SN54HC273, SN74HC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS136B – DECEMBER 1982 – REVISED MAY 1997
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
D
Contain Eight Flip-Flops With Single-Rail
Outputs
D
Direct Clear Input
D
Individual Data Input to Each Flip-Flop
D
Applications Include:
– Buffer/Storage Registers
– Shift Registers
– Pattern Generators
D
Package Options Include Plastic
Small-Outline (DW), Thin Shrink
Small-Outline (PW), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These circuits are positive-edge-triggered D-type
flip-flops with a direct clear (CLR) input.
Information at the data (D) inputs meeting the
setup time requirements is transferred to the
Q outputs on the positive-going edge of the clock
(CLK) pulse. Clock triggering occurs at a
particular voltage level and is not directly related
to the transition time of the positive-going pulse.
When CLK is at either the high or low level, the
D input has no effect at the output.
The SN54HC273 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC273 is characterized for
operation from –40°C to 85 °C.
FUNCTION TABLE
(each flip-flop)
INPUTS OUTPUT
CLR CLK DQ
L X X L
H↑HH
H↑LL
H L X Q0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
CLR
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
VCC
8Q
8D
7D
7Q
6Q
6D
5D
5Q
CLK
SN54HC273 ...J OR W PACKAGE
SN74HC273 ...DW, N, OR PW PACKAGE
(TOP VIEW)
3212019
910111213
4
5
6
7
8
18
17
16
15
14
8D
7D
7Q
6Q
6D
2D
2Q
3Q
3D
4D
1D
1Q
CLR
5Q
5D 8Q
4Q
GND
CLK VCC
SN54HC273 . . . FK PACKAGE
(TOP VIEW)
Copyright 1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.