DMG6602SVTQ
Document number: DS37643 Rev. 1 - 2
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DMG6602SVTQ
ADVANCE INFO R MA T I O N
COMPLEMENTARY PAIR ENHANCEMENT MODE MOSFET
Product Summary
Device
V(BR)DSS
ID
TA = +25°C
Q1
30V
3.4A
2.7A
Q2
-30V
-2.8A
-2.3A
Description and Applications
This new generation MOSFET is designed to minimize the on-state
resistance (RDS(on)) and yet maintain superior switching performance,
making it ideal for high efficiency power management applications.
Backlighting
DC-DC Converters
Power Management Functions
Features and Benefits
Low On-Resistance
Low Input Capacitance
Fast Switching Speed
Low Input/Output Leakage
Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
Halogen and Antimony Free. “Green” Device (Note 3)
Qualified to AEC-Q101 Standards for High Reliability
PPAP Capable (Note 4)
Mechanical Data
Case: TSOT26
Case Material: Molded Plastic, “Green” Molding Compound.
UL Flammability Classification Rating 94V-0
Moisture Sensitivity: Level 1 per J-STD-020
Terminals Connections: See Diagram
Terminals: Finish Matte Tin Annealed over Copper Leadframe.
Solderable per MIL-STD-202, Method 208
Weight: 0.013 grams (Approximate)
Ordering Information (Note 5)
Part Number
Case
Packaging
DMG6602SVTQ-7
TSOT26
3,000 / Tape & Reel
DMG6602SVTQ-13
TSOT26
10,000 / Tape & Reel
Notes: 1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.
2. See http://www.diodes.com/quality/lead_free.html for more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, "Green"
and Lead-free.
3. Halogen- and Antimony-free "Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and
<1000ppm antimony compounds.
4. Automotive products are AEC-Q101 qualified and are PPAP capable. Automotive, AEC-Q101 and standard products are electrically and thermally
the same, except where specified. For more information, please refer to http://www.diodes.com/quality/product_compliance_definitions/.
5. For packaging details, go to our website at http://www.diodes.com/products/packages.html.
Marking Information
Date Code Key
Year
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
Code
X
Y
Z
A
B
C
D
E
F
G
H
Month
Jan
Feb
Mar
Apr
May
Jun
Jul
Aug
Sep
Oct
Nov
Dec
Code
1
2
3
4
5
6
7
8
9
O
N
D
TSOT26
Top View
Top View
1
2
3
6
5
4
D1
S1
D2
G1
S2
G2
N-Channel
P-Channel
D1
S1
G1
Q1 D2
S2
G2
Q2
66C = Product Type Marking Code
YM = Date Code Marking
Y = Year (ex: X = 2010)
M = Month (ex: 9 = September)
66C
YM
DMG6602SVTQ
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DMG6602SVTQ
ADVANCE INFO R MA T I O N
Maximum Ratings Q1 (@TA = +25°C unless otherwise specified.)
Characteristic
Symbol
Value
Unit
Drain-Source Voltage
VDSS
30
V
Gate-Source Voltage
VGSS
±20
V
Continuous Drain Current (Note 7) VGS = 10V
Steady
State
TA = +25°C
TA = +70°C
ID
3.4
2.7
A
Continuous Drain Current (Note 7) VGS = 4.5V
Steady
State
TA = +25°C
TA = +70°C
ID
2.7
2.2
A
Maximum Continuous Body Diode Forward Current (Note 5)
IS
1.5
A
Pulsed Drain Current (Note 5)
IDM
25
A
Maximum Ratings Q2 (@TA = +25°C unless otherwise specified.)
Characteristic
Symbol
Value
Unit
Drain-Source Voltage
VDSS
-30
V
Gate-Source Voltage
VGSS
±20
V
Continuous Drain Current (Note 7) VGS = -10V
Steady
State
TA = +25°C
TA = +70°C
ID
-2.8
-2.4
A
Continuous Drain Current (Note 7) VGS = -4.5V
Steady
State
TA = +25°C
TA = +70°C
ID
-2.3
-2.1
A
Maximum Continuous Body Diode Forward Current (Note 7)
IS
-1.5
A
Pulsed Drain Current (Note 7)
ID
-20
A
Thermal Characteristics
Characteristic
Symbol
Value
Units
Total Power Dissipation (Note 6)
TA = +25°C
PD
0.84
W
TA = +70°C
0.52
Thermal Resistance, Junction to Ambient (Note 6)
Steady State
RJA
155
°C/W
t<10s
109
Total Power Dissipation (Note 7)
TA = +25°C
PD
1.27
W
TA = +70°C
0.8
Thermal Resistance, Junction to Ambient (Note 7)
Steady State
RJA
102
°C/W
t<10s
71
Thermal Resistance, Junction to Case (Note 7)
RJC
34
Operating and Storage Temperature Range
TJ, TSTG
-55 to +150
°C
Notes: 6. Device mounted on FR-4 substrate PC board, 2oz copper, with minimum recommended pad layout.
7. Device mounted on FR-4 substrate PC board, 2oz copper, with 1inch square copper plate.
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Electrical Characteristics Q1 NMOS (@ TA = +25°C unless otherwise stated.)
Characteristic
Symbol
Min
Typ
Max
Unit
Test Condition
OFF CHARACTERISTICS (Note 8)
Drain-Source Breakdown Voltage
BVDSS
30
-
-
V
VGS = 0V, ID = 250µA
Zero Gate Voltage Drain Current
IDSS
-
-
1.0
µA
VDS = 24V, VGS = 0V
Gate-Source Leakage
IGSS
-
-
±100
nA
VGS = ±20V, VDS = 0V
ON CHARACTERISTICS (Note 8)
Gate Threshold Voltage
VGS(th)
1.0
-
2.3
V
VDS = VGS, ID = 250μA
Static Drain-Source On-Resistance
RDS (ON)
-
38
55
60
100
mΩ
VGS = 10V, ID = 3.1A
VGS = 4.5V, ID = 2A
Forward Transfer Admittance
|Yfs|
-
4
-
S
VDS = 5V, ID = 3.1A
Diode Forward Voltage
VSD
-
0.8
1
V
VGS = 0V, IS = 1A
DYNAMIC CHARACTERISTICS (Note 9)
Input Capacitance
Ciss
-
290
400
pF
VDS = 15V, VGS = 0V,
f = 1.2MHz
Output Capacitance
Coss
-
40
80
Reverse Transfer Capacitance
Crss
-
40
80
Gate Resistance
Rg
-
1.4
-
Ω
VDS = 0V, VGS = 0V, f = 1MHz
Total Gate Charge (VGS = 4.5V)
Qg
-
4
6
nC
VDS = 15V, VGS = 4.5V, ID = 3.1A
Total Gate Charge (VGS = 10V)
Qg
-
9
13
VDS = 15V, VGS = 10V, ID = 3A
Gate-Source Charge
Qgs
-
1.2
-
Gate-Drain Charge
Qgd
-
1.5
-
Turn-On Delay Time
tD(on)
-
3
-
ns
VGS = 10V, VDS = 15V,
RG = 3Ω, RL = 4.7Ω
Turn-On Rise Time
tr
-
5
-
Turn-Off Delay Time
tD(off)
-
13
-
Turn-Off Fall Time
tf
-
3
-
Notes: 8. Short duration pulse test used to minimize self-heating effect.
9. Guaranteed by design. Not subject to product testing.
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
V , DRAIN -SOURCE VOLTAGE(V)
Fig. 1 Typical Output Characteristics
DS
I , DRAIN CURRENT (A)
D
0.0
2.0
4.0
6.0
8.0
10.0
V , GATE SOURCE VOLTAGE(V)
Fig. 2 Typical Transfer Characteristics
GS
I , DRAIN CURRENT (A)
D
0
2
4
6
8
10
0 1 2 3 4 5
V = 5.0V
DS
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I , DRAIN SOURCE CURRENT
Fig. 3 Typical On-Resistance vs.
Drain Current and Gate Voltage
D
R ,DRAIN-SOURCE ON-RESISTANCE( )
DS(ON)
0.01
0.1
1
0 4 8 12 16 20
R ( ) Ave @ V =4.5V
DS(ON) G
R ( ) Ave @ V =10V
DS(ON) G
I , DRAIN SOURCE CURRENT (A)
Fig. 4 Typical On-Resistance vs.
Drain Current and Temperature
D
R , DRAIN-SOURCE ON-RESISTANCE( )
DS(ON)
0
0.04
0.08
0.12
0.16
0 2 4 6 8 10
V = 4.5V
GS
Ave R ( ) @ 150°C
DS(ON)
Ave R ( ) @ -55°C
DS(ON)
Ave R ( ) @ 25°C
DS(ON)
Ave R ( ) @ 85°C
DS(ON)
Ave R ( ) @ 125°C
DS(ON)
-50 -25 0 25 50 75 100 125 150
T , JUNCTION TEMPERATURE ( C)
J
Fig. 5 On-Resistance Variation with Temperature
R , DRAIN-SOURCE ON-RESISTANCE
(Normalized)
DS(ON)
0.6
0.8
1
1.2
1.4
1.6
-50 -25 0 25 50 75 100 125 150
T , JUNCTION TEMPERATURE ( C)
J
Fig. 6 On-Resistance Variation with Temperature
R , DRAIN-SOURCE ON-RESISTANCE
DS(ON)
0
0.02
0.04
0.06
0.08
0.1
0
0.4
0.8
1.6
1.2
2.4
-50 -25 0 25 50 75 100 125 150
V , GATE THRESHOLD VOLTAGE (V)
GS(th)
T , JUNCTION TEMPERATURE ( C)
Fig. 7 Gate Threshold Variation vs. Ambient Temperature
J
I = 250 A
D
I = 1mA
D
2.0
I , SOURCE CURRENT (A)
S
0 0.2 0.4 0.6 0.8 1.0 1.2
V , SOURCE-DRAIN VOLTAGE (V)
Fig. 8 Diode Forward Voltage vs. Current
SD
0
2
4
6
8
10
V (V) @ V =0V T = 25 C
SD DS A
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f = 1MHz
V , DRAIN-SOURCE VOLTAGE (V)
Fig. 9 Typical Junction Capacitance
DS
C , JUNCTION CAPACITANCE (pF)
T
C Ave (pF)
RSS
10
100
1000
0 5 10 15 20 25 30
C Ave (pF)
ISS
C Ave (pF)
OSS
0
2
4
6
8
10
0 2 4 6 8 10
V = 10V
I = 3.0A
DS
D
Q (nC)
g, TOTAL GATE CHARGE
Fig. 10 Gate Charge
V GATE THRESHOLD VOLTAGE (V)
GS
0.1 1 10 100
V , DRAIN-SOURCE VOLTAGE (V)
Fig. 11 SOA, Safe Operation Area
DS
0.01
0.1
1
10
100
I , DRAIN CURRENT (A)
D
R
Limited
DS(on)
T = 150°C
T = 25°C
J(max)
A
V = 10V
Single Pulse
GS
DUT on 1 * MRP Board
DC
P = 10s
WP = 1s
W
P = 100ms
WP = 10ms
W P = 1ms
W
P = 100µs
W
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Electrical Characteristics Q2 PMOS (@ TA = +25°C unless otherwise stated.)
Characteristic
Symbol
Min
Typ
Max
Unit
Test Condition
OFF CHARACTERISTICS (Note 8)
Drain-Source Breakdown Voltage
BVDSS
-30
-
-
V
VGS = 0V, ID = -250µA
Zero Gate Voltage Drain Current
IDSS
-
-
-1.0
µA
VDS = -24V, VGS = 0V
Gate-Source Leakage
IGSS
-
-
±100
nA
VGS = ±20V, VDS = 0V
ON CHARACTERISTICS (Note 8)
Gate Threshold Voltage
VGS(th)
-1.0
-
-2.3
V
VDS = VGS, ID = -250μA
Static Drain-Source On-Resistance
RDS (ON)
-
73
99
95
140
mΩ
VGS = -10V, ID = -2.7A
VGS = -4.5V, ID = -2A
Forward Transfer Admittance
|Yfs|
-
6
-
S
VDS = -5V, ID = -2.7A
Diode Forward Voltage
VSD
-
-0.8
-1.0
V
VGS = 0V, IS = -1A
DYNAMIC CHARACTERISTICS (Note 9)
Input Capacitance
Ciss
-
350
420
pF
VDS = -15V, VGS = 0V,
f = 1.2MHz
Output Capacitance
Coss
-
50
100
Reverse Transfer Capacitance
Crss
-
45
80
Gate Resistance
Rg
-
17.1
-
Ω
VDS = 0V, VGS = 0V, f = 1MHz
Total Gate Charge (VGS = -4.5V)
Qg
-
4
6
nC
VDS = -15V, VGS = -4.5V, ID = -3A
Total Gate Charge (VGS = -10V)
Qg
-
7
9
VDS = -15V, VGS = -10V, ID = -3A
Gate-Source Charge
Qgs
-
0.9
-
Gate-Drain Charge
Qgd
-
1.2
-
Turn-On Delay Time
tD(on)
-
4.8
-
ns
VGS = -10V, VDS = -15V,
RG = 6Ω, RL = 15Ω
Turn-On Rise Time
tr
-
7.3
-
Turn-Off Delay Time
tD(off)
-
20
-
Turn-Off Fall Time
tf
-
13
-
Notes: 8. Short duration pulse test used to minimize self-heating effect.
9. Guaranteed by design. Not subject to production testing.
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
V , DRAIN -SOURCE VOLTAGE(V)
Fig. 12 Typical Output Characteristics
DS
0.0
2.0
4.0
6.0
8.0
I , DRAIN CURRENT
D
V , GATE SOURCE VOLTAGE(V)
Fig. 13 Typical Transfer Characteristics
GS
I , DRAIN CURRENT (A)
D
0
2
4
6
8
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
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I , DRAIN SOURCE CURRENT
Fig. 14 Typical On-Resistance vs.
Drain Current and Gate Voltage
D
R ,DRAIN-SOURCE ON-RESISTANCE( )
DS(ON)
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0 2
R ( ) Ave @ V =2.5V
DS(ON) G
R ( ) Ave @ V =4.5V
DS(ON) G
R ( ) Ave @ V =10V
DS(ON) G
4 86
0 2 4 6 8
I , DRAIN SOURCE CURRENT (A)
Fig. 15 Typical On-Resistance vs.
Drain Current and Temperature
D
R , DRAIN-SOURCE ON-RESISTANCE( )
DS(ON)
V = 4.5V
GS
0
0.04
0.08
0.12
0.16
0.2
Ave R ( ) @ 150°C
DS(ON)
Ave R ( ) @ -55°C
DS(ON)
Ave R ( ) @ 25°C
DS(ON)
Ave R ( ) @ 85°C
DS(ON)
Ave R ( ) @ 125°C
DS(ON)
-50 -25 0 25 50 75 100 125 150
T , JUNCTION TEMPERATURE ( C)
J
Fig. 16 On-Resistance Variation with Temperature
R , DRAIN-SOURCE ON-RESISTANCE
(Normalized)
DS(ON)
0.6
0.8
1
1.2
1.4
1.6
-50 -25 0 25 50 75 100 125 150
T , JUNCTION TEMPERATURE ( C)
J
Fig. 17 On-Resistance Variation with Temperature
R , DRAIN-SOURCE ON-RESISTANCE ( )
DS(ON)
0
0.04
0.08
0.12
0.16
0.2
-50 -25 0 25 50 75 100 125 150
T , JUNCTION TEMPERATURE ( C)
J
Fig. 18 Gate Threshold Variation vs. Ambient Temperature
0
0.4
0.8
1.2
1.6
2
V , GATE THRESHOLD VOLTAGE (V)
GS(TH)
V , SOURCE -DRAIN VOLTAGE (V)
SD
Fig. 19 Diode Forward Voltage vs. Current
I , SOURCE CURRENT (V)
S
0
2
4
6
8
0 0.2 0.4 0.6 0.8 1 1.2 1.4
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-V , DRAIN-SOURCE VOLTAGE (V)
Fig. 20 Typical Junction Capacitance
DS
C , JUNCTION CAPACITANCE (pF)
T
10
100
1000
0 5 10 15 20 25 30
f = 1MHz
C Ave(pF)
ISS
C Ave(pF)
OSS
C Ave(pF)
RSS
0
2
4
6
8
10
0 2 4 6 8 10
V = -15
I = -3A
DS
D
Q (nC)
g, TOTAL GATE CHARGE
Fig. 21 Gate Charge
-V GATE THRESHOLD VOLTAGE (V)
GS
0.1 1 10 100
-V , DRAIN-SOURCE VOLTAGE (V)
Fig. 22 SOA, Safe Operation Area
DS
0.01
0.1
1
10
100
-I , DRAIN CURRENT (A)
D
R
Limited
DS(on)
T = 150°C
T = 25°C
J(max)
A
V = -10V
Single Pulse
GS
DUT on 1 * MRP Board
DC
P = 10s
WP = 1s
W
P = 100ms
WP = 10ms
W P = 1ms
W
P = 100µs
W
0.001
0.01
0.1
1
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
t1, PULSE DURATION TIME (sec)
Fig. 23 Transient Thermal Resistance
r(t), TRANSIENT THERMAL RESISTANCE
D = 0.9
D = 0.7
D = 0.5
D = 0.3
D = 0.1
D = 0.05
D = 0.02
D = 0.01
D = 0.005
Single Pulse
R (t) = r(t) * R
R = 164C/W
Duty Cycle, D = t1/ t2
JA
JA JA
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Package Outline Dimensions
Please see AP02002 at http://www.diodes.com/datasheets/ap02002.pdf for the latest version.
Suggested Pad Layout
Please see AP02001 at http://www.diodes.com/datasheets/ap02001.pdf for the latest version.
TSOT26
Dim
Min
Max
Typ
A

1.00
A1
0.01
0.10
A2
0.84
0.90
D
2.90
E
2.80
E1
1.60
b
0.30
0.45
c
0.12
0.20
e
0.95
e1
1.90
L
0.30
0.50
L2
0.25
θ
θ1
12°
All Dimensions in mm
Dimensions
Value (in mm)
C
0.950
X
0.700
Y
1.000
Y1
3.199
Y1
C C
X (6x)
Y (6x)
c
A1
L
E1 E
A2
D
e1
e6x b
4x 1
L2
A
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IMPORTANT NOTICE
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INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE
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final and determinative format released by Diodes Incorporated.
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written approval of the Chief Executive Officer of Diodes Incorporated. As used herein:
A. Life support devices or systems are devices or systems which:
1. are intended to implant into the body, or
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for
use provided in the labeling can be reasonably expected to result in significant injury to the user.
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failure of the life support device or to affect its safety or effectiveness.
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