LH Series Zener diode Features 1. Low leakage 2. Low zener impedance 3. High reliability 4. Small surface mounting type Applications Voltage stabilization Absolute Maximum Ratings Tj=25 Parameter Symbol Value Unit Power dissipation Pd 500 mW Junction temperature Tj 175 Tstg -55~+175 Storage temperature range Stresses exceeding maximum ratings may damage the device. Maximum ratings are stress ratings only. Functional operation above the recommended operating conditions is not implied. Extended exposure to stresses above the recommended operating conditions may affect device reliability. Electrical Characteristics Tj=25 Type Grade LH 2 A1 A2 A3 B1 B2 B3 C1 C2 C3 Zener Voltage VZ (V) Min 1.6 1.7 1.8 1.9 2.0 2.1 2.2 2.3 2.4 Max 1.8 1.9 2.0 2.1 2.2 2.3 2.4 2.5 2.6 Test Condition IZ (mA) Dynamic Resistance rd () Test Condition Max IZ (mA) Reverse Current IR (A) Test Condition Max VR (V) 5 100 5 25 0.5 5 100 5 5 0.5 Excel Semiconductor www.excel-semi.com FaxBack +86-512-66607370 Rev. 3e, 1-Nov-2006 1/4 LH Series Type Grade LH 3 4 5 6 7 A1 A2 A3 B1 B2 B3 C1 C2 C3 A1 A2 A3 B1 B2 B3 C1 C2 C3 A1 A2 A3 B1 B2 B3 C1 C2 C3 A1 A2 A3 B1 B2 B3 C1 C2 C3 A1 A2 A3 B1 B2 B3 C1 C2 C3 Zener Voltage VZ (V) Min 2.5 2.6 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 3.9 4.0 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 5.0 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 6.0 6.1 6.3 6.4 6.6 6.7 6.9 7.0 7.2 7.3 7.5 Max 2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 3.9 4.0 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 5.0 5.1 5.2 5.3 5.5 5.6 5.7 5.8 5.9 6.0 6.1 6.3 6.4 6.6 6.7 6.9 7.0 7.2 7.3 7.6 7.7 7.9 Test Condition IZ (mA) Dynamic Resistance rd () Test Condition Max IZ (mA) Reverse Current IR (A) Test Condition Max VR (V) 5 100 5 5 0.5 5 100 5 5 1.0 5 100 5 5 1.5 5 40 5 5 2.0 5 15 5 1 3.5 Excel Semiconductor www.excel-semi.com FaxBack +86-512-66607370 Rev. 3e, 1-Nov-2006 2/4 LH Series Type Grade LH 9 11 12 15 16 18 20 22 24 A1 A2 A3 B1 B2 B3 C1 C2 C3 A1 A2 A3 B1 B2 B3 C1 C2 C3 A1 A2 A3 B1 B2 B3 C1 C2 C3 1 2 3 1 2 3 1 2 3 1 2 3 1 2 3 1 2 3 Zener Voltage VZ (V) Min 7.7 7.9 8.1 8.3 8.5 8.7 8.9 9.1 9.3 9.5 9.7 9.9 10.2 10.4 10.7 10.9 11.1 11.4 11.6 11.9 12.2 12.4 12.6 12.9 13.2 13.5 13.8 14.1 14.5 14.9 15.3 15.7 16.3 16.9 17.5 18.1 18.8 19.5 20.2 20.9 21.6 22.3 22.9 23.6 24.3 Max 8.1 8.3 8.5 8.7 8.9 9.1 9.3 9.5 9.7 9.9 10.1 10.3 10.6 10.8 11.1 11.3 11.6 11.9 12.1 12.4 12.7 12.9 13.1 13.4 13.7 14.0 14.3 14.7 15.1 15.5 15.9 16.5 17.1 17.7 18.3 19.0 19.7 20.4 21.1 21.9 22.6 23.3 24.0 24.7 25.5 Test Condition IZ (mA) Dynamic Resistance rd () Test Condition Max IZ (mA) Reverse Current IR (A) Test Condition Max VR (V) 5 20 5 1 5.0 5 25 5 1 7.5 5 35 5 1 9.5 5 40 5 1 11.0 5 45 5 1 12.0 5 55 5 1 13.0 2 60 2 1 15.0 2 65 2 1 17.0 2 70 2 1 19.0 Excel Semiconductor www.excel-semi.com FaxBack +86-512-66607370 Rev. 3e, 1-Nov-2006 3/4 LH Series Type Grade LH 27 30 33 36 1 2 3 1 2 3 1 2 3 1 2 3 Zener Voltage VZ (V) Min 25.2 26.2 27.2 28.2 29.2 30.2 31.2 32.2 33.2 34.2 35.3 36.4 Max 26.6 27.6 28.6 29.6 30.6 31.6 32.6 33.6 34.6 35.7 36.8 38.0 Test Condition IZ (mA) Dynamic Resistance rd () Test Condition Max IZ (mA) Reverse Current IR (A) Test Condition Max VR (V) 2 80 2 1 21.0 2 100 2 1 23.0 2 120 2 1 25.0 2 140 2 1 27.0 Note: 1. Tested with DC. 2. Type No. is as follows: 2A1, 2A2, 36-3. Dimensions in mm 1.50.1 Cathode identification 0.3 3.50.2 Glass Case Mini Melf / SOD-80 JEDEC DO-213 AA Excel Semiconductor www.excel-semi.com FaxBack +86-512-66607370 Rev. 3e, 1-Nov-2006 4/4