termination
0 = Clock Encode Termination Off. Default value at start-up.
1 = Clock Encode Termination On.
Bit 4 KAOSC Keep Alive Oscillator Control Bit
0 = Keep Alive Oscillator Enabled. Default value at start-up.
1 = Keep Alive Oscillator Disabled.
Bit 3 CLKINV Output Clock Invert Bit
0 = Normal CLKOUT Polarity (as shown in the timing diagrams). Default value at startup.
1 = Inverted CLKOUT Polarity.
Bits 2-1 CLKPHASE1:CLKPHASE0 Output Clock Phase Delay Bits
00 = No CLKOUT Delay (as shown in the timing diagrams). Default value at start-up.
01 = CLKOUT+/CLKOUT Delayed by 45° (Clock Period × 1/8)
10 = CLKOUT+/CLKOUT Delayed by 90° (Clock Period × 1/4)
11 = CLKOUT+/CLKOUT Delayed by 135° (Clock Period × 3/8)
Note: If the CLKOUT Phase Delay feature is used, the clock duty cycle stabilizer must also be turned on.
Bit 0 DCS Clock Duty Cycle Stabilizer Control Bit
0 = Clock Duty Cycle Stabilizer Off. Default value at start-up.
1 = Clock Duty Cycle Stabilizer On.
applications inFormation
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REGISTER A4: OUTPUT MODE REGISTER (ADDRESS 04h)
D7 D6 D5 D4 D3 D2 D1 D0
X ILVDS2 ILVDS1 ILVDS0 TERMON OUTOFF X LVDS
Bit 7 Unused Bit. Read back as 0.
Bits 6-4 ILVDS2:ILVDS0 LVDS Output Current Control Bits
000 = 3.5mA LVDS Output Driver Current. Default value at start-up.
001 = 4.0mA LVDS Output Driver Current.
010 = 4.5mA LVDS Output Driver Current.
011 = Not Used.
100 = 3.0mA LVDS Output Driver Current.
101 = 2.5mA LVDS Output Driver Current.
110 = 2.1mA LVDS Output Driver Current.
111 = 1.75mA LVDS Output Driver Current.
Bit 3 TERMON LVDS Internal Termination Bit
0 = Internal Termination Off. Default value at start-up.
1 = Internal Termination On. LVDS output driver current is 2× the current set by ILVDS2:ILVDS0
Bit 2 OUTOFF Output Disable Bit
0 = Digital Outputs are Enabled. Default value at start-up.
1 = Digital Outputs are Disabled and Have High Output Impedance.
Bit 1 Unused Bit. Read back as 0.
Bit 0 LVDS Digital Output Mode Control Bit
0 = Double Data Rate LVDS Output Mode. Default value at start-up.
1 = Full-Rate CMOS Output Mode.
applications inFormation
REGISTER A5: DATA FORMAT REGISTER (ADDRESS 05h)
D7 D6 D5 D4 D3 D2 D1 D0
X X OUTTEST2 OUTTEST1 OUTTEST0 ABP RAND TWOSCOMP
Bits 7-6 Unused Bits. Read back as 0.
Bits 5-3 OUTTEST2:OUTTEST0 Digital Output Test Pattern Bits
000 = Digital Output Test Patterns Off. Default value at start-up.
001 = All Digital Outputs = 0.
011 = All Digital Outputs = 1.
101 = Checkerboard Output Pattern. OF, D15-D0 alternate between 10101 0101 0101 0101 and 01010 1010 1010 1010.
111 = Alternating Output Pattern. OF, D15-D0 alternate between 00000 0000 0000 0000 and 11111 1111 1111 1111.
Note: Other bit combinations are not used
Bit 2 ABP Alternate Bit Polarity Mode Control Bit
0 = Alternate Bit Polarity Mode Off. Default value at start-up.
1 = Alternate Bit Polarity Mode On.
Bit 1 RAND Data Output Randomizer Mode Control Bit
0 = Data Output Randomizer Mode Off. Default value at start-up.
1 = Data Output Randomizer Mode On.
Bits 0 TWOSCOMP Tw o ’s Complement Mode Control Bit
0 = Offset Binary Data Format. Default value at start-up.
1 = Tw o ’s Complement Data Format.
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package Description
Please refer to http://www.linear.com/product/LTC2107#packaging for the most recent package drawings.
7.00 ±0.10
(4 SIDES)
NOTE:
1. DRAWING CONFORMS TO JEDEC PACKAGE OUTLINE MO-220 VARIATION (WKKD-2)
2. DRAWING NOT TO SCALE
3. ALL DIMENSIONS ARE IN MILLIMETERS
4. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE
MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.20mm ON ANY SIDE, IF PRESENT
5. EXPOSED PAD SHALL BE SOLDER PLATED
6. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION ON THE TOP AND BOTTOM OF PACKAGE
PIN 1 TOP MARK
(SEE NOTE 6)
PIN 1
CHAMFER
C = 0.35
0.40 ±0.10
4847
1
2
BOTTOM VIEW—EXPOSED PAD
5.50 REF
(4-SIDES)
0.75 ±0.05 R = 0.115
TYP
0.25 ±0.05
0.50 BSC
0.200 REF
0.00 – 0.05
(UK48) QFN 0406 REV C
RECOMMENDED SOLDER PAD PITCH AND DIMENSIONS
APPLY SOLDER MASK TO AREAS THAT ARE NOT SOLDERED
0.70 ±0.05
5.50 REF
(4 SIDES) 6.10 ±0.05 7.50 ±0.05
0.25 ±0.05
0.50 BSC
PACKAGE OUTLINE
5.15 ±0.10
5.15 ±0.10
5.15 ±0.05
5.15 ±0.05
R = 0.10
TYP
UK Package
48-Lead Plastic QFN (7mm × 7mm)
(Reference LTC DWG # 05-08-1704 Rev C)
LTC2107
31
2107fb
For more information www.linear.com/LTC2107
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.
revision history
REV DATE DESCRIPTION PAGE NUMBER
A 08/15 Updated the SPI Port Timing description, diagrams and programming information 6, 8 and 26
B 12/15 Updated Figure 13 21
LTC2107
32
2107fb
For more information www.linear.com/LTC2107
LINEAR TECHNOLOGY CORPORATION 2014
LT 1215 REV B • PRINTED IN USA
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
(408) 432-1900 FAX: (408) 434-0507 www.linear.com/LTC2107
relateD parts
typical application
PART NUMBER DESCRIPTION COMMENTS
High Speed ADCs
LTC2208 16-Bit 130Msps, 3.3V ADC 77.7dB SNR, 100dB SFDR, 1250mW, CMOS/LVDS Outputs,
9mm × 9mm QFN-64
LTC2209 16-Bit 160Msps, 3.3V ADC 77.1dB SNR, 100dB SFDR, 1530mW, CMOS/LVDS Outputs,
9mm × 9mm QFN-64
LTC2217 16-Bit 105Msps, 3.3V ADC 81.6dB SNR, 100dB SFDR, 1190mW, CMOS/LVDS Outputs,
9mm × 9mm QFN-64
LTC2195 16-Bit 125Msps, 1.8V Dual ADC, Ultralow Power 76.8dB SNR, 90dB SFDR, 432mW, Serial LVDS Outputs, 7mm × 8mm QFN-52
LTC2271 16-Bit 20Msps, 1.8V Dual ADC, Ultralow Power 84.1dB SNR, 99dB SFDR, 185mW, Serial LVDS Outputs, 7mm × 8mm QFN-52
Fixed Gain IF Amplifiers/ADC Drivers
LTC6430-15 High Linearity Differential RF/IF Amplifier/ADC Driver 15dB Gain, +50dBm OIP3, 3dB NF at 240MHz, 5V/160mA Supply
Baseband Differential Amplifiers
LTC6409 1.1nV/√Hz Single Supply Differential Amplifier/ADC
Driver 88dB SFDR at 100MHz, AC- or DC-Coupled Inputs, 3mm × 2mm QFN-10
RF Mixers
LTC5551 300MHz to 3.5GHz Ultrahigh Dynamic Range Mixer +36dBm IIP3, 2.4dB Conversion Gain, 0dBm LO Drive, 670mW Total Power
LTC2107 Schematic (Serial Mode)
SENSE
GND
GND
VDD
VDD
VDD
GND
AIN+
AIN
GND
VCM
GND
36
35
34
33
32
31
30
29
28
27
26
25
49
1
2
3
4
5
6
7
8
9
10
11
12
D12_13+
D12_13
D10_11+
D10_11
CLKOUT+
CLKOUT
D8_9+
D8_9
D6_7+
D6_7
D4_5+
D4_5
PAD
GND
ENC+
ENC
GND
SHDN
SDO
OGND
OVDD
D0_1
D0_1+
D2_3
D2_3+
48
47
46
45
44
43
42
41
40
39
38
37
13
14
15
16
17
18
19
20
21
22
23
24
GND
GND
PAR/SER
CS
SCK
SDI
OGND
OVDD
OF+
OF
D14_15+
D14_15
LTC2107
F
F
2.2µF
0.1µF
VDD 10µF
F
SENSE
AIN+
AIN
OVDD
OVDD
2107 TA02
TO µCONTROLLER
OR FPGA
DIGITAL
OUTPUTS
SPI
SIGNALS
ENC+
ENC