CLASS B+ PRODUCTS Q-TECH CORPORATION Features CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz * Made in the USA * ECCN: EAR99 * DFARS 252-225-7014 Compliant: Electronic Component Exemption * USML Registration # M17677 * Broad frequency range from 450kHz to 85MHz * Rugged 4 point mount design for high shock and vibration * ACMOS, HCMOS, TTL or LVHCMOS logic * Tri-State Output Option (D) * Hermetically sealed ceramic SMD package * Fundamental and 3rd Overtone designs * Low phase noise * Custom designs available * Q-Tech does not use pure lead or pure tin in its products * RoHS compliant Introduction The commercial satellite industry has requested that smaller, lighter, less expensive oscillator products with shorter lead times be made available for minisatellites, microsatellites, nanosatellites and picosatellites. In addition some newer satellite programs are being created for short term space lives and do not need oscillators with the assurance of a 15-20 year life span. See website for link to RAD test data. Q-Tech Corporation, the industry leader in both Class B and Space Rated hybrid crystal oscillators is pleased to advise that we have created a special category of product designated as Class B+ for these applications. We have created these Class B+ products for the discriminate user's applications and needs using our small form MIL QPL Class B oscillators. You, the customer, can now pick and choose the style of clock oscillator you wish, whether you want a 100kRad (Si) High Dose Tolerant NSC 54ACT3301 (FACT) or a standard Class B qualified die, a swept quartz space qualified crystal or a Class B cultured quartz crystal and/or a combination thereof in an oscillator product that otherwise utilizes Class B qualified passive devices. Q-Tech offers several different screening options to allow you to choose the screening plan that best suits your needs. Q-Tech Corporation does not guarantee the specific radiation hardness of its Class B+ products but will provide the necessary active device component traceability to allow you to make your own decision and do your own testing and evaluation based upon your specific needs and requirements. Initially we will begin this product offering in three of our leading miniature clock oscillator product lines: QT78 (M55310/27, /28 & /30) , QT88 (M55310/33 & /34) and QT92 (M55310/37 & /38). Product will be available in 5.0 and 3.3 Vdc from 450kHz to 85MHZ. Please consult the factory if you would like to know if this option is available in other standard Q-Tech Class B product lines or if you have any other specific oscillator needs that we can help you with. Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com Class B+ Products (Revision -, April 2009) 1 CLASS B+ PRODUCTS CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz Q-TECH Electrical Characteristics CORPORATION Parameters Output frequency range (Fo) Supply voltage (Vdd) QTX78 QTX88 & QTX92 QTX78AC QTX88AC QTX92AC QTX78HC QTX88HC QTX92HC 450kHz -- 85.000MHz 500kHz -- 85.000MHz 5.0Vdc 10% Maximum Applied Voltage (Vdd max.) 450kHz -- 70.000MHz 500kHz -- 70.000MHz 3.3Vdc 10% -0.5 to +7.0Vdc Frequency stability (F/T) See Option codes Operating temperature (Topr) See Option codes Storage temperature (Tsto) -62C to + 125C Operating supply current (Idd) (No Load) 20 mA max. 25 mA max. 35 mA max. 45 mA max. - Symmetry (50% of ouput waveform or 1.4Vdc for TTL) 45/55% max. - 450kHz ~ < 15MHz 40/60% max. - 15 ~ 85MHz (Tighter symmetry available) 6ns max. - Fo < 30MHz 3ns max. - Fo 30 - 85MHz (between 10% to 90%) Rise and Fall times (with typical load) 15pF // 10kohms Enable/Disable Tristate function Pin 1 6TTL (Fo 60MHz) (30pF max. for F 50MHz) 2.4V min.; 0.4V max. 0.9 x Vdd min.; 0.1 x Vdd max. 5ms max. 8mA max. 8ps typ. - < 40MHz 5ps typ. - 40MHz Jitter RMS 1 (at 25C) 45/55% max. - 450kHz ~ < 15MHz 40/60% max. - 15 ~ 70MHz (Tighter symmetry available) (2LSTTL) 24mA max. Output Current (Ioh/Iol) VIH 2.2V Oscillation; VIL 0.8V High Impedance 10TTL (Fo < 60MHz) -1.6 mA/TTL +40 A/TTL 6ns max. - 450kHz ~ < 40MHz 3ns max. - 40 ~ 70MHz (between 10% to 90%) 15pF // 10kohms 4mA max. 15ps typ. - < 40MHz 8ps typ. - 40MHz 5ppm max. first year / 2ppm max. per year thereafter Aging (at 70C) - Class B+ Products (Revision -, April 2009) 10150 W. Jefferson Boulevard, Culver City 90232 < 500kHz < 16MHz < 32MHz < 60MHz < 70MHz 5ns max. - Fo < 30MHz 3ns max. - Fo 30 - 85MHz (between 0.8V to 2.0V) 0.9 x Vdd min.; 0.1 x Vdd max. Output voltage (Voh/Vol) ~ ~ ~ ~ ~ 7ns max. - Fo < 30MHz 3ns max. - Fo 30 - 85MHz (between 10% to 90%) 30pF max. or 6TTL for (Fo 60MHz) Start-up time (Tstup) 3 mA max. - 450kHz 6 mA max. - 500kHz 10 mA max. - 16MHz 20 mA max. - 32MHz 30 mA max. - 60MHz 450kHz ~ < 16MHz 16MHz ~ < 32MHz 32MHz ~ < 60MHz 60MHz ~ 85MHz 15pF // 10kohms 50pF max. or 10TTL for (Fo < 60MHz) Output Load Q-TECH Corporation QTX78L QTX88L QTX92L QTX78T QTX88T QTX92T - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech .co m 2 CLASS B+ PRODUCTS CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz Q-TECH CORPORATION Package Specifications and Outline QTX78 QTX88 QTX92 0.550.0.005 (13.9700.13) 0.3500.005 (8.890.13) 0.350.0.005 4 4 3 Q-TECH P/N FREQ. D/C S/N 0.3500.005 (8.890.13) 1 (8.890.13) 3 Q-TECH P/N FREQ. D/C S/N 1 2 3 4 0.2900.005 (7.370.13) Q-TECH P/N FREQ. D/C S/N 2 0.100.005 (2.540.13) 0.170 MAX. (5.0800.13) 0.0180.003 (0.4570.076) 0.018.003 (0.460.08) 0.3750.005 (.4570.076) 0.3150.005 (8.000.13) .130 MAX. 3.302 MAX. 0.2400.005 (6.100.13) 0.300.005 Ordering Information = = = = 0.008 (.203) Dimensions are in inches (mm) (7.6200.13) Blank 1 2 3 0.055.005 (1.3960.13) 0.040 Max. (1.02) OUTPUT GND/CASE VDD * Package material: 90% AL2O3 * Lead material: Kovar * Lead finish: Gold Plated: 50 ~ 80 inches Nickel Underplate: 100 ~ 250 inches * Weight: 1.1g typ., 3g max. 0.018.003 0.3150.005 (8.000.13) (9.5250.13) 3 Package Information 0.190 MAX. (4.826 MAX.) 0.170 Max. (4.32) (4.318 MAX.) TRISTATE or NC 4 0.200.005 0.2000.005 (5.080.13) 0.200.005 (5.0800.13) Function 1 2 2 1 0.1000.005 (2.540.13) 0.100.005 (2.540.13) Pin No. 0.2900.005 (7.370.13) 0.110.005 (2.7940.13) QT178XX - D - XX - X - 85.000MHz Class B Die, Cultured Quartz Crystal 100 kRad (Si) High Dose 54ACT3301, Swept Quartz Crystal 100 kRad (Si) High Dose 54ACT3301, Cultured Quartz Crystal Class B Die, Swept Quartz Crystal 78 = QT78 88 = QT88 92 = QT92 L = CMOS 3.3V AC = ACMOS 5V HC = HCMOS 5V T = TTL 5V Tristate Option D (Left blank if no Tristate) 1 4 5 6 9 10 11 12 14 15 = = = = = = = = = = } Blank M B S 100ppm 50ppm 25ppm 50ppm 50ppm 100ppm 50ppm 100ppm 20ppm 25ppm Output frequency See screening level tables on page 4 at at at at at at at at at at 0C 0C -20C -55C -55C -55C -40C -40C -20C -40C Frequency stability vs. temperature codes may not be available in all frequencies. to to to to to to to to to to +70C +70C +70C +105C +125C +125C +85C +85C +70C +85C For Non-Standard requirements, contact Q-Tech Corporation at Sales@Q-Tech.com Packaging Options * Standard packaging in anti-static plastic tube (60pcs/tube) * Tape and Reel is available for an additional charge. Other Options Available For An Additional Charge * Solder Dip Sn/Pb 60/40% * P. I. N. D. test Specifications subject to change without prior notice. Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com Class B+ Products (Revision -, April 2009) 3 CLASS B+ PRODUCTS CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz Q-TECH Screening Test Table CORPORATION SCREENING Blank M B S TEST DESCRIPTION Non destructive bond pull Stabilization bake Class H 100% 1010 B (for M) C (for B & S) 1008 C 2001 B 1015 125C for 160 hours Burn-in #2 883 1015 125 C for 160 hours Radiographic inspection Frequency aging 30days (see note 2) 100% (see note 2) 100% 1014 A1 100% 883 2012 Class S 100% - MIL-PRF-55310 External visual 100% 883 MIL-PRF-55310 Frequency/Temperature stability 100% 100% Refer to detail specification ................... (for Blank) Refer to Table I and detail specification ....... (for M) Refer to Table I and detail specification ....... (for B) Refer to Table I, II and detail specification ... (for S) 1014 883 2009 Y1 direction only 5 passes minimum (see note 1) 100% Refer toTable I, II and detail specification 883 10 cycles 100% Refer to Table I and detail specification Seal: Gross leak 48 hours at 150'C 100% 883 Interim electrical 2.4 grams 100% A 2020 COMMENTS 100% Burn-in #1 Seal: Fine leak 2017 883 Pre burn-in electrical 883 2023 883 Particle impact noise detection (PIND) QUANTITY 883 Constant acceleration Final electrical CONDITION 883 Temperature cycling METHOD 883 Internal visual STANDARD C 100% 1.5ppm max. (see note 3) Measure the output frequency at ten equispaced points minimum of the specified operating temperature range 70 C 100% 100% 1. PIND testing shall be performed using five (5) independent passes and all failures found at the end of each pass are rejected. The survivors of the last pass are acceptable. 2. Burn-in shall be under the specified load and nominal voltage conditions. 3. Normally, frequency aging tests are for 30 days. However, the frequency aging test may be ceased if after 15 days the measured aging rate is less than half of the specified aging rate. Table I Electrical Test - Measurement Requirements (Applicable to screening level M, B, & S only) Pre BI at 25C Parameters Output frequency Frequency/temperature stability Frequency/voltage stability Input current M B S Output voltage Waveform Duty cycle (symmetry) Rise and fall times Start up time Pre BI Low T M B S Pre BI High T Interim BI at 25C Post BI at 25C M B S M Table II Delta Limits (Applicable to screening level S only) Test Burn-In (second 160 hours Burn-In period) Frequency aging after 30 days at +70C B S M B S Parameter Symbol Output Frequency Fo Supply current Icc Post BI Low T Post BI High T M B S M B S Delta Limits 10% of initial reading Refer to detail spec. Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com Class B+ Products (Revision -, April 2009) 4 CLASS B+ PRODUCTS CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz Q-TECH Reflow Profile Embossed Tape and Reel Information CORPORATION FEEDING (PULL) DIRECTION 0.3.005 2.00.1 o1.5 4.00.1 5.50.1 5 MAX B o1.5 C TYPICAL REFLOW PROFILE FOR Sn-Pb ASSEMBLY 160.1 24.00.3 The five transition periods for the typical reflow process are: * Preheat * Flux activation * Thermal equalization * Reflow * Cool down 1.750.1 A TEMP(*C) Ramp up (3C/s Max) 240 o13.00.5 250 225 o1781 or o3301 2.5 Ramp down (6C/s Max) 200 225 min. 240 max. 175 60s min. 150s max. 150 60s min. 120s max. 125 2.0 100 120 QT 75 QTX78 QTX88 & QTX92 60s min. 120s max. 50 25 0 0 20 40 60 80 100 120 140 160 180 200 220 240 260 280 300 320 340 360 380 400 420 Environmental Specifications Time (s) A 10.01 0.1 7.747 0.1 B 14.53 0.1 9.271 0.1 26 C 4.80 0.1 4.699 0.1 Dimensions are in mm. Tape is compliant to EIA-481-A. Reel size vs. quantity: Reel size (Diameter in mm) 178 330 Qty per reel (pcs) QTX78 QTX88, QTX92 250 1000 150 800 Q-Tech Standard Screening/QCI (MIL-PRF55310) is available for all of our QTX78 Products. Q-Tech can also customize screening and test procedures to meet your specific requirements. The QTX78 product is designed and processed to exceed the following test conditions: Environmental Test Temperature cycling Constant acceleration Seal Fine Leak Burn-in Aging Vibration sinusoidal Shock, non operating Thermal shock, non operating Ambient pressure, non operating Resistance to solder heat Moisture resistance Terminal strength Resistance to solvents Solderability ESD Classification Moisture Sensitivity Level Test Conditions MIL-STD-883, Method 1010, Cond. B or Cond. C MIL-STD-883, Method 2001, Cond. A, Y1 MIL-STD-883, Method 1014, Cond. A 160 hours, 125C with load 30 days, 70C, 1.5ppm max MIL-STD-202, Method 204, Cond. D MIL-STD-202, Method 213, Cond. I (See Note 1) MIL-STD-202, Method 107, Cond. B MIL-STD-202, 105, Cond. C, 5 minutes dwell time minimum MIL-STD-202, Method 210, Cond. B MIL-STD-202, Method 106 MIL-STD-202, Method 211, Cond. C MIL-STD-202, Method 215 MIL-STD-202, Method 208 MIL-STD-883, Method 3015, Class 1HBM 0 to 1,999V J-STD-020, MSL=1 Note 1: Additional shock results successfully passed on 16MHz, 40MHz, and 80MHz * Shock 850g peak, half-sine, 1 ms duration (MIL-STD-202, Method 213, Cond. D modified) * Shock 1,500g peak, half-sine, 0.5ms duration (MIL-STD-883, Method 2002, Cond. B) * Shock 36,000g peak, half-sine, 0.12 ms duration (QTX88 & QTX92) Please contact Q-Tech for higher shock requirements Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com Class B+ Products (Revision -, April 2009) 5 CLASS B+ PRODUCTS CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz Q-TECH CORPORATION Output Waveform (Typical) TH SYMMETRY = Test Circuit Typical test circuit for CMOS logic x 100% T + mA Tr 4 Tf + Vdc + Power supply - Vdd VOH 0.9xVdd Output 3 QT78 0.1F or 2 1 0.01F - 15pF (*) 10k Ground 0.5xVdd Tristate Function 0.1xVdd VOL (*) CL includes probe and jig capacitance GND The Tristate function on pin 1 has a built-in pull-up resistor typical 50k, so it can be left floating or tied to Vdd without deteriorating the electrical performance. TH Frequency vs. Temperature Curve T 50 5 Frequency Stability (PPM) Frequency-Temperature Curve QTX88LD9M-48.21MHz 40 4 30 3 20 2 10 1 0 0 -10 -1 -20 -2 -30 -3 -40 -4 -50 -55 -45 -35 -25 -15 -5 5 Thermal Characteristics 15 25 35 45 55 65 75 85 The heat transfer model in a hybrid package is described in figure 1. Heat spreading occurs when heat flows into a material layer of increased cross-sectional area. It is adequate to assume that spreading occurs at a 45 angle. The total thermal resistance is calculated by summing the thermal resistances of each material in the thermal path between the device and hybrid case. RT = R1 + R2 + R3 + R4 + R5 95 105 115 D/A epoxy Die D/A epoxy 45 45 Heat Substrate Hybrid Case R1 R2 Die D/A epoxy The total thermal resistance RT (see figure 2) between the heat source (die) to the hybrid case is the Theta Junction to Case (Theta JC) inC/W. R3 (Figure 1) Substrate R4 D/A epoxy T * Theta junction to case (Theta JC) for this product is 30C/W. * Theta case to ambient (Theta CA) for this part is 100C/W. * Theta Junction to ambient (Theta JA) is 130C/W. R5 Hybrid Case A CA T C T J Die JC Maximum power dissipation PD for this package at 25C is: * PD(max) = (TJ (max) - TA)/Theta JA * With TJ = 175C (Maximum junction temperature of die) * PD(max) = (175 - 25)/130 = 1.15W -5 125 Temperature (C) JA JC (Figure 2) CA Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com Class B+ Products (Revision -, April 2009) 6 CLASS B+ PRODUCTS CRYSTAL CLOCK OSCILLATORS 3.3 to 5.0Vdc - 450kHz to 85MHz Q-TECH CORPORATION Period Jitter As data rates increase, effects of jitter become critical with its budgets tighter. Jitter is the deviation of a timing event of a signal from its ideal position. Jitter is complex and is composed of both random and deterministic jitter components. Random jitter (RJ) is theoretically unbounded and Gaussian in distribution. Deterministic jitter (DJ) is bounded and does not follow any predictable distribution. DJ is also referred to as systematic jitter. A technique to measure period jitter (RMS) one standard deviation (1) and peak-to-peak jitter in time domain is to use a high sampling rate (>8G samples/s) digitizing oscilloscope. Figure shows an example of peak-to-peak jitter and RMS jitter (1) of a QTX78AC-24MHz, at 5.0Vdc. Phase Noise and Phase Jitter Integration RMS jitter (1): 5.37ps Peak-to-peak jitter: 43ps Phase noise is measured in the frequency domain, and is expressed as a ratio of signal power to noise power measured in a 1Hz bandwidth at an offset frequency from the carrier, e.g. 10Hz, 100Hz, 1kHz, 10kHz, 100kHz, etc. Phase noise measurement is made with an Agilent E5052A Signal Source Analyzer (SSA) with built-in outstanding low-noise DC power supply source. The DC source is floated from the ground and isolated from external noise to ensure accuracy and repeatability. In order to determine the total noise power over a certain frequency range (bandwidth), the time domain must be analyzed in the frequency domain, and then reconstructed in the time domain into an rms value with the unwanted frequencies excluded. This may be done by converting L(f) back to S(f) over the bandwidth of interest, integrating and performing some calculations. L(f) Symbol S (f)=(180/)x2 L(f)df RMS jitter = S (f)/(fosc.360) Definition Integrated single side band phase noise (dBc) Spectral density of phase modulation, also known as RMS phase error (in degrees) Jitter(in seconds) due to phase noise. Note S (f) in degrees. The value of RMS jitter over the bandwidth of interest, e.g. 10kHz to 20MHz, 10Hz to 20MHz, represents 1 standard deviation of phase jitter contributed by the noise in that defined bandwidth. Figure below shows a typical Phase Noise/Phase jitter of a QTX78AC6, 5.0Vdc, 80MHz clock at offset frequencies 10Hz to 5MHz, and phase jitter integrated over the bandwidth of 12kHz to 1MHz. Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com Class B+ Products (Revision -, April 2009) 7