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©2005 Fairchild Semiconductor Corporation RFP12N10L Rev. C0
RFP12N10L
N-Channel Logic Level Power MOSFET
100 V, 12 A, 200 mΩ
These are N-Channel enhancement mode silicon gate
power field effect transistors specifically designed for use
with logic level (5V) driving sources in applications such as
programmable controllers, automotive switching and
solenoid drivers. This performance is accomplished
through a special gate oxide design which provides full
rated conduction at gate biases in the 3V to 5V range,
thereby facilitating true on-off power control directly from
logic circuit supply voltages.
Formerly developmental type TA09526.
Features
12A, 100V
•r
DS(ON) = 0.200
Design Optimized for 5V Gate Drives
Can be Driven Directly from QMOS, NMOS,
TTL Circ uits
Compatible with Automotive Drive Requirem ents
SOA is Power-Dissipation Limited
Nanosecond Switching Speeds
Linear Transfer Characteristics
High Input Impedance
Majority Carrier Device
Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards
Symbol
Packaging
JEDEC TO-220AB
Ordering Information
PART NUMBER PACKAGE BRAND
RFP12N10L TO-220AB F12N10L
D
G
S
SOURCE
DRAIN
GATE
DRAIN
(TAB)
Data Sheet October 2013
©2005 Fairchild Semiconductor Corporation RFP12N10L Rev. C0
Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified RFP12N10L UNITS
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VDS 100 V
Drain to Gate Voltage (RGS = 1MΩ) (Note 1 ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR 100 V
Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID12 A
Pul s e d D rai n C u r re n t (Note 3 ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM 30 A
Gate to Sou rc e Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VGS ±10 V
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .P D60 W
Abo ve TC = 25oC, Derate Linearly. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.48 W/oC
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG -55 to 150 oC
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case fo r 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL
P ackage Body for 10s , See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg 300
260
oC
oC
CAUTION: Str esses above those l isted in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess onl y rating and operation o f the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. TJ = 25oC to 125oC.
Electrical Specifications TC = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BVDSS ID = 250µA, VGS = 0V 100 - - V
Gate to Threshold Voltage VGS(TH) VGS = VDS, ID = 250µA (Figure 7) 1 - 2 V
Zero Gate Voltage Drain Current IDSS VDS = 80V - - 1 µA
VGS = 0V TC = 125oC- - 50 µA
Gate to Source Leakage Current IGSS VGS = 10V, VDS = 0V - - 100 nA
Drain to Source On Resistance (Note 2) rDS(ON) I
D = 12A, VGS = 5V (Figures 5, 6) - - 0.200
Input Capacitance CISS VGS = 0V, VDS = 25V, f = 1MH z
(Figure 8) - - 900 pF
Output Capacitance COSS - - 325 pF
Reverse-Transfer Capacit ance CRSS - - 170 pF
Turn-On Delay Time td(ON) ID = 6A, VDD = 50V, RG = 6.25,
VGS = 5V
(Figures 9, 10, 11)
-1550ns
Rise Time tr- 70 150 ns
Turn-Off Delay Time td(OFF) - 100 130 ns
Fall Ti me tf- 80 150 ns
Thermal Resistance Junction to Case RθJC TO-220 2.083 oC/W
Sour ce to Drain Diode Specifications
PARAMETER SYMBOL T EST CONDITIONS MIN TYP MAX UNITS
Source to Drain Diode Voltage (Note 2) VSD ISD = 6A - - 1.4 V
Diode Reverse Recovery Time trr ISD = 4A, dISD/dt = 50A/µs - 150 - ns
NOTES:
2. Pulsed: pulse duration = 80µs max, duty cycle = 2%.
3. Repetitive rating: pulse width limited by maximum junction temperature.
RFP12N10L
©2005 Fairchild Semiconductor Corporation RFP12N10L Rev. C0
Typical Performance Curves Unless Otherwise Specified
FIGURE 1. NORMALIZED PO WER DISSIPA TI ON vs CASE
TEMPERATURE FIGURE 2. FORWARD BIAS OPERATING AREA
FIGURE 3. SATURATION CHARACTERISTICS FIGURE 4. TRANSFER CHARACTERISTICS
FIGURE 5. DRAIN TO SOURCE ON RESISTANCE vs DRAIN
CURRENT FIGURE 6. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
0 50 100 150
0
TC, CASE TEMPERATURE (oC)
POWER DISSIPATION MULTIPLIER
0.2
0.4
0.6
0.8
1.0
1.2 100
10
1
10001 10 100
OPERATION IN THIS
REGION IS LIMITED
BY rDS(ON)
0.1
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
TC = 25oC
DC OPERATION
60W
ID(MAX) CONTINUOUS
TJ = MAX RATED
40
30
20
0
10
12 3405
V
GS
= 10V
PULSE DURATION = 80µs
DUTY CYCLE 0.5%
TC = 25oC
5V
4V
3V
2V
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
20
15
10
0
5
12340
VDS = 10V
5
25oC
125oC
-40oC
PULSE DURATION = 80µs
DUTY CYCLE 0.5%
-40oC
ID(ON), ON-STATE DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
125oC
rDS(ON), DRAIN TO SOURCE ON
ID, DRAIN CURRENT (A)
0.3
0.2
0.1
00 5 10 15 20 25 30
RESISTANCE ()
-40oC
25oC
VGS = 5V
PULSE DURATION = 80µs
DUTY CYCLE 0.5%
125oC
2.0
1.5
1.0
0
0.5
0 50 100 150-50 TJ, JUNCTION TEMPERATURE (oC)
NORMALIZED DRAIN TO SOURCE
ON RESISTANCE
VGS = 5V, ID = 12A
PULSE DURATION = 80 µs
DUTY CYCLE 0.5%
RFP12N10L
©2005 Fairchild Semiconductor Corporation RFP12N10L Rev. C0
FIGURE 7. NORMALIZED GATE THRESHOLD V OLTAGE vs
JUNCTION TEMPERATURE FIGURE 8. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
NOT E : Refer to Fairchild Applications Notes AN7254 and AN7260
FIGURE 9. NORMALIZED SWITCHING WAVEFORMS FOR CONSTANT GATE CURRENT
Test Circuits and Waveforms
FIGURE 10. SWITCHING TIME TEST CIRCUIT FIGURE 11. RESISTIVE SWITCHING WAVEFORMS
Typical Performance Curves Unless Otherwise Specified (Continued)
1.3
1.1
1.0
0.9
0.8
0.7
0.6
0.5 0 50 100 150-50
VDS = VGS
ID = 250µA
NORMALIZED GATE
TJ, JUNCTION TEMPERATURE (oC)
THRESHOLD VOLTAGE (V )
1.2
800
600
400
200
001020304050
CISS
COSS
CRSS
C, CAPACITANCE (pF)
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
CISS = CGS + CGD
CRSS = CGD
COSS CDS + CGD
0.75BVDSS
0.50BVDSS
0.25BVDSS
DRAIN SOURCE
VOLTAGE
GATE
SOURCE
VOLTAGE
RL = 8.33
IG (REF) = 0.56mA
VGS = 5V
VDD = BVDSS
VDD = BVDSS
BVDSS
IG (REF)
IG (ACT)
20 80 IG (REF)
IG (ACT)
t, TIME (µs)
GATE TO SOURCE VOLTAGE (V)
DRAIN TO SOURCE VOLTAGE (V)
100
75
50
25
0
10
8
6
4
0
2
VGS
RL
RGS DUT
+
-VDD
tON
td(ON)
tr
90%
10%
VDS 90%
10%
tf
td(OFF)
tOFF
90%
50%
50%
10% PULSE WIDTH
VGS
0
0
RFP12N10L
©2005 Fairchild Semiconductor Corporation RFP12N10L Rev. C0
FIGURE 12. GATE CHARGE TEST CIRCUIT FIGURE 13. GATE CHARGE WAVEFORMS
Test Circuits and Waveforms (Continued)
RL
VGS +
-
VDS
VDD
DUT
IG(REF)
VDD
Qg(TH)
VGS = 1V
Qg(5)
VGS = 5V
Qg(TOT)
VGS = 10V
VDS
VGS
IG(REF)
0
0
RFP12N10L
©2005 Fairchild Semiconductor Corporation RFP12N10L Rev. C0
RFP12N10L
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Definition of Terms
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