© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com C1030_C0G_CBR • 8/13/2013 10
Surface Mount Multilayer Ceramic Capacitors (SMD MLCCs) for High Power Applications
CBR Series, C0G Dielectric, Ultra High Q, Low ESR, 6.3 – 500 VDC (RF & Microwave)
Table 4 – Performance & Reliability: Test Methods & Conditions
Stress Test or Inspection Method Requirements
Terminal Strength
0201 case size: 2N
0402 & 0603 case sizes: 5N
0805 case size: 10N
Test time: 10 ±1 second
No visible damage or separation of termination system.
Vibration
Resistance
Vibration frequency: 10 ~ 55 Hz/minimum
Total amplitude: 1.5 mm
Test time: 6 hours (Two hours each in three mutually
perpendicular directions.)
No visible damage.
Cap change and Q/DF: To meet initial specication
Solderability
Solder temperature: 235 ± 5°C
Dipping time: 2 ±0.5 seconds
95% minimum coverage of termination nish.
Board Flex
Capacitor is mounted to a substrate which is exed by means
of ram at a rate of 1 mm per second until the deection
becomes 1 mm. (Deection is maintained for 5 ±1 second)
Store at room temperature for 24 ±2 hours before measuring
No visible damage.
Capacitance change: within ±5.0% or ±0.5 pF, whichever is
larger.
(Capacitance change is monitored during exure.)
Resistance to
Soldering Heat
Solder temperature: 260 ±5°C
Dipping time: 10 ±1 second
Preheating: 120 to 150°C for 1 minute before immerse the
capacitor in a eutectic solder.
Store at room temperature for 24 ±2 hours before measuring
No visible damage.
Capacitance change: within ±2.5% or ±0.25 pF, whichever is
larger.
Q/DF, IR and dielectric strength: To meet initial requirements.
25% maximum leaching on each edge.
Temperature
Cycling
5 cycles of steps 1 - 4:
No visible damage.
Capacitance change: within ±2.5% or ±0.25 pF, whichever is
larger.
Q/DF, IR and dielectric strength: To meet initial requirements.
Store at room temperature for 24 ± 2 hours before measuring
electrical properties.
Humidity (Damp Heat)
Steady State
Test temperature: 40 ±2°C
Humidity: 90 ~ 95% RH
Test time: 500 +24/-0 hours
Store at room temperature for 24 ±2 hours before measuring
electrical properties.
Capacitance change: within ±5.0% or ±0.5 pF, whichever is larger.
Q/DF value: Capacitance ≥ 30 pF, Q ≥ 350,
10 pF ≤ Capacitance < 30 pF, Q ≥ 275 +2.5°C
Capacitance < 10 pF; Q ≥ 200 +10ºC
Humidity (Damp Heat)
Load
Test temperature: 40 ±2°C
Humidity: 90 ~ 95% RH
Test time: 500 +24/-0 hours
Applied voltage: rated voltage
Store at room temperature for 24 ±2 hours before measuring
electrical properties.
No visible damage.
Capacitance change: within ±7.5% or ±0.75 pF, whichever is larger.
Q/DF value: Capacitance ≥ 30 pF, Q ≥ 200,
Capacitance < 30 pF, Q ≥ 100+10/3ºC
IR: ≥ 500MΩ
High Temperature Life
Test temperature: 125 ±3°C
Applied voltage:
200% of rated voltage (6.3 VDC - 250 VDC)
150% of rated voltage (500 VDC)
Test time: 1,000 +24/-0 hours
Store at room temperature for 24 ±2 hours before measuring
No visible damage.
Capacitance change: within ±3.0% or ±0.3 pF, whichever is larger.
Q/DF value: Capacitance ≥ 30 pF, Q ≥350,
10 pF ≤ Capacitance < 30 pF, Q ≥ 275 +2.5°C
Capacitance <10 pF, Q ≥ 200 +10°C
IR: ≥1 GΩ
Step Temp. (ºC) Time (min.)
Minimum operating temp. +0/-3
Maximum operating temp. +3/-0