M1AFS250-PQ208I - Microsemi - Datasheet.Directory

October 2008 I

Actel Fusion Mixed-Signal FPGAs

Family with Optional ARM® Support

Features and Benefits

High-Performance Reprogrammable Flash

Technology

• Advanced 130-nm, 7-Layer Metal, Flash-Based CMOS Process

• Nonvolatile, Retains Program when Powered Off

• Live at Power-Up (LAPU) Single-Chip Solution

• 350 MHz System Performance

Embedded Flash Memory

• User Flash Memory – 2 Mbits to 8 Mbits

– Configurable 8-, 16-, or 32-Bit Datapath

– 10 ns Access in Read-Ahead Mode

• 1 kbit of Additional FlashROM

Integrated A/D Converter (ADC) and Analog I/O

• Up to 12-Bit Resolution and up to 600 ksps

• Internal 2.56 V or External Reference Voltage

• ADC: Up to 30 Scalable Analog Input Channels

• High-Voltage Input Tolerance: –10.5 V to +12 V

• Current Monitor and Temperature Monitor Blocks

• Up to 10 MOSFET Gate Driver Outputs

– P- and N-Channel Power MOSFET Support

– Programmable 1, 3, 10, 30 µA and 20 mA Drive Strengths

• ADC Accuracy is Better than 1%

On-Chip Clocking Support

• Internal 100 MHz RC Oscillator (accurate to 1%)

• Crystal Oscillator Support (32 kHz to 20 MHz)

• Programmable Real-Time Counter (RTC)

• 6 Clock Conditioning Circuits (CCCs) with 1 or 2 Integrated

PLLs

– Phase Shift, Multiply/Divide, and Delay Capabilities

– Frequency: Input 1.5–350 MHz, Output 0.75–350 MHz

Low Power Consumption

• Single 3.3 V Power Supply with On-Chip 1.5 V Regulator

• Sleep and Standby Low Power Modes

In-System Programming (ISP) and Security

• Secure ISP with 128-Bit AES via JTAG

•FlashLock

® to Secure FPGA Contents

Advanced Digital I/O

• 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation

• Bank-Selectable I/O Voltages – Up to 5 Banks per Chip

• Single-Ended I/O Standards: LVTTL, LVCMOS

3.3V/2.5V/1.8V/1.5V, 3.3VPCI / 3.3VPCI-X, and

LVCMOS 2.5 V / 5.0 V Input

• Differential I/O Standards: LVPECL, LVDS, BLVDS, and M-LVDS

– Built-In I/O Registers

– 700 Mbps DDR Operation

• Hot-Swappable I/Os

• Programmable Output Slew Rate, Drive Strength, and Weak

Pull-Up/Down Resistor

• Pin-Compatible Packages across the Fusion Family

SRAMs and FIFOs

• Variable-Aspect-Ratio 4,608-Bit SRAM Blocks (×1, ×2, ×4, ×9,

and ×18 organizations available)

• True Dual-Port SRAM (except ×18)

• Programmable Embedded FIFO Control Logic

Soft ARM7™ Core Support in M7 and M1 Fusion Devices

• ARM Cortex™-M1 (without debug), CoreMP7Sd (with

debug) and CoreMP7S (without debug)

Fusion Family

Fusion Devices AFS090 AFS250 AFS600 AFS1500

ARM-Enabled

Fusion Devices

CoreMP7 1M7AFS600

Cortex-M1 2M1AFS250 M1AFS600 M1AFS1500

General

Information

System Gates 90,000 250,000 600,000 1,500,000

Tiles (D-flip-flops) 2,304 6,144 13,824 38,400

Secure (AES) ISP Yes Yes Yes Yes

PLLs 1 1 2 2

Globals 18181818

Memory

Flash Memory Blocks (2 Mbits) 1 1 2 4

Total Flash Memory Bits 2 M 2 M 4 M 8 M

FlashROM Bits 1 k 1 k 1 k 1 k

RAM Blocks (4,608 bits) 6 8 24 60

RAM kbits 27 36 108 270

Analog and I/Os

Analog Quads 5 6 10 10

Analog Input Channels 15 18 30 30

Gate Driver Outputs 5 6 10 10

I/O Banks (+ JTAG) 4 4 5 5

Maximum Digital I/Os 75 114 172 252

Analog I/Os 20 24 40 40

Notes:

1. Refer to the CoreMP7 datasheet for more information.

2. Refer to the Cortex-M1 product brief for more information.

Preliminary v1.7

Actel Fusion Mixed-Signal FPGAs

II Preliminary v1.7

Fusion Device Architecture Overview

Package I/Os: Single-/Double-Ended (Analog)

Figure 1-1 • Fusion Device Architecture Overview (AFS600)

Fusion Devices AFS090 AFS250 AFS600 AFS1500

ARM-Enabled Devices

CoreMP7 M7AFS600

Cortex-M1 M1AFS250 M1AFS600 M1AFS1500

QN108 37/9 (16)

QN180 60/16 (20) 65/15 (24)

PQ208 93/26 (24) 95/46 (40)

FG256 75/22 (20) 114/37 (24) 119/58 (40) 119/58 (40)

FG484 172/86 (40) 223/109 (40)

FG676 252/126 (40)

Note: All devices in the same package are pin compatible with the exception of the PQ208 package (AFS250 and AFS600).

VersaTile

CCC

I/Os

OSC

CC/PLL

Bank 0

Bank 4

Bank 2

Bank 1

Bank 3

SRAM Block

4,608-Bit Dual-Port SRAM

or FIFO Block

SRAM Block

4,608-Bit Dual-Port SRAM

or FIFO Block

Flash Memory Blocks Flash Memory BlocksADC

Analog

Quad

ISP AES

Decryption

User Nonvolatile

FlashROM Charge Pumps

Analog

Quad

Analog

Quad

Analog

Quad

Analog

Quad

Analog

Quad

Analog

Quad

Analog

Quad

Analog

Quad

Analog

Quad

Actel Fusion Mixed-Signal FPGAs

Preliminary v1.7 III

Product Ordering Codes

Notes:

1. DC and switching characteristics for –F speed grade targets are based only on simulation. The characteristics provided for

the –F speed grade are subject to change after establishing FPGA specifications. Some restrictions might be added and

will be reflected in future revisions of this document. The –F speed grade is only supported in the commercial

temperature range.

2. Quad Flat No Lead packages are only offered as RoHS compliant, QNG.

M7AFS600 FG

Part Number

Fusion Devices

Speed Grade

Blank = Standard

1 = 15% Faster than Standard

F = 20% Slower than Standard

2 = 25% Faster than Standard

Package Type

QN =Quad Flat No Lead (0.5 mm pitch)

256 IG

Package Lead Count

Application (ambient temperature range)

Blank = Commercial (0 to +70°C)

I = Industrial (–40 to +85°C)

PP = Pre-Production

ES = Engineering Silicon (room temperature only)

90,000 System Gates

AFS090 =

250,000 System Gates

AFS250 =

ARM-Enabled Fusion Devices

600,000 System Gates

AFS600 =

1,500,000 System Gates

AFS1500 =

600,000 System Gates

M7AFS600 =

250,000 System Gates

M1AFS250 =

600,000 System Gates

M1AFS600 =

1,500,000 System Gates

M1AFS1500 =

PQ =Plastic Quad Flat Pack (0.5 mm pitch)

FG =Fine Pitch Ball Grid Array (1.0 mm pitch)

Lead-Free Packaging Options

Blank = Standard Packaging

G = RoHS-Compliant (green) Packaging

Actel Fusion Mixed-Signal FPGAs

IV Preliminary v1.7

Temperature Grade Offerings

Speed Grade and Temperature Grade Matrix

Contact your local Actel representative for device availability (http://www.actel.com/contact/offices/index.html).

Fusion Devices AFS090 AFS250 AFS600 AFS1500

ARM-Enabled Devices

CoreMP7 M7AFS600

Cortex-M1 M1AFS250 M1AFS600 M1AFS1500

QN108 C, I – – –

QN180 C, I C, I – –

PQ208 – C, I C, I –

FG256 C, I C, I C, I C, I

FG484 – – C, I C, I

FG676 – – – C, I

Notes:

1. C = Commercial Temperature Range: 0°C to 70°C Ambient

2. I = Industrial Temperature Range: –40°C to 85°C Ambient

–F1Std. –1 –2

C2✓✓✓✓

I3–✓✓✓

Notes:

1. DC and switching characteristics for –F speed grade targets are based only on simulation. The characteristics provided

for the –F speed grade are subject to change after establishing FPGA specifications. Some restrictions might be added

and will be reflected in future revisions of this document. The –F speed grade is only supported in the commercial

temperature range.

2. C = Commercial Temperature Range: 0°C to 70°C Ambient

3. I = Industrial Temperature Range: –40°C to 85°C Ambient

Preliminary v1.7 1-1

1 – Fusion Device Family Overview

Introduction

The Actel Fusion® mixed-signal FPGA satisfies the demand from system architects for a device that

simplifies design and unleashes their creativity. As the world’s first mixed-signal programmable

logic family, Fusion integrates mixed-signal analog, flash memory, and FPGA fabric in a monolithic

device. Actel Fusion devices enable designers to quickly move from concept to completed design

and then deliver feature-rich systems to market. This new technology takes advantage of the

unique properties of Actel flash-based FPGAs, including a high-isolation, triple-well process and the

ability to support high-voltage transistors to meet the demanding requirements of mixed-signal

system design.

Actel Fusion mixed-signal FPGAs bring the benefits of programmable logic to many application

areas, including power management, smart battery charging, clock generation and management,

and motor control. Until now, these applications have only been implemented with costly and

space-consuming discrete analog components or mixed-signal ASIC solutions. Actel Fusion mixed-

signal FPGAs present new capabilities for system development by allowing designers to integrate a

wide range of functionality into a single device, while at the same time offering the flexibility of

upgrades late in the manufacturing process or after the device is in the field. Actel Fusion devices

provide an excellent alternative to costly and time-consuming mixed-signal ASIC designs. In

addition, when used in conjunction with the Actel or ARM-based soft MCU core, Actel Fusion

technology represents the definitive mixed-signal FPGA platform.

Flash-based Fusion devices are live at power-up. As soon as system power is applied and within

normal operating specifications, Fusion devices are working. Fusion devices have a 128-bit flash-

based lock and industry-leading AES decryption, used to secure programmed intellectual property

(IP) and configuration data. Actel Fusion devices are the most comprehensive single-chip analog

and digital programmable logic solution available today.

To support this new ground-breaking technology, Actel has developed a series of major tool

innovations to help maximize designer productivity. Implemented as extensions to the popular

Actel Libero® Integrated Design Environment (IDE), these new tools allow designers to easily

instantiate and configure peripherals within a design, establish links between peripherals, create

or import building blocks or reference designs, and perform hardware verification. This tool suite

will also add comprehensive hardware/software debug capability as well as a suite of utilities to

simplify development of embedded soft-processor-based solutions.

General Description

The Actel Fusion family, based on the highly successful ProASIC®3 and ProASIC3E Flash FPGA

architecture, has been designed as a high-performance, programmable, mixed-signal platform. By

combining an advanced flash FPGA core with flash memory blocks and analog peripherals, Fusion

devices dramatically simplify system design and, as a result, dramatically reduce overall system cost

and board space.

The state-of-the-art flash memory technology offers high-density integrated flash memory blocks,

enabling savings in cost, power, and board area relative to external flash solutions, while providing

increased flexibility and performance. The flash memory blocks and integrated analog peripherals

enable true mixed-mode programmable logic designs. Two examples are using an on-chip soft

processor to implement a fully functional Flash MCU and using high-speed FPGA logic to offer

system and power supervisory capabilities. Live at power-up and capable of operating from a single

3.3 V supply, the Fusion family is ideally suited for system management and control applications.

The devices in the Fusion family are categorized by FPGA core density. Each family member

contains many peripherals, including flash memory blocks, an analog-to-digital-converter (ADC),

high-drive outputs, both RC and crystal oscillators, and a real-time counter (RTC). This provides the

Fusion Device Family Overview

1-2 Preliminary v1.7

user with a high level of flexibility and integration to support a wide variety of mixed-signal

applications. The flash memory block capacity ranges from 2 Mbits to 8 Mbits. The integrated 12-

bit ADC supports up to 30 independently configurable input channels. The on-chip crystal and RC

oscillators work in conjunction with the integrated phase-locked loops (PLLs) to provide clocking

support to the FPGA array and on-chip resources. In addition to supporting typical RTC uses such as

watchdog timer, the Fusion RTC can control the on-chip voltage regulator to power down the

device (FPGA fabric, flash memory block, and ADC), enabling a low-power standby mode.

The Actel Fusion family offers revolutionary features, never before available in an FPGA. The

nonvolatile flash technology gives the Fusion solution the advantage of being a secure, low-power,

single-chip solution that is live at power-up. Fusion is reprogrammable and offers time to market

benefits at an ASIC-level unit cost. These features enable designers to create high-density systems

using existing ASIC or FPGA design flows and tools.

The family has up to 1.5 M system gates, supported with up to 270 kbits of true dual-port SRAM, up

to 8 Mbits of flash memory, 1 kbit of user FlashROM, and up to 278 user I/Os. With integrated flash

memory, the Fusion family is the ultimate soft-processor platform. The AFS600 and AFS1500 devices

both support the Actel ARM7 core (CoreMP7). The ARM-enabled versions are identified with the

M7 prefix as M7AFS600 and M7AFS1500. The AFS250, AFS600, and AFS1500 devices support the

Actel Cortex-M1 core. The Cortex-M1-enabled versions are identified with the M1 prefix as

M1AFS250, M1AFS600, and M1AFS1500.

Flash Advantages

Reduced Cost of Ownership

Advantages to the designer extend beyond low unit cost, high performance, and ease of use. Flash-

based Fusion devices are live at power-up and do not need to be loaded from an external boot

PROM. On-board security mechanisms prevent access to the programming information and enable

secure remote updates of the FPGA logic. Designers can perform secure remote in-system

reprogramming to support future design iterations and field upgrades, with confidence that

valuable IP cannot be compromised or copied. Secure ISP can be performed using the industry-

standard AES algorithm with MAC data authentication on the device. The Fusion family device

architecture mitigates the need for ASIC migration at higher user volumes. This makes the Fusion

family a cost-effective ASIC replacement solution for applications in the consumer, networking and

communications, computing, and avionics markets.

Security

As the nonvolatile, flash-based Fusion family requires no boot PROM, there is no vulnerable

external bitstream. Fusion devices incorporate FlashLock, which provides a unique combination of

reprogrammability and design security without external overhead, advantages that only an FPGA

with nonvolatile flash programming can offer.

Fusion devices utilize a 128-bit flash-based key lock and a separate AES key to secure programmed

IP and configuration data. The FlashROM data in Fusion devices can also be encrypted prior to

loading. Additionally, the Flash memory blocks can be programmed during runtime using the

industry-leading AES-128 block cipher encryption standard (FIPS Publication 192). The AES standard

was adopted by the National Institute of Standards and Technology (NIST) in 2000 and replaces the

DES standard, which was adopted in 1977. Fusion devices have a built-in AES decryption engine

and a flash-based AES key that make Fusion devices the most comprehensive programmable logic

device security solution available today. Fusion devices with AES-based security allow for secure

remote field updates over public networks, such as the Internet, and ensure that valuable IP

remains out of the hands of system overbuilders, system cloners, and IP thieves. As an additional

security measure, the FPGA configuration data of a programmed Fusion device cannot be read

back, although secure design verification is possible. During design, the user controls and defines

both internal and external access to the flash memory blocks.

Security, built into the FPGA fabric, is an inherent component of the Fusion family. The Flash cells

are located beneath seven metal layers, and many device design and layout techniques have been

used to make invasive attacks extremely difficult. Fusion with FlashLock and AES security is unique

in being highly resistant to both invasive and noninvasive attacks. Your valuable IP is protected,

Actel Fusion Mixed-Signal FPGAs

Preliminary v1.7 1-3

making secure remote ISP possible. A Fusion device provides the most impenetrable security for

programmable logic designs.

Single Chip

Flash-based FPGAs store their configuration information in on-chip flash cells. Once programmed,

the configuration data is an inherent part of the FPGA structure, and no external configuration

data needs to be loaded at system power-up (unlike SRAM-based FPGAs). Therefore, flash-based

Fusion FPGAs do not require system configuration components such as EEPROMs or

microcontrollers to load device configuration data. This reduces bill-of-materials costs and PCB

area, and increases security and system reliability.

Live at Power-Up

Flash-based Fusion devices are Level 0 live at power-up (LAPU). LAPU Fusion devices greatly simplify

total system design and reduce total system cost by eliminating the need for CPLDs. The Fusion

LAPU clocking (PLLs) replaces off-chip clocking resources. The Fusion mix of LAPU clocking and

analog resources makes these devices an excellent choice for both system supervisor and system

management functions. LAPU from a single 3.3 V source enables Fusion devices to initiate, control,

and monitor multiple voltage supplies while also providing system clocks. In addition, glitches and

brownouts in system power will not corrupt the Fusion device flash configuration. Unlike SRAM-

based FPGAs, the device will not have to be reloaded when system power is restored. This enables

reduction or complete removal of expensive voltage monitor and brownout detection devices from

the PCB design. Flash-based Fusion devices simplify total system design and reduce cost and design

risk, while increasing system reliability.

Firm Errors

Firm errors occur most commonly when high-energy neutrons, generated in the upper atmosphere,

strike a configuration cell of an SRAM FPGA. The energy of the collision can change the state of the

configuration cell and thus change the logic, routing, or I/O behavior in an unpredictable way.

Another source of radiation-induced firm errors is alpha particles. For an alpha to cause a soft or

firm error, its source must be in very close proximity to the affected circuit. The alpha source must

be in the package molding compound or in the die itself. While low-alpha molding compounds are

being used increasingly, this helps reduce but does not entirely eliminate alpha-induced firm errors.

Firm errors are impossible to prevent in SRAM FPGAs. The consequence of this type of error can be

a complete system failure. Firm errors do not occur in Fusion Flash-based FPGAs. Once it is

programmed, the flash cell configuration element of Fusion FPGAs cannot be altered by high-

energy neutrons and is therefore immune to errors from them.

Recoverable (or soft) errors occur in the user data SRAMs of all FPGA devices. These can easily be

mitigated by using error detection and correction (EDAC) circuitry built into the FPGA fabric.

Low Power

Flash-based Fusion devices exhibit power characteristics similar to those of an ASIC, making them

an ideal choice for power-sensitive applications. With Fusion devices, there is no power-on current

surge and no high current transition, both of which occur on many FPGAs.

Fusion devices also have low dynamic power consumption and support both low power standby

mode and very low power sleep mode, offering further power savings.

Advanced Flash Technology

The Fusion family offers many benefits, including nonvolatility and reprogrammability through an

advanced flash-based, 130-nm LVCMOS process with seven layers of metal. Standard CMOS design

techniques are used to implement logic and control functions. The combination of fine granularity,

enhanced flexible routing resources, and abundant flash switches allows very high logic utilization

(much higher than competing SRAM technologies) without compromising device routability or

performance. Logic functions within the device are interconnected through a four-level routing

hierarchy.

Fusion Device Family Overview

1-4 Preliminary v1.7

Advanced Architecture

The proprietary Fusion architecture provides granularity comparable to standard-cell ASICs. The

Fusion device consists of several distinct and programmable architectural features, including the

following (Figure 1-1 on page 1-5):

• Embedded memories

– Flash memory blocks

–FlashROM

– SRAM and FIFO

• Clocking resources

– PLL and CCC

– RC oscillator

– Crystal oscillator

– No-Glitch MUX (NGMUX)

• Digital I/Os with advanced I/O standards

• FPGA VersaTiles

• Analog components

– ADC

– Analog I/Os supporting voltage, current, and temperature monitoring

– 1.5 V on-board voltage regulator

– Real-time counter

The FPGA core consists of a sea of VersaTiles. Each VersaTile can be configured as a three-input

logic lookup table (LUT) equivalent or a D-flip-flop or latch (with or without enable) by

programming the appropriate flash switch interconnections. This versatility allows efficient use of

the FPGA fabric. The VersaTile capability is unique to the Actel families of flash-based FPGAs.

VersaTiles and larger functions are connected with any of the four levels of routing hierarchy. Flash

switches are distributed throughout the device to provide nonvolatile, reconfigurable interconnect

programming. Maximum core utilization is possible for virtually any design.

In addition, extensive on-chip programming circuitry allows for rapid (3.3 V) single-voltage

programming of Fusion devices via an IEEE 1532 JTAG interface.

Unprecedented Integration

Integrated Analog Blocks and Analog I/Os

Fusion devices offer robust and flexible analog mixed-signal capability in addition to the high-

performance flash FPGA fabric and flash memory block. The many built-in analog peripherals

include a configurable 32:1 input analog MUX, up to 10 independent MOSFET gate driver outputs,

and a configurable ADC. The ADC supports 8-, 10-, and 12-bit modes of operation with a

cumulative sample rate up to 600 k samples per second (ksps), differential nonlinearity (DNL) < 1.0

LSB, and Total Unadjusted Error (TUE) of 0.72 LSB in 10-bit mode. The TUE is used for

characterization of the conversion error and includes errors from all sources, such as offset and

linearity. Internal bandgap circuitry offers 1% voltage reference accuracy with the flexibility of

utilizing an external reference voltage. The ADC channel sampling sequence and sampling rate are

programmable and implemented in the FPGA logic using Designer and Libero IDE software tool

support.

Two channels of the 32-channel ADCMUX are dedicated. Channel 0 is connected internally to VCC

and can be used to monitor core power supply. Channel 31 is connected to an internal temperature

diode which can be used to monitor device temperature. The 30 remaining channels can be

connected to external analog signals. The exact number of I/Os available for external connection

signals is device-dependent (refer to the "Fusion Family" table on page I for details).

Actel Fusion Mixed-Signal FPGAs

Preliminary v1.7 1-5

With Fusion, Actel also introduces the Analog Quad I/O structure (Figure 1-1 on page 1-5). Each

quad consists of three analog inputs and one gate driver. Each quad can be configured in various

built-in circuit combinations, such as three prescaler circuits, three digital input circuits, a current

monitor circuit, or a temperature monitor circuit. Each prescaler has multiple scaling factors

programmed by FPGA signals to support a large range of analog inputs with positive or negative

polarity. When the current monitor circuit is selected, two adjacent analog inputs measure the

voltage drop across a small external sense resistor. Built-in operational amplifiers amplify small

voltage signals (2 mV sensitivity) for accurate current measurement. One analog input in each quad

can be connected to an external temperature monitor diode and achieves detection accuracy of

±3ºC. In addition to the external temperature monitor diode(s), a Fusion device can monitor an

internal temperature diode using dedicated channel 31 of the ADCMUX.

Figure 1-1 on page 1-5 illustrates a typical use of the Analog Quad I/O structure. The Analog Quad

shown is configured to monitor and control an external power supply. The AV pad measures the

source of the power supply. The AC pad measures the voltage drop across an external sense resistor

to calculate current. The AG MOSFET gate driver pad turns the external MOSFET on and off. The AT

pad measures the load-side voltage level.

Embedded Memories

Flash Memory Blocks

The flash memory available in each Fusion device is composed of one to four flash blocks, each 2

Mbits in density. Each block operates independently with a dedicated flash controller and

interface. Fusion flash memory blocks combine fast access times (60 ns random access and 10 ns

access in Read-Ahead mode) with a configurable 8-, 16-, or 32-bit datapath, enabling high-speed

Figure 1-1 • Analog Quad

Analog Quad

AV AC AT

Voltage

Monitor Block

Current

Monitor Block

Power Line Side Load Side

Pre-

scaler

Digital

Input

Power

MOSFET

Gate Driver

Current

Monitor/Instr

Amplifier

Temperature

Monitor

Digital

Input

Digital

Input

Pre-

scaler

Pre-

scaler

Pads

To Analog MUX To Analog MUX To Analog MUX

To FPGA

(DAVOUTx)

To FPGA

(DACOUTx)

To FPGA

(DATOUTx)

On-Chip

Gate

Driver

Temperature

Monitor Block

Off-Chip Rpullup

From FPGA

(GDONx)

Fusion Device Family Overview

1-6 Preliminary v1.7

flash operation without wait states. The memory block is organized in pages and sectors. Each

page has 128 bytes, with 33 pages comprising one sector and 64 sectors per block. The flash block

can support multiple partitions. The only constraint on size is that partition boundaries must

coincide with page boundaries. The flexibility and granularity enable many use models and allow

added granularity in programming updates.

Fusion devices support two methods of external access to the flash memory blocks. The first

method is a serial interface that features a built-in JTAG-compliant port, which allows in-system

programmability during user or monitor/test modes. This serial interface supports programming of

an AES-encrypted stream. Secure data can be passed through the JTAG interface, decrypted, and

then programmed in the flash block. The second method is a soft parallel interface.

FPGA logic or an on-chip soft microprocessor can access flash memory through the parallel

interface. Since the flash parallel interface is implemented in the FPGA fabric, it can potentially be

customized to meet special user requirements. For more information, refer to the CoreCFI

Handbook. The flash memory parallel interface provides configurable byte-wide (×8), word-wide

(×16), or dual-word-wide (×32) data port options. Through the programmable flash parallel

interface, the on-chip and off-chip memories can be cascaded for wider or deeper configurations.

The flash memory has built-in security. The user can configure either the entire flash block or the

small blocks to prevent unintentional or intrusive attempts to change or destroy the storage

contents. Each on-chip flash memory block has a dedicated controller, enabling each block to

operate independently.

The flash block logic consists of the following sub-blocks:

• Flash block – Contains all stored data. The flash block contains 64 sectors and each sector

contains 33 pages of data.

• Page Buffer – Contains the contents of the current page being modified. A page contains 8

blocks of data.

• Block Buffer – Contains the contents of the last block accessed. A block contains 128 data

bits.

• ECC Logic – The flash memory stores error correction information with each block to

perform single-bit error correction and double-bit error detection on all data blocks.

User Nonvolatile FlashROM

In addition to the flash blocks, Actel Fusion devices have 1 kbit of user-accessible, nonvolatile

FlashROM on-chip. The FlashROM is organized as 8×128-bit pages. The FlashROM can be used in

diverse system applications:

• Internet protocol addressing (wireless or fixed)

• System calibration settings

• Device serialization and/or inventory control

• Subscription-based business models (for example, set-top boxes)

• Secure key storage for secure communications algorithms

• Asset management/tracking

• Date stamping

• Version management

The FlashROM is written using the standard IEEE 1532 JTAG programming interface. Pages can be

individually programmed (erased and written). On-chip AES decryption can be used selectively over

public networks to securely load data such as security keys stored in the FlashROM for a user

design.

The FlashROM can be programmed (erased and written) via the JTAG programming interface, and

its contents can be read back either through the JTAG programming interface or via direct FPGA

core addressing.

The FlashPoint tool in the Actel Fusion development software solutions, Libero IDE and Designer,

has extensive support for flash memory blocks and FlashROM. One such feature is auto-generation

of sequential programming files for applications requiring a unique serial number in each part.

Another feature allows the inclusion of static data for system version control. Data for the

FlashROM can be generated quickly and easily using the Actel Libero IDE and Designer software

Actel Fusion Mixed-Signal FPGAs

Preliminary v1.7 1-7

tools. Comprehensive programming file support is also included to allow for easy programming of

large numbers of parts with differing FlashROM contents.

SRAM and FIFO

Fusion devices have embedded SRAM blocks along the north and south sides of the device. Each

variable-aspect-ratio SRAM block is 4,608 bits in size. Available memory configurations are 256×18,

512×9, 1k×4, 2k×2, and 4k×1 bits. The individual blocks have independent read and write ports that

can be configured with different bit widths on each port. For example, data can be written

through a 4-bit port and read as a single bitstream. The SRAM blocks can be initialized from the

flash memory blocks or via the device JTAG port (ROM emulation mode), using the UJTAG macro.

In addition, every SRAM block has an embedded FIFO control unit. The control unit allows the

SRAM block to be configured as a synchronous FIFO without using additional core VersaTiles. The

FIFO width and depth are programmable. The FIFO also features programmable Almost Empty

(AEMPTY) and Almost Full (AFULL) flags in addition to the normal EMPTY and FULL flags. The

embedded FIFO control unit contains the counters necessary for the generation of the read and

write address pointers. The SRAM/FIFO blocks can be cascaded to create larger configurations.

Clock Resources

PLLs and Clock Conditioning Circuits (CCCs)

Fusion devices provide designers with very flexible clock conditioning capabilities. Each member of

the Fusion family contains six CCCs. In the two larger family members, two of these CCCs also

include a PLL; the smaller devices support one PLL.

The inputs of the CCC blocks are accessible from the FPGA core or from one of several inputs with

dedicated CCC block connections.

The CCC block has the following key features:

• Wide input frequency range (fIN_CCC) = 1.5 MHz to 350 MHz

• Output frequency range (fOUT_CCC) = 0.75 MHz to 350 MHz

• Clock phase adjustment via programmable and fixed delays from –6.275 ns to +8.75 ns

• Clock skew minimization (PLL)

• Clock frequency synthesis (PLL)

• On-chip analog clocking resources usable as inputs:

– 100 MHz on-chip RC oscillator

– Crystal oscillator

Additional CCC specifications:

• Internal phase shift = 0°, 90°, 180°, and 270°

• Output duty cycle = 50% ± 1.5%

• Low output jitter. Samples of peak-to-peak period jitter when a single global network is

used:

– 70 ps at 350 MHz

– 90 ps at 100 MHz

– 180 ps at 24 MHz

– Worst case < 2.5% × clock period

• Maximum acquisition time = 150 µs

• Low power consumption of 5 mW

Global Clocking

Fusion devices have extensive support for multiple clocking domains. In addition to the CCC and

PLL support described above, there are on-chip oscillators as well as a comprehensive global clock

distribution network.

The integrated RC oscillator generates a 100 MHz clock. It is used internally to provide a known

clock source to the flash memory read and write control. It can also be used as a source for the PLLs.

Fusion Device Family Overview

1-8 Preliminary v1.7

The crystal oscillator supports the following operating modes:

• Crystal (32.768 kHz to 20 MHz)

• Ceramic (500 kHz to 8 MHz)

• RC (32.768 kHz to 4 MHz)

Each VersaTile input and output port has access to nine VersaNets: six main and three quadrant

global networks. The VersaNets can be driven by the CCC or directly accessed from the core via

MUXes. The VersaNets can be used to distribute low-skew clock signals or for rapid distribution of

high-fanout nets.

Digital I/Os with Advanced I/O Standards

The Fusion family of FPGAs features a flexible digital I/O structure, supporting a range of voltages

(1.5 V, 1.8 V, 2.5 V, and 3.3 V). Fusion FPGAs support many different digital I/O standards, both

single-ended and differential.

The I/Os are organized into banks, with four or five banks per device. The configuration of these

banks determines the I/O standards supported. The banks along the east and west sides of the

device support the full range of I/O standards (single-ended and differential). The south bank

supports the Analog Quads (analog I/O). In the family's two smaller devices, the north bank

supports multiple single-ended digital I/O standards. In the family’s larger devices, the north bank is

divided into two banks of digital Pro I/Os, supporting a wide variety of single-ended, differential,

and voltage-referenced I/O standards.

Each I/O module contains several input, output, and enable registers. These registers allow the

implementation of the following applications:

• Single-Data-Rate (SDR) applications

• Double-Data-Rate (DDR) applications—DDR LVDS I/O for chip-to-chip communications

• Fusion banks support LVPECL, LVDS, BLVDS, and M-LVDS with 20 multi-drop points.

VersaTiles

The Fusion core consists of VersaTiles, which are also used in the successful Actel ProASIC3 family.

The Fusion VersaTile supports the following:

• All 3-input logic functions—LUT-3 equivalent

• Latch with clear or set

• D-flip-flop with clear or set and optional enable

Refer to Figure 1-2 for the VersaTile configuration arrangement.

Figure 1-2 • VersaTile Configurations

LUT-3

Data Y

CLK

Enable

CLR

D-FFE

Data Y

CLK

CLR

D-FF

LUT-3 Equivalent D-Flip-Flop with Clear or Set Enable D-Flip-Flop with Clear or Set

Actel Fusion Mixed-Signal FPGAs

Preliminary v1.7 1-9