C3225X7R2A225KT5L0U - TDK - Datasheet.Directory

X5R Dielectric

General Specications

• General Purpose Dielectric for Ceramic Capacitors

• EIA Class II Dielectric

• Temperature variation of capacitance is within ±15%

from -55°C to +85°C

• Well suited for decoupling and ltering applications

• Available in High Capacitance values (up to 100µF)

GENERAL DESCRIPTION

-5

-10

-15

-20

-60 -40 -20 0 +20 +40 +60 +80

10,000

1,000

100

0 100 12080 6040 20

PART NUMBER (see page 2 for complete part number explanation)

**EIA 01005

NOTE: Contact factory for availability of Tolerance Options for Specic Part Numbers.

Contact factory for non-specied capacitance values.

Temperature Coe󰀩cient

% Capacitance

Temperature °C

Insulation Resistance (Ohm-Farads)

Insulation Resistance vs Temperature

Temperature °C

1210

Size

(L” x W”)

0101**

0201

0402

0603

0805

1206

1210

1812

Voltage

4 = 4V

6 = 6.3V

Z = 10V

Y = 16V

3 = 25V

D = 35V

5 = 50V

1 = 100V

Dielectric

D = X5R

Capacitance

Tolerance

K = ±10%

M = ±20%

Failure

Rate

A = N/A

Terminations

T = Plated Ni

and Sn

Packaging

2 = 7” Reel

4 = 13” Reel

U = 4mm TR

(01005)

Special

Code

A = Std.

107

Capacitance

Code (In pF)

2 Sig. Digits

+ Number of

Zeros

TYPICAL ELECTRICAL CHARACTERISTICS

121818

X5R Dielectric

Specications and Test Methods

042418 2727

Parameter/Test X5R Specication Limits Measuring Conditions

Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber

Capacitance Within specied tolerance

Freq.: 1.0 kHz ± 10%

Voltage: 1.0Vrms ± .2V

For Cap > 10 µF, 0.5Vrms @ 120Hz

Dissipation Factor

≤ 2.5% for ≥ 50V DC rating

≤ 12.5% for 25V, 35V DC rating

≤ 12.5% Max. for 16V DC rating and lower

Contact Factory for DF by PN

Insulation Resistance 10,000MΩ or 500MΩ - µF,

whichever is less

Charge device with rated voltage for

120 ± 5 secs @ room temp/humidity

Dielectric Strength No breakdown or visual defects Charge device with 250% of rated voltage for

1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Resistance to

Flexure

Stresses

Appearance No defects Deection: 2mm

Test Time: 30 seconds

Capacitance

Variation

≤ ±12%

Dissipation

Factor Meets Initial Values (As Above)

Insulation

Resistance ≥ Initial Value x 0.3

Solderability ≥ 95% of each terminal should be covered

with fresh solder

Dip device in eutectic solder at 230 ± 5ºC

for 5.0 ± 0.5 seconds

Resistance to

Solder Heat

Appearance No defects, <25% leaching of either end terminal

Dip device in eutectic solder at 260ºC for 60sec-

onds. Store at room temperature for 24 ± 2hours

before measuring electrical properties.

Capacitance

Variation

≤ ±7.5%

Dissipation

Factor Meets Initial Values (As Above)

Insulation

Resistance Meets Initial Values (As Above)

Dielectric

Strength Meets Initial Values (As Above)

Thermal

Shock

Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes

Capacitance

Variation

≤ ±7.5% Step 2: Room Temp ≤ 3 minutes

Dissipation

Factor Meets Initial Values (As Above) Step 3: +85ºC ± 2º 30 ± 3 minutes

Insulation

Resistance Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes

Dielectric

Strength Meets Initial Values (As Above) Repeat for 5 cycles and measure after

24 ± 2 hours at room temperature

Load Life

Appearance No visual defects Charge device with 1.5X rated voltage in

test chamber set at 85ºC ± 2ºC for 1000 hours

(+48, -0).

Note: Contact factory for *optional

specication part numbers that are tested at

< 1.5X rated voltage.

Remove from test chamber and stabilize at room

temperature for 24 ± 2 hours

Capacitance

Variation

≤ ±12.5%

Dissipation

Factor ≤ Initial Value x 2.0 (See Above)

Insulation

Resistance ≥ Initial Value x 0.3 (See Above)

Dielectric

Strength Meets Initial Values (As Above)

Load

Humidity

Appearance No visual defects Store in a test chamber set at 85ºC ± 2ºC/

85% ± 5% relative humidity for 1000 hours

(+48, -0) with rated voltage applied.

Remove from chamber and stabilize at room

temperature and humidity for

24 ± 2 hours before measuring.

Capacitance

Variation

≤ ±12.5%

Dissipation

Factor ≤ Initial Value x 2.0 (See Above)

Insulation

Resistance ≥ Initial Value x 0.3 (See Above)

Dielectric

Strength Meets Initial Values (As Above)

100917 5

C0G (NP0) Dielectric

Specifications and Test Methods

Parameter/Test NP0 Specification Limits Measuring Conditions

Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber

Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF

Q<30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF

≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V

Insulation Resistance 100,000MΩ or 1000MΩ - µF, Charge device with rated voltage for

whichever is less 60 ± 5 secs @ room temp/humidity

Charge device with 250% of rated voltage for

Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Note: Charge device with 150% of rated

voltage for 500V devices.

Appearance No defects Deflection: 2mm

Capacitance Test Time: 30 seconds

Resistance to Variation ±5% or ±.5 pF, whichever is greater

Flexure Q Meets Initial Values (As Above)

Stresses

Insulation ≥ Initial Value x 0.3

Resistance

Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC

with fresh solder for 5.0 ± 0.5 seconds

Appearance No defects, <25% leaching of either end terminal

Capacitance

Variation ≤ ±2.5% or ±.25 pF, whichever is greater

Dip device in eutectic solder at 260ºC for 60

Q Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2

Resistance to

hours before measuring electrical properties.

Solder Heat Insulation Meets Initial Values (As Above)

Resistance

Dielectric Meets Initial Values (As Above)

Strength

Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes

Capacitance

Variation ≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes

Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes

Thermal

Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes

Resistance

Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after

Strength 24 hours at room temperature

Appearance No visual defects

Capacitance

Variation ≤ ±3.0% or ± .3 pF, whichever is greater Charge device with twice rated voltage in

≥ 30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC

Load Life Q≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).

(C=Nominal Cap) <10 pF: Q≥ 200 +10C

Insulation ≥ Initial Value x 0.3 (See Above) Remove from test chamber and stabilize at

Resistance room temperature for 24 hours

Dielectric Meets Initial Values (As Above) before measuring.

Strength

Appearance No visual defects

Capacitance

Variation ≤ ±5.0% or ± .5 pF, whichever is greater Store in a test chamber set at 85ºC ± 2ºC/

≥ 30 pF: Q≥ 350 85% ± 5% relative humidity for 1000 hours

Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied.

Humidity <10 pF: Q≥ 200 +10C

Insulation ≥ Initial Value x 0.3 (See Above) Remove from chamber and stabilize at

Resistance room temperature for 24 ± 2 hours

Dielectric Meets Initial Values (As Above) before measuring.

Strength

Case Size 0101* 0201 0402 0603 0805

Soldering Reow Only Reow Only Reow/Wave Reow/Wave Reow/Wave

Packaging Paper/Embossed All Paper All Paper All Paper Paper/Embossed

(L) Length mm

(in.)

0.40 ± 0.02

(0.016 ± 0.0008)

0.60 ± 0.09

(0.024 ± 0.004)

1.00 ± 0.15

(0.040 ± 0.006)

1.60 ± 0.15

(0.063 ± 0.006)

2.01 ± 0.20

(0.079 ± 0.008)

(W) Width mm

(in.)

0.20 ± 0.02

(0.008 ± 0.0008)

0.30 ± 0.09

(0.011 ± 0.004)

0.50 ± 0.15

(0.020 ± 0.006)

0.81 ± 0.15

(0.032 ± 0.006)

1.25 ± 0.20

(0.049 ± 0.008)

(t) Terminal mm

(in.)

0.10 ± 0.04

(0.004 ± 0.0016)

0.15 ± 0.05

(0.006 ± 0.002)

0.25 ± 0.15

(0.010 ± 0.006)

0.35 ± 0.15

(0.014 ± 0.006)

0.50 ± 0.25

(0.020 ± 0.010)

Voltage: 6.3 16 4 6.3 10 16 25 4 6.3 10 16 25 50 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50

Cap(pF) 100 101 B A

150 151 B A

220 221 B A C

330 331 B A C

470 471 B A C

680 681 B A C

1000 102 B A A C

1500 152 B B A A C

2200 222 B B A A A C

3300 332 B B A A A C

4700 472 B B A A A C G

6800 682 B B A A A C G

Cap(µF) 0.01 103 B B A A A C G G G

0.015 150 B C G G G

0.022 223 B A A A A C C G G G N

0.033 333 B C G G G N

0.047 473 B A A A A C C G G G N

0.068 689 B C G G N

0.1 104 B A A A A C C C C G G G N N N

0.15 154 G N N

0.22 224 B A A A C C C C C G G N N N

0.33 334 G G N

0.47 474 B A A C C C C C EG J N P P

0.68 684 G N

1.0 105 A A C C C C C C C EG G G G J G G N N P P

1.5 155

2.2 225 C C C C C C C C G G J J J K K N N P P P

3.3 335 J J J N N

4.7 475 CE E E E J J J G G N P J N N P P

10 106 E E E K J J J P P P P P

22 226 E E K K K P P P P P

47 476 K K P P P

100 107 P P

Voltage: 6.3 16 4 6.3 10 16 25 4 6.3 10 16 25 50 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50

Case Size 0101* 0201 0402 0603 0805

Letter A B C EG J K M N P Q X Y Z

Max. 0.33 0.22 0.56 0.71 0.90 0.94 1.02 1.27 1.40 1.52 1.78 2.29 2.54 2.79

Thickness (0.013) (0.009) (0.022) (0.028) (0.035) (0.037) (0.040) (0.050) (0.055) (0.060) (0.070) (0.090) (0.100) (0.110)

PAPER EMBOSSED

PAPER and EMBOSSED available for 01005

NOTE: Contact factory for non-specied capacitance values

*EIA 01005

PREFERRED SIZES ARE SHADED

X5R Dielectric

Capacitance Range

042319

Letter A B C E G J K M N P Q X Y Z

Max.

Thickness

0.33

(0.013)

0.22

(0.009)

0.56

(0.022)

0.71

(0.028)

0.90

(0.035)

0.94

(0.037)

1.02

(0.040)

1.27

(0.050)

1.40

(0.055)

1.52

(0.060)

1.78

(0.070)

2.29

(0.090)

2.54

(0.100)

2.79

(0.110)

PAPER EMBOSSED

X5R Dielectric

Capacitance Range

PAPER and EMBOSSED available for 01005

NOTE: Contact factory for non-specied capacitance values

*EIA 01005

PREFERRED SIZES ARE SHADED

120318

Case Size 1206 1210 1812

Soldering Reow/Wave Reow Only Reow Only

Packaging Paper/Embossed Paper/Embossed All Embossed

(L) Length

mm 3.20 ± 0.20

(0.126 ± 0.008)

3.20 ± 0.20

(0.126 ± 0.008)

4.50 ± 0.30

(0.177 ± 0.012)

(in.)

(W) Width mm 1.60 ± 0.20

(0.063 ± 0.008)

2.50 ± 0.20

(0.098 ± 0.008)

3.20 ± 0.20

(0.126 ± 0.008)

(in.)

(t) Terminalmm 0.50 ± 0.25

(0.020 ± 0.010)

0.50 ± 0.25

(0.020 ± 0.010)

0.61 ± 0.36

(0.024 ± 0.014)

(in.)

Voltage: 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50

Cap(pF) 100 101

150 151

220 221

330 331

470 471

680 681

1000 102

1500 152

2200 222

3300 332

4700 472

6800 682

Cap(µF) 0.01 103

0.015 150

0.022 223

0.033 333

0.047 473

0.068 689

0.1 104

0.15 154

0.22 224

0.33 334

0.47 474 Q Q X X

0.68 684

1.0 105 Q Q Q X X X

1.5 155

2.2 225 Q Q Q Q Q X Z Z

3.3 335 Q Q

4.7 475 X X X X X X X Z Z Z Z Z

10 106 X X X X X X X X X Z Z Z Z Z

22 226 X X X X X Z Z Z Z Z Z Z Z Z Z

47 476 X X X X Z Z Z Z Z

100 107 X X Z Z Z Z

Voltage: 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50

Case Size 1206 1210 1812