Walsin Technology Corporation
Page 6 of 7 WA04X_1% Version 6 Mar.-2007
TEST AND REQUIREMENTS(JIS C 5201-1 : 1998)
Essentially all tests are carried out according to the schedule of IEC publication 60115-8, category LCT/UCT/56
(rated temperature range : Lower Category Temperature, Upper Category Temperature; damp heat, long term,
56 days). The testing also meets the requirements specified by EIA, EIAJ and JIS.
The tests are carried out in accordance with IEC pub1ication 68, "Recommended basic climatic and mechanical
robustness testing procedure for electronic components" and under standard atmospheric conditions according
to IEC 60068-1, subclause 5.3. Unless otherwise specified, the following value supplied :
Temperature: 15°C to 35°C, Relative humidity: 45% to 75%, Air pressure: 86kPa to 106 kPa (860 mbar to 1060
mbar). All soldering tests are performed with midly activated flux.
REQUIREMENT
TEST PROCEDURE Resistor Jumper
DC resistance
Clause 4.5
DC resistance values measured at the test voltages specified below :
<10Ω@0.1V,<100Ω@0.3V,<1KΩ@1.0V,<10KΩ@3V, <100KΩ@10V,
<1MΩ@25V, <10MΩ@30V
Within the specified
tolerance
< 50mΩ
Temperature Coefficient of
Resistance (T.C.R)
Clause 4.8
Natural resistance change per change in degree centigrade.
()
6
121
12 10×
−
−
ttR RR (ppm/°C) t1 : 20°C+5°C-1°C
R1 : Resistance at reference temperature
R2 : Resistance at test temperature
Refer to
“QUICK REFERENCE DATA”
N/a
Short time overload
(S.T.O.L)
Clause 4.13
Permanent resistance change after a 5second application of a
voltage 2.5 times RCWV or the maximum overload voltage specified
in the above list, whichever is less.
∆R/R max. ±(2%+0.10Ω)
< 50mΩ
Resistance to Soldering
Heat (R.S.H) Clause 4.18
Un-mounted chips completely immersed for 10±1second in a solder
bath at 270℃±5ºC
ΔR/R max. ±(1%+0.05Ω)
no visible damage
< 50mΩ
Solderability
Clause4.17
Un-mounted chips completely immersed for 2±0.5second in a solder
bath at 235℃±5℃
good tinning (>95% covered)
no visible damage
Leaching Test
Clause 4.18
Un-mounted chips completely immersed for 60±1second in a solder
bath at 260℃±5℃
Ditto
Temperature cycling
Clause 4.19
30 minutes at -55°C±3°C, 2~3 minutes at 20°C+5°C-1°C, 30 minutes
at +155°C±3°C, 2~3 minutes at 20°C+5°C-1°C, total 5 continuous
cycles
ΔR/R max. ±(1%+0.05Ω)
no visible damage
< 50mΩ
Load life (endurance)
Clause 4.25
70±2ºC, 1000 hours, loaded with RCWV or Vmax,1.5 hours on and
0.5 hours off
ΔR/R max.±(3%+0.10Ω)
For 10Ω≤R<1MΩ ;
ΔR/R max.±(5%+0.10Ω)
For R<10Ω, R≥1MΩ
< 50mΩ
Load life in Humidity
Clause 4.24
1000 hours, at rated continuous working voltage in humidity chamber
controller at 40°C±2°C and 90~95% relative humidity, 1.5hours on
and 0.5 hours off
ΔR/R max.±(3%+0.10Ω)
For 10Ω≤R<1MΩ ;
ΔR/R max.±(5%+0.10Ω)
For R<10Ω, R≥1MΩ
< 50mΩ
Adhesion
Clause 4.32
Pressurizing force: 5N, Test time: 10±1sec. No remarkable damage or removal of
the terminations.