PD - 95970A IRG4BC30FD-SPbF Fast CoPack IGBT INSULATED GATE BIPOLAR TRANSISTOR WITH HYPERFAST DIODE C VCES = 600V Features Fast: optimized for medium operating frequencies (1-5 kHz in hard switching, >20kHz in resonant mode). Generation 4 IGBT design provides tighter parameter distribution and higher efficiency than Generation 3. IGBT co-packaged with HEXFREDTM ultrafast, ultra-soft recovery anti-parallel diodes for use in bridge configurations. Lead-Free VCE(on) typ. = 1.59V G @VGE = 15V, IC = 17A E n-channel Benefits Generation 4 IGBT's offer highest efficiency available. IGBT's optimized for specific application conditions. HEXFRED diodes optimized for performance with IGBT's. Minimized recovery characteristics require less/no snubbing. Designed to be a "drop-in" replacement for equivalent industry-standard Generation 3 IR IGBT's. D2Pak Absolute Maximum Ratings Parameter Max. Units V VCES Collector-to-Emitter Voltage 600 IC @ TC = 25C Continuous Collector Current 31 IC @ TC = 100C ICM Continuous Collector Current Pulse Collector Current (Ref.Fig.C.T.5) ILM Clamped Inductive Load current IF @ TC = 100C Diode Continuous Forward Current 12 IFM Diode Maximum Forward Current 120 d 17 c A 124 124 VGE Gate-to-Emitter Voltage 20 V PD @ TC = 25C Maximum Power Dissipation 100 W PD @ TC = 100C Maximum Power Dissipation Operating Junction and TJ 42 TSTG -55 to +150 C Storage Temperature Range Thermal / Mechanical Characteristics Parameter RJC Junction-to-Case- IGBT RCS Case-to-Sink, flat, greased surface RJA Junction-to-Ambient (PCB Mounted,steady state) Wt Weight www.irf.com g Min. Typ. Max. Units --- --- 1.2 C/W --- 0.50 --- --- --- 40 --- 2.0 (0.07) --- g (oz.) 1 01/27/10 IRG4BC30FD-SPbF Electrical Characteristics @ TJ = 25C (unless otherwise specified) Parameter e V(BR)CES Collector-to-Emitter Breakdown Voltage V(BR)CES/TJ Temperature Coeff. of Breakdown Voltage VCE(on) Collector-to-Emitter Voltage Min. Typ. Max. Units 600 -- -- -- 0.69 -- -- 1.59 1.8 -- 1.99 -- -- 1.7 -- VGE(th) Gate Threshold Voltage 3.0 -- 6.0 VGE(th)/TJ Threshold Voltage temp. coefficient -- -11 -- gfe ICES Forward Transconductance Zero Gate Voltage Collector Current 6.1 10 -- -- -- 250 -- -- 2500 -- 1.4 1.7 -- 1.3 1.6 -- -- 100 VFM f Diode Forward Voltage Drop IGES Gate-to-Emitter Leakage Current V Conditions VGE = 0V, IC = 250A V/C VGE = 0V, IC = 1mA IC = 17A V VGE = 15V IC = 31A See Fig. 2, 5 IC = 17A, TJ = 150C V VCE = VGE, IC = 250A mV/C VCE = VGE, IC = 250A S VCE = 100V, IC = 17A A VGE = 0V, VCE = 600V V IF = 12A VGE = 0V, VCE = 600V, TJ = 150C See Fig. 13 IF = 12A, TJ = 150C nA VGE = 20V Switching Characteristics @ TJ = 25C (unless otherwise specified) Parameter Qg Total Gate Charge (turn-on) Conditions Min. Typ. Max. Units -- 51 IC = 17A 77 VCC = 400V Qge Gate-to-Emitter Charge (turn-on) -- 7.9 12 Qgc Gate-to-Collector Charge (turn-on) -- 19 28 td(on) Turn-On delay time -- 42 -- tr Rise time -- 26 -- td(off) Turn-Off delay time -- 230 350 VGE = 15V, RG = 23 tf Fall time -- 160 230 Energy losses inlcude "tail" and Eon Turn-On Switching Loss -- 0.63 -- Eoff Turn-Off Switching Loss -- 1.39 -- Ets Total Switching Loss -- 2.02 3.9 td(on) Turn-On delay time -- 42 -- tr Rise time -- 27 -- td(off) Turn-Off delay time -- 310 -- tf Fall time -- 310 -- Ets Total Switching Loss -- 3.2 -- mJ diode reverse recovery. LE Internal Emitter Inductance -- 7.5 -- nH Cies Input Capacitance -- 1100 -- Measured 5mm from package VGE = 0V -- 74 -- pF VCC = 30V ns TJ = 25C Coes Output Capacitance Cres Reverse Transfer Capacitance -- 14 -- trr Diode Reverse Recovery Time -- 42 60 -- 80 120 6.0 Irr Diode Peak Reverse Recovery Current -- 3.5 -- 5.6 10 Qrr Diode Reverse Recovery Charge -- 80 180 220 600 di(rec)M/dt Diode Peak Rate of Fall of Recovery -- 180 -- During tb -- 120 -- 2 nC See Fig. 8 VGE = 15V TJ = 25C ns IC = 17A, VCC = 480V diode reverse recovery. mJ See Fig. 9, 10, 11, 18 TJ = 150C ns See Fig. 9,10,11,18 IC = 17A, VCC = 480V VGE = 15V, RG = 23 Energy losses inlcude "tail" and See Fig. 7 f = 1.0MHz TJ = 125C A TJ = 25C nC TJ = 25C TJ = 125C TJ = 125C A/s TJ = 25C TJ = 125C See Fig. 14 IF = 12A See Fig. 15 VR = 200V See Fig. 16 di/dt 200A/s See Fig. 17 www.irf.com IRG4BC30FD-SPbF www.irf.com 3 IRG4BC30FD-SPbF 4 www.irf.com IRG4BC30FD-SPbF www.irf.com 5 IRG4BC30FD-SPbF 6 www.irf.com IRG4BC30FD-SPbF www.irf.com 7 IRG4BC30FD-SPbF 90% Vge Same type device as D.U.T. +Vge Vce 430F 80% of Vce D.U.T. Ic 90% Ic 10% Vce Ic 5% Ic td(off) tf Eoff = Fig. 18a - Test Circuit for Measurement of t1+5S Vce icIcdtdt Vce t1 ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf t1 t2 Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining Eoff, td(off), tf GATE VOLTAGE D.U.T. 10% +Vg trr Ic Qrr = tx DUT VOLTAGE AND CURRENT Vce 10% Ic 90% Ic tr td(on) 10% Irr Ipk Vpk Vcc Irr Ic DIODE RECOVERY WAVEFORMS 5% Vce t1 t2 VceieIcdt dt Eon = Vce t1 t2 DIODE REVERSE RECOVERY ENERGY t3 Fig. 18c - Test Waveforms for Circuit of Fig. 18a, Defining Eon, td(on), tr 8 +Vg 10% Vcc Vcc trr id Ic dtdt tx t4 Erec = Vd VdidIcdt dt t3 t4 Fig. 18d - Test Waveforms for Circuit of Fig. 18a, Defining Erec, trr, Qrr, Irr www.irf.com IRG4BC30FD-SPbF Vg GATE SIGNAL DEVICE UNDER TEST CURRENT D.U.T. VOLTAGE IN D.U.T. CURRENT IN D1 t0 t1 t2 Fig.18e - Macro Waveforms for Figure 18a's Test Circuit RL = VCC ICM D.U.T. L 1000V Vc* 50V 6000F 100V 0 - VCC 480F Pulsed Collector Current Test Circuit Fig. 19 - Clamped Inductive Load Test Circuit www.irf.com Fig. 20 - Pulsed Collector Current Test Circuit 9 IRG4BC30FD-SPbF D2Pak Package Outline Dimensions are shown in millimeters (inches) D2Pak Part Marking Information 7+,6,6$1,5)6:,7+ /27&2'( $66(0%/('21:: ,17+($66(0%/