ADT7482
Rev. 0 | Page 9 of 24
THEORY OF OPERATION
The ADT7482 is a local and 2× remote temperature sensor and
overtemperature/undertemperature alarm. When the ADT7482
is operating normally, the on-board ADC operates in a free-
running mode. The analog input multiplexer alternately selects
either the on-chip temperature sensor to measure its local
temperature or either of the remote temperature sensors. The
ADC digitizes these signals and the results are stored in the
local, Remote 1, and Remote 2 temperature value registers.
The local and remote measurement results are compared with
the corresponding high, low, and THERM temperature limits,
stored in on-chip registers. Out-of-limit comparisons generate
flags that are stored in the status register. A result that exceeds
the high temperature limit, the low temperature limit, or a
remote diode open circuit causes the ALERT output to assert
low. Exceeding THERM temperature limits causes the THERM
output to assert low. The ALERT output can be reprogrammed
as a second THERM output.
The limit registers can be programmed, and the device
controlled and configured, via the serial SMBus. The contents
of any register can also be read back via the SMBus.
Control and configuration functions consist of switching the
device between normal operation and standby mode, selecting
the temperature measurement scale, masking or enabling the
ALERT output, switching Pin 8 between ALERT and THERM2,
and selecting the conversion rate.
SERIES RESISTANCE CANCELLATION
Parasitic resistance to the D+ and D− inputs to the ADT7482,
seen in series with the remote diode, is caused by a variety of
factors, including PCB track resistance and track length. This
series resistance appears as a temperature offset in the remote
sensor temperature measurement. This error typically causes a
0.5°C offset per ohm of parasitic resistance in series with the
remote diode.
The ADT7482 automatically cancels out the effect of this series
resistance on the temperature reading, providing a more
accurate result, without the need for user characterization of
this resistance. The ADT7482 is designed to automatically cancel
typically up to 1.5 kΩ of resistance. By using an advanced
temperature measurement method, this is transparent to the
user. This feature allows resistances to be added to the sensor
path to produce a filter, allowing the part to be used in noisy
environments. See the Noise Filtering section for more details.
TEMPERATURE MEASUREMENT METHOD
A simple method of measuring temperature is to exploit the
negative temperature coefficient of a diode, measuring the
base-emitter voltage (VBE) of a transistor operated at constant
current. However, this technique requires calibration to null out
the effect of the absolute value of VBE, which varies from device
to device.
The technique used in the ADT7482 is to measure the change
in VBE when the device is operated at three different currents.
Previous devices have used only two operating currents. The
use of a third current allows automatic cancellation of
resistances in series with the external temperature sensor.
Figure 16 shows the input signal conditioning used to measure
the output of an external temperature sensor. This figure shows
the external sensor as a substrate transistor, but it could equally
be a discrete transistor. If a discrete transistor is used, the collec-
tor is not grounded and should be linked to the base. To prevent
ground noise from interfering with the measurement, the more
negative terminal of the sensor is not referenced to ground, but
is biased above ground by an internal diode at the D− input.
Capacitor C1 can be added as a noise filter (a recommended
maximum value of 1000 pF). However, a better option in noisy
environments is to add a filter, as described in the Noise
Filtering section. See the Layout Considerations section for
more information.
To me asure ΔVBE, the operating current through the sensor is
switched among three related currents. Shown in Figure 16,
N1 × I and N2 × I are different multiples of the current, I. The
currents through the temperature diode are switched between I
and N1 × I, giving ΔVBE1, and then between I and N2 × I, giving
ΔVBE2. The temperature can then be calculated using the two
ΔVBE measurements. This method can also be shown to cancel
the effect of any series resistance on the temperature measurement.
The resulting ΔVBE waveforms are passed through a 65 kHz
low-pass filter to remove noise and then to a chopper-stabilized
amplifier. This amplifies and rectifies the waveform to produce
a dc voltage proportional to ΔVBE. The ADC digitizes this vol-
tage and a temperature measurement is produced. To reduce the
effects of noise, digital filtering is performed by averaging the
results of 16 measurement cycles for low conversion rates. At
rates of 16, 32, and 64 conversions/second, no digital averaging
takes place.
Signal conditioning and measurement of the internal tempera-
ture sensor are performed in the same manner.