SCOPE: CMOS, 12-BIT BUFFERED, MULTIPLYING D/A CONVERTER Device Type 01 02 03 04 Generic Number MX7545S(x)/883B MX7545T(x)/883B MX7545U(x)/883B MX7545GU(x)/883B Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows: Outline Letter MAXIM SMD Q R E 2 Mil-Std-1835 GDIP1-T20 or CDIP2-T20 CQCC1-N20 Case Outline Package Code 20 LEAD CERDIP 20 LCC J20 L20 Absolute Maximum Ratings: VREF to GND ...................................................................................................... -0.3V, + 17V Digital Input to DGND ....................................................................................... -0.3V to VDD VRFB to GND .................................................................................................................. 25V VREF to GND .................................................................................................................. 25V VOUT1 to AGND ................................................................................................. -0.3V to VDD AGND to DGND ............................................................................................... -0.3V to VDD Lead Temperature (soldering, 10 seconds) ........................................................................ +300C Storage Temperature ........................................................................................... -65C to +150C Continuous Power Dissipation .................................................................................. TA=+70C 20 pin CERDIP(derate 11.1mW/C above +70C) ......................................................... 889mW 20 pin LCC(derate 9.1mW/C above +70C) ................................................................. 727mW Junction Temperature TJ .............................................................................................. +150C Thermal Resistance, Junction to Case, JC 20 pin CERDIP.......................................................................................................... 40C/W 20 pin LCC ............................................................................................................... 20C/W Thermal Resistance, Junction to Ambient, JA: 20 pin CERDIP.......................................................................................................... 90C/W 20 pin LCC ............................................................................................................. 110C/W Recommended Operating Conditions Ambient Operating Range (TA) .................................................................... -55C to +125C Supply Voltage Range ......................................................................................... +5V to +15V Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ---------------------------- Electrical Characteristics of MX7545/883B for SMD 5962-87702 19-0277 Page 2 of Rev. C 7 TABLE 1. ELECTRICAL TESTS: TEST Resolution NOTE 4 Relative Accuracy Symbol CONDITIONS -55 C TA +125C 1/ Unless otherwise specified RES VDD=+5V and +15V RA VDD=+5V and +15V Group A Subgroup 12-bit monotonic, VDD=+5V and +15V VDD=5V Gain Error NOTE 3 1.0 1,2,3 01 02 20 10 1 2,3 03 5.0 6.0 NOTE 3 1,2,3 AE 1 2,3 Gain Temperature Coefficient NOTE 4 TCAE Power Supply Rejection PSRR 1.0 2.0 25 15 10 01 02 03 6.0 7.0 5 04 All VDD=+15V VDD=5%, VDD=5V 1 2,3 1 2,3 1 2,3 All 4,5,6 All 1,2,3 All 1,2,3 All VDD=+5V & +15V, ___ __ D0-D11=0V, WR=CS=0V Feedthrough Error NOTE 4, NOTE 5 FTE VREF=10V, 10kHz sine wave VDD=5V RIN VIH VREF=10V, 10kHz sine wave VDD=15V VDD=+5V and +15V VDD=+5V VIL VDD=+15V VDD=+5V LSB LSB LSB ppm/C %/% 0.01 0.02 10 200 7 2.4 nA 10 mVp-p 25 k V 13.5 0.8 1,2,3 All V VDD=+15V ---------------------------- LSB 10 0.015 0.03 All VDD=5%, VDD=15V IOUT1 Digital Input Low Voltage 04 VDD=+5V Out1 Leakage Current Input Resistance Digital Input High Voltage 01 02 03,04 Units Bits 02,03, 04 1 2,3 Gain Error 12 01 AE VDD=15V Limits Max 2.0 1.0 0.5 4.0 1,2,3 1,2,3 DNL Limits Min All 10-bit monotonic, VDD=+5V and +15V Differential Nonlinearity Device type Electrical Characteristics of MX7545/883B for SMD 5962-87702 1.5 19-0277 Page 3 of Rev. C 7 TEST Digital Input Leakage Current Digital Input Capacitance NOTE 2, NOTE 6 Symbol IIN CONDITIONS -55 C TA +125C 1/ Unless otherwise specified VIN=0V or VDD VDD=+5V or +15V D0-D11, VDD=5V ___ __ WR, CS, VDD=5V CIN Group A Subgroup Device type 1 2,3 All 4 All Limits Min Limits Max 1.0 10 5 Units A 20 pF D0-D11, VIN=0V, VDD=15V ___ __ WR, CS, VIN=0V, VDD=15V VDD=5V ___ __ D0-D11=0V, WR, CS=0V 5 20 70 pF Output Capacitance NOTE 2, NOTE 6 COUT1 VDD=5V ___ __ D0-D11=VDD, WR, CS=0V 200 4 Chip Select to WriteSetup Time NOTE 7 Chip Select to Write-Hold Time NOTE 7 Write Pulse Width NOTE 7 Data-Setup Time NOTE 7 Data-Hold Time NOTE 7 Supply Current tCS All ___ __ VDD=15V D0-D11=0V, WR, CS=0V 70 VDD=15V ___ __ D0-D11=VDD, WR, CS=0V VDD=5V 200 170 9,10,11 All ns tCH VDD=15V VDD=+5V and +15V 9,10,11 All 95 0 tWR tCStWR, tCH0, VDD=+5V 9,10,11 All 170 tDS tCStWR, tCH0, VDD=15V VDD=5V All 95 150 All 80 5 ns ns 9,10,11 ns tDH VDD=15V VDD=+5V and +15V All digital inputs VIL or VIH VDD=+5V and +15V 9,10,11 1,2,3 All digital inputs 0V or VDD VDD=+5V and +15V 1 2,3 IDD 2.0 All 100 500 NOTE 1: NOTE 2: NOTE 3: NOTE 4: VDD=+15V, VOUT1=0V; VREF=+10V, AGND=DGND, unless otherwise specified. These parameters may be guaranteed if not tested at 25C to the limits specified in Table 1. Measured using internal feedback resistor and includes effect of 5ppm max gain TC. These parameters may be guaranteed if not tested over the full military temp range to the limits specified in Table 1. NOTE 5: Feedthrough error can be reduced by connecting the metal lid on the package to ground. NOTE 6: Subgroup 4 (CIN measurement) shall be measured only for the initial test and after process or design changes which may affect capacitance. NOTE 7: Timing Diagram. See Commercial Datasheet. ---------------------------- ns mA Electrical Characteristics of MX7545/883B for SMD 5962-87702 19-0277 Page 4 of Rev. C 7 A ORDERING INFORMATION: Package Pkg. Code 01 20 pin CERDIP J20 01 20 pin LCC L20 02 20 pin CERDIP J20 02 20 pin LCC L20 03 20 pin CERDIP J20 03 20 pin LCC L20 04 20 pin CERDIP J20 04 20 pin LCC L20 MAXIM PART # MX7545SQ/883B MX7545SE/883B MX7545TQ/883B MX7545TE/883B MX7545UQ/883B MX7545UE/883B MX7545GUQ/883B MX7545GUE/883B SMD Number 5962-8770201RA 5962-87702012C 5962-8770202RA 5962-87702022C 5962-8770203RA 5962-87702032C 5962-8770204RA 5962-87702042C TERMINAL CONNECTIONS: J20 & L20 Pin 1 OUT1 2 AGND 3 DGND 4 D11(MSB) 5 D10 6 D9 7 D8 8 D7 9 D6 10 D5 11 D4 12 D3 13 D2 14 D1 15 D0(LSB) 16 __ CS 17 ___ WR 18 VDD 19 VREF 20 RFB ---------------------------- Electrical Characteristics of MX7545/883B for SMD 5962-87702 19-0277 Page 5 of Rev. C 7 QUALITY ASSURANCE Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in MilStd-883. Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015: 1. Test Condition, A, B, C, or D. 2. TA = +125C minimum. 3. Interim and final electrical test requirements shall be specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted. Group C and D inspections: a. End-point electrical parameters shall be specified in Table 1. b. Steady-state life test, Method 1005 of Mil-Std-883: 1. Test condition A, B, C, D. 2. TA = +125C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883. TABLE 2. ELECTRICAL TEST REQUIREMENTS Mil-Std-883 Test Requirements Interim Electric Parameters Method 5004 Final Electrical Parameters Method 5005 Group A Test Requirements Method 5005 Group C and D End-Point Electrical Parameters Method 5005 * ** *** Subgroups per Method 5005, Table 1 1 1*, 2, 3 1, 2, 3, 4**, 5, 6, 9, 10***, 11*** 1 PDA applies to Subgroup 1 only. Subgroup 4 shall be tested at initial qualification and upon redesign. Sample size will be 116 units. Subgroups 10 and 11, if not tested shall be guaranteed to the specified limits of Table 1. ---------------------------- Electrical Characteristics of MX7545/883B for SMD 5962-87702 19-0277 Page 6 of Rev. C 7