Description
New applications for linear output Hall-effect devices, such
as displacement, angular position, and current measurement,
require high accuracy in conjunction with small package size.
The Allegro® A1324, A1325, and A1326 linear Hall-effect
sensor ICs are designed specifically to achieve both goals. This
temperature-stable device is available in a miniature surface
mount package (SOT23W) and an ultra-mini through-hole
single in-line package.
These ratiometric Hall effect sensor ICs provide a voltage
output that is proportional to the applied magnetic field. They
feature a quiescent voltage output of 50% of the supply voltage.
The A1324/25/26 feature factory programmed sensitivities of
5.0 mV/G, 3.125 mV/G, and 2.5 mV/G, respectively.
The features of these linear devices make them ideal for use in
automotive and industrial applications requiring high accuracy,
and are guaranteed through an extended temperature range,
–40°C to 150°C.
Each BiCMOS monolithic circuit integrates a Hall element,
temperature-compensating circuitry to reduce the intrinsic
sensitivity drift of the Hall element, a small-signal high-gain
amplifier, a clamped low-impedance output stage, and a
proprietary dynamic offset cancellation technique.
These devices are available in a 3-pin ultra-mini SIP package
(UA), and a 3-pin surface mount SOT-23 style package (LH). Both
are lead (Pb) free, with 100% matte tin leadframe plating.
A1324-DS, Rev. 1
Features and Benefits
Temperature-stable quiescent output voltage and sensitivity
Output voltage proportional to magnetic flux density
Low-noise output increases accuracy
Precise recoverability after temperature cycling
Ratiometric rail-to-rail output
Wide ambient temperature range: –40°C to 150°C
Immune to mechanical stress
• Solid-state reliability
Enhanced EMC performance for stringent automotive
applications
Low Noise, Linear Hall Ef fect Sensor ICs with Analog Output
Functional Block Diagram
A1324, A1325, and A1326
Packages
Approximate footprint
3-pin SOT23-W
2 mm × 3 mm × 1 mm
(suffix LH)
3-pin ultramini SIP
1.5 mm × 4 mm × 3 mm
(suffix UA)
Trim Control
Sensitivity and
Sensitivity TC Offset
Tuned Filter
GND
VC
V+
C
VOUT
Dynamic Offset
Cancellation
To All Subcircuits
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
2
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Absolute Maximum Ratings
Characteristic Symbol Notes Rating Unit
Forward Supply Voltage VCC 8V
Reverse Supply Voltage VRCC –0.1 V
Forward Output Voltage VOUT 15 V
Reverse Output Voltage VROUT –0.1 V
Output Source Current IOUT(SOURCE) VOUT to GND 2 mA
Output Sink Current IOUT(SINK) VCC to VOUT 10 mA
Operating Ambient Temperature TAL temperature range –40 to 150 ºC
Maximum Junction Temperature TJ(max) 165 ºC
Storage Temperature Tstg –65 to 170 ºC
Terminal List Table
Name Number Function
LH UA
VCC 1 1 Input power supply; tie to GND with
bypass capacitor
VOUT 2 3 Output signal; also used for
programming
GND 3 2 Ground
Selection Guide
Part Number Packing1Package Sensitivity (Typ.)
(mV/G)
A1324LLHLX-T 10 000 pieces per reel 3-pin SOT-23W surface mount 5.000
A1324LUA-T2500 pieces per bag 3-pin ultramini SIP through hole mount
A1325LLHLX-T 10 000 pieces per reel 3-pin SOT-23W surface mount 3.125
A1325LUA-T2500 pieces per bag 3-pin ultramini SIP through hole mount
A1326LLHLX-T 10 000 pieces per reel 3-pin SOT-23W surface mount 2.500
A1326LUA-T2500 pieces per bag 3-pin ultramini SIP through hole mount
1Contact Allegro® for additional packing options.
2Contact factory for availability.
Thermal Characteristics may require derating at maximum conditions, see application information
Characteristic Symbol Test Conditions* Value Unit
Package Thermal Resistance RθJA
Package LH, on 4-layer PCB with copper limited to solder pads 228 ºC/W
Package LH, on 2-layer PCB with 0.463 in.2 of copper area each
side, connected by thermal vias 110 ºC/W
Package UA, on 1-layer PCB with copper limited to solder pads 165 ºC/W
*Additional thermal information available on the Allegro website
231
21
3
Pin-out Diagrams
LH Package UA Package
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
3
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
OPERATING CHARACTERISTICS Valid throughout TA range, CBYPASS = 0.1 μF, VCC = 5 V; unless otherwise noted
Characteristics Symbol Test Conditions Min. Typ. Max. Unit1
Electrical Characteristics
Supply Voltage VCC 4.5 5.0 5.5 V
Supply Current ICC No load on VOUT 6.9 9 mA
Power-On Time2 t
PO TA = 25°C, CL (PROBE) = 10 pF 32 μs
Supply Zener Clamp Voltage VZTA = 25°C, ICC = 12 mA 6 8.3 V
Internal Bandwidth BWiSmall signal, –3 dB 17 kHz
Chopping Frequency3fCTA = 25°C 400 kHz
Output Characteristics
Quiescent Voltage Output VOUT(Q) B = 0 G, TA = 25°C 2.425 2.500 2.575 V
Output Referred Noise VN
A1324, TA = 25°C, CBYPASS = 0.1 μF 7.0 mV(p-p)
A1325, TA = 25°C, CBYPASS = 0.1 μF 4.4 mV(p-p)
A1326, TA = 25°C, CBYPASS = 0.1 μF 3.5 mV(p-p)
Input Referred RMS Noise Density VNRMS
TA = 25°C, CBYPASS = open, no load on VOUT,
f << BWi
1.3 mG/Hz
DC Output Resistance ROUT –< 1– Ω
Output Load Resistance RL
VOUT to VCC 4.7 kΩ
VOUT to GND 4.7 kΩ
Output Load Capacitance CLVOUT to GND 10 nF
Output Saturation Voltage VOUT(sat)HIGH RPULLDOWN = 4.7 kΩ, VCC = 5 V 4.7 V
VOUT(sat)LOW RPULLUP = 4.7 kΩ, VCC = 5 V 0.30 V
Magnetic Characteristics
Sensitivity Sens
A1324, TA = 25°C 4.750 5.000 5.250 mV/G
A1325, TA = 25°C 2.969 3.125 3.281 mV/G
A1326, TA = 25°C 2.375 2.500 2.625 mV/G
Sensitivity Temperature Coefficient TCSens
LH package; programmed at TA = 150°C,
calculated relative to Sens at 25°C 0 %/°C
UA package; programmed at TA = 150°C,
calculated relative to Sens at 25°C 0.03 %/°C
Error Components
Sensitivity Drift at Maximum Ambient
Operating Temperature Sens(TAmax)
LH package; from hot to room temperature –5 5 %
UA package; from hot to room temperature –2.5 7.5 %
Sensitivity Drift at Minimum Ambient
Operating Temperature Sens(TAmin)
LH package; from cold to room temperature –3.5 8.5 %
UA package; from cold to room temperature –6 4 %
Continued on the next page…
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
4
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
OPERATING CHARACTERISTICS (continued) Valid throughout TA range, CBYPASS = 0.1 μF, VCC = 5 V; unless otherwise noted
Characteristics Symbol Test Conditions Min. Typ. Max. Unit1
Error Components (continued)
Quiescent Voltage Output Drift
Through Temperature Range VOUT(Q) Defined in terms of magnetic flux density, B –10 10 G
Linearity Sensitivity Error LinERR –1.5 1.5 %
Symmetry Sensitivity Error SymERR –1.5 1.5 %
Ratiometry Quiescent Voltage
Output Error4RatVOUT(Q)
Throughout guaranteed supply voltage range
(relative to VCC = 5 V) –1.3 1.3 %
Ratiometry Sensitivity Error4RatSens
Throughout guaranteed supply voltage range
(relative to VCC = 5 V), TA = 25°C and 150°C –1.5 1.5 %
Throughout guaranteed supply voltage range
(relative to VCC = 5 V), TA = –40°C –2 2 %
Sensitivity Drift Due to Package
Hysteresis SensPKG TA = 25°C, after temperature cycling ±2 %
11 G (gauss) = 0.1 mT (millitesla).
2See Characteristic Definitions section.
3fC varies up to approximately ±20% over the full operating ambient temperature range and process.
4Percent change from actual value at VCC = 5 V, for a given temperature.
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
5
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Power-On Time When the supply is ramped to its operating
voltage, the device output requires a finite time to react to an
input magnetic field. Power-On Time is defined as the time it
takes for the output voltage to begin responding to an applied
magnetic field after the power supply has reached its minimum
specified operating voltage, VCC(min).
V
+t
VCC
VCC(min.)
VOUT
90% VOUT
0
t1= time at which power supply reaches
minimum specified operating voltage
t2=
time at which output voltage settles
within ±10% of its steady state value
under an applied magnetic field
t1t2
tPO
V
CC
(typ.)
Quiescent Voltage Output In the quiescent state (that is, with
no significant magnetic field: B = 0), the output, VOUT(Q)
, equals
a ratio of the supply voltage, VCC , throughout the entire operat-
ing range of VCC and the ambient temperature, TA .
Quiescent Voltage Output Drift Through Temperature
Range Due to internal component tolerances and thermal con-
siderations, the quiescent voltage output, VOUT(Q)
, may drift from
its nominal value through the operating ambient temperature
range, TA . For purposes of specification, the Quiescent Voltage
Output Drift Through Temperature Range, VOUT(Q) (mV), is
defined as:
VOUT(Q) VOUT(Q)TA VOUT(Q)25°C
=
(1)
Sensitivity The presence of a south-polarity magnetic field
perpendicular to the branded surface of the package increases the
output voltage from its quiescent value toward the supply voltage
rail. The amount of the output voltage increase is proportional
to the magnitude of the magnetic field applied. Conversely, the
application of a north polarity field will decrease the output volt-
age from its quiescent value. This proportionality is specified
as the magnetic sensitivity, Sens (mV/G), of the device and is
defined as:
VOUT(B+) VOUT(B–)
B(+) – B(–)
Sens =(2)
where B(+) and B(–) are two magnetic fields with opposite
polarities.
Sensitivity Temperature Coefficient The device sensitivity
changes with temperature, with respect to its sensitivity tem-
perature coefficient, TCSENS
. TCSENS is programmed at 150°C,
and calculated relative to the nominal sensitivity programming
temperature of 25°C. TCSENS (%/°C) is defined as:
SensT2 – SensT1
SensT1 T2–T1
1
TCSens =×
100%
(3)
where T1 is the nominal Sens programming temperature of 25°C,
and T2 is the TCSENS programming temperature of 150°C.
The ideal value of sensitivity through the temperature range,
SensIDEAL(TA), is defined as:
SensT1 × (100% + TCSENS(TA –T1) )
S
ensIDEAL(TA) =(4)
Sensitivity Drift Through Temperature Range Second
order sensitivity temperature coefficient effects cause the mag-
netic sensitivity to drift from its ideal value through the operating
ambient temperature, TA. For purposes of specification, the sensi-
tivity drift through temperature range, SensTC
, is defined as:
SensTA – SensIDEAL(TA)
SensIDEAL(TA)
SensTC =×
100% (5)
Sensitivity Drift Due to Package Hysteresis Package
stress and relaxation can cause the device sensitivity at TA = 25°C
to change during or after temperature cycling. This change in
sensitivity follows a hysteresis curve.
For purposes of specification, the Sensitivity Drift Due to Pack-
age Hysteresis, SensPKG , is defined as:
Sens(25°C)2 – Sens(25°C)1
Sens(25°C)1
SensPKG =×
100% (6)
where Sens(25°C)1 is the programmed value of sensitivity at
Characteristic Definitions
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
6
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
TA = 25°C, and Sens(25°C)1 is the value of sensitivity at TA = 25°C
after temperature cycling TA up to 150°C, down to –40°C, and
back to up 25°C.
Linearity Sensitivity Error The 132x is designed to provide
linear output in response to a ramping applied magnetic field.
Consider two magnetic fields, B1 and B2. Ideally the sensitivity
of a device is the same for both fields for a given supply voltage
and temperature. Linearity sensitivity error is present when there
is a difference between the sensitivities measured at B1 and B2.
Linearity Sensitivity Error is calculated separately for the positive
(LINERR+) and negative (LINERR–
) applied magnetic fields. Lin-
earity Sensitivity Error (%) is measured and defined as:
SensB(++)
SensB(+)
1–
LinERR+ =×
100%
SensB(– –)
SensB(–)
1–
LinERR– =×
100%
(7)
and
LinERR = max(| LinERR+| , |LinERR–| ) (8)
where:
|VOUT(Bx) VOUT(Q)|
BX
SensBx =
(9)
and B(++), B(+), B(– –), and B(–) are positive and negative mag-
netic fields with respect to the quiescent voltage output such that
|B(++)| > |B(+)| and |B(– –)| > |B(– )| .
Symmetry Sensitivity Error The magnetic sensitivity of a
device is constant for any two applied magnetic fields of equal
magnitude and opposite polarities.
Symmetry Error (%), is measured and defined as:
SensB(+)
SensB(–)
1–
SymERR =×
100%
(11)
where SensBx is defined as in equation 9, and B(+), B(–) are posi-
tive and negative magnetic fields such that |B(+)| = |B(–)|.
Ratiometry Error The A132x features a ratiometric output.
This means that the quiescent voltage output, VOUT(Q)
, magnetic
sensitivity, Sens, and clamp voltages, VCLPHIGH and VCLPLOW
,
are proportional to the supply voltage, VCC. In other words, when
the supply voltage increases or decreases by a certain percent-
age, each characteristic also increases or decreases by the same
percentage. Error is the difference between the measured change
in the supply voltage, relative to 5 V, and the measured change in
each characteristic.
The ratiometric error in quiescent voltage output, RatVOUT(Q)
(%), for a given supply voltage, VCC, is defined as:
VOUT(Q)VCC cVOUT(Q)5V
VCC c V
1–
RatVOUT(Q) =×
100%
(12)
The ratiometric error in magnetic sensitivity, RatSENS (%), for a
given supply voltage, VCC, is defined as:
SensVCC cSens5V
VCC cV
1–
RatVOUT(Q) =×
100%
(13)
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
7
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Typical Characteristics
(30 pieces, 3 fabrication lots)
4
5
6
7
8
9
10
11
12
I
CCav (mA)
Average Supply Current versus Ambient Temperature
VCC = 5 V
Average Postive Linearity versus Ambient Temperature
VCC = 5 V
Average Sensitivity Ratiometry versus Ambient TemperatureAverage Quiescent Voltage Output Ratiometry versus Ambient Temperature
Average Negative Linearity versus Ambient Temperature
VCC = 5 V
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
95
96
97
98
99
100
101
102
103
104
105
Lin+
av
(%)
95
96
97
98
99
100
101
102
103
104
105
Lin–
av
(%)
RatSens(
av)
(%)
99.0
99.2
99.4
99.6
99.8
100.0
100.2
100.4
100.6
100.8
101.0
98.0
98.5
99.0
99.5
100.0
100.5
101.0
101.5
102.0
Rat
VOUTQ(
av)
(%)
5.5 to 5.0 V
V
CC
4.5 to 5.0 V
5.5 to 5.0 V
V
CC
4.5 to 5.0 V
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
8
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Typical Characteristics, continued
(30 pieces, 3 fabrication lots)
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
–40 25 150
T
A
(°C)
2.425
2.445
2.465
2.485
2.505
2.525
2.545
2.565
V
OUT(Q)av
(G)
V
OUT(Q)
(V)
V
OUT(Q)av
(V)
2.0
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
Sens
av
(mV/G)
Sens
av
(mV/G)
2.0
2.5
1.0
1.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
Sens
av
(%)
-10
-8
-6
-4
-2
0
2
4
6
8
10
-10
-8
-6
-4
-2
0
2
4
6
8
10
4.5 5
V
CC
(V)
5.5
4.5 5
V
CC
(V)
5.5
Average Absolute Quiescent Voltage Output versus Ambient Temperature
VCC = 5 V
Quiescent Voltage Output versus Supply Voltage
TA = 25°C
Average Sensitivity versus Supply Voltage
TA = 25°C
Average Absolute Sensitivity versus Ambient Temperature
VCC = 5 V
Average Quiescent Voltage Output Drift versus Ambient Temperature
VOUT(Q)av values relative to 25°C, VCC = 5 V
Average Sensitivity Drift versus Ambient Temperature
Sensav values relative to 25°C, VCC = 5 V
A1324
A1325
A1326
A1324
A1325
A1326
A1324
A1325
A1326
A1324
A1325
A1326
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
9
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Amp
Regulator
Clock/Logic
Hall Element
Tuned
Filter
Anti-Aliasing
LP Filter
Concept of Chopper Stabilization Technique
Typical Application Circuit
Chopper Stabilization Technique
When using Hall-effect technology, a limiting factor for
switchpoint accuracy is the small signal voltage developed across
the Hall element. This voltage is disproportionally small relative
to the offset that can be produced at the output of the Hall IC.
This makes it difficult to process the signal while maintaining an
accurate, reliable output over the specified operating temperature
and voltage ranges. Chopper stabilization is a unique approach
used to minimize Hall offset on the chip. Allegro employs a
patented technique to remove key sources of the output drift
induced by thermal and mechanical stresses. This offset reduc-
tion technique is based on a signal modulation-demodulation
process. The undesired offset signal is separated from the
magnetic field-induced signal in the frequency domain, through
modulation. The subsequent demodulation acts as a modulation
process for the offset, causing the magnetic field-induced signal
to recover its original spectrum at baseband, while the DC offset
becomes a high-frequency signal. The magnetic-sourced signal
then can pass through a low-pass filter, while the modulated DC
offset is suppressed. In addition to the removal of the thermal and
stress related offset, this novel technique also reduces the amount
of thermal noise in the Hall IC while completely removing the
modulated residue resulting from the chopper operation. The
chopper stabilization technique uses a high frequency sampling
clock. For demodulation process, a sample-and-hold technique
is used. This high-frequency operation allows a greater sampling
rate, which results in higher accuracy and faster signal-processing
capability. This approach desensitizes the chip to the effects
of thermal and mechanical stresses, and produces devices that
have extremely stable quiescent Hall output voltages and precise
recoverability after temperature cycling. This technique is made
possible through the use of a BiCMOS process, which allows the
use of low-offset, low-noise amplifiers in combination with high-
density logic integration and sample-and-hold circuits.
GND
1[1]
3[2]
Pin numbers in brackets
refer to the UA package
2[3]
VOUT
VOUT
A132x
VCC
V+
0.1 μF
CBYPASS
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
10
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Package LH, 3-Pin SOT23W
0.55 REF
Gauge Plane
Seating Plane
0.25 BSC
0.95 BSC
0.95
1.00
0.70 2.40
2
1
AActive Area Depth, 0.28 mm REF
B
C
C
B
Reference land pattern layout
All pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary
to meet application process requirements and PCB layout tolerances
Branding scale and appearance at supplier discretion
A
PCB Layout Reference View
Standard Branding Reference View
1
Branded Face
N = Last three digits of device part number
NNN
2.90 +0.10
–0.20
+4°
–0°
8X 10° REF
0.180+0.020
–0.053
0.05 +0.10
–0.05
0.25 MIN
1.91 +0.19
–0.06
2.98 +0.12
–0.08
1.00 ±0.13
0.40 ±0.10
For Reference Only; not for tooling use (reference DWG-2840)
Dimensions in millimeters
Dimensions exclusive of mold flash, gate burrs, and dambar protrusions
Exact case and lead configuration at supplier discretion within limits shown
DHall element, not to scale
D
D
D
1.49
0.96
3
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
11
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Package UA, 3-Pin SIP
231
1.02
MAX
45°
45°
C
1.52 ±0.05
B
Gate and tie bar burr area
A
B
C
Dambar removal protrusion (6X)
A
D
E
D
E
E
1.44 NOM
2.05 NOM
E
Active Area Depth, 0.50 mm REF
Branding scale and appearance at supplier discretion
Hall element (not to scale)
For Reference Only; not for tooling use (reference DWG-9065)
Dimensions in millimeters
Dimensions exclusive of mold flash, gate burrs, and dambar protrusi
o
Exact case and lead configuration at supplier discretion within limits
s
Standard Branding Reference View
NNN
1
Mold Ejector
Pin Indent
= Supplier emblem
N = Last three digits of device part number
0.41 +0.03
–0.06
0.43 +0.05
–0.07
14.99 ±0.25
4.09 +0.08
–0.05
3.02 +0.08
–0.05
0.79 REF
10°
Branded
Face
Linear Hall Ef fect Sensor ICs with Analog Output
A1324, A1325,
and A1326
12
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Copyright ©2010-2011, Allegro MicroSystems, Inc.
Allegro MicroSystems, Inc. reserves the right to make, from time to time, such de par tures from the detail spec i fi ca tions as may be required to per-
mit improvements in the per for mance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the
information being relied upon is current.
Allegro’s products are not to be used in life support devices or systems, if a failure of an Allegro product can reasonably be expected to cause the
failure of that life support device or system, or to affect the safety or effectiveness of that device or system.
The in for ma tion in clud ed herein is believed to be ac cu rate and reliable. How ev er, Allegro MicroSystems, Inc. assumes no re spon si bil i ty for its use;
nor for any in fringe ment of patents or other rights of third parties which may result from its use.
For the latest version of this document, visit our website:
www.allegromicro.com
Revision History
Revision Revision Date Description of Revision
Rev. 1 October 11, 2011 Update Sensitivity specifications