DS05-30333-3E
FUJITSU SEMICONDUCTOR
DATA SHEET
MEMORY
5V-ONLY
FLASH MEMORY CARD
MB98A81063-15/MB98A81183-15/MB98A81273-15/
MB98A81373-15/MB98A81473-15/MB98A81573-15
1M/2M/4M/8M/16M/32M-BYTE 5V-ONLY
FLASH ERASABLE AND PROGRAMMABLE MEMORY CARD
DESCRIPTION
The Fujitsu 5V-Only Flash memory cards are electrically erasable and prog rammab le memory cards capable of
storing and retrieving large amounts of data. The memory circuits are housed in a credit-card sized 68-pin
package . Internal circuit is protected b y two metal panels, one at the top and the other at the bottom of the card,
that help to reduce chip damage from electrostatic discharge.
A unique f eature of the Fujitsu memory cards allows the user to organize the card into either an 8-bit or a 16-bit
bus configuration. All cards are portable and operate on low power at high speed.
In accordance with the Personal Computer Memory Card Internal Association (PCMCIA) and Japan Electrical
Industry Development Association (JEID A) industry standard specifications, Flash memory cards offer additional
EEPROM memory that is used to store attribute data. The attribute memory is a Flash memory card option.
(See page 3 for description of the three available options.)
PRODUCT LINE & FEATURES
Meet PCMCIA and JEIDA industry standards for 68-pin memory card
Type I : 85.6 mm × 54.0 mm × 3.3 mm
•+5 V±5% power supply program and erase
Command control for Automated Program / Automated Erase operation
Erase Suspend Read / Program Capability (Only Erase Suspend Read is possible for MB98A81063)
128 KB Sector Erase (at ×16 mode)
Any Combination of Sectors Erase and Full Chip Erase
Detection of completion of program/erase operation with Data Polling or Toggle bit.
Ready/Busy Output with R/B (Except for MB98A81063)
Reset Function with RESET pin (Except for MB98A81063)
Write protect function with WP switch
•Low V
CC Write Inhibit
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PACKAGE
CRD-68P-M17
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
DESCRIPTIONS
DESCRIPTION TABLE
DIFFERENCES
Part Number Common Memory Attribute Memory
Memory Device Organization
(W × bit) Access
Time Memory
Device Organization
(W × bit) Access
Time
MB98A81063 4M bit Flash Memory × 21M × 8/512K × 16
150 ns
max. 16K bit
EEPROM × 1 2K × 8 250 ns
max.
MB98A81183 8M bit Flash Memory × 22M × 8/1M × 16
MB98A81273 16M bit Flash Memory × 24M × 8/2M × 16
MB98A81373 16M bit Flash Memory × 48M × 8/4M × 16
MB98A81473 16M bit Flash Memory × 816M × 8/8M × 16
MB98A81573 16M bit Flash Memory × 16 32M × 8/16M × 16
MB98A81063 MB98A81183 MB98A81273 MB98A81373 MB98A81473 MB98A81573
Density 1MB 2MB 4MB 8MB 16MB 32MB
Memory Device 4M bit 8M bit 16M bit ←←
Quantity 2224816
Read 1 B unit ←←
Program 1 B unit ←←
Chip Erase 512 KB unit 1 MB unit 2 MB unit ←←
Sector Erase 64 KB unit ←←
Number of
Sectors 16 32 64 128 256 512
Erase Suspend
Read Yes Yes Yes Yes Yes Yes
Erase Suspend
Program No Yes Yes Yes Yes Yes
Address A0 to A19 A0 to A20 A0 to A21 A0 to A22 A0 to A23 A0 to A24
RESET No Yes Yes Yes Yes Yes
R/B No Yes Yes Yes Yes Yes
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
DESCRIPTIONS (Continued)
ADDRESS MAP (for × 16 mode, not contained A0)
chip15, 14
chip13, 12
chip11,10
chip9, 8
chip7, 6
chip5, 4
chip3, 2
chip1, 0
chip7, 6
chip5, 4
chip3, 2
chip1, 0
chip3, 2
chip1, 0
chip1, 0
chip1, 0
chip1, 0
MB98A81063MB98A81183 MB98A81273 MB98A81373 MB98A81473 MB98A81573
FFFFFFh
DFFFFFh
BFFFFFh
9FFFFFh
7FFFFFh
5FFFFFh
3FFFFFh
1FFFFFh
0FFFFFh
07FFFFh
000000h
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PIN ASSIGNMENTS
* : See “DESCRIPTIONS”.
Pin No. Symbol Pin No. Symbol Pin No. Symbol Pin No. Symbol
1 GND 18 N.C. 35 GND 52 N.C.
2D
319 A16 36 CD1 53 A22/N.C.*
3D
420 A15 37 D11 54 A23/N.C.*
4D
521 A12 38 D12 55 A24/N.C.*
5D
622 A739 D13 56 N.C.
6D
723 A640 D14 57 N.C.
7CE
124 A
541 D15 58 RESET/N.C.
8A
10 25 A442 CE259N.C.
9OE
26 A343 N.C. 60 N.C.
10 A11 27 A244 N.C. 61 REG
11 A928 A145 N.C. 62 BVD2
12 A829 A046 A17 63 BVD1
13 A13 30 D047 A18 64 D8
14 A14 31 D148 A19 65 D9
15 WE 32 D249 A20/N.C.* 66 D10
16 R/B/N.C.* 33 WP 50 A21/N.C.* 67 CD2
17 VCC 34 GND 51 VCC 68 GND
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PIN DESCRIPTIONS
PIN LOCATIONS
Symbol Pin Name Input/Output Function
A0 to A24 Address Input Input Address Inputs, A0 to A24.
D0 to D15 Data Input/Output Input/Output Data Inputs/Outputs.
This data bus siz e (8-bit or 16-bit) is selected with
CE1 and CE2.
CE1 Card Enable for Lower Byte Input Active Low.
-Lower byte (D0 to D7) is selected for read/write/
erase function of flash memory cards.
CE2 Card Enable for Upper Byte Input Active Low.
-Upper byte (D8 to D15) is selected for read/write /
erase function of flash memory cards.
REG Attribute Memory Select Input Active Low.
-Attribute memory is selected for read/write
function of identification data of flash memory
cards. (N.C. or “FF” data or attribute data.)
OE Output Enable Input Active Low.
-Output enab le for flash memory cards.
WE Write Enable Input Active Low.
-Write enable for flash memory cards.
CD1, CD2 Card Detect Output These pins detect if the card has been correctly
inserted. Both pins are tied to GND internally.
WP Write Protect Output Write controller for flash memory cards.
This pin outputs the Protect/Non Protect status of
“WP Switch”.
BVD1, BVD2 Battery Voltage Detect Output Both pins are tied to VCC internally.
RESET Hardware Reset Input The card ma y be reset by driving the RESET pin
to VIH.
R/B Ready/Busy Output System can be detect the completion of program
or erase operation.
VCC Power Supply Power Supply Voltage. (+5.0 V ±5%)
GND Ground System Ground.
N.C. Non Connection
34
68
1
35
Front Side
Back Side
Fig. 1 - BOTTOM VIEW (CONNECTOR SIDE)
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
BLOCK DIAGRAM
MB98A81063, MB98A81183, MB98A81273 and MB98A81373
*1: Not available for MB98A81063.
Fig. 2.1 - Block Diagram
GND
Internal circuit
Internal circuit
VCC
VCC
10 K
VCC
100 K
510 K
D0 to D15
VCC
WP Switch
CE1
CE2
REG
WE
WP
OE
RESET*1
Address
BVD1
BVD2
CD1
CD2
(EVEN BYTE)
4M Flash chip × 1 (81063)
8M Flash chip × 1 (81183)
16M Flash chip × 1 (81273)
16M Flash chip × 2 (81273
Address
I/O
WE
OE
CE
Attribute memory
16K EEPROM
Address
I/O
R/B
RESET
WE
OE
CE
R/B*1
RESET
WE
OE
CE
(ODD BYTE)
4M Flash chip × 1 (81063)
8M Flash chip × 1 (81183)
16M Flash chip × 1 (81273)
16M Flash chip × 2 (81373)
Address
I/O
R/B
Buffer
I/O Buffer
Decoder
WP Control
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
BLOCK DIAGRAM (Continued)
MB98A81473 and MB98A81573
Fig. 2.2 - Block Diagram
GND
Internal circuit
Internal circuit
Control circuit
VCC
VCC
10 K
VCC
100 K
510 K
VCC
WP Switch
CE1
CE2
REG
WE
WP
OE
RESET
R/B
BVD1
BVD2
CD1
CD2
Address
I/O
R/B
RESET
WE
OE
CE
Address
I/O
WE
OE
CE
Attribute memory
16K EEPROM
Address
I/O
R/B
RESET
WE
OE
CE
Address
(ODD BYTE)
16M Flash chip × 4 (81473)
16M Flash chip × 8 (81573)
(EVEN BYTE)
16M Flash chip × 4 (81473)
16M Flash chip × 8 (81573)
Buffer
I/O Buffer
Decoder
WP Control
D0 to D15
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
CHIP AND SECTOR DECODING
Chip can be selected with;
- A0, A22, A23 and A24 for × 8-bit mode No.1.
- A22, A23 and A24 for × 8-bit mode No.2 and × 16-bit mode.
Sector per each chip can be selected with A17, A18, A19, A20 and A21.
ERASE SECTOR DECODING TABLE
*1:A20 is not a vailable for MB98A81063. MB98A81063 has 8 sectors.
*2:A21 is not available for MB98A81063 and MB98A81183. MB98A81063 has 8
sectors and MB98A81183 has 16 sectors.
CARD CHIP / SECTOR CONFIGURATION
Card Chip Configuration for 32MB Card Sector Configuration for 2 Chips
*1:4M Flash Chip for MB98A81063. 8M Flash chip for
MB98A81183.
*2:Sector 7 for MB98A81063. Sector 15 for MB98A81183.
Sector Address (SA)
A21*2 A20*1 A19 A18 A17
Sector 31 1 1 1 1 1
Sector 30 1 1 1 1 0
Sector 29 1 1 1 0 1
Total 32 sectors*1*2
per 1 chip
Sector 2 00010
Sector 1 0 0 0 0 1
Sector 0 00000
D15 D8D7 D0
UPPER BYTE LOWER BYTE
EVEN ADDRESS BYTE
ODD ADDRESS BYTE Chip 1
(16M Flash Chip*1)Chip 0
(16M Flash Chip*1)
Chip 15 Chip 14 Sector 31*2(64K × 8 bits) Sector 31*2(64K × 8 bits)
Chip 13 Chip 12
Chip 11 Chip 10
Chip 5 Chip 4 Sector 2 (64K × 8 bits) Sector 2 (64K × 8 bits)
Chip 3 Chip 2 Sector 1 (64K × 8 bits) Sector 1 (64K × 8 bits)
Chip1 Chip 0 Sector 0 (64K × 8 bits) Sector 0 (64K × 8 bits)
× 8 bit mode No. 1
× 16 bit mode
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
FUNCTION DESCRIPTIONS
1. Read Mode
The data in the common and attribute memory can be read with “OE=VIL” and “WE=VIH”. The address is selected
with A0 to A24. And CE1 and CE2 select output mode (× 8/× 16 output mode, See “FUNCTION TRUTH TABLES”.).
The following 1) and 2) are the descriptions for Common Memory Read and Attribute Memory Read mode.
(1) Common Memory Read
- Two modes of Common Memory Read, reading the data in memory array and Intelligent ID are available.
The card enter each Read mode by writing “Read Memory/Reset Command” or “Intelligent ID Read Command”.
The card automatically resets to the condition of Common Memory Read mode upon initial power-up.
(2) Attribute Memory Read
- The data on the attribute memory can be read with “REG=VIL”, “OE=VIL” and “WE=VIH”.
- An address on attribute memory can be selected with A0 to A11 pin. And CE1 and CE2 select output mode.
2. Standby Mode
-CE1 and CE2 at “VIH” place the card in Standby mode. D0 to D15 are placed in a high-Z state independent of
the status “OE”, “WE” and “REG”.
3. Output Disable Mode
- The outputs are disabled with OE and WE at “VIH”. D0 to D15 are placed in high-Z state.
4. Write Mode
(1) Common Memory Write
- The card is in Write mode with “OE=VIH” and “WE and CE=VIL”.
- Commands can be written at the Write mode. See “5.Command Definitions”.
- Two types of the Write mode, “WE control” and “CE control” are available.
(2) Attribute Memory Write
-REG
at L-le v el selects Attribute memory and “OE=VIH”, “WE and CE=VIL” place it in write mode. Two types of
the write mode, “WE control” and “CE control” are available.
- Attribute memory is not controlled b y writing Commands. And attribute memory has the Data polling function,
which can detect whether the attribute memory status is in progr amming oper ation. When the read operation
is executed at programming cycle, the opposite data is output from D7 (I7), and the same data (O7) as the
written data is output from D7 pin at the completion of programming operation.
5. Command Definitions
- User can select the card operation by writing the specific address and data sequences into the command
register. If incollect address and data are written or improper sequence is done, the card is reseted to read
mode. See “COMMAND DEFINISION TABLE”.
6. Automated Program Capability
- Programming operation can swich the data from “1” to “0”.
- The data is programmed on a byte-by-byte or word-by-word basis.
- The card will automatically provide adequate internally generated programming pulses and verify the
programmed cell margine by writing four bus cycle operation. The card returns to Common Memory Read
mode automatically after the progra mming is completed.
- Addresses are latched at f alling edge of WE or CE and data is latched at rising edge of WE or CE. The f ourth
rising edge of WE or CE on the command write cycle begins programming operation.
- W e can chec k whether a byte (w ord) progr amming operation is completed successfully b y sequence flug with
R/B (Except for MB98A81063), Data Polling or Toggle Bit function. See “WRITE OPERATION STATUS”.
- Any commands written to the chip during programming operation will be ignored.
7. Automated Chip Erase Capability
- We can execute chip erase operation by 6 bus cycle operation. Chip erase does not require the user to pre-
program prior to erase. Upon executing the Erase command sequence the chip automatically will program
and verify the entire memory for an all zero data pattern prior to electrical erase. The system is not required
to provide any controls or timing during these operations.
- The card returns to Common Memory Read mode automatically after the chip erasing is completed.
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
FUNCTION DESCRIPTIONS (Continued)
- Whether or not chip erase operation is completed successfully can be checked by sequence flug with R/B
(Except for MB98A81063), Data Polling or Toggle Bit function. See “WRITE OPERATION STATUS”.
- Any commands written to the chip during programming operation will be ignored.
8. Automated Sector Erase Capability
- We can execute the erase operation on any sectors by 6 bus cycle operation.
- A time-out of 50 µs (typ.) from the rising edge of the last Sector Erase command will initiate the Sector Erase
command(s) for other sector than the sector that sector erase command have been valid.
- Multiple sectors in a chip can be erased concurrently. This sequence is followed with writes of 30H to addresses
in other sectors desired to be concurrently erased. The time between writes 30H must be less than 50 µs,
otherwise that command will not be accepted. Any command other than Sector Erase or Erase Suspend during
this time-out period will reset the chip to Read mode. The automated sector erase begins after the 50 µs (typ .)
time out from the rising edge of WE pulse for the last Sector Er ase command pulse. Whether the sector erase
window is still open can be monitored with D3 and D11.
- Sector Erase does not require the user to pre-prog ram prior to erase . The chip automatically progr ams “0” to
all memory locations in the sector(s) prior to electrical erase. The system is not required to provide any controls
or timing during these operations.
- The card returns to Common Memory Read mode automatically after the sector erasing is completed.
- Whether or not sector erase oper ation is completed successfully can be checked by sequence flug with R/B,
Data Polling or Toggle Bit function. The sequence flug must be read from the address of the sector in v olv ed in
erase operation. See “WRITE OPERATION STATUS”.
9. Erase Suspend
- Erase Suspend command allows the user to interrupt the sector erase operation and then do data reads or
program from or to a non-busy sector in the chip which has the sector(s) suspended erase (only data read is
possible for MB98A81063). This command is applicab le only during the sector erase operation (including the
sector erase time-out period after the sector erase commands 30H) and will be ignored if written during the
chip erase or programming operation. Writing this command during the time-out will result in immediate
termination of the time-out period. The addresses are “don’t cares” in wrinting the Erase Suspend or Resume
commands in the chip.
- When the Erase Suspend command is written during a Sector Erase operation, the chip will enter the Erase
Suspend Read mode. User can read the data from other sectors than those in suspention. The read oper ation
from sectors in suspention results D2/D10 toggling for MB98A81183 and MB98A8xx7x. User can program to
non-busy sectors by writing program commands for MB98A81183 and MB98A8xx7x.
- A read from a sector being erase suspended may result in invalid data.
10. Intelligent Identifier (ID) Read Mode
- Each common memory can execute an Intelligent Identifier operation, initiated by writing Intelligent ID command
(90H). Following the command write, a read cycle from address 00H retrieves the manufacture code, and a
read cycle from address 01H returns the device code as follows. To terminate the operation, it is necessary
to write Read/Reset command.
11. Hardware Reset (not applied for MB98A81063)
- The Card may be reset by driving the RESET pin to VIH. The RESET pin must be kept High (VIH) for at least
500 ns. Any operation in progress will be terminated and the card will be reset to the read mode 20 µs after
the RESET pin is driven High. If a hardware reset occurs during a program operation, the data at that particular
location will be indeterminate.
- When the RESET pin is high and the internal reset is complete, the Card goes to standby mode and cannot
be accessed. Also, note that all the data output pins are High-Z for the duration of the RESET pulse. Once
the RESET pin is taken low, the Card requires 500 ns of wake up time until outputs are valid for read access.
- If hardware reset occurs during a erase operation, there is a possibility that the erasing sector(s) cannot be
used after this.
Part Number Maker Code Device Code
MB98A81063 04 h / 0404 h A4 h / A4A4 h
MB98A81183 04 h / 0404 h D5 h / D5D5 h
MB98A81273/81373/1473/81573 04 h / 0404 h 3D h / 3D3D h
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
FUNCTION DESCRIPTIONS (Continued)
12. Data Protection
- The card has WP (Write Protect) switch for write lockout.
- To av oid initiation of a write cycle during VCC pow er-up and power-do wn, a write cycle is locked out f or VCC less
than 3.2 V (typically 3.7 V). If VCC < VLKO, the command register is disabled and all internal program/erase
circuits are disabled. Under this condition the device will reset to the read mode. Subsequent writes will be
ignored until the VCC level is greater than VLKO. It is the users responsibility to ensure that the control pins are
logically correct to prevent unintentional writes when VCC is above 3.2 V.
-If V
CC would be less than VLKO during program/erase operation, the operation will stop. And after that, the
operation will not resume e v en if VCC returns recommended v oltage lev el. Theref ore, program command m ust
be written again because the data on the address interrupted program operation is invalid. And regarding
interrupting erase operation, there is possibility that the erasing sector(s) cannot be used.
- Noise pulses of less than 5 ns (typical) on OE, CE or WE will not initiate a write cycle.
FUNCTION TRUTH TABLE
MAIN MEMORY FUNCTION*1
Notes:
*1:H =VIH, L = VIL, X = Either VIL or VIH, WP SW = Write Protect Switch, P = Protect, NP = Non Protect
*2:L-level is output when WPSW = NP. H-level is output when WPSW = P.
*3:Not available for MB98A81063.
Mode RESET*3 REG CE2CE1A
0OE WE WP
*2 Data Input/Output WP SW
D8 to D15 D0 to D7
Hardware Reset H XXXXXXX High-Z
P or NP
Standby
L
XHHXXXX High-Z
Read (×8 No.1)
H
HLL
LHX
High-Z
DOUT
(Even Byte)
Read (×8 No.1) H DOUT
(Odd Byte)
Read (×8 No.2) LHXDOUT
(Odd Byte) High-Z
Read (×16) L DOUT
Write (×8 No.1)
HL
L
HL
L
High-Z
DIN
(Even Byte) NP
Output Disable H High-Z P
Write (×8 No.1) HLDIN
(Odd Byte) NP
Output Disable H
High-Z
P
Write (×8 No.2)
L
H
X
LDIN
(Odd Byte) NP
Output Disable H High-Z P
Write (×16) LLD
IN NP
Output Disable H High-Z P
Output Disable XXXXHHX High-Z P or NP
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
FUNCTION TRUTH TABLE (Continued)
ATTRIBUTE MEMORY FUNCTION*1
Notes:
*1:H = VIH, L = VIL, X = Either VIL or VIH, WP SW = Write Protect Switch, P = Protect, NP = Non Protect
*2:L-level is output when WPSW = NP. H-level is output when WPSW = P.
*3:Not available for MB98A81063.
Mode RESET*3 REG CE2CE1A
0OE WE WP
*2 Data Input/Output WP SW
D8 to D15 D0 to D7
Standby
L
XHHXXXX High-Z
P or NP
Read (×8 No.1)
L
HLL
LHX
High-Z DOUT
Read (×8 No.1) H H
Read (×8 No.2) LHXH
High-Z
Read (×16) L DOUT
Write (×8 No.1)
HL
L
HL
L
High-Z
DIN NP
Output Disable H High-Z P
Write (×8 No.1) HLINVALID
DIN NP
Output Disable H
High-Z
P
Write (×8 No.2)
L
H
X
LINVALID
DIN NP
Output Disable H High-Z P
Write (×16) LLINVALID
DIN DIN NP
Output Disable H High-Z P
Output Disable XXXXHHX High-Z P or NP
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
COMMAND DEFINITION TABLE
Command table for 8-bit Mode
Notes:
CA: Chip Address. (address in chip selected by A0, A22, A23 and A24)
SA: Sector Address (address in 64 KB selected by A0, A17, A18, A19, A20, A21, A22, A23 and A24)
PA: Program Address (address to be programmed)
RA: Read Address (address to be read)
IA: Intelligent ID read address (Manufacture Code 0000H, Device Code 0002H)
PD: Progr amming data
RD: R ead data
ID: Intelligent Identifier (ID) Code
CCMA1, CCMA2: Command adddress for chip erase
SCMA1, SCMA2: Command address for sector erase
PCMA1, PCMA2: Command address for program
RCMA1, RCMA2: Command address for Read/Reset
ICMA1, ICMA2: Command address for intelligent ID read
Command Bus
Cycle 1st Bus
Write Cycle 2nd Bus
Write/Read
Cycle 3rd Bus Write
Cycle 4th Bus
Write/Read
Cycle 5th Bus Write
Cycle 6th Bus Write
Cycle
Read/Reset 1 2 Write Read
CA F0H RA RD
Read/Reset 2 4 Write Write Write Read
RCMA1 AAH RCMA2 55H RCMA1 F0H RA RD
Read
Intelligent
ID Codes 4Write Write Write Read
ICMA1 AAH ICMA2 55H ICMA1 90H IA ID
Byte Program 4 Write Write Write Write
PCMA1 AAH PCMA2 55H PCMA1 A0H PA PD
Sector Erase 6 Write Write Write Write Write Write
SCMA1 AAH SCMA2 55H SCMA1 80H SCMA1 AAH SCMA2 55H SA 30H
Chip Erase 6 Write Write Write Write Write Write
CCMA1 AAH CCMA2 55H CCMA1 80H CCMA1 AAH CCMA2 55H CCMA1 10H
Sector Erase
Suspend 1Write
CA B0H
Sector Erase
Resume 1Write
CA 30H
See “Command Address Table for
8-bit Mode” in page 16.
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
Command Table for 16-bit Mode*1
Notes:
CA: Chip Address. (address in chip selected by A22, A23 and A24)
SA: Sector Address (address in 128 KB selected by A17, A18, A19, A20, A21, A22, A23 and A24)
PA: Program Address (address to be programmed)
RA: Read Address (address to be read)
IA: Intelligent ID read address (Manufacture Code 0000H, Device Code 0001H)
PD: Progr amming data
RD: Read data
ID: Intelligent Identifier (ID) Code
CCMA1, CCMA2: Command address for chip erase
SCMA1, SCMA2: Command address f or sector erase
PCMA1, PCMA2: Command address for program
RCMA1, RCMA2: Command address for Read/Reset
ICMA1, ICMA2: Command address for intelligent ID read
*1: Address number is not contained “A0”.
Command Bus
Cycle 1st Bus
Write Cycle 2nd Bus
Write/Read
Cycle 3rd Bus
Write Cycle 4th Bus
Write/Read
Cycle 5th Bus
Write Cycle 6th Bus
Write Cycle
Read/Reset 1 2 Write Read
F0F0H RA RD
Read/Reset 2 4 Write Write Write Read
RCMA1 AAAAH RCMA2 5555H RCMA1 F0F0H RA RD
Read
Intelligent
ID Codes 4Write Write Write Read
ICMA1 AAAAH ICMA2 5555H ICMA1 9090H IA ID
Byte Program 4 WriteWriteWriteWrite
PCMA1 AAAAH PCMA2 5555H PCMA1 A0A0H PA PD
Sector Erase 6 WriteWriteWriteWriteWriteWrite
SCMA1 AAAAH SCMA2 5555H SCMA1 8080H SCMA1 AAAAH SCMA2 5555H SA 3030H
Chip Erase 6 WriteWriteWriteWriteWriteWrite
CCMA1 AAAAH CCMA2 5555H CCMA1 8080H CCMA1 AAAAH CCMA2 5555H CCMA1 1010H
Sector Erase
Suspend 1Write
CA B0B0H
Sector Erase
Resume 1Write
CA 3030H
See “Command Address Table for
16-bit Mode” in page 16.
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16
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
COMMAND DEFINITION TABLE (Continued)
Command Address Table for 8-bit Mode
Command Address Table for 16-bit Mode
Command
Address MB98A81063 MB98A81183 MB98A81273, 81373, 81473,
81573
CCMA1 (CA AND 000001h) OR AAAAh (CA AND 000001h) OR AAAh CA
CCMA2 (CA AND 000001h) OR 5554h (CA AND 000001h) OR 554h CA
SCMA1 (SA AND 000001h) OR AAAAh (SA AND 000001h) OR AAAh CA
SCMA2 (SA AND 000001h) OR 5554h (SA AND 000001h) OR 554h CA
PCMA1 (PA AND 000001h) OR AAAAh (PA AND 000001h) OR AAAh CA
PCMA2 (PA AND 000001h) OR 5554h (PA AND 000001h) OR 554h CA
RCMA1 (RA AND 000001h) OR AAAAh (RA AND 000001h) OR AAAh CA
RCMA2 (RA AND 000001h) OR 5554h (RA AND 000001h) OR 554h CA
ICMA1 (IA AND 000001h) OR AAAAh (IA AND 000001h) OR AAAh CA
ICMA1 (IA AND 000001h) OR 5554h (IA AND 000001h) OR 554h CA
Command
Address MB98A81063 MB98A81183 MB98A81273, 81373, 81473,
81573
CCMA1 5555h 555h CA
CCMA2 2AAAh 2AAh CA
SCMA1 5555h 555h CA
SCMA2 2AAAh 2AAh CA
PCMA1 5555h 555h CA
PCMA2 2AAAh 2AAh CA
RCMA1 5555h 555h CA
RCMA2 2AAAh 2AAh CA
ICMA1 5555h 555h CA
ICMA1 2AAAh 2AAh CA
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17
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
WRITE OPERATION STATUS
Har dware Sequence Flag Table
Notes:
(1): Erase Suspended Sector (2): Non-Erase Suspended Sector
*1. Performing successive read operations from the erase-suspended sector will cause D2, D10 to toggle.
*2. Performing successive read operations from any address will cause D6, D14 to toggle.
*3. Reading the byte address being programmed while in the erase-suspend program mode will indicate logic
“1” at the D2, D10 bit. However, successive reads from the erase-suspended sector will cause D2, D10 to
toggle.
*4. Not applied for MB98A81063.
D7, D15 (Data Polling)
The card features Data Polling as a method to indicate to the host that the Program/Erase Operation are in
progress or completed. During the program oper ation an attempt to read the program address will produce the
compliment of the data last written to D7/D15. Upon completion of the program operation, an attempt to read the
program address will produce the true data last written to D7/D15. During the erase operation, an attempt to
read the erase address will produce a “0” at the D7/D15 output. Upon completion of the erase operation an
attempt to read the device will produce a “1” at the D7/D15 output.
For Chip Erase, the Data Polling is valid after the rising edge of the sixth WE pulse in the six write pulse sequence.
F or sector er ase , the Data Polling is valid after the last rising edge of the sector erase WE pulse . Even if the
de vice has completed the oper ation and D7/D15 has a valid data, the data outputs on D0 to D6/D8 to D14 ma y be
still invalid. The valid data on D0 to D7/D8 to D15 will be read on the successive read attempts.
The Data Polling feature is only active during the programming operation, erase operation, sector erase time-
out, Erase Suspend Read mode and Erase Suspend Program mode.
D6, D14 (Toggle Bit l)
The card also features the “Toggle Bit” as a method to indicate to the host system that the Program/Erase
Operation are in progress or completed.
During an Program or Erase cycle, successive attempts to read (OE or CE toggling) data from the card will
result in D6/D14 toggling between one and zero . Once the Program or Erase cycle is completed, D6/D14 will stop
toggling and valid data will be read on the next successive attempts. During programming, the Toggle Bit is
v alid after the rising edge of the fourth WE pulse in the f our write pulse sequence. For chip erase, the Toggle
Bit is valid after the rising edge of the sixth WE pulse in the six write pulse sequence. For sector erase, the
Toggle Bit is valid after the last rising edge of the sector erase WE pulse. The Toggle Bit is also active during
the sector time out.
Either CE or OE toggling will cause the D6/D14 to toggle.
Status D7, D15 D6, D14 D5, D13 D3, D11 D2, D10*4 R/B*4
In
Progress
Programming D7, D15 Toggle0010
Erasing 0 Toggle 0 1 Toggle 0
Erase
Suspend
Read
(1)1100*11
(2)DataDataDataDataData 1
Erase Suspend*4
Program D7, D15 *2 0 0 *1, *3 0
Exceeded
Time
Limits
Programming D7, D15 Toggle1010
Erasing 0 Toggle 1 1 N/A 0
Erase Suspend*4
Program D7, D15 Toggle 1 0 N/A 0
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18
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
D5, D13 (Exceeded Timing Limits)
D5/D13 will indicate if the program or er ase time has e xceeded the specified limits (internal pulse count). Under
these conditions D5/D13 will produce a “1”. This is a f ailure condition which indicates that the progr am or erase
cycle was not successfully completed. Data Polling is the only operating function of the card under this condition.
If this failure condition occurs during sector erase operation, it specifies that a particular sector is bad and it
may not be reused, however, other sectors are still functional and may be used for the program or erase operation.
The chip must be reset to use other sectors . Write the Reset command sequence to the chip , and then
execute Program or Erase command sequence. This allows the system to continue to use the other active
sectors in the chip.
If this failure condition occurs during the chip erase operation, it specifies that the entire chip is bad or
combination of sectors are bad.
If this failure condition occurs during the byte programming operation, it specifies that the entire sector containing
that byte is bad and this sector may not be reused, (other sectors are still functional and can be reused).
The D5/D13 f ailure condition may also appear if a user tries to program a non b lank location without erasing. In
this case the card locks out and never completes the card operation. Hence, the system never reads a valid
data on D7/D15 bit and D6/D14 ne v er stops toggling. Once the card has exceeded timing limits , the D5/D13 bit will
indicate a “1”. Please note that this is not a device failure condition since the device was incorrectly used.
D3, D11 (Sector Erase Timer)
After the completion of the initial sector erase command sequence the sector erase time-out will begin. D 3/D11
will remain low until the time-out is complete . Data Polling and Toggle Bit are valid after the initial sector erase
command sequence.
If Data P olling or the Toggle Bit indicates the card has been written with a v alid erase command, D3/D11 may
be used to determine if the sector erase timer window is still open. If D3/D11 is high (“1”) the internally controlled
erase cycle has begun; attempts to write subsequent commands to the card will be ignored until the erase
operation is completed as indicated by Data Polling or Toggle Bit. If D3/D11 is low (“0”), the card will accept
additional sector erase commands . To insure the command has been accepted, the system softw are should
check the status of D3/D11 prior to and follo wing each subsequent sector er ase command. If D3/D11 w ere high
on the second status check, the command may not have been accepted.
Refer to Table : Hardware Sequence Flags.
D2, D10 (Toggle Bit ll, not applied for MB98A81063)
This Toggle bit, along with D6, can be used to determine whether the card is in the Erase operation or in Er ase
Suspend.
Successiv e reads from the erasing sector will cause D2 to toggle during the Erase operation. If the card is in the
erase-suspended-read mode, successive reads from the erase-suspended sector will cause D2 to toggle. When
the card is in the erase-suspended-program mode, successive reads from the byte address of the non-erase
suspended sector will indicate a logic ‘1‘ at the D2 bit.
D6 is diff erent from D2 in that D6 toggles only when the standard Progr am or Erase , or Erase Suspend Progr am
operation is in progress.
R/B (Ready/Busy, not applied for MB98A81063)
The card provides a R/B output pin as a w ay to indicate to the system that the progr am or er ase oper ation are
either in progress or has been completed. If the output is low, the card is busy with either a program or erase
operation. If the card is placed in an Erase Suspend mode, the R/B output will be high.
During programming, the R/B pin is driven low after the rising edge of the fourth WE pulse. During an erase
operation, the R/B pin is driv en low after the rising edge of the sixth WE pulse. The R/B pin will indicate a b usy
condition during the RESET pulse.
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19
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART
START
SET PA
YES
Fig. 3 - PROGRAM FLOWCHART
COMPLETED
DATA POLLING or
TOGGLE BIT *1
SET ADDRESS
PCMA1,PCMA2*2
WRITE COMMAND
(PCMA1/AAH or AAAAH)*2
WRITE COMMAND
(PCMA2/55H or 5555H)*2
WRITE COMMAND
(PCMA1/A0H/A0A0H)*2
WRITE DATA (PA/PD)
LAST ADDRESS ?
INCREMENT PA
NO
*1 See Fig. 7, 6, 9, 10.
*2 See “COMMAND DEFINITION TABLE”.
Notes:
PD : PROGRAM DATA
PA : PROGRAM ADDRESS
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20
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
START
SET CA
NO
Fig. 4 - CHIP ERASE FLOWCHART
COMPLETED
DATA POLLING or TOGGLE BIT *1
WRITE COMMAND
(CCMA1/AAH or AAAAH)*2
WRITE COMMAND
(CCMA2/55H or 5555H)*2
WRITE COMMAND
(CCMA1/80H or 8080H)*2
DESIRED OTHER
CHIPS ERASE ?
INCREMENT CA
YES
*1 See Fig. 7, 8, 9, 10.
*2 See “COMMAND DEFINITION TABLE”.
Note:
CA : CHIP ADDRESS
WRITE COMMAND
(CCMA1/AAH or AAAAH)*2
WRITE COMMAND
(CCMA2/55H or 5555H)*2
WRITE COMMAND
(CCMA1/10H or 1010H)*2
SET ADDRESS
(CCMA1,CCMA2)*2
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21
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
SET SA
NO
Fig. 5 - SECTOR ERASE FLOWCHART
COMPLETED
DATA POLLING or TOGGLE BIT *1
WRITE COMMAND
(SCMA1/AAH or AAAAH)*3
WRITE COMMAND
(SCMA2/55H or 5555H)*3
DESIRED OTHER
SECTORS ERASE ? YES
*1 See Fig.7, 8, 9, 10.
*2 Possible for the sectors in a chip
*3 See “COMMAND DEFINITION TABLE”.
Note:
SA : SECTOR ADDRESS
SET ADDRESS SCMA1,SCMA2*3
WRITE COMMAND
(SA/30H or 3030H)
*2
START
WRITE COMMAND
(SCMA1/80H or 8080H)*3
WRITE COMMAND
(SCMA1/AAH or AAAAH)*3
WRITE COMMAND
(SCMA2/55H or 5555H)*3
WRITE COMMAND
(SA/30H or 3030H)
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22
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
No
Fig. 6 - ERASE SUSPEND FLOWCHART
FINISHED
Yes
*1 Detection whether suspend mode is valid
can be done by Data Polling and R/B
also. (MB98A81063 does not have R/B).
*2 Only Read operation for MB98A81063.
Notes:
CA: CHIP ADDRESS
SA: SECTOR ADDRESS
RA: READ ADDRESS
EXECUTING
SECTOR ERASE
READ DATA (SA)*1
Toggle
bit=Toggle?*1
Read or Program*2
STOP Erase
Suspend mode?
WRITE COMMAND
(CA/30H or 3030H)
No
Yes
WRITE COMMAND
(CA/B0H or B0B0H)
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23
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
TIMER START *1
No
Fig. 7 - DATA POLLING FLOWCHART: × 8-bit mode No.1
Yes
*1 User sets the time period referring to
“PROGRAM AND ERASE PERFORMANCES”.
*2 ProgramVA=PA
Chip EraseVA=CA
Sector EraseVA=SA
START
READ (VA) *2
D7=Data?
No
Yes
D5=1 or Time-up?
READ (VA) *2
D7=Data?
ERROR COMPLETED
Yes
No
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24
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
TIMER START *1
Yes
Fig. 8 - TOGGLE BIT FLOWCHART: × 8-bit mode No.1
No
*1 User sets the time period referring to
“PROGRAM AND ERASE PERFORMANCES”.
*2 Program VA=PA
Chip Erase VA=CA
Sector EraseVA=SA
START
READ (VA) *2
D6=Toggle?
No
Yes
D5=1 or Time-up?
READ (VA) *2
D6=Toggle?
ERROR COMPLETED
No
Yes
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25
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
TIMER START *1
No
Yes
*1 User sets the time period referring to
“PROGRAM AND ERASE PERFORMANCES”.
*2 Program VA=PA
Chip Erase VA=CA
Sector EraseVA=SA
Notes:
EF: Error Flag
EF=0: Operation Completed
EF=1: Lower Byte Error
EF=2: Upper Byte Error
EF=3: Lower/Upper Byte Error
START
READ (VA) *2
No
Yes
D5=1 or Time-up?
READ (VA) *2
EF=1
Yes
No
D7=Data?
D7=Data?
1
No
Yes
READ (VA) *1
No
Yes
D13=1 or Time-up?
READ (VA)
EF=EF+2
Yes
No
D15=Data?
D15=Data?
1
Yes
EF=0?
ERROR
COMPLETED
No
EF=0
Fig. 9 - DATA POLLING FLOWCHART: × 16-bit mode
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26
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM / ERASE FLOWCHART (Continued)
TIMER START *1
Yes
No
*1 User sets the time period referring to
“PROGRAM AND ERASE PERFORMANCES”.
*2 Program VA=PA
Chip Erase VA=CA
Sector EraseVA=SA
Notes:
EF: Error Flag
EF=0: Operation Completed
EF=1: Lower Byte Error
EF=2: Upper Byte Error
EF=3: Lower/Upper Byte Error
START
READ (VA) *2
No
Yes
D5=1 or Time-up?
READ (VA)
EF=1
No
Yes
D6=Toggle?
D6=Toggle?
1
Yes
No
READ (VA) *1
No
Yes
D13=1 or Time-up?
READ (VA)
EF=EF+2
No
Yes
D14=Toggle?
D14=Toggle?
1
Yes
EF=0?
ERROR
COMPLETED
No
EF=0
Fig. 10 - TOGGLE BIT FLOWCHART: × 16-bit mode
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27
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
ABSOLUTE MAXIMUM RATINGS (See WARNING)
WARNING: Semiconductor devices can be permanently damaged by application of stress (voltage, current,
temperature, etc.) in excess of absolute maximum ratings. Do not exceed these ratings.
RECOMMENDED OPERATING CONDITIONS
(Referenced to VSS)
WARNING: The recommended operating conditions are required in order to ensure the normal operation of the
semiconductor device. All of the device’s electrical characteristics are warranted when the device is
operated within these ranges.
Always use semiconductor devices within their recommended operating conditions ranges Operation
outside these ranges may adversely affect reliability and could result in device failure.
No warranty is made with respect to uses, operating conditions, or combinations not represented on
the data sheet. Users considering application outside the listed conditions are advised to contact their
FUJITSU representatives beforehand.
CAPACITANCE (TA = 25°C, f = 1 MHz, VIN = VI/O = GND)
Notes:
*1 This value does not apply to CE1, CE2, WE, REG and RESET.
*2 This value does not apply to CD1, CD2, BVD1 and BVD2.
Parameter Symbol Value Unit
Supply Voltage VCC –0.5 to +6.0 V
Input Voltage VIN –0.5 to VCC +0.5 V
Output Voltage VOUT –0.5 to VCC +0.5 V
Temperature under Bias TA0 to +60 °C
Storage Temperature TSTG –30 to +70 °C
Parameter Symbol Min. Typ. Max. Unit
VCC Supply Vo ltage VCC 4.75 5.0 5.25 V
Ground GND 0 V
Ambient Temperature TA0—55°C
Parameter Symbol Min. Max. Unit
Input Capacitance *1 CIN —75pF
I/O Capacitance *2 CI/O —50pF
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28
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
DC CHARACTERISTICS
Notes:
*1 This value does not apply to CE1, CE2, WE and REG.
*2 This value does not apply to BVD1, BVD2, CD1 and CD2.
*3 This value does not apply to BVD1 and BVD2.
Parameter Test Conditons Symbol Value Unit
Min. Typ. Max.
Input Leakage Current *1 VCC = VCC max., VIN = 0 V or VCC ILI ±1.0 ±20 µA
Output Leakage Current *2 VCC = VCC max., VIN = 0 V or VCC ILO ±1.0 ±20 µA
Standby Current
VCC = VCC max.
CE1, CE2 = VCC VIN = 0 V or VCC ISB1 —0.51.7mA
VCC = VCC max., CE1, CE2 = VIH
VIN = VIL or VIH ISB2 —4.08.0mA
Active Read Current VCC = VCC max., CE1, CE2 = VIL
Cycle = 200 ns, IOUT = 0 mA ICC1 100 160 mA
Program Current Program in progress (× 16 mode) ICC2 ——120mA
Erase Current Erase in progress (× 16 mode) ICC3 ——120mA
Input Low Voltage VIL –0.3 0.8 V
Input High Voltage VIH 2.4 VCC+0.3 V
Output Low Voltage IOL = 3.2 mA, VCC = VCC min. VOL ——0.4V
Output High Voltage *3 IOH = 2.0 mA, VCC = VCC min. VOH 3.8 V
Low VCC Lock-out Voltage Common Memory VLKO 3.2 3.7 4.2 V
Attribute Memory 3.8 V
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29
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
AC TEST CONDITIONS
PROGRAM AND ERASE PERFORMANCES
MAIN MEMORY PROGRAM / ERASE PERFORMANCE
(MB98A81063)
Notes:
*1 Excludes system-level overhead.
*2 Excludes 00H programming prior to erasure.
(MB98A81183)
Notes:
*1 Excludes system-level overhead.
*2 Excludes 00H programming prior to erasure.
Parameter Min. Typ. Max. Unit
Byte Progra m Time *1 8 500 µs
Chip Programming Time *1 4.2 25 Sec.
Sector Erase Time *2 1 15 Sec.
Program/Erase Cycles 100,000 Cycles
Parameter Min. Typ. Max. Unit
Byte Progra m Time *1 8 500 µs
Chip Programming Time *1 8.4 50 Sec.
Sector Erase Time *2 1 15 Sec.
Program/Erase Cycles 100,000 Cycles
Fig. 11 - AC TEST CONDITIONS
Input Pulse Levels: VIH = 2.6 V, VIL = 0.6 V
Input Pulse Rise and Fall Times: 5 ns
(Transient between 0.8 V and 2.4 V)
Timing Reference Levels
Input: VIL = 0.8 V, VIH = 2.4 V
Output: VOL = 0.8 V, VOH = 2.0 V
Output Load +5 V
R1
R2
CL
DOUT (I/O)
* Including jig and stray capacitance
All parameters except tCLZ, tOLZ, tCHZ, tOHZ, tRCLZ, tROLZ,
tRCHZ and tROHZ
tCLZ, tOLZ, tCHZ, tOHZ, tRCLZ, tROLZ, tRCHZ and tROHZ
1.8 K
R1
1.8 K
R2
990
990
CL
100 pF
5 pF
Parameter Measured
Load Ι
Load Ι Ι
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30
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PROGRAM AND ERASE PERFORMANCES (Continued)
(MB98A81273, 81373, 81473, 81573)
Notes:
*1 Excludes system-level overhead.
*2 Excludes 00H programming prior to erasure.
ATTRIBUTE MEMORY PROGRAM PERFORMANCE
AC CHARACTERISTICS
(Recommended operating conditions unless otherwise noted.)
MAIN MEMORY READ CYCLE*1
Notes:
*1 Rise/Fall time < 5 ns.
*2 Transition is measured at the point of ±500 mV from steady state v oltage . This parameter is specified using
Load ll in Fig. 11.
*3 This parameter is specified from the rising edge of OE, CE1 or CE2, whichever occurs first.
Parameter Min. Typ. Max. Unit
Byte Progra mming Time *1 8 500 µs
Chip Programming Time *1 16.8 100 Sec.
Sector Erase Time *2 1 15 Sec.
Program/Erase Cycles 100,000 Cycles
Parameter Min. Typ. Max. Unit
Byte Progra m Time 1 ms
Number of Program per Byte 100,000 Times
Parameter Symbol Min. Max. Unit
Read Cycle Time tRC 150 ns
Card Enable Access Time tCE 150 ns
Address Access Time tACC 150 ns
Output Enable Access Time tOE 75 ns
Card Enable to Output in Low-Z*2 tCLZ 5 ns
Card Disable to Output in High-Z*2 tCHZ 60 ns
Output Enable to Output in Low-Z*2 tOLZ 5 ns
Output Disable to Output in High-Z*2 tOHZ 60 ns
Output Hold from Address, CE, or OE Change *3 tOH 5 ns
Ready Time from RESET tRDY 20 ms
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31
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
AC CHARACTERISTICS (Continued)
(Recommended operating conditions unless otherwise noted.)
MAIN MEMORY PROGRAM / ERASE CYCLE*1 *2
Notes:
*1 Read timing parameters during Program/Erase operations are the same as those during read only operations.
Refer to AC characteristics for Main Memory Read Cycle.
*2 Rise/Fall time 5 ns.
*3 These do not include the preprogramming time.
*4 Not 100% tested.
Parameter Symbol Min. Typ. Max. Unit
Write Cycle Time tWC 150 ns
Address Setup Time tAS 20 ns
Address Hold Time tAH 20 ns
Data Setup Time tDS 50 ns
Data Hold Time tDH 20 ns
Read Recovery Time (WE control) tGHWL 10 ns
Read Recovery Time (CE control) tGHEL 10 ns
Output Enable Hold Time tOEH 10 ns
Card Enable Setup Time tCS 20 ns
Card Enable Hold Time tCH 0 ns
Write Enable Pulse Width tWP 80 ns
Write Enable Setup Time tWS 0 ns
Write Enable Hold Time tWH 0 ns
Card Enable Pulse Width tCP 100 ns
Duration of Byte Program Operation
(WE control) tWHWH1 8 µs
Duration of Erase Operation *3
(WE control) tWHWH2 1 15 s
Duration of Byte Program Operation
(CE control) tEHEH1 8 µs
Duration of Erase Operation *3
(CE control) tEHEH2 1 15 s
VCC Setup Time *4 tVCS 50 µs
Reset Pulse Width tRP 500 ns
Busy Delay Time tBSY 100 ns
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32
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
AC CHARACTERISTICS (Continued)
ATTRIBUTE MEMORY READ CYCLE *1
Notes:
*1 Rise/Fall time < 5 ns.
*2 Transition is measured at the point of ±500 mV from steady state v oltage . This parameter is specified using
Load ll in Fig. 3.
*3 This parameter is specified from the rising edge of OE, CE1 or CE2, whichever occurs first.
ATTRIBUTE MEMORY PROGRAM CYCLE
Parameter Symbol Min. Max. Unit
Read Cycle Time tRRC 250 ns
Address Access Time tRAA 250 ns
Card Enable Access Time tRCE 250 ns
Output Enable Access Time tROE 125 ns
Output Hold from Address Change tROH 5 ns
Card Enable to Output Low-Z *2 tRCLZ 5 ns
Output Enable to Output Low-Z *2 tROLZ 5 ns
Card Enable to Output High-Z *2 tRCHZ 60 ns
Output Enable to Output High-Z *2*3 tROHZ 60 ns
Parameter Symbol Min. Max. Unit
Address Setup Time tRAS 20 ns
Card Enable Setup Time tRCS 0 ns
Output Enable Setup Time tOES 20 ns
Write Pulse Width tRWP 100 1000 ns
Address Hold Time tRAH 50 ns
Data Setup Time tRDS 50 ns
Data Hold Time tRDH 20 ns
Card Enable Hold Time tRCH 0 ns
Output Enable Hold Time tROEH 20 ns
Progr am Time tRWR 1 ms
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MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM
MAIN / ATTRIBUTE MEMORY READ CYCLE TIMING DIAGRAM (WE = VIH, REG = VIH)*1
Notes:
*1 The addresses and parameters in ( ) are applied for attribute memory access.
*2 A0 = Either VIH or VIL.
CE1 = OE = VIL, CE2 = VIH: × 8-bit No.1 Bus Organization
READ CYCLE 1:
A0 to A24
(A0 to A11)
D0 to D7PREVIOUS DATA VALID DATA VALID
VIH
VIL
VOH
VOL
PREVIOUS DATA VALID DATA VALID
CE1 = VIH, CE2 = OE = VIL: × 8-bit No.2 Bus OrganizationREAD CYCLE 2:
A1 to A24 *2
(A1 to A11)
D8 to D15
or
D0 to D15
VIH
VIL
VOH
VOL
:Undefined
CE1 = CE2 = OE = VIL: × 16-bit Bus Organization
tRC
(tRRC)
tACC (tRAA)
tOH (tROH)
tRC
(tRRC)
tACC (tRAA)
tOH (tROH)
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34
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN / ATTRIBUTE MEMORY READ CYCLE TIMING DIAGRAM (Continued) (WE = VIH, REG = VIH)*1
Note:
*1 The addresses and parameters in ( ) are applied for attribute memory access.
OE
CE1
CE2 = VIH: × 8-bit No.1 Bus OrganizationREAD CYCLE 3:
A0 to A24
(A0 to A11)
High-Z DATA VA LID
VIH
VIL
VOH
VOL
:Undefined
VIH
VIL
VIH
VIL
D0 to D7
tOLZ
(tROLZ)
tACC (tRAA)
tCE
(tRCE)
tCLZ
(tRCLZ)
tOHZ
(tROHZ)
tCHZ
(tRCHZ)
tOE
(tROE)
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35
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN / ATTRIBUTE MEMORY READ CYCLE TIMING DIAGRAM(Continued)(WE = VIH, REG = VIH)*1
Notes:
*1 The addresses and parameters in ( ) are applied for attribute memory access.
*2 A0 = Either VIH or VIL.
High-Z DATA VALID
D8 to D15
CE1 = VIH: × 8-bit No.2 Bus OrganizationREAD CYCLE 4:
A1 to A24 *2
(A1 to A11)VIH
VIL
VOH
VOL
VIH
VIL
VIH
VIL
CE1 = CE2 = VIL: × 16-bit Bus OrganizationREAD CYCLE 5:
:Undefined
D0 to D15
A1 to A24 *2
(A1 to A11)VIH
VIL
VOH
VOL
VIH
VIL
VIH
VIL
tOLZ
(tROLZ)
High-Z DATA VALID
tOLZ
(tROLZ)
OE
CE2
OE
CE1=CE2
tA CC (tRAA) tCHZ
(tRCHZ)
tOHZ
(tROHZ)
tCE
(tRCE)
tCLZ
(tRCLZ)
tOE
(tROE)
tCE
(tRCE)
tCLZ
(tRCLZ)
tCHZ
(tRCHZ)
tOHZ
(tROHZ)
tOE
(tROE)
tA CC (tRAA)
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36
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN MEMORY PROGRAM CYCLE TIMING DIAGRAM (WE = CONTROLLED, REG = VIH)
Notes:
*1 See “FUNCTION TRUTH TABLE”.
*2 PCMA1/PCMA2 = Command Address for Program, PA = Program Address, PD = Program Data. See
“COMMAND DEFINITION TABLE”.
A0 to A24
*1
VIH
VIL
VIH
VIL
:Undefined
VIH
VIL
VIH
VIL
Data *1 VIH/OH
VIL/OL
VCC
tAS tAH
PCMA1 *2 PCMA2 *2 PCMA1 *2 PA *2 PA *2
1st
Bus Cycle 2nd
Bus Cycle 3rd
Bus Cycle 4th
Bus Cycle Data
Polling Cycle
AAH
(AAAAH) 55H
(5555H) A0H
(A0A0H) PD *2 D7,D15 PD *2 Data
tOEH
tWHWH1
tWPH
tCS tCH
tGHWL
tWP
tDS
tVCS
tDH
OE
WE tBSY
VOH
VOL
R/B
CE*1
tWC tRC tRC
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37
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN MEMORY PROGRAM CYCLE TIMING DIAGRAM (CE = CONTROLLED, REG = VIH)
Notes:
*1 See “FUNCTION TRUTH TABLE”.
*2 PCMA1/PCMA2 = Command Address for Program, PA = Program Address, PD = Program Data. See
“COMMAND DEFINITION TABLE”.
A0 to A24
*1
VIH
VIL
VIH
VIL
:Undefined
VIH
VIL
VIH
VIL
Data *1 VIH/OH
VIL/OL
VCC
tAS tAH
PCMA1 *2 PCMA2 *2 PCMA1 *2 PA *2 PA *2
1st
Bus Cycle 2nd
Bus Cycle 3rd
Bus Cycle 4th
Bus Cycle Data
Polling Cycle
AAH
(AAAAH) 55H
(5555H) A0H
(A0A0H) PD *2 D7,D15 PD *2 Data
tOEH
tEHEH1
tCPH
tWS tWH
tGHEL
tCP
tDS
tVCS
tDH
OE
WE
CE*1
tBSY
R/B VOH
VOL
tWC tRC tRC
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38
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN MEMORY ERASE CYCLE TIMING DIAGRAM (WE = CONTROLLED, REG = VIH)
Notes:
*1 See “FUNCTION TRUTH TABLE”.
*2 CCMA1/CCMA2 = Command Address for Chip Erase, SCMA1/SCMA2 = Command Address for Sector
Erase, SA = Sector Address. See “COMMAND DEFINITION TABLE”.
A0 to A24
*1
VIH
VIL
VIH
VIL
:Undefined
VIH
VIL
VIH
VIL
Data *1 VIH/OH
VIL/OL
VCC
tAS tAH
CCMA1/
SCMA1 *2
1st
Bus Cycle 2nd
Bus Cycle 3rd
Bus Cycle 4th
Bus Cycle
AAH
(AAAAH) 55H
(5555H) 80H
(8080H)
tWPH
tCS tCH
tGHWL
tWP
tDS
tVCS
tDH
AAH
(AAAAH) 55H
(5555H) 10H/30H
(1010H/3030H)
5th
Bus Cycle 6th
Bus Cycle
CCMA1/
SA *2
OE
WE
CE*1
CCMA2/
SCMA2 *2 CCMA1/
SCMA1 *2 CCMA1/
SCMA1 *2 CCMA2/
SCMA2 *2
tWC
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39
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN MEMORY ERASE CYCLE TIMING DIAGRAM (CE = CONTROLLED, REG = VIH)
Notes:
*1 See “FUNCTION TRUTH TABLE”.
*2 CCMA1/CCMA2 = Command Address for Chip Erase, SCMA1/SCMA2 = Command Address for Sector
Erase, SA = Sector Address. See “COMMAND DEFINITION TABLE”.
A0 to A24
*1
VIH
VIL
VIH
VIL
:Undefined
VIH
VIL
VIH
VIL
Data *1 VIH/OH
VIL/OL
VCC
tAS tAH
1st
Bus Cycle 2nd
Bus Cycle 3rd
Bus Cycle 4th
Bus Cycle
AAH
(AAAAH) 55H
(5555H) 80H
(8080H)
tCPH
tWS tWH
tGHEL
tCP
tDS
tVCS
tDH
AAH
(AAAAH) 55H
(5555H) 10H/30H
(1010H/3030H)
5th
Bus Cycle 6th
Bus Cycle
OE
WE
CE*1
CCMA1/
SCMA1 *2 CCMA1/
SA *2
CCMA2/
SCMA2 *2 CCMA1/
SCMA1 *2 CCMA1/
SCMA1 *2 CCMA2/
SCMA2 *2
tWC
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40
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN MEMORY DATA POLLING CYCLE TIMING DIAGRAM (REG = VIH)
Notes:
*1 VA = PA for Programming Cycle, VA = SA for Sector Erase, VA = CA for Chip Erase.
*2 See “FUNCTION TRUTH TABLE”.
*3 tEHEH1, 2 for CE Control.
*4 Program/Erase operation is finished.
A0 to A24
*2
VIH
VIL
VIH
VIL
:Undefined
VIH
VIL
VIH
VIL
D7,D15 VIH/OH
VIL/OL
D0 to D6 *2
D8 to D14
tCHZ
Command Write Cycle Data Polling Read Cycle
VA *1
D7,D15 D7,D15 D7,D15 Valid Data
D0 to D6,
D8 to D14
D0 to D6, D8 to D14
Invalid Data D0 to D6, D8 to D14
Valid Data
*2
tOE
*4
VIH/OH
VIL/OL
OE
WE
CE*2
tCE
tACC
tWC
tOEH tOHZ
tWHWH1,2
(tEHEH1,2)*3
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41
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
TIMING DIAGRAM (Continued)
MAIN MEMORY TOGGLE BIT TIMING DIAGRAM (REG = VIH)
Notes:
*1 VA = PA for Programming Cycle, VA = SA for Sector Erase, VA = CA for Chip Erase.
*2 See “FUNCTION TRUTH TABLE”.
*3 Program/Erase operation is finished.
*4 PD, 10H (1010H) or 30H (3030H)
A0 to A24
*2
VIH
VIL
VIH
VIL
:Undefined
VIH
VIL
VIH
VIL
Data *2 VIH/OH
VIL/OL
Command Write Cycle
*4
D6,D14
Toggle D6,D14
Toggle D6,D14
Stop
Toggling
Valid Data
tOE
VA *1 VA *1 VA *1 VA *1
Toggle Bit
Read Cycle
*3
OE
WE
CE*2
tRC
tOEH
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42
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
AC CHARACTERISTICS (Continued)
(Recommended operating conditions unless otherwise noted.)
ATTRIBUTE MEMORY WRITE CYCLE TIMING DIAGRAM (WE = CONTROLLED, REG = VIL)
Note:
*1 Data polling operation.
A0 to A11
High-Z
tRCS
VIH
VIL
VIH
VIL
: Undefined
VIH
VIL
VIH
VIL
VOH
VOL
VIH
VIL
tRAS
DATA VALID
tRCH
High-Z
tRWP
tRDS
D7 *1
tROES
tRDH
tRAH
tROEH
tRWR
D0 to D7High-Z
O7
I7
OE
WE
CE1
CE2 = VIH : × 8-bit No.1 Bus OrganizationWRITE CYCLE 1:
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43
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
AC CHARACTERISTICS (Continued)
(Recommended operating conditions unless otherwise noted.)
ATTRIBUTE MEMORY WRITE CYCLE TIMING DIAGRAM (WE = CONTROLLED, REG = VIL)
Notes:
*1 Inputs from D8 to D15 are not defined.
*2 Data polling operation.
CE1 = CE2 : × 16-bit Bus OrganizationWRITE CYCLE 2:
A1 to A11
High-Z
tRCS
VIH
VIL
VIH
VIL
: Undefined
VIH
VIL
VIH
VIL
VOH
VOL
VIH
VIL
tRAS
DATA VALID
tRCH
High-Z
tRWP
tRDS
D7 *2
tROES
tRDH
tRAH
tROEH
tRWR
D0 to D7 *1High-Z
O7
I7
CE1=CE2
OE
WE
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44
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
AC CHARACTERISTICS (Continued)
(Recommended operating conditions unless otherwise noted.)
R/B Timing Diagram During Program / Erase Operations (except for MB98A81063)
RESET Timing Diagram (except for MB98A81063)
Entire programming or
erase operation
R/B
CE
WE
tRSY
tRP
tRDY
RESET
Possible next operation
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45
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
UNIQUE FEATURES FOR FLASH MEMORY CARD
1. SPECIAL MONITORING PINS
WP Switch WP (output)
Protect H
Non Protect L
(A)
(B)
VCC
CD1
CD2
system side card side
- Fig. 13 -
- Fig. 12-
1.1 CD1, CD2: Card Detection Pins
CD1 and CD2 are to detect whether or not the card has been
correctly inserted. (See Fig. 12.)
When the memory card has been correctly inserted, CD1 and
CD2 are detected by the system. CD1, CD2 are tied to ground
on the card side as shown in Fig. 12.
1.2 WP: Write Protect Pins
This pin monitors the position of the Write Protect
switch. As shown in Fig. 13, the Flash memory card
has a Write Protect switch at the top of the card.
To write to the card, the switch must be turned to the
“Non Protect” position and the WE pin low . And at that
time, L-level is output on the WP pin.
T o prevent writing to the card, the switch must be turned
to the ”Protect” position. At that time, H-le v el is output
on the WP pin. Non Protect
Flash Memory Card Write Protect Switch
VCC
Protect
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46
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
CARD INFORMATION
Memory Card have CIS (Card Information Structure) in Attribute memory.
1. CIS
(Continued)
Address MB98A81063 MB98A81183 MB98A81273 MB98A81373 MB98A81473 MB98A81573
0000 h 01 h
0002 h 03 h
0004 h 53 h
0006 h 0D h 1D h 0E h 1E h 3E h 7E h
0008 h FF h
000A h 15 h
000C h 1C h
000E h 04 h
0010 h 01 h
0012 h 46 h
0014 h 55 h
0016 h 4A h
0018 h 49 h
001A h 54 h
001C h 53 h
001E h 55 h
0020 h 00 h
0022 h 4D h
0024 h 42 h
0026 h 39 h
0028 h 38 h
002A h 41 h
002C h 38 h
002E h 30 h
0030 h 30 h
0032 h 36 h 38 h 37 h
0034 h 33 h
0036 h 73 h
0038 h 65 h
003A h 72 h
003C h 69 h
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47
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
(Continued)
Address MB98A81063 MB98A81183 MB98A81273 MB98A81373 MB98A81473 MB98A81573
003E h 65 h
0040 h 73 h
0042 h 00 h
0044 h FF h
0046 h 17 h
0048 h 03 h
004A h 41 h
004C h 01 h
004E h FF h
0050 h 18 h
0052 h 03 h
0054 h 04 h
0056 h A4 h D5 h 3D h
0058 h FF h
005A h 1E h
005C h 07 h
005E h 02 h
0060 h 11 h
0062 h 01 h
0064 h 01 h
0066 h 01 h
0068 h 01 h
006A h FF h
006C h 10 h
006E h 06 h
0070 h CA h
0072 h FF h
0074 h 3C h
0076 h 00 h
0078 h 02 h 45 h 9D h AD h CD h 0D h
007A h FF h
007C h FF h
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48
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
2. Explanation for CIS
(Continued)
Address MB98A81573 Attribute
0000 h 01 h Common memory device information tuple
0002 h 03 h Link to next tuple
0004 h 53 h Flash memory with 150 ns access time
0006 h 7E h 32MB device size
0008 h FF h End of list
000A h 15 h Level 1 version/product - information tuple
000C h 1C h Link to next tuple
000E h 04 h Conformed to JEIDA Ver.4.2/PCMCIA 2.1
0010 h 01 h
0012 h 46 h
Product/Maker Information for “FUJITSU MB98A80070 series”
0014 h 55 h
0016 h 4A h
0018 h 49 h
001A h 54 h
001C h 53 h
001E h 55 h
0020 h 00 h
0022 h 4D h
0024 h 42 h
0026 h 39 h
0028 h 38 h
002A h 41 h
002C h 38 h
002E h 30 h
0030 h 30 h
0032 h 37 h
0034 h 33 h
0036 h 73 h
0038 h 65 h
003A h 72 h
003C h 69 h
003E h 65 h
0040 h 73 h
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49
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
(Continued)
Address MB98A81573 Attribute
0042 h 00 h
0044 h FF h End of list
0046 h 17 h Attribute memory device information tuple
0048 h 03 h Link to next tuple
004A h 41 h EEPROM with 250 ns access time
004C h 01 h 2 KB device size
004E h FF h End of list
0050 h 18 h JEDEC device ID tuple for common memory
0052 h 03 h Link to next tuple
0054 h 04 h Manufacture ID
0056 h 3D h Device ID
0058 h FF h End of list
005A h 1E h Device geometry information for common memory device tuple
005C h 07 h Link to next tuple
005E h 02 h System bus width is 2 Bytes
0060 h 11 h Erase block size is 64 KBytes
0062 h 01 h Read block size is 1 Byte
0064 h 01 h Program block size is 1 Byte
0066 h 01 h No special partitioning requirements
0068 h 01 h Non interleaved
006A h FF h End of list
006C h 10 h Checksum tuple
006E h 06 h Link to next tuple
0070 h CA h Offset to checksum area
0072 h FF h
0074 h 3C h Length of check
0076 h 00 h
0078 h 0D h Checksum
007A h FF h End of list
007C h FF h The end of chain tuple
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50
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
PACKAGE DIMENSIONS
"A"
1.60±0.05
(.063±.002)
85.60±0.20(3.370±.008)
10.50(.413)
10.50(.413)
2-R1.00(.039)
1.00±0.05
(.039±.002)
1.00±0.05
(.039±.002)
1.00±0.05
(.039±.002)
1.27±0.10(.050±.004)TYP.
1PIN
1.27±0.10
(.050±.004)
41.91
REF
(1.650) 54.00±0.10
(2.126±.004)
C
1997 FUJITSU LIMITED K68017SC-3-3
(.571)
14.50
Details of "A" part
3.30±0.10(.130±.004) 3.30±0.20(.130±.008)
Connector edge Base
68-PIN MEMORY CARD
(CASE No.: CRD-68P-M17)
Dimensions in mm (inches)
Dimention comform with PCMCIA/JEIDA. (PC CARD STANDARD)
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51
MB98A81063-15/81183-15/81273-15/81373-15/81473-15/81573-15
FUJITSU LIMITED
For further information please contact:
Japan
FUJITSU LIMITED
Corporate Global Business Support Division
Electronic Devices
KAWASAKI PLANT, 4-1-1, Kamikodanaka
Nakahara-ku, Kawasaki-shi
Kanagawa 211-8588, Japan
Tel: 81(44) 754-3763
Fax: 81(44) 754-3329
http://www.fujitsu.co.jp/
North and South America
FUJITSU MICROELECTRONICS, INC.
Semiconductor Division
3545 North First Street
San Jose, CA 95134-1804, USA
Tel: (408) 922-9000
Fax: (408) 922-9179
Customer Response Center
Mon. - Fri.: 7 am - 5 pm (PST)
Tel: (800) 866-8608
Fax: (408) 922-9179
http://www.fujitsumicro.com/
Europe
FUJITSU MIKROELEKTRONIK GmbH
Am Siebenstein 6-10
D-63303 Dreieich-Buchschlag
Germany
Tel: (06103) 690-0
Fax: (06103) 690-122
http://www.fujitsu-ede.com/
Asia Pacific
FUJITSU MICROELECTR ONICS ASIA PTE LTD
#05-08, 151 Lorong Chuan
New Tech Park
Singapore 556741
Tel: (65) 281-0770
Fax: (65) 281-0220
http://www.fmap.com.sg/
F9811
FUJITSU LIMITED Printed in Japan
All Rights Reserved.
The contents of this document are subject to change without
notice. Customers are advised to consult with FUJITSU sales
representatives before ordering.
The information and circuit diagrams in this document are
presented as examples of semiconductor device applications,
and are not intended to be incorporated in devices for actual use.
Also, FUJITSU is unable to assume responsibility for
infringement of any patent rights or other rights of third parties
arising from the use of this information or circuit diagrams.
FUJITSU semiconductor devices are intended for use in
standard applications (computers, office automation and other
office equipment, industrial, communications, and measurement
equipment, personal or household devices, etc.).
CAUTION:
Customers considering the use of our products in special
applications where failure or abnormal operation may directly
affect human lives or cause physical injury or property damage,
or where extremely high levels of reliability are demanded (such
as aerospace systems, atomic energy controls, sea floor
repeaters, vehicle operating controls, medical devices for life
support, etc.) are requested to consult with FUJITSU sales
representatives before such use. The company will not be
responsible for damages arising from such use without prior
approval.
Any semiconductor devices have an inhereut chance of
failure. You must protect against injury, damage or loss from
such failures by incorporating safety design measures into your
facility and equipment such as redundancy, fire protection, and
prevention of over-current levels and other abnormal operating
conditions.
If any products described in this document represent goods or
technologies subject to certain restrictions on export under the
Foreign Exchange and Foreign Trade Law of Japan, the prior
authorization by Japanese government will be required for
export of those products from Japan.
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