IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
1
FEATURES
Single Power Supply Operation
- Low voltage range: 1.65 V – 1.95 V
• Memory Organization
- IS25WD020: 256K x 8 (2 Mbit)
- IS25WD040: 512K x 8 (4 Mbit)
Cost Effective Sector/Block Architec ture
- 2Mb : Uniform 4KByte sectors / Four uniform
64KByte blocks
- 4Mb : Uniform 4KByte sectors / Eight uniform
64KByte blocks
Serial Peripheral Interface (SPI) Compatible
- Supports single- or dual-output
- Supports SPI Modes 0 and 3
- Maximum 30 MHz clock rate for normal read
- Maximum 80 MHz clock rate for f ast read
Page Program (up to 256 Bytes) Operation
- Typical 2 ms per page progra m
Sector, Block or Chip Erase Operation
- Typical 7 ms sector, block or chip e ra se
Low Power Consumption
- Typical 2 mA active read current
- Typical 6 mA program/erase current
Hardware Write Protection
- Protect and unprotect the device from write
operation by Write Protect (WP#) Pin
Software Write Protection
- The Block Protect (BP2, BP1, BP0) bits allow
partial or entire memory to be configured as read-
only
High Product Endurance
- Guaranteed 200,000 pro gram/erase cycles per
single sector
- Minimum 20 years data retention
Industrial Standard Pin-out and Package
- 8-pin 150mil SOIC
- 8-pin 150mil VVSOP
- 8-pin 208mil SOIC for IS25WD040
- 8-pin 300mil PDIP for IS25WD040
- 8-contact WSON
- Lead-free (Pb-free) package
GENERAL DESCRIPTION
The IS25WD020/040 are 2 Mbit / 4Mbit Serial Peripheral Interface (SPI) Flash memories, providing single- or
dual-output. The devices are designed to support a 30 MHz fclock rate in normal read mode, and 80 MHz in fast
read, the fastest in the industry. The devices use a single low voltage power supply, wide operating voltage
ranging from 1.65 Volt to 1.95 Volt, to perform read, erase and program operations. The devices can be
programmed in stand ard EPROM programmers.
The IS25WD020/040 are accessed through a 4 -wire SPI Interface consisting of Serial Data Input/Output (S lO),
Serial Data Output (SO), Serial Clock (SCK), and Chip Enable (CE#) pins. They comply with all recognized
command codes and operations. The dual-output fast read operation provides and effective serial data rate of
160MHz.
The devices support page program mode, where 1 to 256 bytes data can be programmed into the memory in
one program operation. These device s are divided into uniform 4 KByte sectors or unifo rm 64 KByte blocks.
The IS25WD020/040 are manufactured on pFLASH™’s adv anced non-volatile technology. The devices are
offered in 8-pin SOIC 150mil, 8-pin VVSOP 150mil and 8-contact WSON. The 8-pin 208mil SOIC and 8-pin
300mil PDIP just for IS25WD040. The devices operate at wide temperatures between -40°C to +105° C.
2 Mbit / 4 Mbit Single Operating Voltage Serial Flash
Memory With 80 MHz Dual-Output SPI Bus Interface
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
2
CONNECTION DIAGRAMS
PIN DESCRIPTIONS
SYMBOL TYPE DESCRIPTION
CE# INPUT
Chip Enable: CE# low activates the devices internal circuitries for
device operation. CE# high deselect s the devices and switches into
standby mode to reduce the power consumption. When a device is not
selected, data will not be accepted via the serial input pin (Sl), and the
serial output pin (SO) will remain in a high impedance state.
SCK INPUT Serial Data Clock
SIO INPUT/OUTPUT Serial Data Input/Output
SO OUTPUT Serial Data Output
GND Ground
Vcc Device Power Supply
WP# INPUT Write Protect: A hardware program/erase protection for all or part of a
memory array. When the WP# pin is low, memory array write -p rotection depends
on the setting of BP2, BP1 and BP0 bits in the Status Register. When the WP# is
high, the devices are not write-protected.
HOLD# INPUT Hold: Pause serial commu nication by the master device without resetting
the serial sequen ce.
CE# CE#
SO
WP#
GND
Vcc
HOLD#
SCK
SIO
SIO
SCK
HOLD#
Vcc
SO
WP#
GND
1
2
3
4
8
7
6
5
1
2
3
4
8
7
6
5
8-Pin SOIC/VVSOP 8-Contact WSON
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
3
BLOCK DIAGRAM
SIO
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
4
SPI MODES DESCRIPTION
Multiple IS25WD020/040 devices can be connected on
the SPI serial bus and controlled by a S PI Master, i.e.
microcontroller, as shown in Figure 1. The devices
support either of two SPI modes:
Mode 0 (0, 0)
Mode 3 (1, 1)
The difference between these two modes is the clock
polarity when the SPI master is in Stand-by mode: the
serial clock remains at “0” (SCK = 0) for Mode 0 and
the clock remains at “1 ” (SCK = 1) for Mode 3. Please
refer to Figure 2. For both modes, the input data is
latched on the rising edge of Serial Clock (SCK), and
the output data is available from the falling edge of
SCK.
Figure 1. Connection Diagram among SPI Master and SPI Slaves (Memory Devices)
SPI Master
(i.e. Microcontroller)
CS3 CS2 CS1
SPI Memory
Device
SPI Memory
Device
SPI Memory
Device
SPI Interface with
(0,0) or (1,1)
SDIO
SDI
SCK SCK SCK SCK SO SO SO
SI
O
SIO SIO
CE# CE# CE#
WP# WP# WP#
HOLD# HOLD# HOLD#
N
ote
: 1. Th
e
Wri
te
Pr
otect
(
WP
#)
a
n
d
H
o
l
d
(
H
O
LD
#)
s
i
g
n
a
l
s
s
h
ou
l
d
be
d
riv
e
n hi
g
h
o
r l
o
w
as
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
5
Figure 2. SPI Modes Supported
MSb
MSb
SCK
SCK
SO
SIO
In
p
ut mode
Mode 0
(
0
,
0
)
Mode 3
(
1
,
1
)
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
6
SYSTEM CONFIGURATION
The IS25WD020/040 devices are designed to interface directly with the synchronous Serial P eripheral Interface
(SPI) of the Motorola MC68HCxx series of microcontrollers or any SPI interface-equipped system controllers.
The devices have two superset features that can be enabled through specific software instructions and the
Configuration Register:
Table 1 illustrates the memory map of the devices. The Configuration Register controls how the memory is
mapped.
BLOCK/SECTOR ADDRESSES
Table 1. Block/Sector Addresses of IS25WD020/040
Memory Density Block No. Block
Size
(Kbytes) Sector No. Sector
Size
(Kbytes) Address Range
4 Mbit
2 Mbit
Block 0 64
Sector 0 4 000000h – 000FFFh
Sector 1 4 001000h – 001FFFh
: : :
Sector 15 4 00F000h – 00FFFFh
Block 1 64
Sector 16 4 010000h – 010FFFh
Sector 17 4 011000h – 011FFFh
: : :
Sector 31 4 01F000h – 01FFFFh
: : : : :
Block 3 64 : 4 030000h – 0 3FFFFh
Block 4 64 : 4 040000h – 0 4FFFFh
: : : : :
: : : : :
Block 7 64 : 4 070000h – 0 7FFFFh
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
7
REGISTERS (CONTINUED)
STATUS REGISTER
Refer to Tables 5 and 6 for Status Register Format and
Status Register Bit Definitions.
The BP0, BP1, BP2, and SRWD are volatile memory
cells that can be written by a Write Statu s Re gister
(WRSR) instruction. The default value of the BP2, BP1,
BP0 were set to “0” and SRWD bits was set to “0” at
factory. Once a “0” or “1”is written, it will not be
changed by device power- up or power-down, and can
only be altered by the next WRSR instruction. The
Status Register can be rea d by the Read Status
Register (RDSR). Refer to Table 10 for Instruction Set.
The function of Status Register bits are descri bed as
follows:
WIP bit: The Write In Progress (WIP) bit is read-only,
and can be used to detect the progress or completio n
of a program or erase operation. When the WIP bit is
“0”, the device is ready for a write status register,
program or erase operation. When the WIP bit is “1”,
the device is busy.
WEL bit: The Write Enable Latch (WEL) bit indicate s
the status of the internal write enable latch. When the
WEL is “0”, the write enable latch is disabled, and all
write operations, including write status register, page
program, sector erase, block and chip erase operations
are inhibited. When the WEL bit is “1”, write operatio ns
are allowed. The WEL bit is set by a Write Enable
(WREN) instruction. Each write register, program and
erase instruction must be preceded by a WREN
instruction. The WEL bit can be reset by a Write
Disable (WRDI) instruction. It will automatically be the
reset after the completion of a write instructio n.
BP2, BP1, BP0 bits: The Block Protection (BP2, BP1,
BP0) bits are used to define the portion of the memory
area to be protected. Refer to Tables 7, 8 and 9 for the
Block Write Protection bit settings. When a defined
combination of BP2, BP1 and BP0 bits are set, the
corresponding memory area is protected. Any program
or erase operation to that area will be inhibited. Note:
a Chip Erase (CHIP_ER) instruction is executed
successfully only if all the Block Protection Bits are set
as “0”s.
SRWD bit: The Status Register Write Disabl e (SRWD)
bit operates in conjunction with the Write Protection
(WP#) signal to provide a Hardware Protection Mo de.
When the SRWD is set to “0”, the Status Register is
not write-protected. When the SRWD is set to “1” and
the WP# is pulled low (VIL), the volatile bits of Status
Register (SRWD, BP2, BP1, BP0) become read-only,
and a WRSR instruction will be ignored. If the SRWD is
set to “1” and WP# is pulled high (VIH), t he Status
Register can be ch anged by a WRSR instruction.
Table 5. Status Register Format
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
SRWD1 Reserved BP2 BP1 BP0 WEL WIP
Default (flash bit) 0 0 0 0 0 0 0
IS25WD020/040
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REGISTERS (CONTINUED)
Table 6. Status Register Bit Definition
Bit Name Definition Read-
/Write Non-Volatile
bit
Bit 0 WIP Write In Progress Bit:
“0” indicates the device is ready
“1” indicates a write cycle is in progress and the device is busy R No
Bit 1 WEL Write Enable Latch:
“0” indicates the device is not write enabled
“1” indicates the device is write en abled (default) R/W No
Bit 2 BP0 Block Protection Bit: (See Table 7 and Table 8 for details)
“0” indicates the specific blocks are not write-protecte d (default)
“1” indicates the specific blocks are write-protected R/W Yes
Bit 3 BP1
Bit 4 BP2
Bits 5 – 6 N/A Reserved: Always “0” s N/A
Bit 7 SRWD Status Register Write Disable: (See Table 9 for details)
“0” indicates the Status Register i s not write-p rotected (default)
“1” indicates the Status Register i s write -protecte d R/W Yes
Table 8. Block Write Protect Bits for IS25WD02 0
Status Register Bits Protected Memory Area
BP2 BP1 BP0 2 Mbit
Not used 0 0 None
Not used 0 1 Upper eight (block : 3): 030000h – 03F FFFh
Not used 1 0 Upper quarter (two blocks :2 and 3): 020000h – 03FFFFh
Not used 1 1 Upper half (four blocks :0 to 3): 000000h – 03FFFFh
Table 8-1. Block Write Protect Bits for IS25WD040
Status Register Bits Protected Memory Area
BP2 BP1 BP0 4 Mbit
0 0 0 None
0 0 1 Upper eight (block : 7): 070000h – 07F FFFh
0 1 0 Upper quarter (two blocks :6 and 7): 060000h – 07FFFFh
0 1 1 Upper half (four blocks :4 to 7): 040000h – 07FFFFh
1 0 0
All Blocks (Block 0 to 7):
000000h – 07FFFFh
1 0 1
1 1 0
1 1 1
IS25WD020/040
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REGISTERS (CONTINUED)
PROTECTION MODE
The IS25WD020/040 have two types of write-
protection mechanisms: hardware and software.
These are used to prevent irrelevant operation in a
possibly noisy environment and protect the data
integrity.
HARDWARE WRITE-PROTECTION
The devices provide two hardware write -protection
features:
a. When inputting a program, erase or write status
register instruction, the number of clock pulse is
checked to determine whether it is a multiple of eight
before the executing. Any incomplete in struction
command sequence will be ignored.
0. The Write Protection (WP#) pin provides a
hardware write prote ction method for BP2, BP1,
BP0 and SRWD in the Status Register. Refer to
the STATUS REGISTER description.
c. Write inhibit is 1.5 V, all write sequence will be
ignored when Vcc drop to 1.5 V and lower
SOFTWARE WRITE PROTECTION
The IS25WD020/040 also provides two software write
protection features:
a. Before the execution of any program, erase or write
status register instruction, the Write Enable Latch
(WEL) bit must be enabled by executing a Write
Enable (WREN) instruction. If the WEL bit is not
enabled first, the program, erase o r write register
instruction will be ignored.
b. The Block Protection (BP2, BP1, BP0) bits allow part
or the whole memory area to be write-protected.
Table 9. Hardware Write Protection on Status
Register
SRWD WP# Status Register
0 Low Writable
1 Low Protected
0 High Writable
1 High Writable
IS25WD020/040
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DEVICE OPERATION
The IS25WD020/040 utilize an 8-bit instruction
register. Refer to Table 10 Instruction Set for details of
the Instructions and Instruction Codes. All instructions,
addresses, and data are shifted in with the most
significant bit (MSB) first on Serial Data Input (SI). The
input data on SI is latched on the rising edge of Serial
Clock (SCK) after Chip En able (CE#) is driven low
(VIL). Every instruction sequence starts with a one-byt e
instruction code and i s followe d by address bytes, data
bytes, or both address bytes and data bytes,
depending on the type of instruction. CE# must be
driven high (VIH) after the last bit of the instruction
sequence has been shifted in.
The timing for each instruction is illustrated in the
following operational descriptions.
Table 10. Instruction Set
Instruction Name Hex
Code Operation Command
Cycle Maximum
Frequency
RDID Abh Read Manufacturer and Product ID 4 Bytes 80 MHz
JEDEC ID READ 9Fh Read Manufacturer and Product ID by JEDEC ID
Command 1 Byte 80 MHz
RDMDID 90h Read Manufacturer and Device ID 4 Bytes 80 MHz
WREN 06h Write Enable 1 Byte 80 MHz
WRDI 04h Write Disable 1 Byte 80 MHz
RDSR 05h Read Status Register 1 Byte 80 MHz
WRSR 01h Write Status Register 2 Bytes 80 MHz
READ 03h Read Data Bytes from Memory at Normal Read Mode 4 Bytes 30 MHz
FAST_READ 0Bh Read Data Bytes from Me mory at Fast Read Mode 5 Bytes 80 MHz
FRDO 3Bh Fast Read Dual Output 5 Bytes 80 MHz
PAGE_ PROG 02h Page Program Data Bytes Into Memory 4 Bytes +
256B 80 MHz
SECTOR_ER D7h/
20h Sector Erase 4 Bytes 80 MHz
BLOCK_ER D8h Block Erase 4 Bytes 80 MHz
CHIP_ER C7h/
60h Chip Erase 1 Byte 80 MHz
HOLD OPERATION
HOLD# is used in conjunction with CE# to select
the IS25WD020/040. When the devices are
selected and a serial sequence is underway,
HOLD# can be used to pause the serial
communication with the m aster device without
resetting the serial sequence. To pa use, HOLD# is
brought low while the SCK signal is low. To resume
serial communication, HOLD# is brought high whil e
the SCK signal is low (SCK may still toggle during
HOLD). Inputs to Sl will be ignored while SO is in
the high impedance state.
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
RDID COMMAND (READ PRODU CT
IDENTIFICATION) OPERATION
The Read Product Identification (RDID) instruction is
for reading out the old style of 8-bit Electronic
Signature, whose values are shown a s table of ID
Definitions. This is not same as RDID or JEDEC ID
instruction. It’s not recomm ended to use for new
design. For new design, please use RDID or JEDEC ID
instruction.
The RDES instruction code is followed by three dummy
bytes, each bit being latched-in on SI during the rising
edge of SCK. Then the Device ID is shifted out on SO
with the MSB first, each bit been shifted out during the
falling edge of SCK. The RDES instructi on is ended by
CE# goes high. The Device ID outputs repeatedly if
continuously send the additional clock cycles on SCK
while CE# is at low.
Table 11. Product Identification
Product Identification Data
Manufacturer ID First Byte 9Dh
Second Byte 7Fh
Device ID: Device ID 1 Device ID 2
IS25WD020 11h 32h
IS25WD040 12h 33h
Figure 3. Read Product Identification Sequence
01 8 31 38 39 46 47 54
HIGH IMPEDAN CE Device ID1 Device ID1 Device ID1
SCK
CE#
SI
SO
INSTRUCTION
97
1010 1011b
3 Dummy Bytes
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
JEDEC ID READ COMMAND (READ PRODUCT IDENTIFICATION BY JEDEC ID)
OPERATION
The JEDEC ID READ instruction all ows the user to
read the manufacturer and produ ct ID of devices. Refer
to Table 11 Product Identification for pFlash
Manufacturer ID and Device ID. After the JEDEC ID
READ command is input, the second Manufacturer ID
(7Fh) is shifted out on SO with the MSB first, followed
by the first Manufacturer ID (9Dh) and the Device ID
(32h, in the case of the IS25WD020), each bit shifted
out during the falling edge of SCK. If CE# stays low
after the last bit of the Device ID is shifted out, the
Manufacturer ID and Device ID will loop until CE# is
pulled high.
Figure 4. Read Product Identification by JEDEC ID READ Sequence
SCK
CE#
SI
INSTRUCTION
1001 1111b
0815 23 24 31
716
HIGH IMPEDANCE
SO
Device ID2Manufacture ID1Manufacture ID2
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
RDMDID COMMAND (READ DEVICE MANUF ACTURER AND DEVICE ID)
OPERATION
The RDMDID instruction allows the user to read the
manufacturer and product ID of devices. Refer to Table
11 Product Identification for pFlash Man ufacturer ID
and Device ID. The RDMDID command is input,
followed by a 24-bit address pointing to an ID table.
The table contains the first Manufacturer ID (9Dh) and
the Device ID (32h, in the case of the IS25WD020),
and is shifted out on SO with the MSB first, each bit
shifted out during the falling edge of SCK. If CE# stays
low after the last bit of the Device ID is shifted out, the
Manufacturer ID and Device ID will loop until CE# is
pulled high.
Figure 5. Read Product Identification by RDMDID READ Sequence
IS25WD020/040
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Note :
0. ADDRESS A0 = 0, will output the 1st manufacture ID (9Dh) first -> device ID1 -> 2nd manufacture ID (7Fh)
ADDRESS A0 = 1, will output the device ID1 -> 1st manufacture ID (9D) -> 2nd manufacture ID (7Fh)
IS25WD020/040
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Rev. A
09/12/2012
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DEVICE OPERATION (CONTINUED)
WRITE ENABLE OPERATION
The Write Enable (WREN) instruction is used to set the
Write Enable Latch (WEL) bit. The WEL bit of the
IS25WD020/040 is reset to the write –protected state
after power-up. The WEL bit must be write enable d
before any write operation, including sector, block
erase, chip erase, page program and write status
register operations. The WEL bit will be reset to the
write-protect state automatically upon completion of a
write operation. The WREN instruction is required
before any above operation is executed.
Figure 6. Write Enable Sequence
WRDI COMMAND (WRITE DISABLE) OPERATION
The Write Disable (WRDI) instruction resets the WEL
bit and disables all write instructions. The WRDI instruction i s not required after the execution of a write
instruction, since the WEL bi t is automatically reset.
Figure 7. Write Disable Sequence
SIO
SIO
IS25WD020/040
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Rev. A
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DEVICE OPERATION (CONTINUED)
RDSR COMMAND (READ STATUS REGISTER) O PERATION
The Read Status Register (RDSR) instruction provides
access to the Status Register. During the execution of
a program, erase or write status registe r operation, all
other instructions will be ignored except the RDSR
instruction, which can be used to che ck the progress or
completion of an operation by reading the WIP bit of
Status Register.
Figure 8. Read Status Register Sequence
WRSR COMMAND (WRITE STATUS REGISTER) OPERATION
The Write Status Register (WRSR) instru ction allows
the user to enable or disable the block protection and
status register write prote ction features by writing “0”s
or “1” s into the volatile BP2, BP1, BP0 and SRWD
bits.
Figure 9. Write Status Register Sequ ence
SIO
SIO
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
READ COMMAND ( REA D D ATA ) OPERATION
The Read Data (READ) instruction is used to read
memory data of a IS25WD020/040 under norm al mode
running up to 30 MHz.
The READ instruction code is tran smitted via the Sl
line, followed by three address bytes (A23 – A0) of the
first memory location to be read. A total of 24 address
bits are shifted in, but only AMS (most significant
address) – A0 are decoded. The remaining bits (A23 –
AMS) are ignored. The first byte addressed can be at
any memory location. Upon completion, any data on
the Sl will be ignored. Refer to Table 12 for the related
Address Key.
The first byte data (D7 – D0) addressed is then shifted
out on the SO line, MSb first. A single byte of data, or
up to the whole memory array, can be re ad out in one
READ instruction. The address is automatically
incremented after each byte of data is shifted out. The
read operation can be terminated at any time by driving
CE# high (VIH) after the data come s out. When the
highest address of the device s is reached, the address
counter will roll over to the 000000h add ress, allo wing
the entire memory to be read in one cont inuous READ
instruction.
Table 12. Address Key
Address IS25WD020 IS25WD040
AN (AMS – A0) A17 – A0 A18 – A0
Don’t Care Bits A23 – A18 A23 – A19
Figure 12. Read Data Sequence
SIO
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
FAST_READ COMMAND (FAST READ DATA) OPERATION
The FAST_READ instruction is u sed to read memory
data at up to a 80 MHz clock.
The FAST_READ instruction co de is followed by three
address bytes (A23 – A0) and a dummy byte (8
clocks), transmitted via the SI line, with each bit
latched-in during the rising edge of SCK. Then the first
data byte addressed is shifted out on the SO line, with
each bit shifted out at a maximum frequency fCT, during
the falling edge of SCK.
The first byte addressed can be at any memory
location. The address is automatically incremented
after each byte of data is shifted out. When the highest
address is reached, the address counter will roll over to
the 000000h address, allowing the entire memory to be
read with a single FAST_READ instruction. The
FAST_READ instruction is terminated by driving CE#
high (VIH).
Figure 13. Fast Read Data Sequence
SIO
SIO
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
FRDO COMMAND (F AST READ DUAL OUTPUT ) OPERATION
The FRDO instruction is used to read m emory data on
two output pins each at up to a 80 MHz clock.
The FRDO instruction code is followed by three
address bytes (A23 – A0) and a dummy byte (8
clocks), transmitted via the SI line, with each bit
latched-in during the rising edge of SCK. Then the first
data byte addressed is shifted out on the SO and SIO
lines, with each pair of bits shifted out at a maximum
frequency fCT, during the falling edge of SCK. The first
bit (MSb) is output on SO, while simultaneously the
second bit is output on SIO.
The first byte addressed can be at any memory
location. The address is automatically incremented
after each byte of data is shifted out. When the highest
address is reached, the address counter will roll over to
the 000000h address, allowing the entire memory to be
read with a single FRDO instruction. FRDO instruction
is terminated by driving CE# high (VIH).
Figure 14. Fast Read Dual-Output Se quence
01234567 8910 11 28 29 30 31
...
INSTRUCTION = 0011 1011b ...
23 22 21 3210
3 - BYTE ADDRESS
CE#
SCK
SIO
SO HIGH IMPEDANCE
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
6
CE#
SCK
SIO
SO HIGH IMPEDANCE DATA OUT 1 DATA OUT 2
IS25WD020/040
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DEVICE OPERATION (CONTINUED)
PAGE_PROG COMMAND (PAGE PROGRAM) OPERATION
The Page Program (PAGE_PROG) instruction allows
up to 256 bytes data to be programmed into memory in
a single operation. The destination of the memory to be
programmed must be outside the protected memo ry
area set by the Block Protection (BP2, BP1, BP0) bits.
A PAGE_PROG instruction which attempts to program
into a page that is write-protected will be ignored.
Before the execution of PAGE_PROG instruction, the
Write Enable Latch (WEL) must be enabled through a
Write Enable (WREN) inst r uction.
The PAGE_PROG instruction code, three address
bytes and program data (1 to 256 bytes) are input via
the Sl line. Program operation will start immediately
after the CE# is brought high, otherwise the
PAGE_PROG instruction will not be executed. The
internal control logic automatically handles the
programming voltages and timing. During a program
operation, all instructions will be ignored except the
RDSR instruction. The progress or completion of the
program operation ca n be determined by reading the
WIP bit in Status Register via a RDSR instruction. If
the WIP bit is “1”, the program operation is still in
progress. If WIP bit is “0”, the program operation has
completed.
If more than 256 bytes data are sent to a device, the
address counter rolls over within the same page, the
previously latched data are discarded, and the last 256
bytes data are kept to be programmed into the page.
The starting byte can be anywhere within the page.
When the end of the page is reached, the address will
wrap around to the beginning of the sam e page. If the
data to be programmed are less than a full page, the
data of all other bytes on the same page will remain
unchanged.
Note: A program operation can alter “1 ”s into “0”s, but
an erase operation is required to change “0”s back to
“1”s. A byte cannot be reprogrammed wi thout first
erasing the whole sector or block.
Figure 15. Page Program Sequence
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IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
21
DEVICE OPERATION (CONTINUED)
ERASE OPERATION
The memory array of the IS25WD020/040 is organized
into uniform 4 Kbyte sectors or 64 Kbyte uniform
blocks (a block consists of sixteen adjacent sectors).
Before a byte can be reprogramm ed, the sector or
block that contains the byte must be era sed (erasi ng
sets bits to “1”). In order to erase the devices, there are
three erase instructions available: Sector Era se
(SECTOR_ER), Block Erase (BLOCK_ E R) and Chip
Erase (CHIP_ER). A sector erase ope ration allows any
individual sector to be erased without affecting the data
in other sectors. A block erase operation erases a ny
individual block. A chip erase operation erases the
whole memory array of a device. A sector erase, block
erase or chip erase operation can be executed prior to
any programming operation.
SECTOR_ER COMMAND (SECTOR ERASE)
OPERATION
A SECTOR_ER instruction erases a 4 Kbyte sector.
Before the execution of a SECTOR_ER i nstruction, the
Write Enable Latch (WEL) must be set via a Write
Enable (WREN) instruction. The WEL bit is reset
automatically after the completion of sector an erase
operation.
A SECTOR_ER instruction is entered, after CE# is
pulled low to select the device and stays low during the
entire instruction se quence The SECTOR_ER
instruction code, and three address bytes are input via
SI. Erase operation will start immediately after CE# is
pulled high. The internal control logic automatically
handles the erase voltage and timing. Refer to Figure
14 for Sector Erase Sequence.
During an erase operation, all instruction will be
ignored except the Read Status Registe r (RDSR)
instruction. The progress or com pletion of the erase
operation can be determined by reading the WIP bit in
the Status Register using a RDSR instruction. If the
WIP bit is “1”, the erase operation is still in progress. If
the WIP bit is “0”, the erase operation has been
completed.
BLOCK_ER COMMA ND (BLOCK ERASE)
OPERATION
A Block Erase (BLOCK_ER) instruction erases a 64
Kbyte block of the IS25WD020/040. Before the
execution of a BLOCK_ER instruction, the Write
Enable Latch (WEL) must be set via a Write Enable
(WREN) instruction. The WEL is reset automatically
after the completion of a block erase operation.
The BLOCK_ER instruction code and three address
bytes are input via SI. Erase operation will start
immediately after the CE# is pulled high, otherwise the
BLOCK_ER instruction will not be executed. The
internal control logic automatically handles the erase
voltage and timing. Refer to Figure 15 for Block Erase
Sequence.
CHIP_ER COMMAND (CH I P ERASE) OPERATION
A Chip Erase (CHIP_ER) instruction erases the entire
memory array of a IS25WD020/040. Before the
execution of CHIP_ER instruction, the Write Enable
Latch (WEL) must be set via a Write Enable (WREN)
instruction. The WEL is reset automati cally after
completion of a chip erase operation.
The CHIP_ER instruction code is input via the SI.
Erase operation will start immediately after CE# is
pulled high, otherwise the CHIP_ER instruction will not
be executed. The internal control logic automatically
handles the erase voltage and timing. Refer to Figure
16 for Chip Erase Sequence.
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
22
DEVICE OPERATION (CONTINUED)
Figure 16. Sector Erase Sequence
Figure 17. Block Erase Sequence
Figure 18. Chip Erase Sequence
SIO
SIO
SIO
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
23
ABSOLUTE MAXIMUM RATINGS (1)
Temperature Under Bias -65oC to +125oC
Storage Temperature -65oC to +125oC
Surface Mount Lead Soldering Temperature Halogen-free Package 260oC 10 Seconds
Lead-free Package 260oC 10 Seconds
Input Voltage with Respect to Groun d on All Pins (2) -0.5 V to VCC + 0.5 V
All Output Voltage with Respect to Ground -0.5 V to VCC + 0.5 V
VCC (2) -0.5 V to +4.0 V
Notes:
1. Applied conditions greater than those listed in “Absolute Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only. The functional operation of the device conditions that exceed those
indicated in the operational sections of this spe cification is not implied. Exposure to absolute maximum rating
condition for extended periods may affe ct device reliability.
2. Maximum DC voltage on input or I/O pins is VCC + 0.5 V. During voltage transitions, input or I/O pins may
overshoot VCC by + 2.0 V for a period of time not to exceed 20 ns. Minimum DC voltage on input or I/O pins is
-0.5 V. During voltage transitions, input or I/O pins may undershoot GND by -2.0 V for a period of time not to
exceed 20 ns.
DC AND AC OPERATING RANGE
Part Number IS25WD020/040
Operating Temperature (Extended Grade) -40oC to 105oC
Operating Temperature (Industrial Grade) -40oC to 85oC
Operating Temperature (Automotive, A1 Grade) -40oC to 85oC
Operating Temperature (Automotive, A2 Grade) -40oC to 105oC
Operating Temperature (Automotive, A3 Grade) -40oC to 125oC
Vcc Power Supply 1.65 V – 1.95 V
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
24
DC CHARACTERISTICS
Applicable over recommended operating range from:
VCC = 1.65 V to 1.95 V (unless otherwise noted).
Symbol Parameter Condition Min Typ Max Units
ICC1 Vcc Active Read Current VCC = 1.95Vat 30 MHz, SO = Open 2 5 mA
ICC2 Vcc Program/Erase Current VCC = 1.95Vat 30 MHz, SO = Open 6 10 mA
ISB1 Vcc Stand by Current CMOS VCC = 1.95V, CE# = VCC 10
A
ISB2 Vcc Stand by Current TTL VCC = 1.95V, CE# = VIH to VCC 2 mA
ILI Input Leakage Current VIN = 0V to VCC 1
A
ILO Output Leaka ge Current VIN = 0V to VCC, TAC = 0oC to 85oC 1
A
VIL Input Low Voltage -0.5 0.3 V
VIH Input High Voltage 0.7VCC VCC +
0.3 V
VOL Output Low Voltage 1.65V < VCC < 1.95V IOL = 2.1 mA 0.2 V
VOH Output High Voltage IOH = -100 A VCC
0.2 V
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
25
AC CHARACTERISTICS
Applicable over recom m ended operating range from VCC = 1.65 V to 1.95 V
CL = 1 TTL Gate and 10 pF (unles s otherwise noted).
Symbol Parameter Min Typ Max Units
fCT Clock Frequency for fast read mode 0 80 MHz
fC Clock Frequency for read mode 0 30 MHz
tRI Input Rise Time 8 ns
tFI Input Fall Time 8 ns
tCKH SCK High Time 4 ns
tCKL SCK Low Time 4 ns
tCEH CE# High Time 25 ns
tCS CE# Setup Time 10 ns
tCH CE# Hold Time 5 ns
tDS Data In Setup Time 2 ns
tDH Data in Hold Time 2 ns
tHS Hold Setup Time 15 ns
tHD Hold Time 15 ns
tV Output Valid 8 ns
tOH Output Hold Time Normal Mode 0 ns
tLZ Hold to Output Low Z 20 ns
tHZ Hold to Output High Z 20 ns
tDIS Output Disable Time 20 ns
tEC Sector/Block/Chip Erase Time 7 15 ms
tPP Page Program Time 2 3 ms
tVCS VCC Set-up Time 50 s
tw Write Status Register time 2 ms
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
26
AC CHARACTERISTICS (CONTINUED)
SERIAL INPUT/OUTPUT TIMING (1)
Note: 1. For SPI Mode 0 (0,0)
SIO
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
27
AC CHARACTERISTICS (CONTINUED)
HOLD TIMING
PIN CAPACITANCE (f = 1 MHz, T = 25°C )
Typ Max Units Conditions
CIN 4 6 pF VIN = 0 V
COUT 8 12 pF VOUT = 0 V
Note: These parameters are characterized but not 100% tested.
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
28
POWER-UP AND POWER-DOWN
At Power-up and Power-down, the device must not be
selected (CE# must follow the voltage applied on Vcc)
until Vcc reaches the correct value:
- Vcc(min) at Power-up, and then for a furthe r delay of
tVCE
0. Vss at Power-down
Usually a simple pull-up resistor on CE# can be used
to insure safe and proper Power-up and Power-down.
To avoid data corruption and inadvertent write
operations during power up , a Power On Reset (POR)
circuit is included. The logic inside the device is held
reset while Vcc is less than the POR threshold value
(Vwi) during power up, the device does not respond to
any instruction until a time delay of tPUW has elapse d
after the moment that Vcc rised above the Vwi
threshold. However, the correct operation of the device
is not guaranteed if, by this time, Vcc is still below
Vcc(min). No Write Status Register, Pro gram or Erase
instructions should be sent until the later of:
- tPUW after Vcc passed the VWI thre shold
- tVCE after Vcc passed the Vcc(min) level
At Power-up, the device is in the following state:
- The device is in the Standby mode
- The Write Enable Latch (WEL) bit is reset
At Power-down, when Vcc drops from the operating
voltage, to below the Vwi, all write operations are
disabled
and the device does not respo nd to any write
instruction.
Chip Selection Not Allowed
All Write Comm ands are Rejected
tVCE Read Access Allowed Device fully accessible
tPUW
Vcc
Vcc(max)
Vcc(min)
Reset State
V (write inhibit)
Time
Symbol Parameter Min. Max. Unit
t
VCE *1
Vcc( m in ) to CE# Low 10 us
t
PUW *1
Pow er - U p t ime delay t o W r it e in struct ion 1 10 m s
N ot e : *1. T hese param et er s are charac t er ized onl y.
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
29
PROGRAM/ERASE PERFORMANCE
Parameter Unit Typ Max Remarks
Sector Erase Time ms 7 15 From writing erase command to erase completion
Block Erase Time ms 7 15 From writing erase command to erase completion
Chip Erase Time ms 7 15 From writing erase command to erase completion
Page Programming Time ms 2 3 From writing program command to prog ram completion
Note: These parameters are characterized and are not 100% tested.
RELIABILITY CHARACTERISTICS
Parameter Min Typ Unit Test Method
Endurance 200,000 Cycles JEDEC Standard A117
Data Retention 20 Years JEDEC Standard A103
ESD – Human Body Model 2,000 Volts JEDEC Standard A114
ESD – Machine Model 200 Volts JEDEC Standard A115
Latch-Up 100 + ICC1 mA JEDEC Standard 78
Note: These parameters are characterized and are not 100% tested.
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
30
PACKAGE TYPE INFORMATION
`
JN
8-Pin JEDEC 150mil Broad Small Outline Integrated Circuit (SOIC) Package
(measure in millimeters)
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
31
PACKAGE TYPE INFORMATION (CONTINUED)
JB
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
32
PACKAGE TYPE INFORMATION (CONTINUED)
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
33
PACKAGE TYPE INFORMATION (CONTINUED)
JA
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
34
PACKAGE TYPE INFORMATION (CONTINUED)
JV
8-pin VVSOP 150mil
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
35
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
36
PRODUCT ORDERING INFORMATION
IS25WD*** - JN L E
Temperature Range
E = Extended Grade (-40°C to +105°C)
I = Industrial Grade (-40°C to +85°C)
A1 = Automotive, A1 Grade (-40°C to +85°C)
A2 = Automotive, A2 Grade (-40°C to +105°C)
A3 = Automotive, A3 Grade (-40°C to +125°C)
Environmental Attribute
L = Lead-free (Pb-free) package
Package Type
JN = 8-pin SOIC 150mil
JV = 8-pin VVSOP 150mil
JB = 8-pin SOIC 208mil
JA = 8-pin PDIP 300 mil
JP = 8-contact WSON
Device Number
IS25WD020/040
IS25WD020/040
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
09/12/2012
37
ORDERING INFORMATION:
Density Frequency
(MHz) Order Part Number Package
2M 80
IS25WD020-JNLE 8-pin SOIC 150mil
IS25WD020-JVLE 8-pin VVSOP 150-mil
IS25WD020-JBLE 8-pin SOIC 208-mil
IS25WD020-JALE 8-pin PDIP 300mil
IS25WD020-JPLE 8-pin WSON
IS25WD020-JNLI 8-pin SOIC 150mil
IS25WD020-JVLI 8-pin VVSOP 150-mil
IS25WD020-JBLI 8-pin SOIC 208-mil
IS25WD020-JALI 8-pin PDIP 300mil
IS25WD020-JPLI 8-pin WSON
IS25WD020-JNLA1 8-pin SOIC 150mil
IS25WD020-JVLA1 8-pin VVSOP 150-mil
IS25WD020-JBLA1 8-pin SOIC 208-mil
IS25WD020-JALA1 8-pin PDIP 300mil
IS25WD020-JPLA1 8-pin WSON
IS25WD020-JNLA2 8-pin SOIC 150mil
IS25WD020-JVLA2 8-pin VVSOP 150-mil
IS25WD020-JBLA2 8-pin SOIC 208-mil
IS25WD020-JALA2 8-pin PDIP 300mil
IS25WD020-JPLA2 8-pin WSON
4M 80
IS25WD040-JNLE 8-pin SOIC 150mil
IS25WD040-JVLE 8-pin VVSOP 150-mil
IS25WD040-JBLE 8-pin SOIC 208-mil
IS25WD040-JALE 8-pin PDIP 300mil
IS25WD040-JPLE 8-pin WSON
IS25WD040-JNLI 8-pin SOIC 150mil
IS25WD040-JVLI 8-pin VVSOP 150-mil
IS25WD040-JBLI 8-pin SOIC 208-mil
IS25WD040-JALI 8-pin PDIP 300mil
IS25WD040-JPLI 8-pin WSON
IS25WD040-JNLA1 8-pin SOIC 150mil
IS25WD040-JVLA1 8-pin VVSOP 150-mil
IS25WD040-JBLA1 8-pin SOIC 208-mil
IS25WD040-JALA1 8-pin PDIP 300mil
IS25WD040-JPLA1 8-pin WSON
IS25WD040-JNLA2 8-pin SOIC 150mil
IS25WD040-JVLA2 8-pin VVSOP 150-mil
IS25WD040-JBLA2 8-pin SOIC 208-mil
IS25WD040-JALA2 8-pin PDIP 300mil
IS25WD040-JPLA2 8-pin WSON