M14D5121632A-3BIG2H - Elite Semiconductor Memory Technology, Inc.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 1/62

DDR II SDRAM 8M x 16 Bit x 4 Banks

DDR II SDRAM

Features

z JEDEC Standard

z VDD = 1.8V ± 0.1V, VDDQ = 1.8V ± 0.1V

z VDD = 1.75V ~ 1.9V, VDDQ = 1.75V ~ 1.9V (for speed grade -1.8)

z Internal pipelined double-data-rate architecture; two data access per clock cycle

z Bi-directional differential data strobe (DQS, DQS ); DQS can be disabled for single-ended data strobe operation.

z On-chip DLL

z Differential clock inputs (CLK and CLK )

z DLL aligns DQ and DQS transition with CLK transition

z Quad bank operation

z CAS Latency : 3, 4, 5, 6, 7

z Additive Latency: 0, 1, 2, 3, 4, 5, 6

z Burst Type : Sequential and Interleave

z Burst Length : 4, 8

z All inputs except data & DM are sampled at the rising edge of the system clock(CLK)

z Data I/O transitions on both edges of data strobe (DQS)

z DQS is edge-aligned with data for READ; center-aligned with data for WRITE

z Data mask (DM) for write masking only

z Off-Chip-Driver (OCD) impedance adjustment

z On-Die-Termination for better signal quality

z Special function support

- 50/ 75/ 150 ohm ODT

- High Temperature Self refresh rate enable

- Duty Cycle Corrector

z Auto & Self refresh

z Refresh cycle :

- 8192 cycles/64ms (7.8μs refresh interval) at -40 ℃ ≦ TC ≦ +85 ℃

- 8192 cycles/32ms (3.9μs refresh interval) at +85 ℃ ＜ TC ≦ +95 ℃

z SSTL_18 interface

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 2/62

Control Logic

Mode Register &

Extended Mode

Column

Address

Buffer

Refresh

Counter

Row

Address

Buffer

Refresh

Counter

Row Decoder

Sense Amplifier

Column Decoder

Data Control Circuit

Input & Output

Buffer

Address

Clock

Generator

CLK

CKE

RAS

CAS

DLL

CLK, CLK ODT

DQS, DQS

Ordering Information:

Product ID Max Freq. VDD Data Rate

(CL-tRCD-tRP) Package Comments

M14D5121632A -1.8BIG2H 533MHz 1.8V DDR2-1066 (7-7-7)

M14D5121632A -2.5BIG2H 400MHz 1.8V DDR2-800 (5-5-5)

M14D5121632A -3BIG2H 333MHz 1.8V DDR2-667(4-4-4)

84 ball BGA Pb-free

Functional Block Diagram

Bank A

Command Decoder

Bank D

Latch Circuit

Bank B

Bank C

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 3/62

BALL CONFIGURATION (TOP VIEW)

(BGA84, 8mmX12.5mmX1.2mm Body, 0.8mm Ball Pitch)

DQ14

DQ12

DQ6

SSQ

DDQ

SSQ

DQ1

CKE

BA0

A10

UDM

DQ11

DDQ

DQ15

DQ13

SSQ

DQ10

LDQS

DQ2

UDQS

SSQ

DDQ

SSQ

CLK

123 789

A12

DQ4

DQ9

DDQ

DDL

SSQ

REF

DDQ

LDM

DDQ

BA1

DQ3

UDQS

DQ8 V

DDQ

RAS

CAS

A11

CLK

SSQ LDQS

DDQ

DQ7

DQ5

DDQ

DQ0

SSQ

SSDL

ODT

SSQ

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 4/62

Pin Description

Pin Name Function Pin Name Function

A0~A12,

BA0,BA1

Address inputs

- Row address A0~A12

- Column address A0~A9

A10/AP : Auto Precharge

BA0, BA1 : Bank selects (4 Banks)

(LDM, UDM)

DM is an input mask signal for write data.

LDM is DM for DQ0~DQ7 and UDM is DM

for DQ8~DQ15.

DQ0~DQ15 Data-in/Data-out CLK, CLK Differential clock input

RAS Command input CKE Clock enable

CAS Command input CS Chip select

WE Command input VDDQ Supply Voltage for DQ

VSS Ground VSSQ Ground for DQ

VDD Power VREF Reference Voltage

DQS, DQS

(LDQS, LDQS

UDQS, UDQS )

Bi-directional differential Data Strobe.

LDQS and LDQS are DQS for DQ0~DQ7;

UDQS and LDQS are DQS for DQ8~DQ15.

VDDL Supply Voltage for DLL

ODT

On-Die-Termination.

ODT is only applied to DQ0~DQ15, DM,

DQS and DQS .

VSSDL Ground for DLL

NC No connection

Absolute Maximum Rating

Parameter Symbol Value Unit

Voltage on any pin relative to VSS V

IN, VOUT -0.5 ~ 2.3 V

Voltage on VDD supply relative to VSS V

DD -1.0 ~ 2.3 V

Voltage on VDDL supply relative to VSS V

DDL -0.5 ~ 2.3 V

Voltage on VDDQ supply relative to VSS V

DDQ -0.5 ~ 2.3 V

Storage temperature TSTG -55 ~ +100 C° (

Note *)

Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a

stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect

reliability.

Note *: Storage Temperature is the case surface temperature on the center/top side of the DRAM.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 5/62

Operation Temperature Condition

Parameter Symbol Value Unit

Operation temperature TC -40 ~ +95 C°

Note: 1. Operating temperature is the case surface temperature on the center/top side of the DRAM.

2. Supporting -40 to +85℃ with full AC and DC specifications.

Supporting -40 to + 85℃ and being able to extend to + 95 ℃ with doubling auto-refresh commands in frequency to a

32ms period ( tREFI = 3.9μs ) and higher temperature Self-Refresh entry via A7 “1” on EMRS(2).

DC Operation Condition & Specifications

DC Operation Condition

(Recommended DC operating conditions)

Parameter Symbol Min. Typ. Max. Unit Note

Supply voltage VDD 1.7 1.8 1.9 V 4,9

Supply voltage for DLL VDDL 1.7 1.8 1.9 V 4,9

Supply voltage for output VDDQ 1.7 1.8 1.9 V 4,9

Input reference voltage VREF 0.49 x VDDQ 0.5 x VDDQ 0.51 x VDDQ V 1,2,9

Termination voltage (system) VTT V

REF - 0.04 VREF V

REF + 0.04 V 3,9

Input logic high voltage VIH (DC) VREF + 0.125 - VDDQ + 0.3 V

Input logic low voltage VIL (DC) -0.3 - VREF - 0.125 V

(All voltages referenced to VSS)

Parameter Symbol Value Unit Note

Minimum required output pull-up under AC test load VOH V

TT + 0.603 V 8

Maximum required output pull-down under AC test load VOL V

TT - 0.603 V 8

Input leakage current |I LI| 5 uA 5

Output leakage current |I LO| 5 uA 6

Output minimum source DC current ( VDDQ(min); VOUT

=1.42V )

I OH -13.4 mA 7, 8

Output minimum sink DC current ( VDDQ(min); VOUT =

0.28V )

I OL +13.4 mA 7, 8

Note:

1. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of

REF is expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ.

2. Peak to peak AC noise on VREF may not exceed ±2% VREF(DC).

3. VTT of transmitting device must track VREF of receiving device.

4. VDDQ and VDDL track VDD. AC parameters are measured with VDD, VDDQ and VDDL tied together.

5. Any input 0V ≤ VIN ≤ VDD; all other balls not under test = 0V.

6. 0V ≤ VOUT ≤ VDDQ; DQ and ODT disabled.

7. The DC value of VREF applied to the receiving device is expected to be set to VTT.

8. After OCD calibration to 18Ω at TC = 25℃, VDD = VDDQ = 1.8V.

9. There is no specific device VDD supply voltage requirement for SSTL_18 compliance. However, under all conditions

VDDQ must be less than or equal to VDD.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 6/62

DC Specifications

(IDD values are for the operation range of Voltage and Temperature)

Version

Parameter Symbol Test Condition

-1.8 -2.5 -3

Unit

Operating Current

(Active - Precharge) IDD0

One bank;

tCK = tCK (IDD), tRC = tRC (IDD), tRAS = tRAS (IDD)min;

CKE is High, CS is HIGH between valid commands;

Address bus inputs are SWITCHING;

Data bus inputs are SWITCHING

100 90 80 mA

Operating Current

(Active - Read -

Precharge)

IDD1

One bank; IOUT = 0mA;

BL = 4, CL = CL(IDD), AL = 0;

tCK = tCK (IDD), tRC = tRC (IDD),

tRAS = tRAS (IDD)min, tRCD = tRCD (IDD);

CKE is HIGH, CS is HIGH between valid commands;

Address bus inputs are SWITCHING;

Data pattern is same as IDD4W

120 110 110 mA

Precharge

Power-Down

Standby Current

IDD2P

All banks idle;

tCK = tCK (IDD); CKE is LOW;

Other control and address bus inputs are STABLE;

Data bus inputs are FLOATING

15 15 15 mA

Precharge Quiet

Standby Current IDD2Q

All banks idle;

tCK = tCK (IDD); CKE is HIGH, CS is HIGH;

Other control and address bus inputs are STABLE;

Data bus inputs are FLOATING

60 55 50 mA

Idle Standby Current IDD2N

All banks idle;

tCK = tCK (IDD); CKE is HIGH, CS is HIGH;

Other control and address bus inputs are SWITCHING;

Data bus inputs are SWITCHING

60 55 50 mA

Fast PDN Exit

MRS(12) = 0 75 65 60

Active Power-down

Standby Current IDD3P

All banks open;

tCK = tCK (IDD); CKE is LOW;

Other control and address bus inputs

are STABLE;

Data bus input are FLOATING

Slow PDN Exit

MRS(12) = 1 25 25 25

Active Standby

Current IDD3N

All banks open;

tCK = tCK (IDD), tRAS = tRAS (IDD)max, tRP = tRP (IDD);

CKE is HIGH, CS is HIGH between valid commands;

Other control and address bus inputs are SWITCHING;

Data bus inputs are SWITCHING

95 80 75 mA

Operation Current

(Read) IDD4R

All banks open, continuous burst Reads, IOUT = 0mA;

BL = 4, CL = CL (IDD), AL = 0;

tCK = tCK (IDD), tRAS = tRAS (IDD)max, tRP = tRP (IDD);

CKE is HIGH, CS is HIGH between valid commands;

Address bus inputs are SWITCHING;

Data pattern is the same as IDD4W;

230 190 180 mA

Operation Current

(Write) IDD4W

All banks open, continuous burst Writes;

BL = 4, CL = CL (IDD), AL = 0;

tCK = tCK (IDD), tRAS = tRAS (IDD)max, tRP = tRP (IDD);

CKE is HIGH, CS is HIGH between valid commands;

Address bus inputs are SWITCHING;

Data bus inputs are SWITCHING

240 200 190 mA

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 7/62

Version

Parameter Symbol Test Condition

-1.8 -2.5 -3

Unit

Auto Refresh Current IDD5

tCK = tCK (IDD);

Refresh command every tRFC (IDD) interval;

CKE is HIGH, CS is HIGH between valid commands;

Other control and address bus inputs are SWITCHING;

Data bus inputs are SWITCHING

150 110 100 mA

Self Refresh Current IDD6

Self Refresh Mode;

CLK and CLK at 0V; CKE

≤

0.2V;

Other control and address bus inputs are FLOATING;

Data bus inputs are FLOATING

10 mA

Operating Current

(Bank interleaving) IDD7

All bank interleaving Reads, IOUT = 0mA;

BL = 4, CL= CL (IDD), AL = tRCD (IDD) – 1 × tCK (IDD);

tCK = tCK (IDD), tRC = tRC (IDD),

tRRD = tRRD (IDD), tRCD = 1 × tCK (IDD);

CKE is HIGH, CS is HIGH between valid commands;

Address bus inputs are STABLE during Deslects;

Data pattern is the same as IDD4W;

280 220 200 mA

Note:

1. IDD specifications are tested after the device is properly initialized.

2. Input slew rate is specified by AC Input Test Condition.

3. IDD parameters are specified with ODT disabled.

4. Data bus consists of DQ, DM, DQS and DQS , IDD values must be met with all combinations of EMRS bits 10 and 11.

5. Definitions for IDD:

LOW is defined as V

≤

VIL (AC) (max.).

HIGH is defined as VIN V

IH (AC) (min.).

STABLE is defined as inputs stable at a HIGH or LOW level.

FLOATING is defined as inputs at VREF = VDDQ/2

SWITCHING is defined as:

Address and control signal Inputs are changed between HIGH and LOW every other clock cycle (once per two clocks), and

DQ (not including mask or strobe) signal inputs are changed between HIGH and LOW every other data transfer (once per

clock).

6. When T

C ≧ +85 ℃, IDD6 must be derated by 80%.

IDD6 will increase by this amount if TC ≧ +85 ℃ and double refresh option is still enabled.

7. AC Timing for IDD test conditions

For purposes of IDD testing, the following parameters are to be utilized.

-1.8 -2.5 -3

Parameter DDR2-1066 (7-7-7) DDR2-800 (5-5-5) DDR2-667 (4-4-4) Unit

CL (IDD) 7 5 4 tCK

tRCD (IDD) 13.125 12.5 12 ns

tRC (IDD) 58.125 57.5 57 ns

tRRD (IDD) 10 10 10 ns

tFAW (IDD) 45 45 50 ns

tCK (IDD) 1.875 2.5 3 ns

tRAS (IDD) min. 45 45 45 ns

tRAS (IDD) max. 70000 ns

tRP (IDD) 13.25 12.5 12 ns

tRFC (IDD) 105 105 105 ns

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 8/62

AC Operation Conditions & Timing Specification

AC Operation Conditions

-1.8/ 2.5/ 3

Parameter Symbol

Min. Max.

Unit Note

Input High (Logic 1) Voltage VIH(AC) VREF + 0.2 V

Input Low (Logic 0) Voltage VIL(AC) VREF - 0.2 V

Input Differential Voltage VID(AC) 0.5 VDDQ+0.6 V 1

Input Crossing Point Voltage VIX(AC) 0.5 x VDDQ - 0.175 0.5 x VDDQ + 0.175 V 2

Output Crossing Point Voltage VOX(AC) 0.5 x VDDQ - 0.125 0.5 x VDDQ + 0.125 V 2

Note:

1. VID(AC) specifies the input differential voltage |VTR – VCP| required for switching, where VTR is the true input signal (such

as CLK,DQS) and VCP is the complementary input signal (such as CLK , DQS ). The minimum value is equal to VIH(AC) –

IL(AC).

2. The typical value of VIX / VOX(AC) is expected to be about 0.5 x VDDQ of the transmitting device and VIX / VOX(AC) is

expected to track variations in VDDQ. VIX / VOX(AC) indicates the voltage at which differential input / output signals must

cross.

Input / Output Capacitance

Parameter Symbol Min. Max. Unit Note

-1.8/ 2.5 1.0 1.75

Input capacitance

(A0~A12, BA0~BA1, CKE, CS , RAS , CAS , WE , ODT) -3

CIN1

1.0 2.0

pF 1

Input capacitance (CLK, CLK ) CIN2 1.0 2.0 pF

DQS, DQS & Data input/output capacitance -1.8/ 2.5/ 3 CI / O 2.5 3.5 pF

Input capacitance (DM) -1.8/ 2.5/ 3 CIN3 2.5 3.5 pF

Note: 1. Capacitance delta is 0.25 pF.

2. Capacitance delta is 0.5 pF.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 9/62

AC Overshoot / Undershoot Specification

Value

Parameter Pin

-1.8 -2.5 -3

Unit

Maximum peak amplitude allowed for

overshoot

Address, CKE, CS , RAS , CAS , WE ,

ODT, CLK, CLK , DQ, DQS, DQS , DM

0.5 0.5 V

Maximum peak amplitude allowed for

undershoot

Address, CKE, CS , RAS , CAS , WE ,

ODT, CLK, CLK , DQ, DQS, DQS , DM

0.5 0.5 V

Address, CKE, CS , RAS , CAS , WE ,

ODT, 0.5 0.66 0.8 V-ns

Maximum overshoot area above VDD

CLK, CLK , DQ, DQS, DQS , DM 0.19 0.23 V-ns

Address, CKE, CS , RAS , CAS , WE ,

ODT, 0.5 0.8 V-ns

Maximum undershoot area below VSS

CLK, CLK , DQ, DQS, DQS , DM 0.19 0.23 V-ns

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 10/62

AC Operating Test Conditions

Parameter Value Unit Note

Input reference voltage ( VREF ) 0.5 x VDDQ V 1

Input signal maximum peak swing ( VSWING(max.) ) 1.0 V 1

Input signal minimum slew rate 1.0 V/ns 2,3

Input level VIH / VIL V

Input timing measurement reference level VREF V

Output timing measurement reference level (VOTR) 0.5 x VDDQ V 4

Note:

1. Input waveform timing is referenced to the input signal crossing through the VIH / VIL (AC) level applied to the device under

test.

2. The input signal minimum slew rate is to be maintained over the range from VREF to VIH (AC) (min.) for rising edges and the

range from VREF to VIL (AC)(max.) for falling edges as shown in the below figure.

3. AC timings are referenced with input waveforms switching from VIL (AC) to VIH (AC) on the positive transitions and VIH (AC) to

VIL (AC) on the negative transitions.

4. The VDDQ of the device under test is reference.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 11/62

AC Timing Parameter & Specifications

-1.8

Parameter Symbol

Min. Max.

Unit Note

Clock period CL=7 tCK (avg) 1875 7500 ps 13

DQ output access time from

CLK/ CLK tAC -350 +350 ps 10

CLK high-level width tCH (avg) 0.48 0.52

tCK (avg) 13

CLK low-level width tCL (avg) 0.48 0.52

tCK (avg) 13

DQS output access time from

CLK/ CLK tDQSCK -325 +325

ps 10

Clock to first rising edge of DQS

delay tDQSS -0.25 +0.25

tCK (avg)

Data-in and DM setup time

(to DQS)

tDS

(base) 0 -

ps 4

Data-in and DM hold time

(to DQS)

tDH

(base) 75 -

ps 5

DQ and DM input pulse width

(for each input) tDIPW 0.35 -

tCK (avg)

Address and Control Input

setup time tIS (base) 125 -

ps 4

Address and Control Input hold

time tIH (base) 200 -

ps 5

Control and Address input pulse

width tIPW 0.6 -

tCK (avg)

DQS input high pulse width tDQSH 0.35 -

tCK (avg)

DQS input low pulse width tDQSL 0.35 -

tCK (avg)

DQS falling edge to CLK rising

setup time tDSS 0.2 -

tCK (avg)

DQS falling edge from CLK

rising hold time tDSH 0.2 -

tCK (avg)

Data strobe edge to output data

edge tDQSQ - 175

Data-out high-impedance

window from CLK/ CLK tHZ - tAC(max.) ps 10

Data-out low-impedance window

from CLK/ CLK

tLZ

(DQS) tAC(min.) tAC(max.) ps 10

DQ low-impedance window from

CLK/ CLK

tLZ

(DQ) 2 x tAC(min.) tAC(max.) ps 10

Half clock period tHP Min

(tCL(abs),tCH(abs)) - ps 6,13

DQ/DQS output hold time from

DQS tQH tHP-tQHS -

DQ hold skew factor tQHS - 250

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 12/62

AC Timing Parameter & Specifications - Contiuned

-1.8

Parameter Symbol

Min. Max.

Unit Note

Active to Precharge command tRAS 45 70K ns

Active to Active command

(same bank) tRC 58.125 - ns

Auto Refresh row cycle time tRFC 105 - ns

Active to Read, Write delay tRCD 13.125 - ns

Precharge command period tRP 13.125 - ns

Active bank A to Active bank B

command tRRD 10 - ns

Write recovery time tWR 15 - ns

Write data in to Read command

delay tWTR 7.5 - ns

Col. address to Col. address

delay tCCD 2 - tCK

Active to Auto Precharge delay tRAP tRCD(min.) - ns

Average periodic Refresh

interval ( -40℃ ≦TC ≦ +85℃ )tREFI - 7.8 us

Average periodic Refresh

interval (+85℃ ＜TC ≦ +95℃) tREFI - 3.9 us

Write preamble tWPRE 0.35 - tCK (avg)

Write postamble tWPST 0.4 0.6 tCK (avg)

DQS Read preamble tRPRE 0.9 1.1 tCK (avg) 11

DQS Read postamble tRPST 0.4 0.6 tCK (avg) 12

Load Mode Register / Extended

Mode Register cycle time tMRD 2 - tCK

Auto Precharge write recovery

+ Precharge time tDAL WR+tnRP - tCK 1

Internal Read to Precharge

command delay tRTP 7.5 - ns

Exit Self Refresh to Read

command tXSRD 200 - tCK

Exit Self Refresh to non-Read

command tXSNR tRFC + 10 - ns

Exit Precharge Power-Down to

any non-Read command tXP 3 - tCK

Exit Active Power-Down to

Read command tXARD 3 - tCK 3

Exit active power-down to Read

command

(slow exit / low power mode)

tXARDS 10 - AL - tCK 2,3

CKE minimum pulse width

(high and low pulse width) tCKE 3 - tCK

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 13/62

AC Timing Parameter & Specifications - Contiuned

-1.8

Parameter Symbol

Min. Max.

Unit Note

Minimum time clocks remains

ON after CKE asynchronously

drops low

tDELAY t

IS + tCK (avg)+tIH - ns

Output impedance test driver

delay tOIT 0 12

MRS command to ODT update

delay tMOD 0 12

ODT turn-on delay tAOND 2 2

tCK

ODT turn-on tAON tAC(min.) tAC(max.) + 2575 ps 14,16

ODT turn-on (Power-Down

mode) tAONPD tAC(min.) + 2000 3 x tCK +tAC(max.)

+ 1000 ps

ODT turn-off delay tAOFD 2.5 2.5

tCK 15,17,

ODT turn-off tAOF tAC(min.) tAC(max.) + 600 ps

ODT turn-off (Power-Down

mode) tAOFPD tAC(min.) + 2000 2.5 x tCK

+tAC(max.) + 1000 ps

ODT to Power-Down entry

latency tANPD 4 -

tCK

ODT Power-Down exit latency tAXPD 11 -

tCK

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 14/62

AC Timing Parameter & Specifications - Contiuned

-2.5 -3

Parameter Symbol

Min. Max. Min. Max.

Unit Note

CL=6 2500 8000 - -

CL=5 2500 8000 3000 8000

Clock period

CL=4

tCK (avg)

- - 3750 8000

ps 13

DQ output access time from

CLK/ CLK tAC -400 +400 -450 +450

ps 10

CLK high-level width tCH (avg) 0.48 0.52 0.48 0.52

tCK (avg) 13

CLK low-level width tCL (avg) 0.48 0.52 0.48 0.52

tCK (avg) 13

DQS output access time from

CLK/ CLK tDQSCK -350 +350 -400 +400

ps 10

Clock to first rising edge of DQS

delay tDQSS -0.25 +0.25 -0.25 +0.25

tCK (avg)

Data-in and DM setup time

(to DQS)

tDS

(base) 50 - 100 -

ps 4

Data-in and DM hold time

(to DQS)

tDH

(base) 125 - 175 -

ps 5

DQ and DM input pulse width

(for each input) tDIPW 0.35 - 0.35 -

tCK (avg)

Address and Control Input

setup time tIS (base) 175 - 200 -

ps 4

Address and Control Input hold

time tIH (base) 250 - 275 -

ps 5

Control and Address input pulse

width tIPW 0.6 - 0.6 -

tCK (avg)

DQS input high pulse width tDQSH 0.35 - 0.35 -

tCK (avg)

DQS input low pulse width tDQSL 0.35 - 0.35 -

tCK (avg)

DQS falling edge to CLK rising

setup time tDSS 0.2 - 0.2 -

tCK (avg)

DQS falling edge from CLK

rising hold time tDSH 0.2 - 0.2 -

tCK (avg)

Data strobe edge to output data

edge tDQSQ - 200 - 240

Data-out high-impedance

window from CLK/ CLK tHZ - tAC(max.) - tAC(max.) ps 10

Data-out low-impedance window

from CLK/ CLK

tLZ

(DQS) tAC(min.) tAC(max.) tAC(min.) tAC(max.) ps 10

DQ low-impedance window from

CLK/ CLK

tLZ

(DQ) 2 x tAC(min.) tAC(max.) 2 x tAC(min.) tAC(max.) ps 10

Half clock period tHP Min

(tCL(abs),tCH(abs)) - Min

(tCL(abs),tCH(abs)) - ps 6,13

DQ/DQS output hold time from

DQS tQH tHP-tQHS - tHP-tQHS -

DQ hold skew factor tQHS - 300 - 340

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 15/62

AC Timing Parameter & Specifications - Contiuned

-2.5 -3

Parameter Symbol

Min. Max. Min. Max.

Unit Note

Active to Precharge command tRAS 45 70K 45 70K ns

Active to Active command

(same bank) tRC 57.5 - 57 - ns

Auto Refresh row cycle time tRFC 105 - 105 - ns

Active to Read, Write delay tRCD 12.5 - 12 - ns

Precharge command period tRP 12.5 - 12 - ns

Active bank A to Active bank B

command tRRD 10 - 10 - ns

Write recovery time tWR 15 - 15 - ns

Write data in to Read command

delay tWTR 7.5 - 7.5 - ns

Col. address to Col. address

delay tCCD 2 - 2 - tCK

Average periodic Refresh

interval ( -40℃ ≦TC ≦ +85℃ )tREFI - 7.8 - 7.8 us

Average periodic Refresh

interval (+85℃ ＜TC ≦ +95℃) tREFI - 3.9 - 3.9 us

Write preamble tWPRE 0.35 - 0.35 - tCK (avg)

Write postamble tWPST 0.4 0.6 0.4 0.6 tCK (avg)

DQS Read preamble tRPRE 0.9 1.1 0.9 1.1 tCK (avg) 11

DQS Read postamble tRPST 0.4 0.6 0.4 0.6 tCK (avg) 12

Load Mode Register / Extended

Mode Register cycle time tMRD 2 - 2 - tCK

Auto Precharge write recovery

+ Precharge time tDAL WR+tnRP - WR+tnRP - tCK 1

Internal Read to Precharge

command delay tRTP 7.5 - 7.5 - ns

Exit Self Refresh to Read

command tXSRD 200 - 200 - tCK

Exit Self Refresh to non-Read

command tXSNR tRFC + 10 - tRFC + 10 - ns

Exit Precharge Power-Down to

any non-Read command tXP 2 - 2 - tCK

Exit Active Power-Down to

Read command tXARD 2 - 2 - tCK 3

Exit active power-down to Read

command

(slow exit / low power mode)

tXARDS 8 - AL - 7 - AL - tCK 2,3

CKE minimum pulse width

(high and low pulse width) tCKE 3 - 3 - tCK

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 16/62

AC Timing Parameter & Specifications - Contiuned

-2.5 -3

Parameter Symbol

Min. Max. Min. Max.

Unit Note

Minimum time clocks remains

ON after CKE asynchronously

drops low

tDELAY t

IS + tCK (avg)+tIH - tIS + tCK (avg)+tIH - ns

Output impedance test driver

delay tOIT 0 12 0 12

MRS command to ODT update

delay tMOD 0 12 0 12

ODT turn-on delay tAOND 2 2 2 2

tCK

ODT turn-on tAON tAC(min.) tAC(max.) + 700 tAC(min.) tAC(max.) +

700 ps 14,16

ODT turn-on (Power-Down

mode) tAONPD tAC(min.) + 2000

2 x tCK

+tAC(max.) +

1000

tAC(min.) + 2000

2 x tCK

+tAC(max.) +

1000

ODT turn-off delay tAOFD 2.5 2.5 2.5 2.5

tCK 15,17

,18

ODT turn-off tAOF tAC(min.) tAC(max.) + 600 tAC(min.) tAC(max.) +

600 ps

ODT turn-off (Power-Down

mode) tAOFPD tAC(min.) + 2000

2.5 x tCK

+tAC(max.) +

1000

tAC(min.) + 2000

2.5 x tCK

+tAC(max.) +

1000

ODT to Power-Down entry

latency tANPD 3 - 3 -

tCK

ODT Power-Down exit latency tAXPD 8 - 8 -

tCK

Note:

1. tDAL[nCLK] = WR[nCLK] + tnRP[nCLK] =WR+RU{tRP[ps]/tCK(avg)[ps]}, where WR is the value programmed in the mode

2. AL: Additive Latency.

3. MRS A12 bit defines which Active Power-Down Exit timing to be applied.

4. The figures of Input Waveform Timing 1 and 2 are referenced from the input signal crossing at the VIH (AC) level for a rising

signal and VIL (AC) for a falling signal applied to the device under test.

5. The figures of Input Waveform Timing 1 and 2 are referenced from the input signal crossing at the VIL (DC) level for a rising

signal and VIH (DC) for a falling signal applied to the device under test.

6. tHP is the minimum of the absolute half period of the actual input clock. tHP is an input parameter but not an input

specification parameter. It is used in conjunction with tQHS to derive the DRAM output timing tQH. The value to be used for tQH

calculation is determined by the following equation;

HP = Min ( tCH (abs), tCL (abs) ), where:

CH (abs) is the minimum of the actual instantaneous clock HIGH time;

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

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CL (abs) is the minimum of the actual instantaneous clock LOW time;

7. tQHS accounts for:

a. The pulse duration distortion of on-chip clock circuits, which represents how well the actual tHP at the input is

transferred to the output; and

b. The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next transition, both

of which are independent of each other, due to data pin skew, output pattern effects, and p-channel to n-channel

variation of the output drivers.

8. tQH = tHP - tQHS, where:

tHP is the minimum of the absolute half period of the actual input clock; and tQHS is the specification value under the max

column. {The less half-pulse width distortion present, the larger the tQH value is; and the larger the valid data eye will be.}

Examples:

a. If the system provides tHP of 1315 ps into a DDR2-667 SDRAM, the DRAM provides tQH of 975 ps minimum.

b. If the system provides tHP of 1420 ps into a DDR2-667 SDRAM, the DRAM provides tQH of 1080 ps minimum.

9. RU stands for round up. WR refers to the tWR parameter stored in the MRS.

10. When the device is operated with input clock jitter, this parameter needs to be de-rated by the actual tERR (6-10per) of the

input clock. (output de-ratings are relative to the SDRAM input clock.)

For example, if the measured jitter into a DDR2-667 SDRAM has tERR (6-10per)(min.) = - 272 ps and tERR (6-10per)(max.) =

+ 293 ps, then tDQSCK (min.)(derated) = tDQSCK (min.) - tERR (6-10per)(max.) = - 400 ps - 293 ps = - 693 ps and tDQSCK (max.)

(derated) = tDQSCK (max.) - tERR (6-10per)(min.) = 400 ps + 272 ps = + 672 ps. Similarly, tLZ (DQ) for DDR2-667 de-rates to tLZ

(DQ)(min.)(derated) = - 900 ps - 293 ps = - 1193 ps and tLZ (DQ)(max.)(derated) = 450 ps + 272 ps = + 722 ps.

11. When the device is operated with input clock jitter, this parameter needs to be de-rated by the actual tJIT (per) of the input

clock. (output de-ratings are relative to the SDRAM input clock.)

For example, if the measured jitter into a DDR2-667 SDRAM has tJIT (per)(min.) = - 72 ps and tJIT (per)(max.) = + 93 ps, then

tRPRE (min.)(derated) = tRPRE (min.) + tJIT (per)(min.) = 0.9 x tCK (avg) - 72 ps = + 2178 ps and tRPRE (max.)(derated) = tRPRE

(max.) + tJIT (per)(max.) = 1.1 x tCK (avg) + 93 ps = + 2843 ps.

12. When the device is operated with input clock jitter, this parameter needs to be de-rated by the actual tJIT (duty) of the input

clock. (output de-ratings are relative to the SDRAM input clock.)

For example, if the measured jitter into a DDR2-667 SDRAM has tJIT (duty)(min.) = - 72 ps and tJIT (duty)(max.) = + 93 ps,

then tRPST (min.)(derated) = tRPST (min.) + tJIT (duty)(min.) = 0.4 x tCK (avg) - 72 ps = + 928 ps and tRPST (max.)(derated) =

tRPST (max.) + tJIT (duty)(max.) = 0.6 x tCK (avg) + 93 ps = + 1592 ps.

13. Refer to the Clock Jitter table.

14. ODT turn on time min is when the device leaves high impedance and ODT resistance begins to turn on.

ODT turn on time max is when the ODT resistance is fully on. Both are measured from tAOND.

15. ODT turn off time min is when the device starts to turn off ODT resistance.

ODT turn off time max is when the bus is in high impedance. Both are measured from tAOFD.

16. When the device is operated with input clock jitter, this parameter needs to be de-rated by the actual tERR (6-10per) of the

input clock. (output de-ratings are relative to the SDRAM input clock.)

17. When the device is operated with input clock jitter, this parameter needs to be derated by { - tJIT (duty)(max.) - tERR

(6-10per)(max.) } and { - tJIT (duty)(min.) - tERR (6-10per)(min.) } of the actual input clock. (output deratings are relative to the

SDRAM input clock.)

For example, if the measured jitter into a DDR2-667 SDRAM has tERR (6-10per)(min.) = - 272 ps, tERR (6- 10per)(max.) = +

293 ps, tJIT (duty)(min.) = - 106 ps and tJIT (duty)(max.) = + 94 ps, then tAOF(min.)(derated) = tAOF(min.) + { - tJIT (duty)(max.) -

tERR (6-10per)(max.) } = - 450 ps + { - 94 ps - 293 ps} = - 837 ps and tAOF(max.)(derated) = tAOF(max.) + { - tJIT (duty)(min.) -

tERR (6-10per)(min.) } = 1050 ps + { 106 ps + 272 ps } = + 1428 ps.

18. For tAOFD of DDR2-667/800/1066, the 1/2 clock of tCK in the 2.5 x tCK assumes a tCH (avg), average input clock HIGH pulse

width of 0.5 relative to tCK (avg). tAOF (min.) and tAOF (max.) should each be derated by the same amount as the actual

amount of tCH (avg) offset present at the DRAM input with respect to 0.5.

For example, if an input clock has a worst case tCH (avg) of 0.48, the tAOF (min.) should be derated by subtracting 0.02 x tCK

(avg) from it, whereas if an input clock has a worst case tCH (avg) of 0.52, the tAOF (max.) should be derated by adding 0.02 x

tCK (avg) to it. Therefore, we have;

tAOF (min.)(derated) = tAC (min.) - [0.5 - Min(0.5, tCH (avg)(min.))] x tCK (avg)

tAOF (max.)(derated) = tAC (max.) + 0.6 + [Max(0.5, tCH (avg)(max.)) - 0.5] x tCK (avg) or

tAOF (min.)(derated) = Min(tAC (min.), tAC (min.) - [0.5 - tCH (avg)(min.)] x tCK (avg))

tAOF (max.)(derated) = 0.6 + Max(tAC (max.), tAC (max.) + [tCH (avg)(max.) - 0.5] x tCK (avg)), where:

tCH (avg)(min.) and tCH (avg)(max.) are the minimum and maximum of tCH (avg) actually measured at the DRAM input balls.

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 18/62

ODT DC Electrical Characteristics

Parameter Symbol Min. Typ. Max. Unit

Rtt effective impedance value for 75Ω setting

EMRS(1) [A6, A2] = 0, 1 Rtt1(eff) 60 75 90

Rtt effective impedance value for 150Ω setting

EMRS(1) [A6, A2) = 1, 0 Rtt2(eff) 120 150 180

Rtt effective impedance value for 50Ω setting

EMRS(1) [A6, A2] = 1, 1 Rtt3(eff) 40 50 60

Deviation of VM with respect to VDDQ /2 △VM -6 - +6 %

Note:

Measurement Definition for Rtt(eff) :

Rtt(eff) is determined by separately applying VIH(AC) and VIL(AC) to test pin, and then measuring current I(VIH(AC)) and

I(VIL(AC)) respectively.

Measurement Definition for △VM :

Measure voltage (VM) at test pin with no load.

OCD Default Characteristics

Parameter Min. Typ. Max. Unit Note

Output impedance 12.6 18 23.4 Ω 1

Pull-up and pull-down mismatch 0 - 4

Ω 1,2,3

Output slew rate 1.5 - 5 V/ns 1,4,5

Note:

1. Absolute specifications: the operation range of Voltage and Temperature.

2. Impedance measurement condition for output source DC current: VDDQ = 1.7V; VOUT = 1,420mV; (VOUT - VDDQ)/IOH must be

less than 23.4Ω for values of VOUT between VDDQ and VDDQ - 280mV. Impedance measurement condition for output sink

DC current: VDDQ = 1.7V; VOUT = 280mV; VOUT/IOL must be less than 23.4Ω for values of VOUT between 0V and 280mV.

3. Mismatch is absolute value between pull-up and pull-down; both are measured at same temperature and voltage.

4. Slew rate measured from VIL (AC) to VIH (AC).

5. The absolute value of the slew rate as measured from DC to DC is equal to or greater than the slew rate as measured from

AC to AC.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 19/62

Clock Jitter [ DDR2- 1066, 800, 667 ]

-1.8 -2.5 -3

Parameter Symbol

Min. Max. Min. Max. Min. Max. Unit Note

Average clock period tCK (avg) 1875 7500 2500 8000 3000 8000 ps 1

Clock period jitter tJIT (per) -90 90 -100 100 -125 125 ps 5

Clock period jitter during

DLL locking period tJIT (per,lck) -80 80 -80 80 -100 100 ps 5

Cycle to cycle period jitter tJIT (cc) -180 180 -200 200 -250 250 ps 6

Cycle to cycle clock period jitter

During DLL locking period tJIT (cc, lck) -160 160 -160 160 -200 200 ps 6

Cumulative error across 2 cycles tERR (2per) -132 132 -150 150 -175 175 ps 7

Cumulative error across 3 cycles tERR (3per) -157 157 -175 175 -225 225 ps 7

Cumulative error across 4 cycles tERR (4per) -175 175 -200 200 -250 250 ps 7

Cumulative error across 5 cycles tERR (5per) -188 188 -200 200 -250 250 ps 7

Cumulative error across

n=6,7,8,9,10 cycles tERR (6-10per) -250 250 -300 300 -350 350 ps 7

Cumulative error across

n=11,12,….49,50 cycles tERR (11-50per) -425 425 -450 450 -450 450 ps 7

Average high pulse width tCH (avg) 0.48 0.52 0.48 0.52 0.48 0.52 tCK (avg) 2

Average low pulse width tCL (avg) 0.48 0.52 0.48 0.52 0.48 0.52 tCK (avg) 3

Duty cycle jitter tJIT (duty) -75 75 -100 100 -125 125 ps 4

Note:

1. tCK (avg) is calculated as the average clock period across any consecutive 200 cycle window.

2. tCH (avg) is defined as the average HIGH pulse width, as calculated across any consecutive 200 HIGH pulses.

3. tCL (avg) is defined as the average LOW pulse width, as calculated across any consecutive 200 LOW pulses.

4. tJIT (duty) is defined as the cumulative set of tCH jitter and tCL jitter. tCH jitter is the largest deviation of any single tCH from tCH

(avg). tCL jitter is the largest deviation of any single tCL from tCL (avg).

tJIT (duty) is not subject to production test.

tJIT (duty) = Min./Max. of { tJIT (CH), tJIT (CL)}, where:

tJIT (CH) = { tCH j - tCH (avg) where j =1 to 200}

tJIT (CL) = {tCL j - tCL (avg) where j =1 to 200}

5. tJIT (per) is defined as the largest deviation of any single tCK from tCK (avg).

tJIT (per) = Min./Max. of { tCK j - tCK (avg) where j =1 to 200}

tJIT (per) defines the single period jitter when the DLL is already locked.

tJIT (per, lck) uses the same definition for single period jitter, during the DLL locking period only.

tJIT (per) and tJIT (per, lck) are not subject to production testing.

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 20/62

6. tJIT (cc) is defined as the difference in clock period between two consecutive clock cycles : tJIT (cc) = Max. of | tCK i +1 - tCK i|

tJIT (cc) defines the cycle to cycle jitter when the DLL is already locked.

tJIT (cc, lck) uses the same definition for cycle to cycle jitter, during the DLL locking period only.

tJIT (cc) and tJIT (cc, lck) are not subject to production testing.

7. tERR (nper) is defined as the cumulative error across multiple consecutive cycles from tCK (avg).

tERR (nper) is not subject to production testing.

8. These parameters are specified per their average values, however it is understood that the following relationship between

the average timing and the absolute instantaneous timing holds at all times. (Min. and max. of SPEC values are to be used

for calculations in the table below.)

Parameter Symbol Min. Max. Unit

Absolute clock period tCK (abs) tCK (avg)(min.) + tJIT (per)(min.) tCK (avg)(max.) + tJIT (per)(max.) ps

Absolute clock high pulse width tCH (abs) tCH (avg)(min.) x tCK (avg)(min.) +

tJIT (duty)(min.)

tCH (avg)(max.) x tCK (avg)(max.)

+ tJIT (duty)(max.) ps

Absolute clock low pulse width tCL (abs) tCL (avg)(min.) x tCK (avg)(min.) +

tJIT (duty)(min.)

tCL (avg)(max.) x tCK (avg)(max.)

+ tJIT (duty)(max.) ps

Example: For DDR2-1066, tCH (abs)(min.) = (0.48 x 1875ps) - 75 ps = 825 ps

Input Slew Rate De-rating

For all input signals the total tIS, tDS (setup time) and tIH, tDH (hold time) required is calculated by adding the data sheet tIS (base), tDS

(base) and tIH (base), tDH (base) value to the ΔtIS, ΔtDS and ΔtIH, ΔtDH de-rating value respectively.

Example: tDS (total setup time) = tDS (base) + ΔtDS.

Setup (tIS, tDS) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VREF (DC) and the first

crossing of VIH (AC)(min.). Setup (tIS, tDS) nominal slew rate for a falling signal is defined as the slew rate between the last crossing

of VREF (DC) and the first crossing of VIL (AC)(max.). If the actual signal is always earlier than the nominal slew rate line between

shaded ‘VREF (DC) to AC region’, use nominal slew rate for de-rating value (See the figure of Slew Rate Definition Nominal).

If the actual signal is later than the nominal slew rate line anywhere between shaded ‘VREF (DC) to AC region’, the slew rate of a

tangent line to the actual signal from the AC level to DC level is used for de-rating value (see the figure of Slew Rate Definition

Tangent).

Hold (tIH, tDH) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VIL (DC)(max.) and the

first crossing of VREF (DC). Hold (tIH, tDH) nominal slew rate for a falling signal is defined as the slew rate between the last crossing

of VIH (DC)(min.) and the first crossing of VREF (DC). If the actual signal is always later than the nominal slew rate line between

shaded ‘DC level to VREF (DC) region’, use nominal slew rate for de-rating value (See the figure of Slew Rate Definition Nominal).

If the actual signal is earlier than the nominal slew rate line anywhere between shaded ‘DC to VREF (DC) region’, the slew rate of a

tangent line to the actual signal from the DC level to VREF (DC) level is used for de-rating value (see the figure of Slew Rate

Definition Tangent).

Although for slow slew rates the total setup time might be negative (i.e. a valid input signal will not have reached VIH / VIL (AC) at

the time of the rising clock transition) a valid input signal is still required to complete the transition and reach VIH / VIL (AC).

For slew rates in between the values listed in the tables below, the de-rating values may be obtained by linear interpolation. These

values are typically not subject to production test. They are verified by design and characterization.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 21/62

De-rating Value of tDS/tDH with Differential DQS(DDR2-667, 800, 1066)

DQS, DQS differential slew rate

4.0 V/ns 3.0 V/ns 2.0 V/ns 1.8 V/ns 1.6 V/ns 1.4 V/ns 1.2 V/ns 1.0 V/ns 0.8 V/ns

ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH ΔtDS ΔtDH

Unit

2.0 +100 +45 +100 +45 +100 +45 - - - - - - - - - - - -

1.5 +67 +21 +67 +21 +67 +21 +79 +33 - - - - - - - - - -

1.0 0 0 0 0 0 0 +12 +12 +24 +24 - - - - - - - -

0.9 - - -5 -14 -5 -14 +7 -2 +19 +10 +31 +22 - - - - - -

0.8 - - - - -13 -31 -1 -19 +11 -7 +23 +5 +35 +17 - - - -

0.7 - - - - - - -10 -42 +2 -30 +14 -18 +26 -6 +38 +6 - -

0.6 - - - - - - - - -10 -59 +2 -47 +14 -35 +26 -23 +38 -11 ps

0.5 - - - - - - - - - - -24 -89 -12 -77 0 -65 +12 -53 ps

DQ slew rate (V/ns)

0.4 - - - - - - - - - - - - -52 -140 -40 -128 -28 -116 ps

De-rating Value of tIS/tIH (DDR2-667, 800, 1066)

CLK, CLK differential slew rate

2.0 V/ns 1.5 V/ns 1.0 V/ns

ΔtIS ΔtIH ΔtIS ΔtIH ΔtIS ΔtIH Unit

4.0 +150 +94 +180 +124 +210 +154

3.5 +143 +89 +173 +119 +203 +149

3.0 +133 +83 +163 +113 +193 +143

2.5 +120 +75 +150 +105 +180 +135

2.0 +100 +45 +130 +75 +160 +105

1.5 +67 +21 +97 +51 +127 +81

1.0 0 0 +30 +30 +60 +60

0.9 -5 -14 +25 +16 +55 +46

0.8 -13 -31 +17 -1 +47 +29

0.7 -22 -54 +8 -24 +38 +6

0.6 -34 -83 -4 -53 +26 -23

0.5 -60 -125 -30 -95 0 -65

0.4 -100 -188 -70 -158 -40 -128

0.3 -168 -292 -138 -262 -108 -232

0.25 -200 -375 -170 -345 -140 -315

0.2 -325 -500 -295 -470 -265 -440

0.15 -517 -708 -487 -678 -457 -648

Command / Address slew rate (V/ns)

0.1 -1000 -1125 -970 -1095 -940 -1065

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

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Slew Rate Definition Nominal

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

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Slew Rate Definition Tangent

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

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Command Truth Table

COMMAND Note 7

CKE(n-1)

Note 7

CKE(n) CS RAS CAS WE DM BA0,1 A10/AP A12~A11,

A9~A0 Note

(Extended) Mode Register Set H H L L L L X OP CODE 1,2

Auto Refresh H

Entry H L L L L H X X 10,12

L H H H

Refresh Self

Refresh Exit L H

HX X X

6,9,

Bank Active H H L L H H X V Row Address

Auto Precharge Disable L

Read

Auto Precharge Enable

H H L H L H X V

Column

Address

(A9~A0)

1,3

Auto Precharge Disable L

Write

Auto Precharge Enable

H H L H L L X V

Column

Address

(A9~A0)

1,3

Bank Selection V L

Precharge All Banks H H L L H L X X H X

HX X X

Entry H L

L H H H X4,11,

12,15

HX X X

Active Power-Down

Exit L H

L H H H X

4,8,

12,15

HX X X

Entry H L

L H H H X4,11,

12,15

HX X X

Precharge Power-Down

Exit L H

L H H H X

4,8,

12,15

DM H H X V X 16

Device Deselect H X H X X X X X

No Operation H X L H H H X X

(OP code = Operand Code, V = Valid, X = Don’t Care, H = Logic High, L = Logic Low)

Note:

1. BA during a MRS/EMRS command selects which mode register is programmed.

2. MRS/EMRS can be issued only at all bank Precharge state.

3. Burst Reads or Writes at BL = 4 cannot be terminated or interrupted.

4. The Power-Down mode does not perform any Refresh operations. The duration of Power-Down is limited by the Refresh

requirements. Need one clock delay to entry and exit mode.

5. The state of ODT does not affect the states described in this table. The ODT function is not available during Self Refresh.

6. Self Refresh Exit is asynchronous.

7. CKE (n) is the logic state of CKE at clock edge n; CKE (n–1) was the state of CKE at the previous clock edge.

8. All states not shown are illegal or reserved unless explicitly described elsewhere in this document.

9. On Self Refresh, Exit Deselect or NOP commands must be issued on every clock edge occurring during the tXSNR period.

Read commands may be issued only after tXSRD is satisfied.

10. Self Refresh mode can only be entered from all banks Idle state.

11. Power-Down and Self Refresh can not be entered while Read or Write operations, MRS/EMRS operations or Precharge

operations are in progress.

12. Minimum CKE HIGH / LOW time is tCKE (min).

13. The state of ODT does not affect the states described in this table. The ODT function is not available during Self Refresh.

14. CKE must be maintained HIGH while the device is in OCD calibration mode.

15. ODT must be driven HIGH or LOW in Power-Down if the ODT function is enabled.

16. Used to mask write data, provided coincident with the corresponding data.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 25/62

Power On and Initialization

DDR2 SDRAM must be powered up and initialized in a predefined manner. Operational procedures other than those specified

may result in undefined operation.

Power-Up and Initialization Sequence

The following sequence is required for Power-Up and Initialization.

1. Apply power and attempt to maintain CKE below 0.2 x VDDQ and ODT (*1) at a low state (all other inputs may be undefined).

- VDD(*2), VDDL(*2) and VDDQ are driven from a single power converter output, AND

- VTT is limited to 0.95V max, AND

- VREF tracks VDDQ /2.

- Apply VDD(*2) before or at the same time as VDDL.

- Apply VDDL(*2) before or at the same time as VDDQ.

- Apply VDDQ before or at the same time as VTT and VREF.

at least one of these two sets of conditions must be met.

2. Start clock and maintain stable condition.

3. For the minimum of 200us after stable power and clock (CLK, CLK ), then apply NOP or Deselect and take CKE High.

4. Waiting minimum of 400ns then issue Precharge commands for all banks of the device. NOP or Deselect applied during

400ns period.

5. Issue EMRS(2) command. (To issue EMRS(2) command, provide “LOW” to BA0, “HIGH” to BA1.)

6. Issue EMRS(3) command. (To issue EMRS(3) command, provide “HIGH” to BA0 and BA1.)

7. Issue EMRS(1) to enable DLL. (To issue "DLL Enable" command, provide "LOW" to A0, "HIGH" to BA0 and "LOW" to

BA1.)

8. Issue a Mode Register Set command for “DLL reset” (*3).

(To issue DLL reset command, provide “HIGH” to A8 and “LOW” to BA0-1)

9. Issue Precharge commands for all banks of the device.

10. Issue 2 or more Auto Refresh commands.

11. Issue a Mode Register Set command with LOW to A8 to initialize device operation. (To program operation parameters without

resetting the DLL.)

12. At least 200 clocks after step 8, execute OCD calibration (Off Chip Driver impedance adjustment).

If OCD calibration is not used, EMRS(1) OCD default command (A9=A8= A7=1) followed by EMRS(1) OCD calibration

mode exit command (A9=A8=A7=0) must be issued with other operating parameters of EMRS(1).

13. The DDR2 SDRAM is now ready for normal operation.

Note :

*1) To guarantee ODT off, VREF must be valid and a low level must be applied to the ODT pin.

*2) If DC voltage level of VDDL or VDD is intentionally changed during normal operation, (for example, for the purpose of VDD

corner test, or power saving) “DLL Reset” must be executed.

*3) Every “DLL enable” command resets DLL. Therefore sequence 8 can be skipped during power up. Instead of it, the

additional 200 cycles of clock input is required to lock the DLL after enabling DLL.

Initialization Sequence after Power-UP

CLK

Command

400ns

PALL

EMRS(2)

200 Cycle (min.)

NOP

EMRS(3) EMRS(1)

MRS PA LL REF MRS

EMRS(1)

Any

Command

EMRS(1)

MRD

RFC

RFC Follow OCD

Flow Chart

OIT

Precharge

All DLL enable

DLL Reset

OCD default OCD Calibration

mode exit

REF

MRD

CKE

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 26/62

Mode Register Definition

Mode Register Set [MRS]

The mode register stores the data for controlling the various operating modes of DDR2 SDRAM. It programs CAS latency, burst

length, burst type, test mode, DLL reset, WR and various vendor specific options to make the device useful for variety of different

applications. The default value of the mode register is not defined, therefore the mode register must be written after Power-Up for

proper operation. The mode register is written by asserting LOW on CS , RAS , CAS , WE , BA0 and BA1 (The device should

be in all bank Precharge with CKE already high prior to writing into the mode register). The state of address pins A0~A12 in the

same cycle as CS , RAS , CAS , WE , BA0 and BA1 going LOW are written in the mode register.

The tMRD time is required to complete the write operation to the mode register. The mode register contents can be changed using

the same command and clock cycle requirements during normal operation as long as all banks are in the idle state. The mode

register is divided into various fields depending on functionality. The burst length is defined by A0 ~ A2. Burst address sequence

type is defined by A3, CAS latency (read latency from column address) is defined by A4 ~ A6. The DDR2 doesn’t support half clock

latency mode. A7 is used for test mode. A8 is used for DLL reset. A7 must be set to low for normal MRS operation. Write recovery

time WR is defined by A9 ~ A11. Refer to the table for specific codes.

BA1 BA0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 Address Bus

0 0 PD WR DLL TM CAS Latency BT Burst Length Mode Register

Note:

1. WR(min.) (write recovery for Auto Precharge) is determined by tCK (max.) and WR(max.) is determined by tCK (min.)

WR in clock cycles is calculated by dividing tWR (in ns) by tCK (in ns) and rounding up a non-integer value to the next

integer ( WR[cycles] = tWR (ns)/ tCK (ns)). The mode register must be programmed to this value. This is also used with

tRP to determine tDAL.

A3 Burst Type

0 Sequential

1 Interleave

A7 Mode

0 No

1 Yes

Active Power down exit timing

A12 PD

0 Fast Exit (normal)

1 Slow Exit (low power)

A2 A1 A0 Burst Length

0 0 0 Reserved

0 0 1 Reserved

0 1 0 4

0 1 1 8

1 0 0 Reserved

1 0 1 Reserved

1 1 0 Reserved

1 1 1 Reserved

A8 DLL reset

0 No

1 Yes

BA1 BA0 Mode Register

0 0 MRS

0 1 EMRS(1)

1 0 EMRS(2)

1 1 EMRS(3) : Reserved

CAS Latency

A6 A5 A4 Latency

0 0 0 Reserved

0 0 1 Reserved

0 1 0 Reserved

0 1 1 3

1 0 0 4

1 0 1 5

1 1 0 6

1 1 1 7

Write recovery for Auto Precharge

A11 A10 A9 WR(cycles)*1

0 0 0 Reserved

0 0 1 2

0 1 0 3

0 1 1 4

1 0 0 5

1 0 1 6

1 1 0 7

1 1 1 8

DDR2-667

DDR2-800

DDR2-1066

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 27/62

Burst Address Ordering for Burst Length

Burst

Length

Starting Column Address

(A2, A1,A0) Sequential Mode Interleave Mode

000 0, 1, 2, 3 0, 1, 2, 3

001 1, 2, 3, 0 1, 0, 3, 2

010 2, 3, 0, 1 2, 3, 0, 1

011 3, 0, 1, 2 3, 2, 1, 0

000 0, 1, 2, 3, 4, 5, 6, 7 0, 1, 2, 3, 4, 5, 6, 7

001 1, 2, 3, 0, 5, 6, 7, 4 1, 0, 3, 2, 5, 4, 7, 6

010 2, 3, 0, 1, 6, 7, 4, 5 2, 3, 0, 1, 6, 7, 4, 5

011 3, 0, 1, 2, 7, 4, 5, 6 3, 2, 1, 0, 7, 6, 5, 4

100 4, 5, 6, 7, 0, 1, 2, 3 4, 5, 6, 7, 0, 1, 2, 3

101 5, 6, 7, 4, 1, 2, 3, 0 5, 4, 7, 6, 1, 0, 3, 2

110 6, 7, 4, 5, 2, 3, 0, 1 6, 7, 4, 5, 2, 3, 0, 1

111 7, 4, 5, 6, 3, 0, 1, 2 7, 6, 5, 4, 3, 2, 1, 0

Mode Register Set

01 234 5678

COMMAND

Precharge

All Banks

Mode

Any

Command

CLK

MRD

*1 : MRS can be issued only at all banks precharge state.

*2 : Minimum t

RP is required to issue MRS command.

DLL Enable / Disable

The DLL must be enabled for normal operation. DLL enable is required during power-up initialization, and upon returning to normal

operation after having the DLL disabled for the purpose of debug or evaluation (upon exiting Self Refresh Mode, the DLL is

enabled automatically). Any time the DLL is enabled, 200 clock cycles must occur before a READ command can be issued.

Output Drive Strength

The normal drive strength for all outputs is specified to be SSTL_18. The device also supports a weak drive strength option,

intended for lighter load and/or point-to-point environments.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 28/62

Extended Mode Register Set-1 [EMRS(1)]

The EMRS(1) stores the data for enabling or disabling DLL, output driver strength, additive latency, ODT, disable DQS , OCD

program. The default value of the EMRS(1) is not defined, therefore EMRS(1) must be written after power up for proper operation.

The EMRS(1) is written by asserting LOW on CS , RAS , CAS , WE , BA1 and HIGH on BA0 (The device should be in all bank

Precharge with CKE already high prior to writing into EMRS(1)). The state of address pins A0~A12 in the same cycle as CS ,

RAS , CAS , WE and BA1 going LOW and BA0 going HIGH are written in the EMRS(1).

The tMRD time is required to complete the write operation to the EMRS(1). The EMRS(1) contents can be changed using the same

command and clock cycle requirements during normal operation as long as all banks are in the idle state. A0 is used for DLL

enable or disable. A1 is used for reducing output driver strength. The additive latency is defined by A3~A5. A7~A9 are used for

OCD control. A10 is used for DQS disable. ODT setting is defined by A2 and A6.

BA1 BA0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0

0 1 Qoff 0*1 DQS OCD program Rtt Additive Latency Rtt ODS DLL

A10 DQS Enable

0 Enable

1 Disable

Note:

1. A11 is reserved for future use and must be set to 0.

2. When adjustable mode of driver impedance is issued, the previously set value of AL must be applied.

3. After setting to default state of driver impedance, OCD calibration mode needs to be exited by setting A9~A7 to 000.

4. Output disabled - DQs, DQSs, DQS s. This feature is used in conjunction with DIMM IDD measurements when IDDQ

is not desired to be included.

A0 DLL Enable

0 Enable

1 Disable

A6 A2 Rtt (nominal)

0 0 Disable

0 1 75 Ω

1 0 150 Ω

1 1 50 Ω A1 Output Driver

Strength Control

0 Normal (100%)

1 Weak (60%)

A12 Qoff*4

0 Output buffer enable

1 Output buffer disable

Additive Latency

A5 A4 A3 Latency

0 0 0 0

0 0 1 1

0 1 0 2

0 1 1 3

1 0 0 4

1 0 1 5

1 1 0 6

1 1 1 Reversed

BA1 BA0 Mode Register

0 0 MRS

0 1 EMRS(1)

1 0 EMRS(2)

1 1 EMRS(3): Reserved

Driver Impedance Adjustment

A9 A8 A7 OCD operation

0 0 0

OCD calibration

mode exit

0 0 1 Drive-1

0 1 0 Drive-0

1 0 0 Adjustable mode*2

1 1 1 OCD default state*3

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 29/62

Extended Mode Register Set-2 [EMRS(2)]

The EMRS(2) stores the data for enabling or disabling high temperature self refresh rate. The default value of the EMRS(2) is not

defined, therefore EMRS(2) must be written after power up for proper operation. The EMRS(2) is written by asserting LOW on CS ,

RAS , CAS , WE , BA0 and HIGH on BA1 (The device should be in all bank Precharge with CKE already high prior to writing into

EMRS(2)). The state of address pins A0~A12 in the same cycle as CS , RAS , CAS , WE and BA0 going LOW and BA1 going

HIGH are written in the EMRS(2).

The tMRD time is required to complete the write operation to the EMRS(2). The EMRS(2) contents can be changed using the same

command and clock cycle requirements during normal operation as long as all banks are in the idle state. A7 is used for high

temperature self refresh rate enable or disable.

BA1 BA0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0

1 0 0*1 SRF 0*1 DCC*2 0

*Note :

1. A0~A2, A4~A6 and A8~A12 are reserved for future use and must be set to 0.

2. User may enable or disable the DCC (Duty Cycle Corrector) by programming A3 bit accordingly.

Extended Mode Register Set-3 [EMRS(3)]

BA1 BA0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0

1 1 0

Note: EMRS(3) is reserved for future. All bits except BA0 and BA1 are reserved for future use and must be set to 0 when

setting to mode register during initialization.

BA1 BA0 Mode Register

0 0 MRS

0 1 EMRS(1)

1 0 EMRS(2)

1 1 EMRS(3): Reserved

A7 High Temperature

Self Refresh rate

0 Disable

1 Enable

A3 DCC Enable

0 Disable

1 Enable

BA1 BA0 Mode Register

0 0 MRS

0 1 EMRS(1)

1 0 EMRS(2)

1 1 EMRS(3): Reserved

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 30/62

Off-Chip Driver (OCD) Impedance Adjustment

DDR2 SDRAM supports driver calibration feature. Every calibration mode command should be followed by “OCD calibration mode

exit” before any other command being issued. MRS should be set before entering OCD impedance adjustment and ODT (On Die

Termination) should be carefully controlled depending on system environment.

OCD Flow Chart

Start

EMRS(1) : Driver-1

DQ & DQS High ; DQS Low

MRS should be set before entering OCD impedance adjustment and

ODT should be carefully controlled depending on system environment

Test

EMRS(1) : OCD calibration mode exit

EMRS(1) :

Enter Adjustable mode

BL=4 code input to all

DQs Inc, Dec, or NOP

EMRS(1) : OCD calibration mode exit

ALL OK

Need Calibration

EMRS(1) : Driver-0

DQ & DQS Low ; DQS High

Test

EMRS(1) : OCD calibration mode exit

EMRS(1) :

Enter Adjustable mode

BL=4 code input to all

DQs Inc, Dec, or NOP

EMRS(1) : OCD calibration mode exit

Need Calibration

EMRS(1) : OCD calibration mode exit

ALL OK

End

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 31/62

EMRS(1) for OCD Impedance Adjustment

OCD impedance adjustment can be done using the following EMRS(1) mode. In drive mode, all outputs are driven out by DDR2

SDRAM. In Drive-1mode, all DQ, DQS signals are driven HIGH and all DQS signals are driven LOW. In Drive-0 mode, all DQ,

DQS signals are driven LOW and all DQS signals are driven HIGH. In adjustable mode, BL = 4 of operation code data must be

used. In case of OCD default state, output driver characteristics have a nominal impedance value of 18 Ω during nominal

temperature and voltage conditions. Output driver characteristics for OCD default state are specified in OCD default characteristics

table. OCD applies only to normal full strength output drive setting defined by EMRS(1) and if weak strength is set or adjustable

mode is used, OCD default output driver characteristics are not applicable. After OCD calibration is completed or driver strength is

set to default, subsequent EMRS(1) commands not intended to adjust OCD characteristics must specify A9-A7 as '000' in order to

maintain the default or calibrated value.

Driver Impedance Adjustment Mode

A9 A8 A7 Operation

0 0 0 OCD calibration mode exit

0 0 1

Device-1: DQ,DQS High and DQS Low

0 1 0

Device-0: DQ,DQS Low and DQS High

1 0 0 Adjustable mode

1 1 1 OCD default state

Adjust OCD Impedance

To adjust output driver impedance, controllers must issue EMRS(1) command for adjustable mode along with a 4bit burst code to

DDR2 SDRAM as in the following table. For this operation, Burst Length has to be set to BL = 4 via MRS command before

activating OCD and controllers must drive this burst code to all DQs at the same time. DT0 in the following table means all DQ bits

at bit time 0, DT1 at bit time 1, and so forth. The driver output impedance is adjusted for all DQs simultaneously and after OCD

calibration, all DQs of a given device will be adjusted to the same driver strength setting.

The maximum step count for adjustment is 16 and when the limit is reached, further increment or decrement code has no effect.

The default setting may be any step within the 16 step range. When Adjustable mode command is issued, AL from previously set

value must be applied.

OCD Adjustment Table

DT0 DT1 DT2 DT3 Pull-up driver strength Pull-down driver strength

0 0 0 0 NOP NOP

0 0 0 1 Increase by 1 step NOP

0 0 1 0 Decrease by 1 step NOP

0 1 0 0 NOP Increase by 1 step

1 0 0 0 NOP Decrease by 1 step

0 1 0 1 Increase by 1 step Increase by 1 step

0 1 1 0 Decrease by 1 step Increase by 1 step

1 0 0 1 Increase by 1 step Decrease by 1 step

1 0 1 0 Decrease by 1 step Decrease by 1 step

Others Reserve Reserve

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 32/62

OCD Adjustable Mode

CLK

EMRS(1) EMRS(1)

NOP

DT0

DT1 DT2 DT3

Command

DQS, DQS

OCD adjustable OCD calibration

ode e

Note: For proper operation of adjustable mode, WL = RL - 1 = AL + CL - 1 clocks and tDS / tDH should be met as the

above timing diagram. For input data pattern for adjustment, DT0 - DT3 is a fixed order and "not affected by

MRS addressing mode (ie. sequential or interleave).

OCD Driver Mode

CLK

EMRS(1) EMRS(1)

NOP

tOIT

Command

DQS, DQS

Enter drive mode OCD Calibration mode exit

High-Z DQs high and DQS low for Drive-1, DQs low and DQS high for Drive-0 High-Z

DQs low for Drive-0

DQs high for Drive-1

tOIT

Note: Drive mode, both Drive-1 and Drive-0, is used for controllers to measure DDR2 SDRAM driver impedance. In

this mode, all outputs are driven out tOIT after “enter drive mode” command and all output drivers are

turned-off tOIT after “OCD calibration mode exit” command as the above timing diagram.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 33/62

ODT (On Die Termination)

On Die Termination (ODT) is a feature that allows a DDR2 SDRAM to turn on/off termination resistance for each DQ, all

DQS/ DQS , and all DM signals via the ODT control pin. The ODT feature is designed to improve signal integrity of the memory

channel by allowing the DRAM controller to independently turn on/off termination resistance for any or all devices.

The ODT function is supported for Active and Standby modes. ODT is turned off and not supported in Self Refresh mode.

Timing for ODT Update Delay

CLK

EMRS(1)

AOFD

Command

ODT

Internal

Rtt Setting

NOP

MOD(min.)

MOD(max.)

Old setting Updating New Setting

Note: tAOFD must be met before issuing EMRS(1) command. ODT must remain low for the entire duration of tMOD

window.

ODT Timing for Active and Standby Mode

CLK

CKE

ODT

Internal

Te r m R e s .

T0 T1 T2 T3 T4 T5 T6

AOFD

AOND

AON(min.)

AON(max.)

AOF(min.)

AOF(max.)

Rtt

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M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

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Revision : 1.1 34/62

ODT Timing for Power-Down Mode

CLK

CKE

ODT

Internal

Term Re s.

T0 T1 T2 T3 T4 T5 T6

AONPD(min.)

AONPD(max.)

AOFPD(min.)

Rtt

AOFPD(max.)

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 35/62

ODT Timing Mode Switch at Entering Power-Down Mode

CKE

CLK

T-5 T-4 T

3T-2 T-1 T0 T1 T2 T3

ANPD

Entering slow exit Active Power-Down mode

or Precharge Power-Down mode.

Active and Standby

mode timings to

be applied.

ODT

Internal

Ter m Res .

AOFD

Rtt

Power-Down

mode timings to

be applied.

ODT

Internal

Ter m Res .

Rtt

Active and Standby

mode timings to

be applied.

ODT

Internal

Te rm R es .

Rtt

Power-Down

mode timings to

be applied.

ODT

Internal

Ter m Res .

Rtt

AOFPD(max.)

AOND

AONPD(max.)

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 36/62

ODT Timing Mode Switch at Exiting Power-Down Mode

CKE

CLK

T0 T1 T4 T5 T6 T7 T8 T9 T10 T11

AXPD

Exiting from slow Active Power-Down mode

or Precharge Power-Down mode.

Active and Standby

mode timings to

be applied.

ODT

Internal

Ter m Res .

AOFD

Rtt

Power-Down

mode timings to

be applied.

ODT

Internal

Term Re s.

Rtt

Active and Standby

mode timings to

be applied.

ODT

Internal

Term Re s.

Rtt

Power-Down

mode timings to

be applied.

ODT

Internal

Te rm R es .

Rtt

AOFPD(max.)

AOND

AONPD(max.)

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 37/62

Precharge

The Precharge command is used to precharge or close a bank that has activated. The command is issued when CS , RAS and

WE are LOW and CAS is HIGH at the rising edge of the clock. The Precharge command can be used to precharge each bank

respectively or all banks simultaneously. The bank select addresses (BA0, BA1) and A10 are used to define which bank is

precharged when the command is initiated. For write cycle, tWR(min.) must be satisfied until the Precharge command can be issued.

After tRP from the precharge, a Bank Active command to the same bank can be initiated.

Bank Selection for Precharge by Address bits

A10/AP BA1 BA0 Precharge

0 0 0 Bank A Only

0 1 0 Bank B Only

0 0 1 Bank C Only

0 1 1 Bank D Only

1 X X All Banks

NOP & Device Deselect

The device should be deselected by deactivating the CS signal. In this mode, DDR2 SDRAM would ignore all the control inputs.

The DDR2 SDRAM are put in NOP mode when CS is active and by deactivating RAS , CAS and WE . For both Deselect and

NOP, the device should finish the current operation when this command is issued.

Bank Active

The Bank Active command is issued by holding CAS and WE HIGH with CS and RAS LOW at the rising edge of the clock

(CLK). The DDR2 SDRAM has four independent banks, so two Bank Select addresses (BA0, BA1) are required. The Bank Active

command to the first Read or Write command must meet or exceed the minimum of RAS to CAS delay time (tRCD(min.)). Once

a bank has been activated, it must be precharged before another Bank Active command can be applied to the same bank. The

minimum time interval between interleaved Bank Active command (Bank A to Bank B and vice versa) is the Bank to Bank delay

time (tRRD min).

Bank Active Command Cycle

CLK

ACT

CCD

T0 T1 T2 T3 Tn Tn+1 Tn+2 Tn+3

Command

Posted

READ

ACT

Posted

READ

PRE ACT

Bank A

Row Addr.

Bank B

Address

Bank B

Row Addr.

Bank B

Col. Addr.

Bank A

Row Addr.

Additive latency (AL)

RCD=1

RRD

Bank A

Col. Addr.

RAS

PRE

Bank A

Active

Bank B

Active

Bank A

Precharge

Bank B

Precharge

Bank A

Active

Bank A Read begins

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 38/62

Read Bank

This command is used after the Bank Active command to initiate the burst read of data. The Read command is initiated by

activating CS , CAS , and deasserting WE at the same clock sampling (rising) edge as described in the command truth table.

The length of the burst and the CAS latency time will be determined by the values programmed during the MRS command.

Write Bank

This command is used after the Bank Active command to initiate the burst write of data. The Write command is initiated by

activating CS , CAS , and WE at the same clock sampling (rising) edge as describe in the command truth table. The length of

the burst will be determined by the values programmed during the MRS command.

Posted CAS

Posted CAS operation is supported to make command and data bus efficient for sustainable bandwidths in DDR2 SDRAM. In

this operation, the DDR2 SDRAM allows a Read or Write command to be issued immediately after the Bank Active command (or

any time during the tRRD period). The command is held for the time of the Additive Latency (AL) before it is issued inside the device.

The Read Latency (RL) is controlled by the sum of AL and the CAS latency (CL). Therefore if a user chooses to issue a R/W

command before the tRCD(min), then AL (greater than 0) must be written into the EMRS(1). The Write Latency (WL) is always

defined as RL - 1 (read latency -1) where read latency is defined as the sum of additive latency plus CAS latency (RL=AL+CL).

Read or Write operations using AL allow seamless bursts.

Read followed by a Write to the Same Bank

< AL= 2; CL= 3 ; BL = 4>

-1 03456

789

10 11 12

CMD

CLK

Active

Bank A

Dout0 Dout1 Dout2 Dout3

Din0 Din1 Din2 Din3

WL = RL -1 =4

AL = 2 CL = 3

>= t

RCD

RL = AL + CL = 5

DQS/DQS

Read

Bank A

Write

Bank A

< AL= 0; CL= 3; BL = 4 >

-1 034

5678910 11 12

CMD

CLK

Write

Bank A

Dout0 Dout1 Dout2 Dout3 Din0 Din1 Din2 Din3

WL = RL -1 = 2

AL = 0

CL = 3

>= t

RCD

RL = AL + CL = 3

DQS/DQS

Active

Bank A

Read

Bank A

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 39/62

Essential Functionality for DDR2 SDRAM

Burst Read Operation

The Burst Read command is initiated by having CS and CAS LOW while holding RAS and WE HIGH at the rising edge of

the clock. The address inputs determine the starting column address for the burst. The delay from the start of the command to

when the data from the first cell appears on the outputs is equal to the value of the read latency (RL). The DQS is driven LOW 1

clock cycle before valid data (DQ) is driven onto the data bus. The first bit of the burst is synchronized with the rising edge of DQS.

Each subsequent data-out appears on the DQ pin in phase with the DQS signal in a source synchronous manner.

The RL is equal to an additive latency (AL) plus CAS latency (CL). The CL is defined by the MRS and the AL is defined by the

EMRS(1).

Read (Data Output) Timing

CLK

Dout0

DQS

DQSQ(max.)

DQS

Dout1 Dout2 Dout3

RPST

DQSQ(max.)

RPRE

Burst Read

< RL= 5 (AL= 2; CL= 3); BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD Posted CAS

READ A

NOP

AL = 2

NOP NOP

NOP

DQS,DQS

CL = 3

RL = 5

DoutA0 DoutA1 DoutA2 DoutA3

DQs

=< t

DQSCK

< RL= 3 (AL= 0; CL= 3); BL= 8 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

NOP

NOP NOP

NOP

DQS,DQS

CL = 3

RL = 3

DoutA4 DoutA5 DoutA6 DoutA7

READ A

DQs DoutA0 DoutA1 DoutA2 DoutA3

=< t

DQSCK

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 40/62

Burst Read followed by Burst Write

< RL= 5; WL= (RL-1) = 4; BL= 4 >

CLK

T0 T1 Tn-1 Tn Tn+1 Tn+2 Tn+3 Tn+4

CMD

Posted CAS

READ A

NOP

Tn+5

NOP NOP NOP

NOP NOP

NOP

DQS,DQS

WL = RL-1 = 4

RL = 5

DoutA0 DoutA1 DoutA2 DoutA3

DQs

Posted CAS

WRITE A

RTW (Read to Write-turn around-time)

DinA0 DinA1 DinA2 DinA3

Note: The minimum time from the Burst Read command to the Burst Write command is defined by a read to

write-turn around-time(tRTW), which is 4 clocks in case of BL = 4 operation, 6 clocks in case of BL = 8

operation.

Seamless Burst Read

< RL= 5; AL= 2; CL= 3; BL = 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

READ A

AL = 2

NOP NOP

NOP

DQS,DQS

CL = 3

RL = 5

DoutA0 DoutA1 DoutA2 DoutA3

DQs

Posted CAS

READ B

DoutB0 DoutB1 DoutB2

Note: The seamless burst read operation is supported by enabling a Read command at every other clock for BL =

4 operation, and every 4 clock for BL = 8 operation. This operation is allowed regardless of same or different

banks as long as the banks are activated.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 41/62

Burst Write Operation

The Burst Write command is issued by having CS , CAS and WE LOW while holding RAS HIGH at the rising edge of the

clock (CLK). The address inputs determine the starting column address. Write latency (WL) is defined by a read latency (RL) minus

one and is equal to (AL + CL -1); and is the number of clocks of delay that are required from the time the write command is

registered to the clock edge associated to the first DQS strobe. A data strobe signal (DQS) should be driven low (preamble) one

clock prior to the WL. The first data bit of the burst cycle must be applied to the DQ pins at the first rising edge of the DQS following

the preamble. The tDQSS specification must be satisfied for each positive DQS transition to its associated clock edge during write

cycles. The subsequent burst bit data are issued on successive edges of the DQS until the burst length is completed, which is 4 or

8 bit burst. When the burst has finished, any additional data supplied to the DQ pins will be ignored. The DQ signal is ignored after

the burst write operation is complete. The time from the completion of the burst write to bank precharge is the write recovery time

(tWR).

Write (Data Input) Timing

DQS

WPRE

Din0 Din1 Din2 Din3

DQS

DQSH

DQSL

WPST

Burst Write

< RL= 5 (AL= 2; CL= 3); WL= 4; BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

WRITE A

NOP

WL=RL-1=4

NOP NOP

NOP Precharge

NOP

DQS,DQS

DinA0 DinA1 DinA2 DinA3

DQs

Case1 : with tDQSS(max)

tDSS

WL=RL-1=4

DQS,DQS

DinA0 DinA1 DinA2 DinA3

DQs

tDSH

Case2 : with tDQSS(min)

tDQSS

>= tWR

< RL= 3 (AL= 0; CL= 3); WL= 2; BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

NOP

NOP NOP

Bank A

Active

NOP

WRITE A

WL=RL-1=2

DQS,DQS

DinA0 DinA1 DinA2 DinA3

DQs

DQSS

Precharge

>= t

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 42/62

Burst Write followed by Burst Read

< RL= 5 (AL= 2; CL= 3); WL= 4; BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD NOP

WL=RL-1=4

NOP NOP NOP

NOP NOP

DQS,DQS

DinA0 DinA1 DinA2 DinA3

WritetoRead=CL-1+BL/2+tWTR

>=tWTR

CL = 3

NOP NOP

NOP

DQS

AL = 2

DoutA0

Posted CAS

READ A

RL = 5

Note: The minimum number of clock from the Burst Write command to the Burst Read command is [CL - 1 + BL/2

+ tWTR]. This tWTR is not a write recovery time (WR) but the time required to transfer the 4 bit write data from

the input buffer into sense amplifiers in the array.

Seamless Burst Write

< RL= 5; WL= 4; BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

NOP NOP

NOP

DQS,DQS

WL = RL-1 = 4

DQs

DinA0

Posted CAS

WRITE A

Posted CAS

WRITE B

DinA1 DinA2 DinA3 DinB0 DinB1 DinB2 DinB3

Note: The seamless burst write operation is supported by enabling a Write command at every other clock for BL =

4 operation, and every 4 clock for BL = 8 operation. This operation is allowed regardless of same or different

banks as long as the banks are activated.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 43/62

Read Interrupted by a Read

Burst Read can only be interrupted by another read with 4 bit burst boundary. Any other case of read interrupt is not allowed.

< CL= 3; AL= 0; RL= 3; BL= 8 >

CLK

CMD

NOP NOP NOP

NOP NOP

NOP

DQS,DQS

DQs

READ A READ B NOP

A1 A3

A2 B0 B3B2

B1 B4 B7B6

NOP

Note:

1. Read burst interrupt function is only allowed on burst of 8. Burst interrupt of 4 is prohibited.

2. Read burst of 8 can only be interrupted by another Read command. Read burst interruption by Write

command or Precharge command is prohibited.

3. Read burst interrupt must occur exactly two clocks after previous Read command. Any other Read burst

interrupt timings are prohibited.

4. Read burst interruption is allowed to any bank inside DRAM.

5. Read burst with Auto Precharge enabled is not allowed to interrupt.

6. Read burst interruption is allowed by another Read with Auto Precharge command.

7. All command timings are referenced to burst length set in the mode register. They are not referenced to

actual burst. For example, Minimum Read to Precharge timing is AL + BL/2 where BL is the burst length

set in the MRS and not the actual burst (which is shorter because of interrupt).

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 44/62

Write Interrupted by a Write

Burst Wirte can only be interrupted by another Write with 4 bit burst boundary. Any other case of Write interrupt is not allowed.

< CL= 3; AL= 0; RL= 3; WL= 2; BL= 8 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Write A NOP NOP

NOP NOP

NOP

DQS,DQS

DQs

NOP NOP NOP

A1 A3

A2 B0 B3B2

B1 B4 B7B6

Write B

Note:

1. Write burst interrupt function is only allowed on burst of 8. Burst interrupt of 4 is prohibited.

2. Write burst of 8 can only be interrupted by another Write command. Write burst interruption by Read

command or Precharge command is prohibited.

3. Write burst interrupt must occur exactly two clocks after previous Write command. Any other Write burst

interrupt timings are prohibited.

4. Write burst interruption is allowed to any bank inside DRAM.

5. Write burst with Auto Precharge enabled is not allowed to interrupt.

6. Write burst interruption is allowed by another Write with Auto Precharge command.

7. All command timings are referenced to burst length set in the MRS. They are not referenced to actual

burst. For example, minimum Write to Precharge timing is WL+BL/2+ tWR where tWR starts with the rising

clock after the un-interrupted burst end and not from the end of actual burst end.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 45/62

Burst Read Followed by Precharge

Minimum Read to Precharge command spacing to the same bank = AL + BL/2 + max(tRTP, 2) - 2 clocks.

For the earliest possible Precharge, the Precharge command may be issued on the rising edge which is “Additive latency (AL) +

BL/2 clocks” after a Read command. A new Bank Active command may be issued to the same bank after the Precharge time (tRP).

A Precharge command cannot be issued until tRAS is satisfied.

The minimum Read to Precharge spacing has also to satisfy a minimum analog time from the rising clock edge that initiates the

last 4-bit prefetch of a Read to Precharge command. This time is called tRTP (Read to Precharge). For BL = 4, this is the time from

the actual read (AL after the Read command) to Precharge command. For BL = 8, this is the time from AL + 2 clocks after the Read

to the Precharge command.

< RL= 4 (AL= 1; CL= 3) >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

READ A

NOP

AL + BL/2 clks

NOP NOP NOP

NOP

Precharge

Bank A

Active

DQS,DQS

DoutA0

DQs

>= t

NOP

AL = 1 CL = 3

RL = 4

DoutA1 DoutA2 DoutA3

>= t

RAS

CL = 3

>= t

RTP

CMD

Posted CAS

READ A

NOP

AL + BL/2 clks

NOP NOP

Precharge A

DQS,DQS

DoutA0

DQs

NOP

AL = 1 CL = 3

RL = 4

DoutA1 DoutA2 DoutA3 DoutA4 DoutA5 DoutA6 DoutA7

>= t

RTP

NOP

BL = 8

BL = 4

< RL= 5 (AL= 2; CL= 3); BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

READ A

NOP

AL + BL/2 clks

NOP NOP NOP

NOP

Precharge A

Bank A

Active

DQS,DQS

DoutA0

DQs

>= t

NOP

AL = 2 CL = 3

RL = 5

DoutA1 DoutA2 DoutA3

>= t

RAS

CL = 3

>= t

RTP

< RL= 6 (AL= 2; CL= 4); BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

READ A

NOP

AL + BL/2 clks

NOP NOP NOP

NOP

Precharge A Bank A

Active

DQS,DQS

DoutA0

DQs

>= tRP

NOP

AL = 2 CL = 4

RL = 6

DoutA1 DoutA2 DoutA3

>= tRAS

CL = 4

>= tRTP

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 46/62

< RL= 4 (AL= 0; CL= 4); BL=8 >

CLK

CMD

NOP NOP

Precharg A

Bank A

Active

NOP

DQS,DQS

AL+2 clks + max(t

RTP

;2)

DQs

Posted CAS

WRITE A

T0 T1 T2 T3 T4 T5 T6 T7 T8

NOP

>=t

CL = 4

AL = 0

>= t

RAS

DoutA0 DoutA1 DoutA2 DoutA3 DoutA4 DoutA5 DoutA6 DoutA7

RL = 4

Burst Write Followed by Precharge

Minimum Write to Precharge command spacing to the same bank = WL + BL/2 clocks + tWR.

For write cycles, a delay must be satisfied from the completion of the last burst write cycle until the Precharge command can be

issued. This delay is known as a write recovery time (tWR) referenced from the completion of the Burst Write to the Precharge

command. No Precharge command should be issued prior to the tWR delay.

< WL= (RL-1) = 3; BL=4>

CLK

CMD

NOP NOP

Precharg A

NOP

DQS,DQS

DQs

Posted CAS

WRITE A

T0 T1 T2 T3 T4 T5 T6 T7 T8

NOP

>=t

WL = 3

DinA0

NOP

DinA1 DinA2 DinA3

< WL= (RL-1) = 4; BL=4 >

CLK

CMD

NOP NOP

Precharg A

NOP

DQS,DQS

DQs

Posted CAS

WRITE A

T0 T1 T2 T3 T4 T5 T6 T7 T9

NOP

>=t

WL = 4

DinA0

NOP

DinA1 DinA2 DinA3

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 47/62

Write data mask by DM

One write data mask (DM) pin for each 8 data bits (DQ) will be supported on DDR2 SDRAM, Consistent with the implementation

on DDR2 SDRAM. It has identical timings on write operations as the data bits, and though used in a uni-directional manner, is

internally loaded identically to data bits to insure matched system timing. DM is not used during read cycles.

Data Mask Timing

DQS

T1 T2 T3 T4 T5 Tn

Din Din Din Din Din Din Din Din Din

Write mask Iatency = 0

Example: < WL= 3; AL= 0; BL= 4 >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

Command

DQS,DQS

Din0DQ

NOP

WRIT

DQSS

Din2

DQSS(min.)

]

DQS,DQS

Din0

DQSS

Din2

DQSS(max.)

]

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 48/62

Read with Auto Precharge

If A10 is HIGH when a Read command is issued, the Read with Auto Precharge function is engaged. The device starts an Auto

Precharge operation on the rising edge which is (AL + BL/2) cycles later than the Read with AP command if tRAS (min) and tRTP(min)

are satisfied.

If tRAS(min) is not satisfied at the edge, the start point of Auto Precharge operation will be delayed until tRAS(min) is satisfied.

If tRTP (min) is not satisfied at the edge, the start point of Auto Precharge operation will be delayed until tRTP (min) is satisfied.

In case the internal precharge is pushed out by tRTP, tRP starts at the point where the internal precharge happens (not at the next

rising clock edge after this event). So for BL = 4, the minimum time from Read_AP to the next Bank Active command becomes AL +

(tRTP + tRP)*. For BL = 8, the time from Read_AP to the next Bank Active command is AL + 2 + (tRTP + tRP)*. (Note: “*” means

“rouded up to the next integer”).

< RL= 4 (AL= 1; CL= 3) >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

NOP NOP

NOP

Bank A

Active

NOP

DQS,DQS

DQs

Posted CAS

READ A

NOP

AL+BL/2 clks >=t

Autoprecharge

CL = 3AL = 1

>= t

RTP

DoutA0 DoutA1 DoutA2 DoutA3 DoutA4 DoutA5 DoutA6 DoutA7

RL = 4

RTP

Precharge begins here

BL = 8

tRTP <= 2 clocks

CMD

NOP NOP

NOP

Bank A

Active

NOP

DQS,DQS

DQs

Posted CAS

READ A

NOP

>=AL+t

RTP+

Autoprecharge

CL = 3AL = 1

DoutA0 DoutA1 DoutA2 DoutA3

RL = 4

RTP

Precharge begins here

BL = 4

tRTP > 2 clocks

A new Bank Active command may be issued to the same bank if the following two conditions are satisfied simultaneously.

(1) The Precharge time (tRP) has been satisfied from the clock at which the Auto Precharge begins.

(2) The RAS cycle time (tRC) from the previous bank activation has been satisfied.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 49/62

< RL= 5 (AL= 2; CL= 3); BL= 4; tRCD = 3 clocks; tRTP <= 2 clocks >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

READ A

NOP

>= t

RAS(min)

NOP NOP NOP

NOP

Bank A

Active

DQS,DQS

DoutA0

DQs

>= t

NOP

AL = 2 CL = 3

RL = 5

DoutA1 DoutA2 DoutA3

>= t

Limit

NOP

Autoprecharge

Autoprecharge begins

CLK

CMD

Posted CAS

READ A

NOP

>= t

RAS(min)

NOP NOP NOP

NOP

Bank A

Active

DQS,DQS

DoutA0DQs

>= t

NOP

AL = 2 CL = 3

RL = 5

DoutA1 DoutA2 DoutA3

Limit

NOP

Autoprecharge

Autoprecharge begins

>= t

Write with Auto Precharge

If A10 is HIGH when a Write command is issued, the Write with Auto Precharge function is engaged. The device automatically

begins precharge operation after the completion of the burst write plus write recovery time (tWR). The Bank Active command

undergoing Auto Precharge from the completion of the write burst may be reactivated if the following two conditions are satisfied.

(1) The data-in to bank activate delay time (tWR + tRP) has been satisfied.

(2) The RAS cycle time (tRC) from the previous bank activation has been satisfied.

< WR = 2; BL= 4; tRP = 3 clocks >

CLK

T0 T1 T2 T3 T4 T5 T6 T7

CMD

Posted CAS

WRITE A NOP

NOP NOP NOP

NOP

Bank A

Active

DQS,DQS

DinA0

DQs

>= t

NOP

WL = RL-1 = 2

>= t

Limit

NOP

Autoprecharge

Auto Precharge begins

CLK

CMD

Posted CAS

WRITE A NOP

NOP NOP NOP

NOP

Bank A

Active

DQS,DQS

DinA0DQs

NOP

DinA1 DinA2 DinA3

>= t

WR +

NOP

Autoprecharge

DinA1 DinA2 DinA3

>= t

T0 T3 T4 T5 T6 T7 T8 T9 T12

Auto Precharge begins

>= t

WL = RL-1 = 4

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 50/62

Auto Refresh & Self Refresh

Auto Refresh

An Auto Refresh command is issued by having CS , RAS and CAS held LOW with CKE and WE HIGH at the rising edge of the

clock(CLK). All banks must be precharged and idle for tRP(min) before the Auto Refresh command is applied. An address counter,

internal to the device, supplies the bank address during the refresh cycle. No control of the external address bus is required once

this cycle has started. When the refresh cycle has completed, all banks will be in the idle state. A delay between the Auto Refresh

command and the next Bank Active command or subsequent Auto Refresh command must be greater than or equal to the

tRFC(min).To allow for improved efficiency in scheduling and switching between tasks, some flexibility in the absolute refresh

interval is provided. A maximum of eight Refresh commands can be posted, meaning that the maximum absolute interval between

any Refresh command and the next Refresh command is 9 x tREFI.

COMMAND

CKE = High

tRP

PRE Au to

Refresh CMD

tRFC

CLK

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 51/62

Self Refresh

A Self Refresh command is defined by having CS , RAS , CAS and CKE held LOW with WE HIGH at the rising edge of the

clock (CLK). ODT must be turned off before issuing Self Refresh command, by either driving ODT pin low or using EMRS(1)

command. Once the command is registered, CKE must be held LOW to keep the device in Self Refresh mode. The DLL is

automatically disabled upon entering Self Refresh and is automatically enabled upon exiting Self Refresh. When the device has

entered Self Refresh mode, all of the external signals except CKE, are “don’t care”.

For proper Self Refresh operation all power supply pins (VDD, VDDQ, VDDL and VREF) must be at valid levels. The device initiates a

minimum of one refresh command internally within tCKE period once it enters Self Refresh mode. The clock is internally disabled

during Self Refresh operation to save power. Self Refresh mode must be remained tCKE (min).

The user may change the external clock frequency or halt the external clock one clock after Self Refresh entry is registered,

however, the clock must be restarted and stable before the device can exit Self Refresh operation. The procedure for exiting Self

Refresh requires a sequence of commands. First, the clock must be stable prior to CKE going back HIGH. Once Self Refresh Exit

is registered, a delay of tXSRD(min) must be satisfied before a valid command can be issued to the device to allow for any internal

refresh in progress. CKE must remain HIGH for the entire Self Refresh exit period tXSRD for proper operation except for Self

Refresh re-entry. Upon exit from Self Refresh, the device can be put back into Self Refresh mode after waiting tXSNR(min) and

issuing one Refresh command. NOP or deselect commands must be registered on each positive clock edge during the Self

Refresh exit interval tXSNR. ODT should be turned off during tXSRD. The use of Self Refresh mode introduces the possibility that an

internally timed refresh event can be missed when CKE is raised for exit from Self Refresh mode. Upon exit from Self Refresh, the

device requires a minimum of one extra auto refresh command before it is put back into Self Refresh mode.

CLK

T0 T1 T2 T3 T4 T5 T6 Tn

CKE

ODT

>= tXSNR

tRP

Command

tAOFD

>= tXSRD

tIS tIS

tIS tIH

tIS

tCK

tCH tCL

Note:

1. Device must be in the “All banks idle” state prior to entering Self Refresh mode.

2. ODT must be turned off tAOFD before entering Self Refresh mode, and can be turned on again when tXSRD

timing is satisfied.

3. t

XSRD is applied for a Read or a Read with Auto Precharge command.

4. t

XSNR is applied for any command except a Read or a Read with Auto Precharge command.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 52/62

Power-Down

Power-Down is synchronously entered when CKE is registered LOW (no accesses can be in progress). CKE is not allowed to go

LOW while MRS or EMRS command time, or read or write operation is in progress. CKE is allowed to go LOW while any of other

operations such as Bank Active, Precharge or Auto Precharge, or Auto Refresh is in progress. The DLL should be in a locked state

when Power-Down is entered. Otherwise DLL should be reset after exiting Power-Down mode for proper read operation.

If Power-Down occurs when all banks are idle, this mode is referred to as Precharge Power-Down; if Power-Down occurs when

there is a Bank Active command in any bank, this mode is referred to as Active Power-Down. Entering Power-Down deactivates

the input and output buffers, excluding CLK, CLK , ODT and CKE. Also the DLL is disabled upon entering Precharge Power-Down

or slow exit Active Power-Down, but the DLL is kept enabled during fast exit Active Power-Down. In Power-Down mode, CKE LOW

and a stable clock signal must be maintained at the inputs of the device, and ODT should be in a valid state but all other input

signals are “Don’t Care”. CKE LOW must be maintained until tCKE has been satisfied. Power-Down duration is limited by 9 times

tREFI of the device.

The Power-Down state is synchronously exited when CKE is registered HIGH (along with a NOP or DESELECT command). CKE

HIGH must be maintained until tCKE has been satisfied. A valid, executable command can be applied with Power-Down exit latency,

tXP, tXARD, or tXARDS, after CKE goes HIGH.

CLK

CKE

Command VALID

NOP NOP VALI D VALI D

VALID

CKE

Enter power-down mode

XP,

XARD,

XARDS

Exit power-down mode t

CKE

:Don’tcare

Read to Power-Down Entry

CLK

Command

READ

CKE

CKE should be kept high until the end of burst operation

T0 T1 T2 Tx Tx+1 Tx+2 Tx+3

High

AL + CL

DoutA0 DoutA1 DoutA2 DoutA3

Tx+4 Tx+5 Tx+6 Tx+7 Tx+8 Tx+9

DQS

BL = 4

CLK

Command

READ

CKE

CKE should be kept high until the end of burst operation

T0 T1 T2 Tx Tx+1 Tx+2 Tx+3

High

AL + CL

DoutA0 DoutA1 DoutA2 DoutA3

Tx+4 Tx+5 Tx+6 Tx+7 Tx+8 Tx+9

DQS

BL = 8

DoutA4 DoutA5 DoutA6 DoutA7

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 53/62

Read with Auto Precharge to Power-Down Entry

CLK

Command

READ

CKE

CKE should be kept high until the end of burst operation

T0 T1 T2 Tx Tx+1 Tx+2 Tx+3

AL+BL/2

with t

RTP

=7.5ns

and t

RAS(min.)

satisfied

AL + CL

DoutA0 DoutA1 DoutA2 DoutA3

Tx+4 Tx+5 Tx+6 Tx+7 Tx+8 Tx+9

DQS

BL = 4

CLK

Command

READ

CKE

CKE should be kept high until the end of burst operation

T0 T1 T2 Tx Tx+1 Tx+2 Tx+3

AL + CL

DoutA0 DoutA1 DoutA2 DoutA3

Tx+4 Tx+5 Tx+6 Tx+7 Tx+8 Tx+9

DQS

BL = 8

DoutA4 DoutA5 DoutA6 DoutA7

PRE

Start internal precharge

AL+BL/2

with t

RTP

=7.5ns

and t

RAS(min.)

satisfied

Write to Power-Down Entry

CLK

Command WRITE

CKE

T0 T1 Tm Tm+1 Tm+2 Tm+3 Tx

DinA0 DinA1 DinA2 DinA3

Tx+1 Tx+2 Ty Ty+1 Ty+2 Ty+3

DQS

BL = 4

CLK

Command WRITE

CKE

T0 T1 Tm Tm+1 Tm+2 Tm+3 Tm+4

DinA0 DinA1

Tm+5 Tx Tx+1 Tx+2 Tx+3 Tx+4

DQS

BL = 8

tWTR

DinA2 DinA3 DinA4 DinA5 DinA6 DinA7

tWTR

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 54/62

Write with Auto Precharge to Power-Down Entry

CLK

Command

WRITE A

CKE

T0 T1 Tm Tm+1 Tm+2 Tm+3 Tx

DinA0 DinA1 DinA2 DinA3

Tx+1 Tx+2 Tx+3 Tx+4 Tx+5 Tx+6

DQS

BL = 4

CLK

Command

WRITE A

CKE

T0 T1 Tm Tm+1 Tm+2 Tm+3 Tm+4

DinA0 DinA1

Tm+5 Tx Tx+1 Tx+2 Tx+3 Tx+4

DQS

BL = 8

DinA2 DinA3 DinA4 DinA5 DinA6 DinA7

PRE

Auto Refresh/ Bank Active/ Precharge to Power-Down Entry

CLK

Command

CMD

CKE

T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11

CKE can go to low one clock after a command

Note: CMD could be Auto Refresh/ Bank Active/ Precharge command.

MRS/EMRS to Power-Down Entry

CLK

T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11

CKE

MRS/

EMRS

Command

tMRD

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 55/62

Asynchronous CKE Low event

DDR2 SDRAM requires CKE to be maintained “HIGH” for all valid operations as defined in this data sheet. If CKE asynchronously

drops “LOW” during any valid operation, the device is not guaranteed to preserve the contents of array. If this event occurs,

memory controller must satisfy tDELAY before turning off the clocks. Stable clocks must exist at the input of device before CKE is

raised “HIGH” again. The device must be fully re-initialized (steps 4 ~ 13) as described in initialization sequence. The device is

ready for normal operation after the initialization sequence.

CLK

CKE

DELAY

Stable clocks

CKE asynchronously

drops low Clockscanbeturnedoff

his

Clock Frequency change in Precharge Power-Down mode

DDR2 SDRAM input clock frequency can be changed under following condition:

The device is in Precharge Power-Down mode. ODT must be turned off and CKE must be at logic LOW level. A minimum of 2

clocks must be waited after CKE goes LOW before clock frequency may change. The device input clock frequency is allowed to

change only between tCK (min) and tCK (max). During input clock frequency change, ODT and CKE must be held at stable LOW

levels. Once input clock frequency is changed, stable new clocks must be provided before Precharge Power-Down may be exited

and DLL must be RESET via MRS after Precharge Power-Down exit. Depending on new clock frequency an additional MRS

command may need to be issued to appropriately set the WR, CL etc.. During DLL re-lock period, ODT must remain off. After the

DLL lock time, the device is ready to operate with new clock frequency.

CLK

Minimum 2 clocks required

before changing frequency

T0 T1 T2 T4

Tx Tx+1 Ty Ty+1 Ty+2 Ty+3 Ty+4 Tz

CKE

ODT

NOP

command

NOP NOP NOP

DLL

Reset

NOP

Vaild

AOFD

200 clocks

Frequency change

occurs here

Stable new clock

bef

wer d

wn exi

ODT is off

during DLL RESET

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 56/62

Functional Truth Table

Current State CS RAS CAS WE Address Command Action

H X X X X DESEL NOP or Power-Down

L H H H X NOP NOP or Power-Down

L H L X BA, CA, A10 READ / READA

WRITE / WRITEA ILLEGAL (*1)

L L H H BA, RA Active Bank Active, Latch RA

L L H L BA, A10 / A10 PRE / PREA Precharge / Precharge All

L L L H X Refresh Refresh (*2)

IDLE

L L L L Op-Code Mode-Add MRS / EMRS Mode Register setting / Extended

Mode Register setting (*2)

H X X X X DESEL NOP

L H H H X NOP NOP

L H L H BA, CA, A10 READ / READA Begin Read, Latch CA,

Determine Auto Precharge

L H L L BA, CA, A10 WRITE / WRITEA Begin Write, Latch CA,

Determine Auto Precharge

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 /A10 PRE / PREA Precharge / Precharge All

L L L H X Refresh ILLEGAL

BANK ACTIVE

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Continue Burst to END)

L H H H X NOP NOP (Continue Burst to END)

L H L H BA, CA, A10 READ / READA

Terminate Burst, Latch CA,

Begin New Read,

Determine Auto Precharge (*1, 4)

L H L L BA, CA, A10 WRITE / WRITEA ILLEGAL (*1)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA ILLEGAL (*1) / ILLEGAL

L L L H X Refresh ILLEGAL

READ

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Continue Burst to end)

L H H H X NOP NOP (Continue Burst to end)

L H L H BA, CA, A10 READ / READA ILLEGAL (*1)

L H L L BA, CA, A10 WRITE / WRITEA

Terminate Burst, Latch CA,

Begin new Write,

Determine Auto-Precharge (*1, 4)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA ILLEGAL (*1) / ILLEGAL

L L L H X Refresh ILLEGAL

WRITE

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 57/62

Current State CS RAS CAS WE Address Command Action

H X X X X DESEL NOP (Continue Burst to end)

L H H H X NOP NOP (Continue Burst to end)

L H L H BA, CA, A10 READ / READA ILLEGAL (*1)

L H L L BA, CA, A10 WRITE / WRITEA ILLEGAL (*1)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA ILLEGAL (*1) / ILLEGAL

L L L H X Refresh ILLEGAL

READ with

AUTO

PRECHARGE

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Continue Burst to END)

L H H H X NOP NOP (Continue Burst to END)

L H L H BA, CA, A10 READ / READA ILLEGAL (*1)

L H L L BA, CA, A10 WRITE / WRITEA ILLEGAL (*1)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 PRE / PREA ILLEGAL (*1) / ILLEGAL

L L L H X Refresh ILLEGAL

WRITE with

AUTO

PRECHARGE

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Idle after tRP)

L H H H X NOP NOP (Idle after tRP)

L H L X BA, CA, A10 READ / READA

WRITE / WRITEA ILLEGAL (*1)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA NOP (Idle after tRP)

L L L H X Refresh ILLEGAL

PRE-CHARGIN

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Bank Active after tRCD)

L H H H X NOP NOP (Bank Active after tRCD)

L H L X BA, CA, A10 READ / READA

WRITE / WRITEA ILLEGAL (*1, 5)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA ILLEGAL

L L L H X Refresh ILLEGAL

ROW

ACTIVATING

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 58/62

Current State CS RAS CAS WE Address Command Action

H X X X X DESEL NOP (Bank Active after tWR)

L H H H X NOP NOP (Bank Active after tWR)

L H L H BA, CA, A10 READ / READA ILLEGAL (*1, 6)

L H L L BA, CA, A10 WRITE / WRITEA WRITE / WRITEA

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA ILLEGAL (*1) / ILLEGAL

L L L H X Refresh ILLEGAL

WRITE

RECOVERING

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Bank Active after tWR)

L H H H X NOP NOP (Bank Active after tWR)

L H L X BA, CA, A10 READ / READA

WRITE / WRITEA ILLEGAL (*1)

L L H H BA, RA Active ILLEGAL (*1)

L L H L BA, A10 / A10 PRE / PREA ILLEGAL (*1) / ILLEGAL

L L L H X Refresh ILLEGAL

WRITE

RECOVERING

with

AUTO

PRECHARGE

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Idle after tRFC)

L H H H X NOP NOP (Idle after tRFC)

L H L X BA, CA, A10 READ / READA

WRITE / WRITEA ILLEGAL

L L H H BA, RA Active ILLEGAL

L L H L BA, A10 / A10 PRE / PREA ILLEGAL

L L L H X Refresh ILLEGAL

REFRESH

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H X X X X DESEL NOP (Idle after tMRD)

L H H H X NOP NOP (Idle after tMRD)

L H L X BA, CA, A10 READ / READA

WRITE / WRITEA ILLEGAL

L L H H BA, RA Active ILLEGAL

L L H L BA, A10 / A10 PRE / PREA ILLEGAL

L L L H X Refresh ILLEGAL

(Extended)

MODE

SETTING

L L L L Op-Code Mode-Add MRS / EMRS ILLEGAL

H = High Level, L = Low level, X = Don’t Care

BA = Bank Address, RA =Row Address, CA = Column Address, NOP = No Operation

ILLEGAL = Device operation and / or data integrity are not guaranteed.

Note:

1. This command may be issued for other banks, depending on the state of the banks.

2. All banks must be in “IDLE”.

3. All AC timing specs must be met.

4. Only allowed at the boundary of 4 bits burst. Burst interruption at other timings is illegal.

5. Available in case tRCD is satisfied by AL setting.

6. Available in case tWTR is satisfied.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 59/62

Simplified States Diagram

Power-Up and

Initialization

Sequence

OCD

calibration

Settign

MRS

EMRS

Self

Refreshing

Idle

All banks

precharged

Refreshing

Precharge

Power-

Down

SRF

REF

CKEH

CKEL

Activating

(E)MRS

Bank

Active

Power

-Down

CKEH

CKEL

Reading

Write

Read

Reading

With

Auto Precharge

Writing

With

Auto Precharge

Precharging

Write

Read

RDA

WRA

PR, PRA PR, PRA

PR, PRA

Read

CKEH

ACT

Automatic Sequence

Command Sequence

CKEL = CKE LOW

CKEH = CKE HIGH

ACT = Activate

WR(A) = Write (with Auto Precharge)

RD(A) = Read (with Auto Precharge)

PR(A) = Precharge (All)

(E)MRS = (Extended) Mode Register Set

SRF = Enter Self Refresh

REF = Auto Refresh

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 60/62

PACKING DIMENSIONS

84-BALL DDRII SDRAM ( 8x12.5 mm )

Symbol Dimension in mm Dimension in inch

Min Norm Max Min Norm Max

1.20

0.047

A1 0.25 0.30 0.40 0.010 0.012 0.016

Φb 0.37 0.45 0.50 0.015 0.018 0.020

D 7.90 8.00 8.10 0.311 0.315 0.319

E 12.40 12.50 12.60 0.488 0.492 0.496

D1 6.40 BSC 0.252 BSC

E1 11.20 BSC 0.441 BSC

e 0.80 BSC 0.031 BSC

Controlling dimension : Millimeter.

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 61/62

Revision History

Revision Date Description

0.1 2011.06.15 Original

1.0 2011.08.02

1. Delete “Preliminary”

2. Correct the specification of tCK(min) for speed grade

-2.5(CL5)

3. Modify the specification of tAXPD for speed grade -2.5,

tMOD and tDAL

1.1 2011.08.23 Modify DC specifications

ESMT

M14D5121632A (2H)

Operation Temperature Condition (TC) -40°C~95°C

Elite Semiconductor Memory Technology Inc. Publication Date : Aug. 2011

Revision : 1.1 62/62

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of publication. ESMT assumes no responsibility for any error in this document,

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the application of our products. No responsibility is assumed by ESMT for any

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otherwise, is granted under any patents, copyrights or other intellectual property

rights of ESMT or others.

ny semiconductor devices may have inherently a certain rate of failure. To

minimize risks associated with customer's application, adequate design and

operating safeguards against injury, damage, or loss from such failure, should be

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