11
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Class B+ Products (Revision -, April 2009)
Q-TECH
CORPORATION
Introduction
The commercial satellite industry has requested that smaller, lighter, less
expensive oscillator products with shorter lead times be made available
for minisatellites, microsatellites, nanosatellites and picosatellites. In
addition some newer satellite programs are being created for short term
space lives and do not need oscillators with the assurance of a 15-20 year
life span.
Q-Tech Corporation, the industry leader in both Class B and Space Rated
hybrid crystal oscillators is pleased to advise that we have created a
special category of product designated as Class B+ for these applications.
We have created these Class B+ products for the discriminate users
applications and needs using our small form MIL QPL Class B oscillators.
You, the customer, can now pick and choose the style of clock oscillator
you wish, whether you want a 100kRad (Si) High Dose Tolerant NSC
54ACT3301 (FACT) or a standard Class B qualified die, a swept quartz
space qualified crystal or a Class B cultured quartz crystal and/or a
combination thereof in an oscillator product that otherwise utilizes Class
B qualified passive devices. Q-Tech offers several different screening
options to allow you to choose the screening plan that best suits your
needs.
Q-Tech Corporation does not guarantee the specific radiation hardness
of its Class B+ products but will provide the necessary active device
component traceability to allow you to make your own decision and do
your own testing and evaluation based upon your specific needs and
requirements.
Initially we will begin this product offering in three of our leading
miniature clock oscillator product lines: QT78 (M55310/27, /28 & /30) ,
QT88 (M55310/33 & /34) and QT92 (M55310/37 & /38). Product will
be available in 5.0 and 3.3 Vdc from 450kHz to 85MHZ. Please consult
the factory if you would like to know if this option is available in other
standard Q-Tech Class B product lines or if you have any other specific
oscillator needs that we can help you with.
Features
Made in the USA
ECCN: EAR99
DFARS 252-225-7014 Compliant:
Electronic Component Exemption
USML Registration # M17677
Broad frequency range from 450kHz to 85MHz
Rugged 4 point mount design for high shock and
vibration
ACMOS, HCMOS, TTL or LVHCMOS logic
Tri-State Output Option (D)
Hermetically sealed ceramic SMD package
Fundamental and 3rd Overtone designs
Low phase noise
Custom designs available
Q-Tech does not use pure lead or pure tin in its
products
RoHS compliant
See website for link to RAD test data.
2
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
Class B+ Products (Revision -, April 2009)
Electrical Characteristics
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Q-TECH
CORPORATION
Parameters
QTX78AC
QTX88AC
QTX92AC
QTX78HC
QTX88HC
QTX92HC
QTX78T
QTX88T
QTX92T
QTX78L
QTX88L
QTX92L
Output frequency range (Fo) QTX78 450kHz 85.000MHz 450kHz 70.000MHz
QTX88 & QTX92 500kHz 85.000MHz 500kHz 70.000MHz
Supply voltage (Vdd) 5.0Vdc ± 10% 3.3Vdc ± 10%
Maximum Applied Voltage (Vdd max.) -0.5 to +7.0Vdc
Frequency stability (∆F/∆T) See Option codes
Operating temperature (Topr) See Option codes
Storage temperature (Tsto) -62ºC to + 125ºC
Operating supply current
(Idd) (No Load)
20 mA max. - 450kHz ~ < 16MHz
25 mA max. - 16MHz ~ < 32MHz
35 mA max. - 32MHz ~ < 60MHz
45 mA max. - 60MHz ~ 85MHz
3 mA max. - 450kHz ~ < 500kHz
6 mA max. - 500kHz ~ < 16MHz
10 mA max. - 16MHz ~ < 32MHz
20 mA max. - 32MHz ~ < 60MHz
30 mA max. - 60MHz ~ < 70MHz
Symmetry
(50% of ouput waveform or 1.4Vdc for TTL)
45/55% max. - 450kHz ~ < 15MHz
40/60% max. - 15 ~ 85MHz
(Tighter symmetry available)
45/55% max. - 450kHz ~ < 15MHz
40/60% max. - 15 ~ 70MHz
(Tighter symmetry available)
Rise and Fall times (with typical load) 6ns max. - Fo < 30MHz
3ns max. - Fo 30 - 85MHz
(between 10% to 90%)
7ns max. - Fo < 30MHz
3ns max. - Fo 30 - 85MHz
(between 10% to 90%)
5ns max. - Fo < 30MHz
3ns max. - Fo 30 - 85MHz
(between 0.8V to 2.0V)
6ns max. - 450kHz ~ < 40MHz
3ns max. - 40 ~ 70MHz
(between 10% to 90%)
Output Load
15pF // 10kohms
50pF max. or 10TTL
for (Fo < 60MHz)
30pF max. or 6TTL
for (Fo 60MHz)
15pF // 10kohms
(2LSTTL)
10TTL (Fo < 60MHz)
6TTL (Fo 60MHz)
15pF // 10kohms
(30pF max. for F 50MHz)
Start-up time (Tstup) 5ms max.
Output voltage (Voh/Vol) 0.9 x Vdd min.; 0.1 x Vdd max. 2.4V min.; 0.4V max. 0.9 x Vdd min.; 0.1 x Vdd max.
Output Current (Ioh/Iol) ± 24mA max. ± 8mA max. -1.6 mA/TTL
+40 µA/TTL
± 4mA max.
Enable/Disable Tristate function Pin 1 VIH 2.2V Oscillation;
VIL 0.8V High Impedance
Jitter RMS (at 25ºC) 8ps typ. - < 40MHz
5ps typ. - 40MHz
15ps typ. - < 40MHz
8ps typ. - 40MHz
Aging (at 70ºC) ± 5ppm max. first year / ± 2ppm max. per year thereafter
33
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Class B+ Products (Revision -, April 2009)
Q-TECH
CORPORATION
Packaging Options Other Options Available For An Additional Charge
Ordering Information
Frequency stability vs. temperature codes may not be available in all frequencies.
For Non-Standard requirements, contact Q-Tech Corporation at Sales@Q-Tech.com
Specifications subject to change without prior notice.
Standard packaging in anti-static plastic tube (60pcs/tube)
Tape and Reel is available for an additional charge.
Solder Dip Sn/Pb 60/40%
P. I. N. D. test
QT178XX - D - XX - X - 85.000MHz
Output frequency
Blank
M
B
S
1 = ± 100ppm at 0ºC to +70ºC
4 = ± 50ppm at 0ºC to +70ºC
5 = ± 25ppm at -20ºC to +70ºC
6 = ± 50ppm at -55ºC to +105ºC
9 = ± 50ppm at -55ºC to +125ºC
10 = ± 100ppm at -55ºC to +125ºC
11 = ± 50ppm at -40ºC to +85ºC
12 = ± 100ppm at -40ºC to +85ºC
14 = ± 20ppm at -20ºC to +70ºC
15 = ± 25ppm at -40ºC to +85ºC
Tristate Option D
(Left blank if no Tristate)
0.170 MAX.
0.018±.003
(0.46±0.08)
(4.318 MAX.)
0.550±.0.005
(13.970±0.13)
0.350±0.005
(8.89±0.13)
0.100±.005
0.200±.005
(2.54±0.13)
(5.080±0.13)
(7.620±0.13)
(9.525±0.13)
P/N
FREQ.
D/C S/N
Q-TECH
43
12
.130 MAX.
0.300±.005
0.375±0.005
3.302 MAX.
Package Specifications and Outline
Dimensions are in inches (mm)
Pin No.
Function
1
TRISTATE or NC
2
GND/CASE
3
OUTPUT
4
VDD
Package material: 90% AL2O3
Lead material: Kovar
Lead finish:
Gold Plated: 50µ ~ 80µ inches
Nickel Underplate: 100µ ~ 250µ inches
Weight: 1.1g typ., 3g max.
Package Information
0.290±0.005
(7.37±0.13)
0.350±0.005
(8.89±0.13)
0.100±0.005
(2.54±0.13)
0.200±0.005
(5.08±0.13)
0.170 Max.
(4.32)
0.018±0.003
(0.457±0.076)
0.315±0.005
(8.00±0.13)
0.240±0.005
(6.10±0.13)
0.040 Max.
(1.02)
P/N
FREQ.
Q-TECH
D/C S/N
1 2
4 3
12
43
0.350±.0.005
0.290±0.005
0.190 MAX.
0.018±.003
(8.00±0.13)
(1.396±0.13)
0.200±.005
(.457±0.076)
(8.89±0.13)
(7.37±0.13)
(5.080±0.13)
(4.826 MAX.)
(.203) (2.794±0.13)
P/N
FREQ.
Q-TECH
D/C S/N
0.315±0.005
0.055±.005
0.008 0.110±.005
0.100±.005
(2.54±0.13)
L = CMOS 3.3V
AC = ACMOS 5V
HC = HCMOS 5V
T = TTL 5V
78 = QT78
88 = QT88
92 = QT92
Blank = Class B Die, Cultured Quartz Crystal
1 = 100 kRad (Si) High Dose 54ACT3301, Swept Quartz Crystal
2 = 100 kRad (Si) High Dose 54ACT3301, Cultured Quartz Crystal
3 = Class B Die, Swept Quartz Crystal }See screening level
tables on page 4
QTX78 QTX88 QTX92
44
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Class B+ Products (Revision -, April 2009)
Q-TECH
CORPORATION
SCREENING TEST DESCRIPTION STANDARD METHOD CONDITION QUANTITY COMMENTS
Blank M B S
Non destructive bond pull 883 2023 100% 2.4 grams
Internal visual 883 2017 Class H 100%
Stabilization bake 883 1008 C 100% 48 hours at 150'C
✓✓✓ Temperature cycling 883 1010 B (for M)
C (for B & S) 100% 10 cycles
✓✓✓ Constant acceleration 883 2001 A 100% Y1 direction only
Particle impact noise detection (PIND) 883 2020 B 100% 5 passes minimum
(see note 1)
✓✓✓ Pre burn-in electrical Refer to Table I and detail specification 100%
✓✓✓ Burn-in #1 883 1015 125°C for 160 hours 100% (see note 2)
Interim electrical Refer toTable I, II and detail specification 100%
Burn-in #2 883 1015 125 °C for 160 hours 100% (see note 2)
Final electrical
Refer to detail specification ................... (for Blank)
Refer to Table I and detail specification ....... (for M)
Refer to Table I and detail specification ....... (for B)
Refer to Table I, II and detail specification ... (for S)
100%
Seal: Fine leak 883 1014 A1 100%
Seal: Gross leak 883 1014 C 100%
Radiographic inspection 883 2012 Class S 100%
Frequency aging 30days MIL-PRF-55310 - 70 °C 100% ±1.5ppm max.
(see note 3)
✓✓✓ Frequency/Temperature stability MIL-PRF-55310 Measure the output frequency at ten equispaced points
minimum of the specified operating temperature range
External visual 883 2009 100%
Parameters Pre BI at 25ºC Pre BI Low T Pre BI High T Interim BI at 25ºC Post BI at 25ºC Post BI Low T Post BI High T
M B S M B S M B S M B S M B S M B S M B S
Output frequency
Frequency/temperature stability
Frequency/voltage stability
Input current
Output voltage
Waveform
Duty cycle (symmetry)
Rise and fall times
Start up time
Test Parameter Symbol Delta Limits
Burn-In (second 160 hours Burn-In period) Supply current Icc ±10% of initial reading
Frequency aging after 30 days at +70°C Output Frequency Fo Refer to detail spec.
Screening Test Table
Table I Electrical Test - Measurement Requirements (Applicable to screening level M, B, & S only)
Table II Delta Limits (Applicable to screening level S only)
1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The survivors of the
last pass are acceptable.
2. Burn-in shall be under the specified load and nominal voltage conditions.
3. Normally, frequency aging tests are for 30 days. However, the frequency aging test may be ceased if after 15 days the measured aging rate is less
than half of the specified aging rate.
55
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Class B+ Products (Revision -, April 2009)
Q-TECH
CORPORATION
Reflow Profile
Environmental Specifications
The five transition periods for the typical reflow process are:
Preheat
Flux activation
Thermal equalization
Reflow
Cool down
0 20 40 60 80 100 120 140 160 180 200 220 240 260 280 300 320 340 360 380 400 420 Time (s)
25
50
75
100
125
150
175
200
225
250
TEMP(*C)
0
60s min.
120s max.
60s min.
120s max.
225º min.
240º max.
60s min.
150s max.
240º
Ramp down (6ºC/s Max)
Ramp up (3ºC/s Max)
TYPICAL REFLOW PROFILE FOR Sn-Pb ASSEMBLY
Q-Tech Standard Screening/QCI (MIL-PRF55310) is available for all of our QTX78 Products. Q-Tech can also customize screening
and test procedures to meet your specific requirements. The QTX78 product is designed and processed to exceed the following test
conditions:
Environmental Test Test Conditions
Temperature cycling MIL-STD-883, Method 1010, Cond. B or Cond. C
Constant acceleration MIL-STD-883, Method 2001, Cond. A, Y1
Seal Fine Leak MIL-STD-883, Method 1014, Cond. A
Burn-in 160 hours, 125°C with load
Aging 30 days, 70°C, ±1.5ppm max
Vibration sinusoidal MIL-STD-202, Method 204, Cond. D
Shock, non operating MIL-STD-202, Method 213, Cond. I (See Note 1)
Thermal shock, non operating MIL-STD-202, Method 107, Cond. B
Ambient pressure, non operating MIL-STD-202, 105, Cond. C, 5 minutes dwell time minimum
Resistance to solder heat MIL-STD-202, Method 210, Cond. B
Moisture resistance MIL-STD-202, Method 106
Terminal strength MIL-STD-202, Method 211, Cond. C
Resistance to solvents MIL-STD-202, Method 215
Solderability MIL-STD-202, Method 208
ESD Classification MIL-STD-883, Method 3015, Class 1HBM 0 to 1,999V
Moisture Sensitivity Level J-STD-020, MSL=1
Note 1: Additional shock results successfully passed on 16MHz, 40MHz, and 80MHz
Shock 850g peak, half-sine, 1 ms duration (MIL-STD-202, Method 213, Cond. D modified)
Shock 1,500g peak, half-sine, 0.5ms duration (MIL-STD-883, Method 2002, Cond. B)
Shock 36,000g peak, half-sine, 0.12 ms duration (QTX88 & QTX92)
Please contact Q-Tech for higher shock requirements
Embossed Tape and Reel Information
Dimensions are in mm. Tape is compliant to EIA-481-A.
Reel size vs. quantity:
FEEDING (PULL) DIRECTION
ø13.0±0.5
2.5
MAX
ø1.5
2.0
1.75±0.1
0.3±.005 ø1.5 2.0±0.1
5.5±0.1
4.0±0.1
ø178±1
or
ø330±1
26
24.0±0.3
16±0.1
120º
B
A
C
QT
A B C
QTX78
10.01 ±0.1 14.53 ±0.1 4.80 ±0.1
QTX88 & QTX92
7.747 ±0.1 9.271 ±0.1 4.699 ±0.1
Reel size
(Diameter in mm)
Qty per reel (pcs)
QTX78 QTX88, QTX92
178
250 150
330
1000 800
66
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Class B+ Products (Revision -, April 2009)
Q-TECH
CORPORATION
Vdd
GND
0.1xVdd
0.9xVdd
VOH
VOL
Tr Tf
TH
T
0.5xVdd
SYMMETRY = x 100%
TH
T
Output Waveform (Typical)
Frequency vs. Temperature Curve
Test Circuit
-5
-4
-3
-2
-1
0
1
2
3
4
5
-50
-40
-30
-20
-10
0
10
20
30
40
50
-55 -45 -35 -25 -15 -5 5 15 25 35 45 55 65 75 85 95 105 115 125
Frequency Stability (PPM)
Temperature (°C)
Frequency-Temperature Curve QTX88LD9M-48.21MHz
45º 45º
Hybrid Case
Substrate
Die
D/A epoxy
D/A epoxy
Heat
Die
R1
D/A epoxy Substrate D/A epoxy Hybrid Case
R2 R3 R4 R5
Thermal Characteristics
JA JC CA
Die
T
T
TC
A
J
CA
JC
(Figure 1)
(Figure 2)
The Tristate function on pin 1 has a built-in pull-up resistor typical 50kΩ, so it
can be left floating or tied to Vdd without deteriorating the electrical performance.
The heat transfer model in a hybrid package is described in
figure 1.
Heat spreading occurs when heat flows into a material layer of
increased cross-sectional area. It is adequate to assume that
spreading occurs at a 45° angle.
The total thermal resistance is calculated by summing the
thermal resistances of each material in the thermal path
between the device and hybrid case.
RT=R1+R2+R3+R4+R5
The total thermal resistance RT (see figure 2) between the heat
source (die) to the hybrid case is the Theta Junction to Case
(Theta JC) in°C/W.
Theta junction to case (Theta JC) for this product is 30°C/W.
Theta case to ambient (Theta CA) for this part is 100°C/W.
Theta Junction to ambient (Theta JA) is 130°C/W.
Maximum power dissipation PD for this package at 25°C is:
PD(max) = (TJ (max) TA)/Theta JA
With TJ = 175°C (Maximum junction temperature of die)
PD(max) = (175 25)/130 = 1.15W
77
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc - 450kHz to 85MHz
Class B+ Products (Revision -, April 2009)
Q-TECH
CORPORATION
Phase noise is measured in the frequency domain, and is expressed as a ratio of signal power to noise power measured in a 1Hz
bandwidth at an offset frequency from the carrier, e.g. 10Hz, 100Hz, 1kHz, 10kHz, 100kHz, etc. Phase noise measurement is made
with an Agilent E5052A Signal Source Analyzer (SSA) with built-in outstanding low-noise DC power supply source. The DC source
is floated from the ground and isolated from external noise to ensure accuracy and repeatability.
In order to determine the total noise power over a certain frequency range (bandwidth), the time domain must be analyzed in the
frequency domain, and then reconstructed in the time domain into an rms value with the unwanted frequencies excluded. This may be
done by converting L(f) back to Sφ(f) over the bandwidth of interest, integrating and performing some calculations.
The value of RMS jitter over the bandwidth of interest, e.g. 10kHz to 20MHz, 10Hz to 20MHz, represents 1 standard deviation of
phase jitter contributed by the noise in that defined bandwidth.
Figure below shows a typical Phase Noise/Phase jitter of a QTX78AC6, 5.0Vdc, 80MHz clock at offset frequencies 10Hz to 5MHz,
and phase jitter integrated over the bandwidth of 12kHz to 1MHz.
Phase Noise and Phase Jitter Integration
Period Jitter
As data rates increase, effects of jitter become critical with
its budgets tighter. Jitter is the deviation of a timing event
of a signal from its ideal position. Jitter is complex and is
composed of both random and deterministic jitter
components. Random jitter (RJ) is theoretically unbounded
and Gaussian in distribution. Deterministic jitter (DJ) is
bounded and does not follow any predictable distribution.
DJ is also referred to as systematic jitter. A technique to
measure period jitter (RMS) one standard deviation (1σ) and
peak-to-peak jitter in time domain is to use a high sampling
rate (>8G samples/s) digitizing oscilloscope. Figure shows
an example of peak-to-peak jitter and RMS jitter (1σ) of a
QTX78AC-24MHz, at 5.0Vdc.
RMS jitter (1σ): 5.37ps Peak-to-peak jitter: 43ps
Symbol
Definition
L(f) Integrated single side band phase noise (dBc)
(f)=(180/Π)x2 L(f)df Spectral density of phase modulation, also known as RMS phase error (in degrees)
RMS jitter = (f)/(fosc.360°) Jitter(in seconds) due to phase noise. Note (f) in degrees.