AFT18H357--24SR6
3
RF Device Data
Freescale Semiconductor, Inc.
Table 4. Electrical Characteristics (TA=25C unless otherwise noted) (continued)
Characteristic Symbol Min Typ Max Unit
Functional Tests (1,2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD =28Vdc,I
DQA = 800 mA, VGSB =0.7V,
Pout = 63 W Avg., f = 1805 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF.
ACPR measured in 3.84 MHz Channel Bandwidth @ 5MHzOffset.
Power Gain Gps 16.6 17.3 19.6 dB
Drain Efficiency D47.4 50.3 — %
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF PAR 7.4 7.8 —dB
Adjacent Channel Power Ratio ACPR —--34.6 --32.0 dBc
Load Mismatch (In Freescale Test Fixture, 50 ohm system) IDQA = 800 mA, f = 1840 MHz, 10 sec Pulse Width, 10% Duty Cycle
VSWR 10:1 at 32 Vdc, 360 W Pulse Output Power
(3 dB Input Overdrive from 210 W Pulse Rated Power)
No Device Degradation
Typical Performance (2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD =28Vdc,I
DQA = 800 mA, VGSB =0.7Vdc,
1805–1880 MHz Bandwidth
Pout @ 1 dB Compression Point, CW P1dB —220 — W
Pout @ 3 dB Compression Point (3) P3dB —320 — W
AM/PM
(Maximum value measured at the P3dB compression point across
the 1805--1880 MHz bandwidth)
—-- 1 5 —
VBW Resonance Point
(IMD Third Order Intermodulation Inflection Point)
VBWres —110 —MHz
Gain Flatness in 75 MHz Bandwidth @ Pout =63WAvg. GF—0.2 —dB
Gain Variation over Temperature
(--30Cto+85C)
G — 0.008 —dB/C
Output Power Variation over Temperature
(--30Cto+85C) (4)
P1dB —0.009 —dB/C
1. Part internally matched both on input and output.
2. Measurements made with device in an asymmetrical Doherty configuration.
3. P3dB = Pavg + 7.0 dB where Pavg is the average output power measured using an unclipped W--CDMA single--carrier input signal where
output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF.
4. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings table.