CY74FCT2245T
2
Maximum Ratings[2,3]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–65°C to +135°C
Supply Volta ge to Ground Potential.. ............. –0.5V to +7.0V
DC Input Voltage............................................ –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin).......120 mA
Power Dissipation. ...................... ............................. ......0.5W
Static Discharge Voltage ...........................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range Range Ambient
Temperature VCC
Commercial DT 0°C to +70°C 5V ± 5%
Commercial T, AT, CT –40°C to +85°C 5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VOH Output HIGH Voltage VCC=Min., IOH=–15 mA Com’l 2.4 3.3 V
VOL Output LOW Voltage VCC=Min., IOL=12 mA Com’l 0.3 0.55 V
ROUT Outp ut Resistance VCC=Min., IOL=12 mA Com’l 20 25 40 Ω
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHHysteresis[6] All inputs 0.2 V
VIK Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V
IIInpu t HIGH Current VCC=Max., VIN=VCC 5µA
IIH Input HIGH Current VCC=Max., VIN=2.7V ±1µA
IIL Input LOW Current VCC=Max., VIN=0.5V ±1µA
IOS Output Short Circuit Current[7] VCC=Max., VOUT=0.0V –60 –120 –225 mA
IOFF Power-Off Disable VCC=0V, VOUT=4.5V ±1µA
Capacitance[6]
Parameter Description Test Condit ions Typ.[5] Max. Unit
CIN Input Capacitance 5 10 pF
COUT Outp ut Capacitance 9 12 pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logi c voltage level, pre ferably either VCC or ground.
4. TA is the “instant on” case temperature.
5. Typical values are at VCC=5.0V, TA=+25°C ambient.
6. This parameter is guaranteed but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable i n order to minimize internal chip heating and more accurately reflect operational values . Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last .