1
A
OS Semiconductor
Produc
t
Reliabilit
y
Repor
t
AOZ8001JI,
rev
1
Plastic Encapsulated Device
ALPH
A
&OMEG
A
Semiconducto
r
,
Inc
495 Mercury Drive
Sunnyvale, CA 94085
U.S.
Tel:
(
408
)
830-9742 www.aosmd.com
Mar 27, 2007
2
This
AOS
product
reliability
report
summarizes
the
qualification
result
for
AOZ8001JI.
Review
of
the
electrical
test
results
confirm
that
AOZ8001J I pass
AOS
quality
and reliability
requirements for prod uc t relea se.
The continuous qualification testing and reliability monitoring
program ensure that all outgoing products will continue to meet AOS quality and reliability standards.
Table of Contents:
I.
Product
Description
II.
Package
and
Die
information
III. Qualification
Test
Requirements
IV. Qualification
Tests
Result
V.
Quality
Assurance
Information
I. Product Description:
The AOZ8001JI is a transient voltage suppressor array designed to protect high speed data lines from ESD and
lightning. The product comes in RoHS compliant, SOT-143 package and is rated over a -40°C to +85°C ambient
temperature range.
.
Absolute
Maximum
Ratings
Parameter
VP-VN
6V
Peak Pulse Current (Ipp), tp=8/20uS 5A
Peak Power Dissipation (8x20mS@ 25°C)
SOT-143
50W
Storage Temperature (TS) -65°C to +150°C
ESD Rating per IEC61000-4-2, contact (1) ±12kV
ESD Rating per IEC61000-4-2, air (2) ±15kV
ESD Rating per Human Body Model (2) ±15kV
Junction Temperature (Tj) -40°C to +125°C
Notes:
(1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330Ω
(2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5kΩ
II. Package and Die Information:
Product ID
AOZ8001JI
Process
UMC 0.5um 5/18V 2P3M process
Package
Type
SOT-143
Die
UE003A3 (size: 716 x 616 um)
L/F material
AgCu
Die attach material
Ablebond 8006NS+84-3J epoxy
Di e bond
wire
Au
,
1mil
Mold
Material
CEL9220HF13
Plating Material
Pure Tin
3
III. Qualification Tests Requirments
• 3 lots of AOZ8001JI up to 168 hrs of B/I for New Product release.
• 2 lots of package qual testing (PCT, 250 cycles TC) for SOT-143 for package release to manufacturing.
IV . Qualification Tests Result
Test
Item
Test
Condition
Sample Size Result
Comment
Pre-
Conditioning Per JESD 22-A113
85 C0/85%RH, 3 cyc
reflow@260 0C
3 lots (82 /lot)
pass
Lot 1 (wafer lot# F162T.51-20, marking:
143A),
82
units, passed pre-conditioning.
Lot 2 (wafer lot# F162T.51-20, marking:
143B),
82
units, passed pre-conditioning.
Lot 3 (wafer lot# F162T.51-20, marking:
143C),
82
units, passed pre-conditioning.
HTOL
(pkg qual
burn-in )
Per JESD 22-A108_B
Vdd=6V
Temp = 125 0C
3 lots (80 /lot)
pass
L
ot 1
(
wafer lot# F162T.51-20, marking:
143A), 80 units, passed 500 hrs .
Lot 2 (wafer lot# F162T.51-20, marking:
143B), 80 units, passed 500 hrs .
Lot 3 (wafer lot# F162T.51-20, marking:
143C
)
,
82
units,
p
assed
p
re-conditionin
g
.
HTOL
(new UH_EPI
process)
Per JESD 22-A108_B
Vdd=6V
Temp = 125 0C
2 lot (80 /lot)
pass
Qual by extension using A OZ8000C
(same die in SOT23 pkg.)
Lot 1 (wafer lot# FNG88, marking:
AC001), 80 units, passed 500 hrs .
Lot 2 (wafer lot# FAYY3.02-3 marking:
AB008), 80 units, passed 500 hrs .
HAST
'130 +/- 2 0C, 85%RH, 33.3
psi, at VCC min power
dissapation
3 lots (60 /lot)
pass
L
ot 1
(
wafer lot# F162T.51-20, marking:
143A), 60 units, passed HAST 100 hrs .
Lot 2 (wafer lot# F162T.51-20, marking:
143B), 60 units, passed HAST 100 hrs .
Lot 3 (wafer lot# F162T.51-20, marking:
143C),
82
units, passed pre-conditioning.
Temperature
Cycle
'-65 0C to +150 0C, air to
air (2cyc/hr)
3 lots (82 /lot)
pass
L
ot 1
(
wafer lot# F162T.51-20, marking:
143A), 82 units, passed TC 500 cycles.
Lot 2 (wafer lot# F162T.51-20, marking:
143B), 82 units, passed TC 500 cycles.
Lot 3 (wafer lot# F162T.51-20, marking:
143C),
82
units, passed pre-conditioning.
Pressure Pot
121C, 15+/-1 PSIG,
RH= 100%
3 lots (82 /lot)
pass
L
ot 1
(
wafer lot# F162T.51-20, marking:
143A), 82 units, passed PCT 96 hrs.
Lot 2 (wafer lot# F162T.51-20, marking:
143B), 82 units, passed PCT 96 hrs.
Lot 3 (wafer lot# F162T.51-20, marking:
143C),
82
units, passed pre-conditioning.
ESD Rating
Per IEC-61000-4-2,
contact
3 units
pass
Lot 1
(
wafer lot# FAYY3.0
3
-4, marking:
143D), 3 units passed ±12kV
ESD Rating
Per IEC-61000-4-2, air
3 units
pass
Lot 1
(
wafer lot# FAYY3.0
3
-4, marking:
143D), 3 units passed ±15kV
Latch-up
Per JESD78A
3 units
pass Lot 1 (wafer lot# FAYY3.03-4, marking:
143D), 3 units passed Latch-up.
The
qualification
test
results
confirm
that
AOZ8001JI pass
AOS
quality
and reliability
requirements for prod uc t relea se.
4
V. Quality Assurance Information
Acceptable
Quality
Level
for
outgoing
inspection:
0.1%
for
electrical
and
visual. Guaranteed
Outgoing
Defect
Rate:
<
50
ppm
Quality
Sample
Plan:
conform
to
Mil-Std
-1 05 D
