100324QI - National Semiconductor

TL/F/9878

100324 Low Power Hex TTL-to-ECL Translator

July 1992

100324

Low Power Hex TTL-to-ECL Translator

General Description

The 100324 is a hex translator, designed to convert TTL

logic levels to 100K ECL logic levels. The inputs are com-

patible with standard or Schottky TTL. A common Enable

(E), when LOW, holds all inverting outputs HIGH and holds

all true outputs LOW. The differential outputs allow each

circuit to be used as an inverting/non-inverting translator, or

as a differential line driver. The output levels are voltage

compensated over the full b4.2V to b5.7V range.

When the circuit is used in the differential mode, the

100324, due to its high common mode rejection, overcomes

voltage gradients between the TTL and ECL ground sys-

tems. The VEE and VTTL power may be applied in either

order.

The 100324 is pin and function compatible with the 100124

with similar AC performance, but features power dissi-

pation roughly half of the 100124 to ease system cooling

requirements.

Features

YPin/function compatible with 100124

YMeets 100124 AC specifications

Y50% power reduction of the 100124

YDifferential outputs

Y2000V ESD protection

Yb4.2V to b5.7V operating range

YAvailable to MIL-STD-883

YAvailable to industrial grade temperature range

Logic Diagram

TL/F/9878–4

Pin Names Description

D0–D5Data Inputs

E Enable Input

Q0–Q5Data Outputs

Q0–Q5Complementary

Data Outputs

Connection Diagrams

24-Pin DIP/SOIC

TL/F/9878–1

28-Pin PCC

TL/F/9878–3

24-Pin Quad Cerpak

TL/F/9878–2

C1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.

Absolute Maximum Ratings

Above which the useful life may be impaired. (Note 1)

If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales

Office/Distributors for availability and specifications.

Storage Temperature (TSTG)b65§Ctoa

150§C

Maximum Junction Temperature (TJ)

Ceramic a175§C

Plastic a150§C

VEE Pin Potential to Ground Pin b7.0V to a0.5V

VTTL Pin Potential to Ground Pin b0.5V to a6.0V

Input Voltage (DC) b0.5V to a6.0V

Output Current (DC Output HIGH) b50 mA

ESD (Note 2) t2000V

Note 1: Absolute maximum ratings are those values beyond which the de-

vice may be damaged or have its useful life impaired. Functional operation

under these conditions is not implied.

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

Recommended Operating

Conditions

Case Temperature (TC)

Commercial 0§Ctoa

85§C

Industrial b40§Ctoa

85§C

Military b55§Ctoa

125§C

Supply Voltage (VEE)b5.7V to b4.2V

Commercial Version

DC Electrical Characteristics

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, TCe0§Ctoa

85§C (Note 3), VTTL ea

4.5V to a5.5V

Symbol Parameter Min Typ Max Units Conditions

VOH Output HIGH Voltage b1025 b955 b870 mV VIN eVIH (Max) Loading with

VOL Output LOW Voltage b1830 b1705 b1620 or VIL (Min) 50Xto b2.0V

VOHC Output HIGH Voltage b1035 mV VIN eVIH(Min) Loading with

VOLC Output LOW Voltage b1610 or VIL (Max) 50Xto b2.0V

VIH Input HIGH Voltage 2.0 5.0 V Guaranteed HIGH

Signal for All Inputs

VIL Input LOW Voltage 0 0.8 V Guaranteed LOW

Signal for All Inputs

VCD Input Clamp Diode Voltage b1.2 V IIN eb

18 mA

IIH Input HIGH Current VIN ea

2.4V,

Data 20 mA All Other Inputs VIN eGND

Enable 120

Input HIGH Current 1.0 mA VIN ea

5.5V,

Breakdown Test, All Inputs All Other Inputs eGND

IIL Input LOW Current VIN ea

0.4V,

Data b0.9 mA All Other Inputs VIN eVIH

Enable b5.4

IEE VEE Power Supply Current b70 b45 b22 mA All Inputs VIN ea

4.0V

ITTL VTTL Power Supply Current 25 38 mA All Inputs VIN eGND

Note 3: The specified limits represent the ‘‘worst case’’ value for the parameter. Since these values normally occur at the temperature extremes, additional noise

immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to

guarantee operation under ‘‘worst case’’ conditions.

Commercial Version (Continued)

DIP AC Electric Characteristics

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, VTTL ea

4.5V to a5.5V

Symbol Parameter TCe0§CT

25§CT

85§CUnits Conditions

Min Max Min Max Min Max

tPLH Propagation Delay 0.50 3.00 0.50 2.90 0.50 3.00 ns

tPHL Data and Enable to Output

Figures 1

and

tTLH Transition Time 0.45 1.80 0.45 1.80 0.45 1.80 ns

tTHL 20% to 80%, 80% to 20%

SOIC, PCC and Cerpak AC Electrical Characteristics

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, VTTL ea

4.5V to a5.5V

Symbol Parameter TCe0§CT

25§CT

85§CUnits Conditions

Min Max Min Max Min Max

tPLH Propagation Delay 0.50 2.80 0.50 2.70 0.50 2.80 ns

tPHL Data and Enable to Output

Figures 1

and

tTLH Transition Time 0.45 1.70 0.45 1.70 0.45 1.70 ns

tTHL 20% to 80%, 80% to 20%

tOSHL Maximum Skew Common Edge PCC Only

Output-to-Output Variation 0.95 0.95 0.95 ns (Note 1)

Data to Output Path

tOSLH Maximum Skew Common Edge PCC Only

Output-to-Output Variation 0.70 0.70 0.70 ns (Note 1)

Data to Output Path

tOST Maximum Skew Opposite Edge PCC Only

Output-to-Output Variation 1.60 1.60 1.60 ns (Note 1)

Data to Output Path

tPS Maximum Skew PCC Only

Pin (Signal) Transition Variation 1.20 1.20 1.20 ns (Note 1)

Data to Output Path

Note 1: Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same packaged

device. The specifications apply to any outputs switching in the same direction either HIGH to LOW (tOSHL), or LOW to HIGH (tOSLH), or in opposite directions both

HL and LH (tOST). Parameters tOST and tPS guaranteed by design.

Industrial Version

PCC DC Electrical Characteristics (Note)

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, TCeb

40§Ctoa

85§C, VTTL ea

4.5V to a5.5V

Symbol Parameter TCeb

40§CT

Ctoa

85§CUnits Conditions

Min Max Min Max

VOH Output HIGH Voltage b1085 b870 b1025 b870 mV VIN eVIH (Max) Loading with

VOL Output LOW Voltage b1830 b1575 b1830 b1620 or VIL (Min) 50Xto b2.0V

VOHC Output HIGH Voltage b1095 b1035 mV VIN eVIH(Min) Loading with

VOLC Output LOW Voltage b1565 b1610 or VIL (Max) 50Xto b2.0V

VIH Input HIGH Voltage 2.0 5.0 2.0 5.0 V Guaranteed HIGH

Signal for All Inputs

VIL Input LOW Voltage 0 0.8 0 0.8 V Guaranteed LOW

Signal for All Inputs

VCD Input Clamp Diode Voltage b1.2 b1.2 V IIN eb

18 mA

IIH Input HIGH Current VIN ea

2.4V,

Data 20 20 mA All Other Inputs VIN eGND

Enable 120 120

Input HIGH Current 1.0 1.0 mA VIN ea

5.5V,

Breakdown Test, All Inputs All Other Inputs eGND

IIL Input LOW Current VIN ea

0.4V,

Data b0.9 b0.9 mA All Other Inputs VIN eVIH

Enable b5.4 b5.4

IEE VEE Power Supply Current b70 b22 b70 b22 mA All Inputs VIN ea

4.0V

ITTL VTTL Power Supply Current 38 38 mA All Inputs VIN eGND

Note: The specified limits represent the ‘‘worst case’’ value for the parameter. Since these values normally occur at the temperature extremes, additional noise

immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to

guarantee operation under ‘‘worst case’’ conditions.

PCC AC Electrical Characteristics

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, VTTL ea

4.5V to a5.5V

Symbol Parameter TCeb

40§CT

25§CT

85§CUnits Conditions

Min Max Min Max Min Max

tPLH Propagation Delay 0.50 2.80 0.50 2.70 0.50 2.80 ns

Figures 1

and

tPHL Data and Enable to Output

tTLH Transition Times 0.35 1.80 0.45 1.70 0.45 1.70 ns

Figures 1

and

tTHL 20% to 80%, 80% to 20%

Military Version

DC Electrical Characteristics

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, TCeb

55§Ctoa

125§C, VTTL ea

4.5V to a5.5V

Symbol Parameter Min Max Units TCConditions Notes

VOH Output HIGH Voltage b1025 b870 mV 0§Ctoa

125§C

VIN eVIH (Max)

or VIL (Min) 50Xto b2.0V

Loading with 1, 2, 3

b1085 b870 mV b55§C

VOL Output LOW Voltage b1830 b1620 mV 0§Ctoa

125§C

b1830 b1555 mV b55§C

VOHC Output HIGH Voltage b1035 mV 0§Ctoa

125§C

VIN eVIH (Max)

or VIL (Min) 50Xto b2.0V

Loading with 1, 2, 3

b1085 mV b55§C

VOLC Output LOW Voltage b1610 mV 0§Ctoa

125§C

b1555 mV b55§C

VIH Input HIGH Voltage 2.0 5.0 V b55§Ctoa

125§C Over VTTL,V

EE,T

CRange 1, 2, 3, 4

VIL Input LOW Voltage 0.0 0.8 V b55§Ctoa

125§C Over VTTL,V

EE,T

CRange 1, 2, 3, 4

IIH Input HIGH Current 20 mAb55§Ctoa

125§CV

IN ea

2.7V 1, 2, 3

Breakdown Test 100 mAb55§Ctoa

125§CV

IN ea

7.0V

IIL Input LOW Current

Data b0.9 mA b55§Ctoa

125§CV

IN ea

0.4V 1, 2, 3

Enable b5.4

VFCD Input Clamp b1.2 V b55§Ctoa

125§CIIN eb

18 mA 1, 2, 3

Diode Voltage

IEE VEE Power b70 b22 mA b55§Ctoa

125§CAll Inputs VIN ea

4.0V 1, 2, 3

Supply Current

ITTL VTTL Power 38 mA b55§Ctoa

125§CAll Inputs VIN eGND 1, 2, 3

Supply Current

Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b55§C), then testing

immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides ‘‘cold start’’ specs which can be

considered a worst case condition at cold temperatures.

Note 2: Screen tested 100% on each device at b55§C, a25§C, and a125§C, Subgroups 1, 2, 3, 7, and 8.

Note 3: Sample tested (Method 5005, Table I) on each manufactured lot at b55§C, a25§C, and a125§C, Subgroups A1, 2, 3, 7, and 8.

Note 4: Guaranteed by applying specified input condition and testing VOH/VOL.

AC Electrical Characteristics

VEE eb

4.2V to b5.7V, VCC eVCCA eGND, VTTL ea

4.5V to a5.5V

Symbol Parameter TCeb

55§CT

25§CT

125§CUnits Conditions Notes

Min Max Min Max Min Max

tPLH Propagation Delay 0.50 3.00 0.50 2.90 0.30 3.30 ns 1, 2, 3,

tPHL Data and Enable to Output

Figures 1

and

tTLH Transition Time 0.35 1.80 0.45 1.80 0.45 1.80 ns 4

tTHL 20% to 80%, 80% to 20%

Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b55§C), then testing

immediately after power-up. This provides ‘‘cold start’’ specs which can be considered a worst case condition at cold temperatures.

Note 2: Screen tested 100% on each device at a25§C temperature only, Subgroup A9.

Note 3: Sample tested (Method 5005, Table I) on each manufactured lot at a25§C, Subgroup A9, and at a125§C and b55§C temperatures, Subgroups A10 and

A11.

Note 4: Not tested at a25§C, a125§C, and b55§C temperature (design characterization data).

Switching Waveform

TL/F/9878–6

FIGURE 1. Propagation Delay and Transition Times

Test Circuit

TL/F/9878–5

FIGURE 2. AC Test Circuit

Notes:

VCC,V

CCA e0V, VEE eb

4.5V, VTTL ea

5.0V, VIH ea

3.0V

L1, L2 and L3 eequal length 50Ximpedance lines

RTe50Xterminator internal to scope

Decoupling 0.1 mF from GND to VCC,V

EE and VTTL

All unused outputs are loaded with 50Xto b2V or with equivalent ECL terminator network

CLeFixture and stray capacitance s3pF

Ordering Information

The device number is used to form part of a simplified purchasing code where a package type and temperature range are

defined as follows:

100324 D C QB

Device Type (Basic) Special Variation

QB eMilitary grade device with

Package Code environmental and burn-in processing

DeCeramic DIP shipped in tubes

FeQuad Cerpak

PePlastic DIP Temperature Range

QePlastic Leaded Chip Carrier (PCC) C eCommercial (0§Ctoa

85§C)

SeSmall Outline (SOIC) I eIndustry (b40§Ctoa

85§C) (PCC Only)

MeMilitary (b55§Ctoa

125§C)

Physical Dimensions inches (millimeters)

24-Lead Ceramic Dual-In-Line Package (0.400×Wide) (D)

NS Package Number J24E

24-Lead Molded Package (0.300×Wide) (S)

NS Package Number M24B

Physical Dimensions inches (millimeters) (Continued)

24-Lead Plastic Dual-In-Line Package (P)

NS Package Number N24E

28-Lead Plastic Chip Carrier (Q)

NS Package Number V28A

100324 Low Power Hex TTL-to-ECL Translator

Physical Dimensions inches (millimeters) (Continued) Lit. Ý103900

24 Lead Quad Cerpak (F)

NS Package Number W24B

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into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life

failure to perform, when properly used in accordance support device or system, or to affect its safety or

with instructions for use provided in the labeling, can effectiveness.

be reasonably expected to result in a significant injury

to the user.

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