© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com C1082_C0G_CBR_0505 • 4/20/2016 10
Ultra HiQ-CBR Squared Series, C0G Dielectric, Low ESR 250 VDC, 1 MHz – 50 GHz (RF & Microwave)
Table 4 – Performance & Reliability: Test Methods & Conditions
Stress Test or Inspection Method Requirements
Terminal Strength
0505 case sizes: 5N
No visible damage or separation of termination system.
Vibration
Resistance
Vibration frequency: 10 ~ 55 Hz/minimum
Total amplitude: 1.5 mm
Test time: 6 hours (Two hours each in three mutually
perpendicular directions.)
No visible damage.
CapacitancechangeandQ/DF:Tomeetinitialspecication
Solderability
Soldertemperature:235±5°C
Dipping time: 2 ±0.5 seconds
95%minimumcoverageofterminationnish.
Board Flex
Capacitorismountedtoasubstratewhichisexedbymeans
oframatarateof1mmperseconduntilthedeection
becomes1mm.(Deectionismaintainedfor5±1second)
Store at room temperature for 24 ±2 hours before measuring
electrical properties.
No visible damage.
Capacitance change: within ±5.0% or ±0.5 pF, whichever is
larger.
(Capacitancechangeismonitoredduringexure.)
Resistance to
Soldering Heat
Soldertemperature:260±5°C
Dipping time: 10 ±1 second
Preheating:120to150°Cfor1minutebeforeimmersethe
capacitor in a eutectic solder.
Store at room temperature for 24 ±2 hours before measuring
No visible damage.
Capacitance change: within ±2.5% or ±0.25 pF, whichever is
larger.
Q/DF, IR and dielectric strength: To meet initial requirements.
25% maximum leaching on each edge.
Temperature
Cycling
5 cycles of steps 1 - 4:
No visible damage.
Capacitance change: within ±2.5% or ±0.25 pF, whichever is
larger.
Q/DF, IR and dielectric strength: To meet initial requirements.
Store at room temperature for 24 ± 2 hours before measuring
electrical properties.
Humidity (Damp Heat)
Steady State
Testtemperature:40±2°C
Humidity: 90 ~ 95% RH
Testtime:500+24/-0hours
Store at room temperature for 24 ±2 hours before measuring
electrical properties.
Capacitance change: within ±5.0% or ±0.5 pF, whichever is larger.
Q/DFvalue:Capacitance≥30pF,Q≥350,
10pF≤Capacitance<30pF,Q≥275+2.5°C
Capacitance<10pF;Q≥200+10ºC
Humidity (Damp Heat)
Load
Testtemperature:40±2°C
Humidity: 90 ~ 95% RH
Testtime:500+24/-0hours
Applied voltage: rated voltage
Store at room temperature for 24 ±2 hours before measuring
No visible damage.
Capacitance change: within ±7.5% or ±0.75 pF, whichever is larger.
Q/DFvalue:Capacitance≥30pF,Q≥200,
Capacitance<30pF,Q≥100+10/3ºC
IR:≥500MΩ
High Temperature Life
Testtemperature:125±3°C
Applied voltage:
200% of rated voltage (6.3 VDC - 250 VDC)
Testtime:1,000+24/-0hours
Store at room temperature for 24 ±2 hours before measuring
Capacitance change: within ±3.0% or ±0.3 pF, whichever is larger.
Q/DFvalue:Capacitance≥30pF,Q≥350,
10pF≤Capacitance<30pF,Q≥275+2.5°C
Capacitance<10pF,Q≥200+10°C
ESR The ESR should be measured at room temperature and
tested at frequency 1±0.1 GHz.
0.4pF≤Capacitance<1.0pF:<1500mΩ
1.0pF≤Capacitance<10pF:<250mΩ
10pF≤Capacitance≤100pF:<200mΩ
Step Temp. (ºC) Time (min.)
Minimumoperatingtemp.+0/-3
Maximumoperatingtemp.+3/-0