Lower Power 3.3V CMOS Fast SRAM 256K (32K x 8-Bit) Features IDT71V256SA Description Ideal for high-performance processor secondary cache Commercial (0C to +70C) and Industrial (-40C to +85C) temperature range options Fast access times: - Commercial and Industrial: 10/12/15/20ns Low standby current (maximum): - 2mA full standby Small packages for space-efficient layouts: - 28-pin 300 mil SOJ - 28-pin TSOP Type I Produced with advanced high-performance CMOS technology Inputs and outputs are LVTTL-compatible Single 3.3V(0.3V) power supply The IDT71V256SA is a 262,144-bit high-speed static RAM organized as 32K x 8. It is fabricated using IDT's high-performance, high-reliability CMOS technology. The IDT71V256SA has outstanding low power characteristics while at the same time maintaining very high performance. Address access times of as fast as 10ns are ideal for 3.3V secondary cache in 3.3V desktop designs. When power management logic puts the IDT71V256SA in standby mode, its very low power characteristics contribute to extended battery life. By taking CS HIGH, the SRAM will automatically go to a low power standby mode and will remain in standby as long as CS remains HIGH. Furthermore, under full standby mode (CS at CMOS level, f=0), power consumption is guaranteed to always be less than 6.6mW and typically will be much smaller. The IDT71V256SA is packaged in a 28-pin 300 mil SOJ and a 28-pin 300 mil TSOP Type I. Functional Block Diagram A0 VCC 262,144 BIT MEMORY ARRAY ADDRESS DECODER GND A14 I/O0 I/O CONTROL INPUT DATA CIRCUIT I/O7 CS OE WE , CONTROL CIRCUIT 3101 drw 01 FEBRUARY 2001 1 (c)2000 Integrated Device Technology, Inc. DSC-3101/06 IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges Truth Table(1) Pin Configurations A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 GND 1 28 2 27 3 26 4 25 5 24 6 7 VCC WE A13 A8 A9 A11 OE A10 CS I/O7 I/O6 I/O5 I/O4 I/O3 23 SO28-5 22 8 21 9 20 10 19 11 18 12 17 13 16 14 15 DIP/SOJ Top View OE A11 A9 A8 A13 WE VCC A14 A12 A7 A6 A5 A4 A3 CS OE I/O X H X High-Z Standby (ISB) X VHC X High-Z Standby (ISB1) H L H High-Z Output Disable H L L DOUT Read L L X DIN Write , Symbol 21 23 20 24 19 25 18 26 17 27 16 28 15 14 2 13 3 12 4 11 5 10 6 9 7 8 A10 CS I/O7 I/O6 I/O5 I/O4 I/O3 GND I/O2 I/O1 I/O0 A0 A1 A2 , Rating Com'l. Unit VCC Supply Voltage Relative to GND -0.5 to +4.6 V VTERM(2) Terminal Voltage Relative to GND -0.5 to VCC+0.5 V TBIAS Temperature Under Bias -55 to +125 o C TSTG Storage Temperature -55 to +125 o C PT Power Dissipation 1.0 W IOUT DC Output Current 50 mA 3101 tbl 03 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Input, Output, and I/O terminals; 4.6V maximum. 3101 drw 03 TSOP Top View 3101 tbl 02 Absolute Maximum Ratings(1) 3101 drw 02 SO28-8 Function NOTE: 1. H = VIH, L = VIL, X = Don't Care 22 1 WE Pin Descriptions Capacitance Name Description A0 - A14 Addresses I/O0 - I/O7 Data Input/Output CS Chip Select CIN Input Capacitance WE Write Enable COUT Output Capacitance OE Output Enable GND Ground VCC Power (TA = +25C, f = 1.0MHz, SOJ package) Parameter(1) Symbol Conditions Max. Unit VIN = 3dV 6 pF VOUT = 3dV 7 pF 3101 tbl 04 NOTE: 1. This parameter is determined by device characterization, but is not production tested. Recommended Operating Temperature and Supply Voltage 3101 tbl 01 Grade Commercial Industrial Temperature GND Vcc 0OC to +70OC 0V 3.3V 0.3V -40OC to +85OC 0V 3.3V 0.3V 3101 tbl 05 2 IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges Recommended DC Operating Conditions Symbol Parameter VCC Supply Voltage GND Ground VIH Input High Voltage - Inputs VIH VIL Input High Voltage - I/O Min. Typ. Max. Unit 3.0 3.3 3.6 V 0 0 0 V 2.0 ____ 5.0 V 2.0 ____ VCC +0.3 V ____ 0.8 V (1) Input Low Voltage -0.3 NOTE: 1. VIL (min.) = -2.0V for pulse width less than 5ns, once per cycle. 3101 tbl 06 DC Electrical Characteristics(1) (VCC = 3.3V 0.3V, VLC = 0.2V, VHC = VCC - 0.2V, Commercial and Industrial Temperture Ranges) Symbol Parameter 71V256SA10 71V256SA12 71V256SA15 71V256SA20 Unit ICC Dynamic Operating Current CS < VIL, Outputs Open, VCC = Max., f = fMAX(2) 100 90 85 85 mA ISB Standby Power Supply Current (TTL Level) CS = VIH, VCC = Max., Outputs Open, f = fMAX(2) 20 20 20 20 mA ISB1 Full Standby Power Supply Current (CMOS Level) CS > VHC, VCC = Max., Outputs Open, f = 0(2), VIN < VLC or VIN > VHC 2 2 2 2 mA 3101 tbl 07 NOTES: 1. All values are maximum guaranteed values. 2. fMAX = 1/tRC, only address inputs cycling at fMAX; f = 0 means that no inputs are cycling. DC Electrical Characteristics (VCC = 3.3V 0.3V) IDT71V256SA Symbol Parameter Test Conditions Min. Typ. Max. Unit Input Leakage Current VCC = Max., VIN = GND to VCC ___ ___ 2 A |ILO| Output Leakage Current VCC = Max., CS = VIH, VOUT = GND to V CC ___ ___ 2 A VOL Output Low Voltage IOL = 8mA, VCC = Min. ___ ___ 0.4 V V OH Output High Voltage IOH = -4mA, VCC = Min. 2.4 ___ ___ |ILI| V 3101 tbl 08 6.42 3 IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges AC Test Conditions Input Pulse Levels GND to 3.0V Input Rise/Fall Times 3ns Input Timing Reference Levels 1.5V Output Reference Levels 1.5V AC Test Load See Figures 1 and 2 3101 tbl 09 3.3V 3.3V 320 320 DATA OUT DATA OUT 350 30pF* 350 , 5pF* , 3101 drw 04 3101 drw 05 Figure 2. AC Test Load (for tCLZ, tOLZ, tCHZ, tOHZ, tOW, tWHZ) Figure 1. AC Test Load *Includes scope and jig capacitances AC Electrical Characteristics (VCC = 3.3V 0.3V, Commercial and Industrial Temperature Ranges) Symbol Parameter 71V256SA10 71V256SA12 71V256SA15 71V256SA20 Min. Max. Min. Max. Min. Max. Min. Max. Unit Read Cycle tRC Read Cycle Time 10 ____ 12 ____ 15 ____ 20 ____ ns tAA Address Access Time ____ 10 ____ 12 ____ 15 ____ 20 ns tACS Chip Select Access Time ____ 10 ____ 12 ____ 15 ____ 20 ns tCLZ(1) Chip Select to Output in Low-Z 5 ____ 5 ____ 5 ____ 5 ____ ns tCHZ(1) Chip Select to Output in High-Z 0 tOE Outp ut Enable to Output Valid (1) 8 0 8 0 9 0 10 ns ____ 6 ____ 6 ____ 7 ____ 8 ns 3 ____ 0 ____ 0 ____ ns tOLZ Output Enable to Output in Low-Z 3 ____ tOHZ(1) Output Disable to Output in High-Z 2 6 2 6 0 7 0 8 ns tOH Output Hold from Address Change 3 ____ 3 ____ 3 ____ 3 ____ ns 10 ____ 12 ____ 15 ____ 20 ____ ns ns Write Cycle tWC Write Cycle Time tAW Address Valid to End-of-Write 9 ____ 9 ____ 10 ____ 15 ____ tCW Chip Select to End-of-Write 9 ____ 9 ____ 10 ____ 15 ____ ns tAS Address Set-up Time 0 ____ 0 ____ 0 ____ 0 ____ ns tWP Write Pulse Width 9 ____ 9 ____ 10 ____ 15 ____ ns tWR Write Recovery Time 0 ____ 0 ____ 0 ____ 0 ____ ns 6 ____ 6 ____ 7 ____ 8 ____ ns Data Hold from Write Time 0 ____ 0 ____ 0 ____ 0 ____ ns tOW Output Active from End-of-Write 4 ____ 4 ____ 4 ____ 4 ____ ns tWHZ(1) Write Enable to Output in High-Z 1 8 1 8 1 9 1 10 tDW Data to Write Time Overlap tDH (1) NOTE: 1. This parameter guaranteed with the AC test load (Figure 2) by device characterization, but is not production tested. 4 ns 3101 tbl 10 IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges Timing Waveform of Read Cycle No. 1(1) t RC ADDRESS t AA t OH OE t OE t OLZ (2) t OHZ (2) t CHZ (2) CS t ACS t CLZ (2) DATAOUT DATA VALID 3101 drw 06 , NOTES: 1. WE is HIGH for Read cycle. 2. Transition is measured 200mV from steady state. Timing Waveform of Read Cycle No. 2(1,2,4) t RC ADDRESS t AA t OH DATAOUT t OH PREVIOUS DATA VALID DATA VALID 3101 drw 07 , Timing Waveform of Read Cycle No. 3(1,3,4) CS t ACS t CLZ t CHZ (5) (5) DATA VALID DATAOUT 3101 drw 08 NOTES: 1. WE is HIGH for Read cycle. 2. Device is continuously selected, CS is LOW. 3. Address valid prior to or coincident with CS transition LOW. 4. OE is LOW. 5. Transition is measured 200mV from steady state. 6.42 5 , IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges Timing Waveform of Write Cycle No. 1 (WE Controlled Timing)(1,2,4,6) t WC ADDRESS t OHZ (5) OE t AW CS t WP (6) t AS t WR WE t WHZ (5) DATAOUT t OW (5) (3) (3) t DW t DH DATA VALID DATAIN 3101 drw 09 , NOTES: 1. A write occurs during the overlap of a LOW CS and a LOW WE. 2. tWR is measured from the earlier of CS or WE going HIGH to the end of the write cycle. 3. During this period, I/O pins are in the output state so that the input signals must not be applied. 4. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state. 5. Transition is measured 200mV from steady state. 6. If OE is LOW during a WE controlled write cycle, the write pulse width must be the larger of t WP or (tWHZ + tDW) to allow the I/O drivers to turn off and data to be placed on the bus for the required tDW. If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the write pulse can be as short as the spectified tWP. Timing Waveform of Write Cycle No. 2 (CS Controlled Timing)(1,2,3,4) t WC ADDRESS t AW CS tAS t CW (5) tWR WE t DW t DH DATA VALID DATAIN 3101 drw 10 NOTES: 1. WE or CS must be HIGH during all address transitions. 2. A write occurs during the overlap of a LOW CS and a LOW WE. 3. tWR is measured from the earlier of CS or WE going HIGH to the end of the write cycle. 4. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state. 5. If OE is LOW during a WE controlled write cycle, the write pulse width must be the larger of t WP or (tWHZ + tDW) to allow the I/O drivers to turn off and data to be placed on the bus for the required tDW. If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the write pulse can be as short as the spectified tWP. 6 , IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges Ordering Information Commercial and Industrial IDT 71V256 SA XX X X Device Type Power Speed Package Process/ Temperature Range Blank I Commercial (0C to +70C) Industrial (-40C to +85C) Y PZ 300 mil SOJ (SO28-5) TSOP Type I (SO28-8) Speed in nanoseconds * Available in SOJ package only. 3101 drw 11 6.42 7 IDT71V256SA 3.3V CMOS Static RAM 256K (32K x 8-Bit) Commercial and Industrial Temperature Ranges Datasheet Document History 1/7/00 Pg. 1, 3, 4, 7 Pg. 1, 2, 7 Pg. 6 Pg. 7 Pg. 8 08/09/00 02/01/01 Updated to new format Expanded Industrial Temperature offerings Removed 28-pin 300 mil plastic DIP package offering Removed Note No. 1 from Write Cycle No. 1 diagram; renumbered notes and footnotes Revised Ordering Information Added Datasheet Document History Not recommended for new designs Removed "Not recommended for new designs" CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax:408-492-8674 www.idt.com The IDT logo is a registered trademark of Integrated Device Technology, Inc. 8 for Tech Support: sramhelp@idt.com 800 544-7726, x4033