MIL SPECS @ oooo1es goodg?700 1 i MIL-~S-19500/104C 29 November 1965 SUPERSEDING MIL-S-19500/104B(NAV Y) 17 August 1962 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650 1N1124RA, IN1126RA, 1N1128RA, 1N3649R, AND 1N3650R This specification is mandatory for use by all Depart- ments and Agencies of the Department of Defense. 1, SCOPE 1.1 Scope. This specification covers the detail requirements for 1 amp, silicon, power rectifiers with the following ratings: 1.2 Reverse types (Suffix R). Reverse and forward types are identical except: The forward types have the cathode connected to the stud; the reverse types have the anode connected to the stud. Designated values are applicable to both types. 1.3 Maximum ratings. Type Vr Vroiwke) lo 1/ Io ig | ig(surge) To= 50C | Tg = 150C 1/120 sec v(pk) | v(pk) Adc Adc_ a a 1N1124A 250 200 3.3 1 10 25 IN1126A 500 400 3.3 1 10 25 1N1128A 750 600 3.3 1 10 25 1N3649 1000 800 3.3 1 10 25 1N3650 1250 1000 3.3 i 10 25 1/Derate at 23 mAdc/C between Tc = 50C and Tc = 150C. OPERATING CASE TEMPERATURE: -65C to + 150C STORAGE TEMPERATURE: -65C to + 175C BAROMETRIC PRESSURE, REDUCED: 8 mm Hg - 1N1124A and 1N1126A; 16 mm Hg - 1N1128A; 30 mm Hg - 1N3649; 54mm Hg - 1N3650 2. APPLICABLE DOCUMENTS 2.1 The following documents, of the issue in effect on date of invitation for bids or request for proposal, form a part of the specification to the extent specified herein. SPECIFICATIONS MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. FSC 5960 THIS DOCUMENT CONTAINS X PAGES.MIL SPECS Icy oo00125 oooov7o1 3 a MIL-S- 19500/104C STANDARDS MILITARY MIL-STD-202 - Test Met hods for Electronic and Electrical Component Parts. MIL-STD-750 - Test Methods for Semiconductor Devices. (Copies of specifications, standards, drawings, and publications required by suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer. ) 2,2 Other publications, The following document forms a part of this specification to the extent specified nerein, Unless otherwise indicated, the issue in effect. on date of invitation for hids or request for proposal shall apply, NATIONAL BUREAU OF STANDARDS Handbook H28 - Screw-Thread Standards for Federal Services. (Application for copies should be addressed to the Superintendent of Documents Government Printing Office, Washington, D, C. 20402.) 8. REQUIREMENTS 3.1 General. Requirements shall be in accordance with MIL-S-19500, and as specified herein. 8.2 Abbreviations and symbols. The abbreviations and symbols used herein are defined in MIL-S-19500, 3.3 Design and construction, The semiconductor diodes shall be of the design, construction, and physical dimensions specified on figure 1. 3.4 Performance characteristics. Performance characteristics shall be as specified in tables I, Ii, and OI. 38.5 Marking. The following marking specified in MIL-S-19500 may be omitted at the option of the manufacturer: (a) Manufacturer's identification. (b) Country of origin. 3.5.1 Polarity. The polarity shall be indicated by a graphic symbol with the arrow pointing toward the negative end for forward bias. 4, QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S~- 19500, 4.2 Qualification inspection. Qualification inspection shall consist of the examinations and tests specified in tables I, H, and I. Subgroups 1, 2, and 3 of group B inspection and subgroup 2 of group C inspection may be performed on an inspection lot in accordance with MIL-S-19500 or may be performed on an inspection sublot on any type to qualify all types. Testing of either polarity for subgroups 1, 2, and 3 of group B inspection and subgroup 2 of group C inspection is sufficient to obtain qualification approval of both polarities. Subgroups 4, 5, and 6 of group B inspection shall be performed on an inspection sublot for each polarity type of the lowest and highest voltage units being qualified, Subgroup 7 of group B inspection and subgroup 1 of group C inspection shall be performed on an inspection sublot for each type being qualified. Either polarity may be tested to qualify both polarities for subgroup 7 of group B inspection. Each polarity must be tested separately to qualify its polarity for subgroup 1 of group C. 4.3 Quality conformance inspection, Qualify conformance inspection shall consist of the examinations and tests specified in groups A, B, and C. Types of opposite polarity shall be considered as separate lots. 4.4 Group A inspection. Group A inspection shall consist of the examinations and tests specified in table I and shall be conducted on an inspection sublot of each type. 4.5 Group B inspection. Group B inspection shall consist of the examinations and tests specified in table Il. Subgroups 5 and 6 shall be performed on an inspection lot with 50% of the sample being the highest voltage type present in the lot and 50% of the sample being the highest volume type present in the lot.MIL SPECS | Icy goo0125 Opoovoe 5 I MIL-S-19500/104C am [ | Lp B r fd] 4 DIA VN : t tis aa . ! SEE NOTE 2 - | . hg J | eg -/SEATING PLANE DIMENSIONS S INCHES MILLIMETERS | 2 LTR MIN MAX | MIN MAX E A 405 10.29 B 424 10.77 : C | .424 | .437 10.77 | 11.10 D{ .075 | .175 1.90 | 4.44 E 800 20.32 F 250 6.35 | 7 G | .060 1.52 H | .060 1,52 J | .422 | .453 10.72 | 11.51 K | 4,5, 6 NOTES: - 1. Angular orientation of this terminal is undefined. 2. Dia of unthreaded portion .189 inch (4,80 mm) max; .163 inch (4.14 mm) min. 3. The A.S.A. thread reference is 10-32 UNF2A. 4. Max pitch dia of plated threads shall be basic pitch dia .169 inch (4,31 mm) and in accordance with Handbook H28. 5, Unit shall not be damaged by torque of 15 in-[b applied to 10-32NF2B nut assembled on thread. 6. Complete threads shall extend to within 2-1/2 threads of the seating plane. 7. Terminal end shape is unrestricted. 8. Reversed (anode to stud) units shall be marked with an R following the last digit in the type no. 9, For marking see 3.5. 10. Metric equivalents (to the nearest .01 mm) are given for general information only and are based upon | inch = 25,4 mm. 11. Dimensions are in inches. FIGURE 1. Semiconductor devices, diode, types IN1124A, 1N1126A, 1N1128A, 1N3649 and 1N3650. . 3MIL SPECS nd | g000125 ooo00703 7 Tt MIL-S-19500/104C 4.6 Group C inspection. Group C inspection shall consist of examinations and tests specified in table III, This inspection shall be conducted on the initial lot, and thereafter every six months during production. Subgroup i shall be performed on an inspection sublot of each type. In the event subsequent lots contain voltage types other than those previously accepted under group C subgroup 1 provisions in the current six month period, the additional types shall be subjected to group C, subgroup 1 inspection. 4.'T Methods of examination and test. Methods of examination and test shall be as specified in tables I, I, and II, and as follows: . 4,7,1 Steady state operation life. This test shall be conducted with a half-sine wave form of the specified peak voltage impressed across the diode in the reverse direction followed by a half-sine wave form of the specified average rectifier current, The forward conduction angle ot the rectified current shall not be greater than 180 nor less than 130 ; and the power shall be equal to or greater than that of a half-sine wave. 4,7,2 Inspection conditions, Unless otherwise specified herein, all inspections shall be conducted at a case temperature (Tc) of 25C. 4.7.3 Shock, The shock testing apparatus shall be capable of providing shock pulses of the specified peak acceleration, waveform, and pulse duration to the body of the device. The acceleration pulse, as determined from the unfiltered output of a transducer with a natural frequency greater than 10, 000 cycles per second, shall be a half sine waveform with an allowable distortion not greater than +20 percent of the specified peak acceleration. The pulse duration shall be measured between the points at 10 percent of the peak acceleration during rise and at 10 percent of the peak acceleration during decay. Absolute tolerance of the pulse duration shall be +40 percent of the specified duration. 4.7.4 Solderability, The immersion depth shall cover the flat portion of the terminal. 4,7.5 Time limit for end points. End point tests for qualification and quality conformance inspection shall be completed within 96 hours after completion of the last test in the subgroup. TABLE I. Group A inspection. L Examination or test MIL-STD-750 p mits Method Detail D Symbol | Min Max | Unit Subgroup 1 7 Visual and mechanical 2071 ene --- woof nee examination Subgroup 2 5 Forward voltage 4011 Ip = 10 Adc (pulse); Vr oo 2.2 | Vde tp =8.5 msec; uty cycles 2% Reverse current 4016 IR 1N1124A VR = 200 Vde 5 --- pAdc 1N1126A VR = 400 Vde --- 5 pAdc IN1128A VR = 600 Vde --- 5 pAdc 1N3649 VR = 800 Vde --- 5 p.Ade 1N3650 VR = 1000 Vde --- 5 pAdc Reverse current at peak 4016 ip reverse voltage 1N1124A Vp = 250 v(pk) --- 100 | #a(pk) 1N1126A vr = 500 v(pk) --- 100 | za(pk) 1N1128A vy = 750 v(pk) --- 100 | j2a(pk) 1N3649 vy = 1000 v(pk) --- 100 | pa(pk) 1N3650 vr = 1250 v(pk) --- 100 | pa(pk) 4MIL SPECS TABLE I, Group A inspection. - Continued Icy 0000125 Oooo7o4 49 i MIL-S-19500/104C L Examination or test MIL-STD-750 > Limits | Method ; Details D Symbol | Min | Max | Unit Subgroup 2 - Continued | Reverse current 4016 Toe 15072 C IR 1N1124A | VR = 200 Vde --- 200 | pAdc IN1126A | VR = 400 Vdc --+ 200 | wAde IN1128A Ve = 600 Vdc --- 200 | pAdc 1N3649 ve = 800 Vdc --- 200 | pAdc 1N3650 Vp = 1000 Vde --- 200 | pAdec TABLE II. Group B inspection. L Examination or test MIL-STD-750 T Limits Pp Method Details D Symbol | Min Max | Unit Subgroup 1 10 Physical dimensions 2066 (See figure 1) --- --- oe Subgroup 2 10 Solderability (see 4.7.4) 2026 Dwell time = 10 + 1 sec --- --- --- | oee Thermal shock 1051 Test cond, F --- --- --- | --- (temperature cycling) Thermal shock (glass strain)} 1056 Test cond. A ~ --- --- w-+ | --- Terminal strength: 2036 Tension Test cond. A; 20 lbs; --- woo won | --- t= 15 + 3 sec Torque (terminal) Test cond, D1, 10 oz-in.; --- --- w-- | --- t= 15+ 3sec Torque (stud) Test cond. D2; 15 lb-in.; --- --- w-- | wee t= 30 + 3 sec Bending stress Test cond. F, method B; --- occ weep onee (axial strain) 3 lbs; t = 15 + 3 sec Seal --- MIL-STD-202, method 112, --- | --- |sx107| Atm test cond. C, procedure III; kec/sec test cond. A for gross leaks Moisture resistance 1021 Omit initial conditioning --- on wee poscn End points: (See 4.7.5) Forward voltage - ~ | 4011 Ip = 10 Adc (pulse); . - . _VRe -| --- 2.2| Vde . te = 8.5 msec; duty uty cycles2%MIL SPECS icf gooo012e5 pooo705 Oo T MIL-S-19500/104C TABLE II. Group B inspection, - Continued L Examination or test MIL-STD-750 > Limits Method , Details D Symbol | Min | Max Unit Subgroup 2 - Continued Reverse current 4016 Ip 1N1124A VR = 200 Vde oe 5 uAde 1N1126A VR = 400 Vde --- 5 | wAde 1N1128A VR = 600 Vde --- 5 | wAde 1N3649 Vp = 800 Vde --- 5 | pAde 1N38650 VR = 1000 Vde --- 5 pAdc Subgroup 3 10 Shock (see 4.7. 3) 2016 Nonoperating; 500 G; -o- --- en t= 0.5 msec; 5 blows ineach orientation: X1, Yi, and Yg Vibration fatigue 2046 10 G, nonoperating ne --- wwe | nee Vibration, variable 2056 10 G, nonoperating eee | eee we-- | --- frequency Constant acceleration 2006 10,000 G; nonoperating; --- os ~-- | -+- Xi, Y1, and Y2 orientations End points: (Same as subgroup 2) Subgroup 4 10 Surge current 4066 ig(surge) = 25a;{= 60 cps; Ig = 1 Ade; Tc = 150 +8 C; Ten 1/120 sec surges, 1 surge/minute 1N1124A vy = 200 v(pk) --- woe a rn 1N1126A vr = 400 v(pk) --- wen --- | --- 1N1128A vy = 600 v(pk) --- --- w-- | --- 1N3649 vy = 800 v(pk) wee | --- --- | --- 1N3650 vr = 1000 v(pk) --- --- | --- End points: (Same as subgroup 2) Subgroup 5 A= 10 High-temperature life 1031 | Ta = 175*3c wee fewer | -ee | we (nonoperating) ~ End points: (See 4.7.5) Forward voltage 4011 Ip = 10 Adc (pulse); VP --- 2.3) Vde tp = 8.5 msec; duty cycleS 2% Reverse current: 4016 ig 1N1124A VR = 200 Vde --- 10 pAdc 1N1126A VR = 400 Vde --- 10 | Ade 1N1128A VR = 600 Vde woe 10 pAdc 1N3649 VR = 800 Vdc --~ 10 pAdc 1N3650 VR= 1000 Vdc wee 10 pAdc rMIL NPECS cj oooo1es Ooo070b 2 i MIL-S-19500/104C TABLE II. Group B inspection. - Continued L Examination or test MIL-STD-750 > Limits Method | Details D Symbol | Min | Max | Unit t Subgroup 6 | dA = 10 Steady state operation life 1026 | Ip = 1 Ade; To= 150 +8 C; w-- | --- --- | -+- (see 4.7.1) f = 60 cps 1N1124A vy = 200 v(pk) --- --- wor pone IN1126A vr = 400 v(pk) --- --- wee | oe 1N1128A Vp = 600 vipk) --- --- woe | nee 1N36 49 vr = 800 v(pk) --- --- w-- | ee 1N3650 vy = 1000 v(pk) o- 7-7 woo [noe End points: (Same as subgroup 5) Subgroup 7 5 Low-temperature operation: To = -65 +9 C 1 Forward voltage 4011 Ip = 10 Adc (pulse) VE --- 2.2 | Vde . tp= 8.5 msec " duty cycle= 2% Reverse current 4016 : IR 1N1124A ' VR = 200 Vde --- 100 | pAdc 1N1126A i Vp = 400 Vdc --- 100 ! pAdc IN1128A VR = 600 Vde --~ 100 ; pAdc 1N3649 ' Vp = 800 Vde --- 100 | pAdc 1N3650 VR = 1000 Vde --- 100 | pAdec TABLE II]. Group C inspection. MIL-STD-750 L mi Examination or test -STD- T Limits | Pp Method i Details D Symbol | Min Max | Unit Subgroup i i 10 Barometric pressure, 1001 8 mm Hg - 1N1124A, 1N1126A; --- --- ---| --- reduced (altitude operation) 16mm Hg - 1N1128A 30 mm Hg - 1N3649 54 mm Hg - 1N3650 t = 60 sec Measurement during test: Reverse current 4016 IR 1N1124A VR 200 Vde oo: 5 pAdc 1IN1126A VR = 400 Vde --- 5 pAdc 1N1128A VR = 600 Vde --- 5 pAdc 1N3649 ! VR = 800 Vde --- 5 pAde 1N3650 : Vp = 1000 Vde --- 5 pAdc l Subgroup 2 | 10 ; | Salt atmosphere - 1041 wee [eee _--| --- i .MIL SPECS Ic OOO01e5 ogoo7o07? 4 i MIL -S-19500/104C 5. PREPARATION FOR DELIVERY 5.1 Preparation for delivery. Preparation for delivery shall be in accordance with MIL-S-19500, 6. NOTES 6.1 The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Asterisks are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. Custodians: Preparing activity: Army - EL Navy - SH Navy - SH Air Force - 11 (Project 5960-2143) Review activities: Army - EL, MU Navy - SH Air Force - 11, 17, 85 User activities: Army - EL, MI Navy - WP, MC, CG Air Force - 14, 19